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公开(公告)号:US20180095207A1
公开(公告)日:2018-04-05
申请号:US15559908
申请日:2016-03-28
Applicant: Konica Minolta, Inc.
Inventor: Hidetaka JIDAI , Munenori KAWAJI , Ryoji MATSUDA
Abstract: A spectral filter (10) is provided with a long-pass filter (12) and a short-pass filter (13). The long-pass filter (12) has a film thickness gradient GL wherein film thickness increases monotonically in a single direction, and transmits light of a wavelength region longer than a cut-off wavelength WL. The short-pass filter (13) has a film thickness gradient GS wherein film thickness increases monotonically in a single direction, and transmits light of a wavelength region shorter than a cut-off wavelength WS. The long-pass filter (12) and the short-pass filter (13) are overlapped such that the single directions match each other. At the positions in the single directions, a transmittance peak is formed by the cut-off wavelength WL being shorter than the cut-off wavelength WS. The film thickness gradient GL is greater than the film thickness gradient GS.
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公开(公告)号:US20180087966A1
公开(公告)日:2018-03-29
申请号:US15714016
申请日:2017-09-25
Applicant: Seiko Epson Corporation
Inventor: Tsugio GOMI
CPC classification number: G01J3/46 , B41F33/0036 , G01J3/26 , G01J3/50 , G01J3/524
Abstract: A measuring device is a measuring device that performs colorimetry of an evaluation patch formed on a medium and a paper white patch that is a portion exposed by the medium. The measuring device has a light source portion that irradiates the medium with an illumination light, a measurement portion that acquires an amount of light from the medium as a measurement value, a memory that holds a paper white standard value that is a reference measurement value of the paper white patch, and a colorimetry unit that corrects a measurement value of the evaluation patch based on the measurement value of the paper white patch and the paper white standard value. Even in a case where a measurement position is changed, a reflectance of the evaluation patch is accurately calculated and a chromaticity of the evaluation patch can be accurately acquired.
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公开(公告)号:US20180080825A1
公开(公告)日:2018-03-22
申请号:US15709370
申请日:2017-09-19
Applicant: TruTag Technologies, Inc.
Inventor: Timothy Learmonth , Ron R. Nissim , Hod Finkelstein , Mark Hsu
CPC classification number: G01J3/26 , G01J3/0297 , G01J3/28
Abstract: A system for determining a calibrated spectral measurement includes a tunable Fabry-Perot etalon, a detector, and a processor. The tunable Fabry-Perot etalon has a settable gap. The detector measures light intensity transmitted through the tunable Fabry-Perot etalon. The processor is configured to determine the calibrated spectral measurement. The calibrated spectral measurement is based at least in part on a measurement set of detected light intensities for a plurality of settable gaps and a reconstruction matrix. The reconstruction matrix is based at least in part on calibration measurements using multiple source wavelengths and multiple settable gaps.
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公开(公告)号:US09909992B2
公开(公告)日:2018-03-06
申请号:US15119055
申请日:2015-02-28
Applicant: IMEC VZW
Inventor: Pol Van Dorpe , Peter Peumans
IPC: G01J3/30 , G01N21/65 , A61B5/00 , A61B5/145 , A61B5/1455 , G01J3/02 , G01J3/36 , G01J3/44 , G01J3/26 , G01N33/49 , G01J3/12
CPC classification number: G01N21/65 , A61B5/0066 , A61B5/14532 , A61B5/1455 , A61B5/443 , A61B2562/0233 , A61B2562/0238 , G01J1/0204 , G01J1/0425 , G01J1/0477 , G01J3/0205 , G01J3/0208 , G01J3/021 , G01J3/0227 , G01J3/0256 , G01J3/0264 , G01J3/0291 , G01J3/1895 , G01J3/26 , G01J3/36 , G01J3/44 , G01J2003/1213 , G01N33/49 , G01N2201/06113 , G01N2201/0633 , G01N2201/0636 , G02B6/0026 , G02B6/0031 , G02B6/0038 , G02B6/0048
Abstract: The present disclosure relates to systems, methods, and sensors configured to characterize a radiation beam. At least one embodiment relates to an optical system. The optical system includes an optical radiation guiding system. The optical radiation guiding system includes a collimator configured to collimate the radiation beam into a collimated radiation beam. The optical radiation guiding system also includes a beam shaper configured to distribute power of the collimated radiation beam over a discrete number of line shaped fields. A spectrum of the collimated radiation beam entering the beam shaper is delivered to each of the discrete number of line shaped fields. The optical system further includes a spectrometer chip. The spectrometer chip is configured to process the spectrum of the collimated radiation beam in each of the discrete number of line shaped fields coming from the beam shaper.
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公开(公告)号:US09885653B1
公开(公告)日:2018-02-06
申请号:US15667019
申请日:2017-08-02
Applicant: Drägerwerk AG & Co. KGaA
Inventor: Ralf Buchtal , Livio Fornasiero , Robert Jahns , Heike Vöhringer
CPC classification number: G01N21/3504 , A61M16/0072 , A61M16/01 , A61M16/024 , A61M16/0833 , A61M16/085 , A61M16/0891 , A61M16/104 , A61M16/12 , A61M16/22 , A61M2016/1035 , A61M2202/0241 , A61M2202/0283 , A61M2205/3313 , A61M2205/502 , A61M2230/432 , A61M2230/437 , G01J3/26 , G01J3/42 , G01J3/45 , G01N2021/3137 , G01N2201/12 , A61M2202/0007
Abstract: A device analyzes an anesthesia ventilation gas with an infrared radiation source and includes a gas cuvette, a Fabry-Perot interferometer with a band pass filter function, adjustable with respect to a central transmission wavelength as a function of a control signal, a detector providing a measured signal and a computing and control unit providing the control signal and detecting the measured signal. The computing and control unit is configured to actuate the Fabry-Perot interferometer in a first operating mode by the control signal such that the central transmission wavelength scans a predefined wavelength range, to detect a presence in the ventilation gas sample potential types of anesthetic gases based on the measured signal. In a second operating mode, the control unit controls the central transmission wavelength within a subrange of the predefined wavelength range and determines a plurality of concentration values at consecutive times for detected types of anesthetic gases.
