公开(公告)号：US11650155B2

公开(公告)日：2023-05-16

申请号：US17390074

申请日：2021-07-30

Applicant: YOKOGAWA ELECTRIC CORPORATION

Inventor： Yuta Suzuki ,  Yuma Kitagawa ,  Toshiyuki Saruya ,  Nobuhiko Kanbara

IPC: G01N21/61

CPC classification number: G01N21/61 ,  G01N2201/068 ,  G01N2201/0612 ,  G01N2201/121

Abstract: A gas analysis system, includes: a light-emitting element that emits a laser light modulated by a predetermined modulation frequency; and a light-receiving element that: receives the laser light that has passed through a measurement target gas; and upon receiving the laser light, outputs a received signal having an N-frequency that is n times the predetermined modulation frequency, wherein n is an integer no less than 2; and a signal processing device that: calculates a third component by removing, from a first component having the N-frequency, a second component, wherein the second component is a component of optical interference noise arising on an optical path of the laser light from the light-emitting element to the light-receiving element and has the same frequency as the first component; and calculates, based on a magnitude of the third component, a concentration of the measurement target gas.

公开(公告)号：US20190187064A1

公开(公告)日：2019-06-20

申请号：US16162408

申请日：2018-10-17

Applicant: OMRON Corporation

Inventor： Yutaka KATO

IPC: G01N21/88 ,  G01B11/245 ,  G01B11/25

CPC classification number: G01N21/88 ,  G01B11/245 ,  G01B11/25 ,  G01N2201/121 ,  G06K9/00201 ,  G06K9/2018 ,  G06K9/2027 ,  G06K2209/19

Abstract: It is to perform image measurement under appropriate conditions according to a position in image data. An image processing device acquires a plurality of pieces of image data generated by imaging in a plurality of different light emission states of a plurality of light emitting units included in an illumination device. The image processing device generates image data to be used for image measurement on the basis of the plurality of pieces of acquired image data and a generation condition defined in association with the position in the image data.

公开(公告)号：US20180249911A1

公开(公告)日：2018-09-06

申请号：US15449195

申请日：2017-03-03

Applicant: Canon USA Inc.

Inventor： Masaki Hosoda ,  Haruo Nakaji

IPC: A61B5/00 ,  G01D5/347 ,  G01N21/47

CPC classification number: A61B5/0075 ,  A61B5/021 ,  A61B5/026 ,  A61B5/6826 ,  G01N21/474 ,  G01N21/4785 ,  G01N2021/4742 ,  G01N2021/4778 ,  G01N2201/121

Abstract: A DWS apparatus includes a coherent light source, a photodetector, a control unit which can measure an intensity autocorrelation function, a measuring unit which can measure a source-detector distance to obtain source-detector distance data, and a calibrating unit which adjusts the intensity autocorrelation function by using the source-detector distance data. The calibrating unit calibrates the intensity autocorrelation function by adjusting the time constant of the autocorrelation function based on a comparison of the source-detector distance to the time constant of the intensity autocorrelation function.

公开(公告)号：US20170052117A1

公开(公告)日：2017-02-23

申请号：US14829355

申请日：2015-08-18

Applicant: LumaSense Technologies Holdings, Inc.

Inventor： Terry M. Stapleton ,  Gregor Hsiao ,  John Paul Jeffrey

IPC: G01N21/64

CPC classification number: G01N21/643 ,  G01N21/274 ,  G01N21/645 ,  G01N2021/6432 ,  G01N2021/6434 ,  G01N2021/773 ,  G01N2021/7786 ,  G01N2201/061 ,  G01N2201/121

Abstract: A system for obtaining a measurement of a species of interest. The system includes one or more reference regions, a sensor region, an exciter unit, a detector unit and a processing unit. The exciter unit exposes first and second chemical transducers in the reference and sensor regions, respectively, to an excitation light while they are exposed to reference environments and an analyte, respectively. The detector unit measures responses of the first and the second chemical transducers to the excitation light. The processing unit determines a compensation for aging of the first chemical transducer from a discrepancy between the measurements of the responses of the first chemical transducer and reference responses. The processing unit applies the compensation for aging to the measurement of the response of the second chemical transducer to obtain the measurement of the species of interest in the analyte.

