Abstract:
A spectrometer, or a spectral instrument using multiple non-interfering optical beam paths and special optical elements. The special optical elements for use with the instrument are used for directing the optical beam and/or altering the form of the beam. The instrument has the potential, depending upon the totality of the optical components incorporated into the instrument, to be a monochromator, a spectroradiometer, a spectrophotometer and a spectral source. The spectral instrument may further be a part of the spectral system. The system may include the spectral instrument, a power module and means for remote control of the instrument. Such remote control may be by use of a personal computer or a control system dedicated to the control, measurement and analysis of the collected information. The multiple non-interfering beam paths are created using specially designed optical elements such as a diffraction grating, a splitter box, a zero back-lash drive system for movement of the grating element. The orientation of and a physical/spatial relationship between the field lenses, slits, return mirror, reflecting prism, turning lenses all define the multiple, preferably two paths. Particularly, there is a double pass through the grating to increase dispersion, reduce scatter while maintaining a perfect temperature independent spectral match for the second pass. Using the same grating twice reduces scatter by about a factor of 1000, increases the dispersion by a factor of two, and eliminates any temperature-related mechanical spectral drift which often is present with two separate monochromators. Because of the specially designed grating structure, the grating can cause the concurrent diffraction of a plurality of incident optical beams, each of which beams have different angles of incidence and different angles of reflection. The path of the incident and the reflected beam to and from the grating is nulloff-axisnull. That is, the beams going to and from the grating do not use the optical axis of the grating structure.
Abstract:
Apparatus comprising a plasma source to generate a spectrum of radiation that includes extreme ultraviolet radiation, a reflector to generate a beam of extreme ultraviolet radiation from the spectrum of radiation, and a thin film to pass at least a portion of the extreme ultraviolet radiation.
Abstract:
A holographic demultiplexor for filtering and spatially positioning individual optical channels, wavelengths, or sets of wavelengths. The holographic demultiplexor includes a volume hologram that includes holograms for redirecting wavelengths included in a light signal. A diffraction grating linearly disperses the light signal and the individual holograms included in the volume hologram spatially reflect the one or more wavelengths back to the diffraction grating as specific angles. The volume hologram spatially reflects the one or more wavelengths such that they are dispersed in two dimensions. The diffraction grating then reflects the two dimensionally dispersed wavelengths to a two dimensional detector array. The detectors of the detector array for adjacent wavelengths can be interleaved to reduce interference. Alternatively, the volume hologram can redirect sets of wavelengths directly to the detector array and the light is not linearly dispersed by a diffraction grating first.
Abstract:
An optical channel monitoring device uses a linear variable filter (LVF) disposed in the path of a beam of light for selectively transmitting light in a variable manner along a length of the filter, a photodetector array positioned in the path of light transmitted through the LVF for measuring spectral characteristics of the transmitted light, and collimating means disposed between the input port and the LVF for collimating said beam of light. The device is a low-cost, compact and rugged high-resolution spectrometer for various uses.
Abstract:
A dispersive spectrometer comprising a primary lens that images a scene onto a slit through which light from a thin portion of the scene passes to a collimating lens. A grism is optically coupled to the collimating lens. The grism includes a diffractive element and is disposed such that light from the thin portion of the scene has an angle of incidence upon the diffractive element that is greater than one-third of the critical angle at the surface of the grism. The diffractive element disperses light from the thin portion of the scene in a direction that is perpendicular to the major dimension of the thin portion of the scene. A focusing lens is optically coupled to the grism to receive dispersed light from the thin portion of the scene. The focusing lens defines a focal plane onto which light from the thin slice of the scene is imaged.
