SPECTROMETER WITH VARIABLE BEAM POWER AND SHAPE

    公开(公告)号:US20170248466A1

    公开(公告)日:2017-08-31

    申请号:US15376541

    申请日:2016-12-12

    CPC classification number: G01J3/0291 G01J3/027 G01J3/42

    Abstract: At least one light source is configured to emit at least one beam into a sample volume of an absorbing medium. In addition, at least one detector is positioned to detect at least a portion of the beam emitted by the at least one light source. Further, at least one beam modification element is positioned between the at least one detector and the at least one light source to selectively change at least one of (i) a power intensity of, or (ii) a shape of the beam emitted by the at least one light source as detected by the at least one detector. A control circuit is coupled to the beam modification element. Related apparatus methods, articles of manufacture, systems, and the like are described.

    Optical module, electronic apparatus, and method of driving optical module

    公开(公告)号:US09702760B2

    公开(公告)日:2017-07-11

    申请号:US14580770

    申请日:2014-12-23

    CPC classification number: G01J3/2803 G01J3/027 G01J3/26 G01J3/42

    Abstract: A spectrometry apparatus includes a wavelength variable interference filter emitting light of various predetermined wavelengths; a roll shutter imaging element having pixels accumulating electric charges when exposed to light, and forming one frame by photodetection for each pixel block including pixels with a predetermined time delay for each pixel block, in which the imaging element accumulates electric charges in a photodetection period, and outputs a detection signal in response to the accumulated electric charges in a non-photodetection period; and a spectroscopic controller controlling the wavelength change driving of the emitted light of the wavelength variable interference filter. For the one frame, the spectroscopic controller starts the wavelength change driving at an end timing of the photodetection period of a final pixel block for which the photodetection process is performed at the end.

    Color measurement device and color measurement method

    公开(公告)号:US09671289B2

    公开(公告)日:2017-06-06

    申请号:US15307392

    申请日:2015-04-14

    Inventor: Yoshiroh Nagai

    CPC classification number: G01J3/52 G01J3/027 G01J3/50

    Abstract: In this color measurement device and method, an entire image and a partial image of a color chart are acquired, respectively, during conveyance of the color chart by a conveyance unit and during re-conveyance of the color chart by the conveyance unit, and an amount of positional deviation of the color chart occurring between the conveyance and the re-conveyance is derived based on the acquired entire and partial images. Then, a color of each of a plurality of patches of the color chart is measured by a color measuring unit, while a measurement position of the color measuring unit is corrected according to the derived positional deviation amount.

    Color sensor
    38.
    发明授权

    公开(公告)号:US09651425B2

    公开(公告)日:2017-05-16

    申请号:US13201213

    申请日:2009-02-27

    Abstract: A color sensor array includes a plurality of sensors. Each of the plurality of sensors has a width dimension and a length dimension that is elongated with respect to the width dimension. The length dimensions of the sensors are substantially equal to one another and parallel to an illumination plane. Each of the plurality of sensors includes a face defined by opposing first and second elongated sides and opposing first and second non-elongated sides. The first non-elongated sides of the plurality of sensors are aligned with one another along an axis that is substantially perpendicular to the illumination plane.

    APPARATUS AND METHOD FOR MEASURING REFERENCE SPECTRUM FOR SAMPLE ANALYSIS, AND APPARATUS AND METHOD FOR ANALYZING SAMPLE
    40.
    发明申请
    APPARATUS AND METHOD FOR MEASURING REFERENCE SPECTRUM FOR SAMPLE ANALYSIS, AND APPARATUS AND METHOD FOR ANALYZING SAMPLE 有权
    用于测量样品分析参考光谱的装置和方法,以及分析样品的装置和方法

    公开(公告)号:US20170059409A1

    公开(公告)日:2017-03-02

    申请号:US15241762

    申请日:2016-08-19

    Inventor: Kun Sun EOM

    Abstract: An apparatus for measuring a reference spectrum includes a parameter adjuster configured to adjust a parameter of a spectroscope so that an intensity of a reflection spectrum of a sample has a value in a range, a reference material spectrum measurer configured to adjust reflectance of a reference material so an intensity of a reflection spectrum of the reference material is not saturated, and measure the reflection spectrum of the reference material, using the spectroscope having the adjusted parameter, a first reference spectrum calculator configured to, in response to the adjusted reflectance of the reference material not being one hundred percent, calculate a first reference spectrum based on the measured reflection spectrum of the reference material, and a second reference spectrum measurer configured to measure a second reference spectrum of the reference material, using the spectroscope having the adjusted parameter, when a light source of the spectroscope is turned off.

    Abstract translation: 用于测量参考光谱的装置包括:参数调节器,被配置为调节分光镜的参数,使得样品的反射光谱的强度具有在一个范围内的值;参考材料光谱测量器,被配置为调节参考材料的反射率 因此参考物质的反射光谱的强度不饱和,并且使用具有调整参数的分光器测量参考物质的反射光谱,第一参考光谱计算器被配置为响应于参考物质的调整的反射率 材料不是百分之百,基于测量的参考材料的反射光谱计算第一参考光谱;以及第二参考光谱测量器,被配置为使用具有调整参数的分光仪,测量参考物质的第二参考光谱,当时 关闭光谱仪的光源。

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