Abstract:
(EN) The invention relates to a special LIBS measurement tube focusing unit, referred to simply as LIBS measurement tube, for vertically dipping into a material to be analyzed, which material is moved in a horizontal flow, characterized in that the measurement tube extends vertically and is internally hollow and open at least at the bottom end, such that a bottom edge is formed at the bottom end, the measurement tube has an inlet for coupling in a laser beam and an outlet for coupling out an emission spectrum at the upper end, the measurement tube is constructed in such a way that, in the measurement tube, the laser beam is focused at the material to be analyzed, specifically bulk material, in particular raw, intermediate, and end products from the processing of potash, magnesium, rock salt, or evaporated salt, but without additional scattering and deflection occurring, such that a plasma of the material to be analyzed is produced within the measurement tube by the laser radiation and the emission spectrum of the material to be analyzed reaches the outlet for outcoupling through the interior of the measurement tube, and scrapers (1, 2) lie on the inner and outer focusing tube wall annularly, preferably at the same vertical height on the focusing tube (3), which scrapers are arranged in such a way that the scrapers can be moved vertically in relation to the focusing tube (3), such that material to be analyzed that adheres to the focusing tube (3) on the inside and outside in the lower region can be scraped off by a relative motion of the focusing tube (3) in relation to the scrapers (1, 2).
Abstract:
This invention discloses a substrate enhanced laser-induced breakdown spectroscopy (LIBS) apparatus for liquid analysis. The LIBS apparatus comprises a pulsed laser for producing a laser beam, a substrate made of a material having a high absorption coefficient at the laser wavelength for receiving the liquid sample, an optical lens or mirror for focusing the laser beam onto the liquid sample to produce a plasma emission, and a spectrometer for measuring the optical spectrum of the plasma emission. When the thickness of the liquid sample reaches an optimum value, the plasma emission from the liquid sample is enhanced by the substrate to produce a strong LIBS signal for spectral analysis.
Abstract:
A handheld LIBS spectrometer includes an optics stage movably mounted to a housing and including a laser focusing lens and a detection lens. One or more motors advance and retract the optics stage, move the optics stage left and right, and/or move the optics stage up and down. A laser source in the housing is oriented to direct a laser beam to the laser focusing lens. A spectrometer subsystem in the housing is configured to receive electromagnetic radiation from the detection lens and to provide an output. A controller subsystem is responsive to the output of the spectrometer subsystem and is configured to control the laser source and motors. In this way, auto-calibration, auto-clean, and auto-focus, and/or moving spot functionality is possible.
Abstract:
A stable etching process is realized at an earlier stage by specifying the combination of wavelength and time interval, which exhibits a minimum prediction error of etching processing result within a short period. For this, the combination of wavelength and time interval is generated from wavelength band of plasma emission generated upon etching of the specimen, the prediction error upon prediction of etching process result is calculated with respect to each combination of wavelength and time interval, the wavelength combination is specified based on the calculated prediction error, the prediction error is further calculated by changing the time interval with respect to the specified wavelength combination, and the combination of wavelength and time interval, which exhibits the minimum value of calculated prediction error is selected as the wavelength and the time interval used for predicting the etching processing process.
Abstract:
Disclosed herein are embodiments of a novel method and system to analyze films using plasma to produce spectral data and analyzing the spectral data.
Abstract:
In an embodiment, a plasma source includes a first electrode, configured for transfer of one or more plasma source gases through first perforations therein; an insulator, disposed in contact with the first electrode about a periphery of the first electrode; and a second electrode, disposed with a periphery of the second electrode against the insulator such that the first and second electrodes and the insulator define a plasma generation cavity. The second electrode is configured for movement of plasma products from the plasma generation cavity therethrough toward a process chamber. A power supply provides electrical power across the first and second electrodes to ignite a plasma with the one or more plasma source gases in the plasma generation cavity to produce the plasma products. One of the first electrode, the second electrode and the insulator includes a port that provides an optical signal from the plasma.
Abstract:
A method and apparatus for analyzing one or more elements of targeted moving snack food surfaces uses laser-induced breakdown spectroscopy to detect the presence, absence, or amount of an element on a heterogeneous surface, including seasoned and ready-to-eat snack foods. A laser is used to quantify the element concentration without destroying the targeted sample. An automated on-line system may be integrated into the method to create a closed-loop feedback control system, adjusting the concentration as desired.
Abstract:
A handheld LIBS spectrometer system features an optics stage moveable with respect to a housing and including a laser focusing lens. A laser source is mounted in the housing for directing a laser beam to a sample via the laser focusing lens. A detection fiber is mounted in the housing and is fixed relative thereto. A first mirror is fixed relative to the housing and includes an aperture for the laser beam. This mirror is oriented to re-direct plasma radiation for delivery to the detection fiber. A controller subsystem is responsive to the output of a spectrometer subsystem and is configured to control the laser source and the optics stage.
Abstract:
An optical emission spectrometer system includes a light source and a dichroic beam combiner. The light source emits first light in a first direction and second light in a second direction different from the first direction. The dichroic beam combiner receives the first light via a first light path and the second light via a second light path, reflects a portion the first light into an entrance aperture of a light detection and measurement apparatus, and transmits a portion of the second light into the entrance aperture, enabling analysis and measurement of both first and second light characteristics simultaneously. The portion of the first light reflected into the entrance aperture predominately has wavelengths in a first range of wavelengths and the portion of the second light transmitted into the entrance aperture predominately has wavelengths in a second range of wavelengths, different from the first range of wavelengths.
Abstract:
A high-frequency input voltage and a high-frequency input current to a series resonant circuit are detected by a voltage detection unit and a current detection unit, respectively, and plasma input power is detected by a plasma input power detection unit based on the detected high-frequency input voltage and high-frequency input current. By directly detecting the plasma input power in this manner, the plasma input power may be accurately controlled regardless of the state of a plasma-generating gas or an analysis sample. Also, use of a switching circuit including a semiconductor device allows an inexpensive configuration compared with a configuration where a vacuum tube or the like is used.