Abstract:
An x-y coordinate is set on the surface of diffraction grating 3 with non-uniformly spaced grooves and expressed by the following series expansion which is a groove function describing a point (w,l) on the nth groove from the origin: 1 n = 1 null null null i , j null n i null null null j null w i null l j null null null ( i + j null 1 ) The focal length (r0null) and the expansion coefficient nij in this series expansion are so determined that all expanded terms Fij in the following optical path function are zero at a desired wavelength: 2 F = null i , j null F i null null null j null w i null l j = null i , j null [ M i null null null j + ( m null null null null null ) null n i null null null j ] null w i null l j null null null ( i + j > 0 ) the optical path being for the light that passes through entrance slit 1 to be reflected by concave mirror 2 and diffracted at a point (w,l) on the surface of diffraction grating 3 before it reaches exit slit 4. The positions of two point light sources C5 and D6 in a holographic recording system are so determined as to realize the required value of nij.
Abstract:
A spectroscope having a high spectroscopic characteristic capable of eliminating a polarization dependence on an arbitrary polarization state of an incident light, and measuring a spectrum having a true central wavelength of the light. The spectroscope comprises: a depolarizer comprising: a first plate a thickness of which continuously changes in a direction of 45 degrees with a first optical axis; and a second plate a thickness of which continuously changes, and which is stuck on the first plate; wherein an angle between the first optical axis and a second optical axis of the second plate, is 45 degrees, and a first reduction direction of the thickness of the first plate and a second reduction direction of the thickness of the second plate is opposite to each other; and a spectroscopic device a dispersion direction of which intersects orthogonally with the first reduction direction.
Abstract:
A depolarizing plate comprising a first rectangular wedge plate that has a first crystallographic optical axis in a diagonal direction of the rectangle and which has a thickness thereof in a vertical direction vary continuously in a direction 45 degrees from said first crystallographic optical axis and a second rectangular wedge plate that has a second crystallographic optical axis in a diagonal direction of the rectangle crossing said first crystallographic optical axis at right angles and which has a thickness thereof in a vertical direction vary continuously in a direction 45 degrees from said second crystallographic optical axis, the two wedge plates being joined in such a position that said first crystallographic optical axis crosses said second crystallographic optical axis at right angles, wherein the slope formed by the joint of said wedge plates is rotated about the optical axis of an incident ray of light.
Abstract:
A high resolution etalon-grating spectrometer. A preferred embodiment presents an extremely narrow slit function in the ultraviolet range and is very useful for measuring bandwidth of narrow band excimer lasers used for integrated circuit lithography. Light from the laser is focused into a diffuser and the diffused light exiting the diffuser illuminates an etalon. A portion of its light exiting the etalon is collected and directed into a slit positioned at a fringe pattern of the etalon. Light passing through the slit is collimated and the collimated light illuminates a grating positioned in an approximately Littrow configuration which disburses the light according to wavelength. A portion of the dispursed light representing the wavelength corresponding to the selected etalon fringe is passed through a second slit and monitored by a light detector. When the etalon and the grating are tuned to the same precise wavelength a slit function is defined which is extremely narrow such as about 0.034 pm (FWHM) and about 0.091 pm (95 percent integral). The etalon and the grating are placed in a leak-fight enclosure filled with a gas, such as nitrogen or helium. The wavelength scanning of the spectrometer is done by changing the gas pressure in the enclosure during the scan.
Abstract:
Optical characteristic measuring systems and methods such as for determining the color or other optical characteristics of teeth are disclosed. Perimeter receiver fiber optics preferably are spaced apart from a source fiber optic and receive light from the surface of the object/tooth being measured. Light from the perimeter fiber optics pass to a variety of filters. The system utilizes the perimeter receiver fiber optics to determine information regarding the height and angle of the probe with respect to the object/tooth being measured. Under processor control, the optical characteristics measurement may be made at a predetermined height and angle. Various color spectral photometer arrangements are disclosed. Translucency, fluorescence, gloss and/or surface texture data also may be obtained. Audio feedback may be provided to guide operator use of the system. The probe may have a removable or shielded tip for contamination prevention. A method of producing dental prostheses based on measured data also is disclosed. Measured data also may be stored and/or organized as part of a patient data base. Such methods and implements may be desirably utilized for purposes of detecting and preventing counterfeiting or the like. Preferably, a two stage spectral separation is utilized, preferably utilizing a diffraction grating and interference filters.