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公开(公告)号:US20180031468A1
公开(公告)日:2018-02-01
申请号:US15727291
申请日:2017-10-06
Applicant: Verifood, Ltd.
Inventor: Ori Aphek
CPC classification number: G01N21/255 , G01J3/0272 , G01J3/0289 , G01J3/26 , G01J3/2803 , G01J3/36 , G01N2201/0221 , H01L27/14603
Abstract: A compact spectrometer system comprising an improved detector is provided herein. The spectrometer system herein disclosed can comprises a filter, a Fourier transform optical element, and a detector. The detector can comprise a custom detector having a shape that corresponds to the pattern of light incident on the detector. The custom detector may comprise a plurality of separate detection areas, each area configured to detect a portion of the light pattern incident on the detector. The custom detector may comprise a material capable of detecting wavelengths in the short-wavelength infrared (SWIR) range. The custom detector may be configured to require a relatively low number of electrical connections such that it may be implemented using standard, low-cost electronic packaging techniques. An improved, custom detector as described herein can provide the functionality of a two-dimensional pixel array detector while being relatively simple and inexpensive to manufacture.
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公开(公告)号:US09857223B2
公开(公告)日:2018-01-02
申请号:US14947238
申请日:2015-11-20
Applicant: RAYTHEON COMPANY
Inventor: Randall W. Zywicki , David C. Mann , Andre D. Cropper
CPC classification number: G01J3/26 , B81B7/00 , G01J3/2803
Abstract: An interferometer system comprising an optical detector including a substrate and a two-dimensional array of pixels disposed on the substrate is provided. The interferometer system may further comprise an interferometer disposed proximate the optical detector without an optical element between the interferometer and the optical detector. The interferometer may include a first plate positioned proximate the substrate and extending over the two-dimensional array of pixels, a second plate spaced apart from the first plate, the first and second plates defining an optical gap between them, and at least one actuatable spacer positioned between the first plate and the second plate and configured to space apart the first and second plates from one another and to selectively alter a thickness of the optical gap.
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公开(公告)号:US09841323B2
公开(公告)日:2017-12-12
申请号:US15104206
申请日:2014-09-17
Applicant: KONICA MINOLTA, INC.
Inventor: Yoshitaka Teraoka , Katsutoshi Tsurutani , Wataru Yamaguchi
IPC: G01N21/25 , G01J3/26 , G01J3/12 , G01J3/36 , G02B5/28 , G01J3/30 , G02B26/00 , G01J3/28 , G01J3/02
CPC classification number: G01J3/26 , G01J3/0221 , G01J3/0262 , G01J3/12 , G01J3/2803 , G01J3/30 , G01J3/36 , G01J2003/1234 , G01J2003/1243 , G02B5/28 , G02B26/001
Abstract: A spectroscopic unit and spectroscopic device according to the present invention are provided with a filter that is provided with a plurality of optical filter elements disposed in order from the entrance side to the exit side of light under measurement and has different transmission wavelengths corresponding to entrance positions along a first direction. A first optical filter element from among the plurality of optical filter elements is tilted with respect to a second optical filter element disposed adjacently to the first optical filter element as a result of the first optical filter element being rotated by a prescribed angle with a third direction that is perpendicular to both the first direction and s second direction from the entrance side to the exit side as the axis of rotation thereof or being rotated by a prescribed angle with the first direction as the axis of rotation thereof.
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公开(公告)号:US20170350761A1
公开(公告)日:2017-12-07
申请号:US15540074
申请日:2015-12-18
Applicant: Teknologian tutkimuskeskus VTT Oy
Inventor: Aapo Varpula , Christer Holmlund , Anna Rissanen
CPC classification number: G01J3/26 , B81B7/00 , G01J3/0286 , G01J3/0297 , G02B5/0825 , G02B26/001 , G02B27/142
Abstract: A mirror plate (100) for a Fabry-Perot interferometer (300) includes a substrate (50), which includes silicon (Si), a semi-transparent reflective coating (110) implemented on the substrate (50), a de-coupling structure (DC1) formed on the substrate (50), a first sensor electrode (G1a) formed on top of the de-coupling structure (DC1), and a second sensor electrode (G1b), wherein the de-coupling structure (DC1) includes an electrically insulating layer (60a), and a first stabilizing electrode (G0a), which is located between the first sensor electrode (G1a) and the substrate (50).
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公开(公告)号:US20170334220A1
公开(公告)日:2017-11-23
申请号:US15465987
申请日:2017-03-22
Applicant: Seiko Epson Corporation
Inventor: Tetsuo TATSUDA
CPC classification number: B41J13/0009 , B41J2/175 , B41J29/38 , G01J3/0232 , G01J3/0291 , G01J3/0297 , G01J3/26 , G01J3/51
Abstract: A measuring device includes an optical device which includes a window on which light is incident, a shutter which includes a white reference surface on an optical device side and is configured to block the window, a first moving mechanism which moves the optical device in a direction, and a second moving mechanism which relatively moves the window and the shutter between a first position at which the window is blocked by the white reference surface and a second position at which light is incident on the window.
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