Abstract:
A meteorological lidar performs highly precise meteorological observation by primarily removing elastically scattered light and by detecting rotational Raman-scattered light without filtering it out. The meteorological lidar according to embodiments measures scattered light of a laser beam, and includes: a diffraction grating diffracting rotational Raman-scattered light contained in scattered light in accordance with the wavelength of rotational Raman-scattered light; a detector detecting the diffracted rotational Raman-scattered light; and a removing element primarily removing elastically scattered light of a specific wavelength contained in the scattered light.
Abstract:
Provided are a spectrometer that may be easily manufactured while having high resolution and sensitivity due to reduced light loss and a non-invasive biometric sensor including the spectrometer. The spectrometer includes: a stacked light absorbing structure including a plurality of absorbing layers stacked in a vertical direction and having different absorption wavelength bands, and a plurality of tunnel junction layers respectively interposed between the plurality of absorbing layers to electrically connect the plurality of absorbing layers; and an illuminating unit configured to provide the stacked light absorbing structure with an illumination light for saturation of the plurality of absorbing layers.
Abstract:
A method for determining spectral calibration data (λcal(Sd), Sd,cal(λ)) of a Fabry-Perot interferometer (100) comprises: forming a spectral notch (NC2) by filtering input light (LB1) with a notch filter (60) such that the spectral notch (NC2) corresponds to a transmittance notch (NC1) of the notch filter (60), measuring a spectral intensity distribution (M(Sd)) of the spectral notch (NC2) by varying the mirror gap (dFP) of the Fabry-Perot interferometer (100), and by providing a control signal (Sd) indicative of the mirror gap (dFP), and determining the spectral calibration data (λcal(Sd), Sd,cal(λ)) by matching the measured spectral intensity distribution (M(Sd)) with the spectral transmittance (TN(λ)) of the notch filter (60).
Abstract:
An optical fluorescence analysis system (100), optical device, and optical analysis process are disclosed. The optical analysis system includes one or more optical filter mechanisms (110) disposed to receive and/or modulate light from a light source (108) and a detector mechanism (112) configured for operative communication with the one or more optical filter mechanisms, the operative communication permitting measurement of properties of filtered light, filtered by the one or more optical filter mechanisms from the light received and/or modulated. The one or more optical filter mechanisms are configured so that the magnitude of the properties measured by the detector mechanism is proportional to information carried by the filtered light.
Abstract:
An apparatus and method for multi-spectral dual balanced imaging is provided. The apparatus includes: (a) a first member operable to produce from incident light a first band having first band wavelengths and a second band; and (b) a second member operable to produce from the second band a third band having wavelengths shorter than the first band wavelengths, excluding the first band wavelengths and having wavelengths longer than the first band wavelengths. The method involves: (a) producing from incident light a first band having first band wavelengths and a second band; and (b) producing from the second band a third band having wavelengths shorter than the first band wavelengths, excluding the first band wavelengths and having wavelengths longer than the first band wavelengths.
Abstract:
A dual source system and method includes a high power laser used to determine elements in a sample and a lower power device used to determine compounds present in the sample. An optical subsystem directs photons from a sample to a detector subsystem after laser energy from the laser strikes the sample along an optical path. After energy from the device strikes the sample protons are directed to the detector subsystem along the same optical path. The detector subsystem receives photons after laser energy from the laser strikes the sample and provides a first signal, and receives photons after energy from the device strikes the sample and provides a second signal. A controller subsystem pulses the high power laser and processes the first signal to determine elements present in the sample, energizes the lower power device and processes the second signal to determine compounds present in the sample.
Abstract:
A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.
Abstract:
An additive {hacek over (S)}olc filter (ASF) includes i) a first polarizer for receiving an input light, such as from a monochromatic light source, and transmitting a first polarized output, ii) at least one birefringent plate positioned to receive the first polarizer output and transmit an output with wavelength-dependent polarization state, and iii) a second polarizer for receiving the plate output and transmitting a second polarized, filtered output. An ASF spectroscopy system includes the ASF; a monochromatic light source input, e.g. a laser; a sample chamber for exposing a sample to the second polarized, tuned output and generating a signal characteristic of the sample that is filtered by the ASF; and a detector for acquiring the characteristic signal.
Abstract:
A Raman analyzer for analyzing light emitted from a Raman cell is provided that has a beam splitter configured to split the light emitted from the Raman cell into a first beam and a second beam. An atomic vapor filter can be used to filter a Raman scattered line from the first beam and a chopper system can periodically interrupt the first and second beams that are directed towards a photo detector, which can convert light from the first and second beams into an electrical signal. The signal output from the photo detector can optionally be amplified, digitized, Fourier filtered, and/or subjected to Fourier analysis.
Abstract:
The invention disclosed here teaches methods to fabricate and utilize a non-dispersive holographic wavelength blocker. The invention enables the observation of the Raman signal near the excitation wavelength (˜9 cm−1) with the compactness of standard thin film/holographic notch filter. The novelty is contacting several individual volume holographic blocking notch filter (VHBF) to form one high optical density blocking filter without creating spurious multiple diffractions that degrade the filter performance. Such ultra-narrow-band VHBF can be used in existing compact Raman instruments and thus will help bring high-end research to a greater number of users at a lower cost.