Photodiode array for spectrometric measurements and spectrometric measurement system
    56.
    发明授权
    Photodiode array for spectrometric measurements and spectrometric measurement system 有权
    用于光谱测量和光谱测量系统的光电二极管阵列

    公开(公告)号:US09429471B2

    公开(公告)日:2016-08-30

    申请号:US14388567

    申请日:2013-03-26

    Abstract: A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO2 coating layer on the silicon substrate and an Al2O3 coating layer are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance can be improved while making the best efforts to avoid a complex manufacturing process.

    Abstract translation: 以一维形式排列的多个光电二极管被分成多个组。 对于每组,改变抗反射涂层的结构,使得属于每个组的光电二极管的所有表面被具有透射特性的抗反射涂层覆盖,所述透射特性在其所接收的光的波长范围内显示最大透射率 光电二极管 特别地,硅衬底上的SiO 2涂层和Al 2 O 3涂层对于所有光电二极管是共同的,而上层的结构相对于波长被修饰。 在紫外线波长区域内,涂层结构相对于波长更细微地变化。 通过这样的设计,可以在尽量避免复杂的制造过程的同时,提高透射率。

    Measuring probe, an apparatus and a method for label free attenuated reflection infrared spectroscopy
    57.
    发明申请
    Measuring probe, an apparatus and a method for label free attenuated reflection infrared spectroscopy 审中-公开
    测量探针,无标签衰减反射红外光谱仪的设备和方法

    公开(公告)号:US20160143539A1

    公开(公告)日:2016-05-26

    申请号:US14936048

    申请日:2015-11-09

    Abstract: Disclosed herein is a measuring probe, an apparatus, and a method for infrared spectroscopy. In some embodiments the measuring probe may have an elongated form with a first end for coupling and decoupling infrared light into and out of the measuring probe and a second end. In other embodiments, the measuring probe may comprise an attenuated total reflection (ATR) prism arranged at the second end of the measuring probe. The ATR prism may include at least a first surface having at least one measuring portion configured to be brought in optical contact with a measured object. The ATR prism may include at least a second surface having at least one reflective portion. In some embodiments, the ATR prism may include a cutting portion for cutting through the measured object.

    Abstract translation: 本文公开了一种用于红外光谱的测量探针,装置和方法。 在一些实施例中,测量探针可以具有细长形式,其具有第一端,用于将红外光耦合和分离出测量探针和从测量探针和第二端分离。 在其他实施例中,测量探针可以包括布置在测量探针的第二端处的衰减全反射(ATR)棱镜。 ATR棱镜可以包括至少一个第一表面,该第一表面具有至少一个测量部分,该测量部分被配置为与测量对象进行光学接触。 ATR棱镜可以包括具有至少一个反射部分的至少第二表面。 在一些实施例中,ATR棱镜可以包括用于切割被测物体的切割部分。

    SPECTRAL IMAGE ACQUISITION APPARATUS AND LIGHT RECEPTION WAVELENGTH ACQUISITION METHOD
    58.
    发明申请
    SPECTRAL IMAGE ACQUISITION APPARATUS AND LIGHT RECEPTION WAVELENGTH ACQUISITION METHOD 有权
    光谱图像获取装置和光接收波长采集方法

    公开(公告)号:US20160037141A1

    公开(公告)日:2016-02-04

    申请号:US14813472

    申请日:2015-07-30

    Abstract: A spectral camera includes a wavelength variable interference filter, an imaging unit having a plurality of light receiving elements arranged in a two-dimensional array configuration, and a wavelength acquisition unit which acquires center wavelengths of light beams received by the light receiving elements in accordance with signal values output from the light receiving elements when reference light is received by the imaging unit. Light amounts of the reference light corresponding to different wavelength components in a certain wavelength range are uniform in a plane, and different signal values are acquired when light beams of the different wavelength components are received by the light receiving elements.

    Abstract translation: 光谱相机包括波长可变干涉滤光器,具有以二维阵列配置布置的多个光接收元件的成像单元和波长获取单元,其获取由光接收元件接收的光束的中心波长 当由成像单元接收参考光时从光接收元件输出的信号值。 对应于一定波长范围的不同波长分量的参考光的光量在平面内是均匀的,并且当由光接收元件接收不同波长分量的光束时,获得不同的信号值。

    PHOTODIODE ARRAY FOR SPECTROMETRIC MEASUREMENTS AND SPECTROMETRIC MEASUREMENT SYSTEM
    60.
    发明申请
    PHOTODIODE ARRAY FOR SPECTROMETRIC MEASUREMENTS AND SPECTROMETRIC MEASUREMENT SYSTEM 有权
    用于光谱测量和光谱测量系统的光电子阵列

    公开(公告)号:US20150048239A1

    公开(公告)日:2015-02-19

    申请号:US14388567

    申请日:2013-03-26

    Abstract: A plurality of photodiodes arrayed in a one-dimensional form are divided into a plurality of groups. The structure of an antireflection coating is changed for each group so that all the surfaces of the photodiodes belonging to each group are covered with an antireflection coating having a transmittance characteristic which shows a maximum transmittance within a range of wavelengths of light to be received by those photodiodes. In particular, a SiO2 coating layer on the silicon substrate and an Al2O3 coating layer are common to all the photodiodes, while the structure of the upper layers are modified with respect to the wavelength. Within an ultraviolet wavelength region, the coating structure is more finely changed with respect to the wavelength. By such a design, the transmittance can be improved while making the best efforts to avoid a complex manufacturing process.

    Abstract translation: 以一维形式排列的多个光电二极管被分成多个组。 对于每组,改变抗反射涂层的结构,使得属于每个组的光电二极管的所有表面被具有透射特性的抗反射涂层覆盖,所述透射特性在其所接收的光的波长范围内显示最大透射率 光电二极管 特别地,硅衬底上的SiO 2涂层和Al 2 O 3涂层对于所有光电二极管是共同的,而上层的结构相对于波长被修饰。 在紫外线波长区域内,涂层结构相对于波长更细微地变化。 通过这样的设计,可以在尽量避免复杂的制造过程的同时,提高透射率。

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