Abstract translation: 用于获得感兴趣物种的测量的系统。 该系统包括一个或多个参考区域，传感器区域，激励器单元，检测器单元和处理单元。 激励器单元将参考和传感器区域中的第一和第二化学传感器分别暴露于激发光，同时它们分别暴露于参考环境和分析物。 检测器单元测量第一和第二化学传感器对激发光的响应。 处理单元根据第一化学传感器和参考响应的响应的测量之间的差异来确定第一化学传感器的老化的补偿。 处理单元将老化补偿应用于测量第二化学传感器的响应，以获得分析物中感兴趣物种的测量。

公开(公告)号：US09513223B2

公开(公告)日：2016-12-06

申请号：US14829983

申请日：2015-08-19

Applicant: OLYMPUS CORPORATION

Inventor： Hiroya Fukuyama

IPC: G01J1/58 ,  G01T1/10 ,  G01N21/64 ,  G02B21/06 ,  G02B21/36

CPC classification number: G01N21/6456 ,  G01N2201/10 ,  G01N2201/121 ,  G02B21/06 ,  G02B21/365

Abstract: A high-resolution fluorescence image in which an afterimage is suppressed is obtained, even when a fluorescence detection interval is shortened. Provided is a scanning observation apparatus including a scanning unit that spatially scans pulsed excitation light emitted from a light source at prescribed time intervals on a specimen; a fluorescence detecting unit that detects fluorescence generated by exciting a fluorescent substance inside the specimen with the excitation light scanned by the scanning unit, in synchronization with the emission of the excitation light; and a fluorescence correcting unit that subtracts, from a fluorescence intensity detected by the fluorescence detecting unit, an afterimage fluorescence component calculated on the basis of time-sequential fluorescence detected by the fluorescence detecting unit prior thereto, at each scanning position, to correct the fluorescence intensity at the scanning position.

Abstract translation: 即使在荧光检测间隔缩短的情况下也能够得到抑制残像的高分辨率的荧光图像。 本发明提供一种扫描观察装置，其具备：扫描单元，其以规定的时间间隔在样本上空间扫描从光源发出的脉冲激发光; 荧光检测单元，其与通过所述激发光的发射同步地检测利用所述扫描单元扫描的激发光来激发所述样本内的荧光物质而产生的荧光; 以及荧光校正单元，从荧光检测单元检测出的荧光强度，在每个扫描位置根据荧光检测单元检测到的时间序列荧光计算的余像荧光成分，从而校正荧光 在扫描位置的强度。

公开(公告)号：US20160231249A1

公开(公告)日：2016-08-11

申请号：US15015325

申请日：2016-02-04

Applicant: Commissariat a L'Energie Atomique et aux Energies Alternatives

Inventor： Blandine ROIG ,  Anne KOENIG ,  Jean-Marc DINTEN ,  Francois PERRAUT

IPC: G01N21/65 ,  G01N21/49 ,  G01N21/64

CPC classification number: G01N21/65 ,  G01J3/0229 ,  G01J3/027 ,  G01J3/44 ,  G01N21/274 ,  G01N21/49 ,  G01N21/6458 ,  G01N21/6486 ,  G01N2201/06113 ,  G01N2201/0833 ,  G01N2201/121 ,  G02B21/0076

Abstract: The invention relates to a method for correcting an optical signal produced by a sample comprising the following steps: illuminating a surface of the sample by a first light beam, produced by a first light source, the said first light source being coupled to a first optical system, focusing the said first light beam in an object focal plane of the first optical system, the said object focal plane being situated, in the sample, at a measuring depth z from the surface of the sample; measuring, with a first photodetector, of a first optical signal backscattered by the sample in response to the first light beam, the first photodetector producing a first measured signal representative of the said first optical signal, a spatial filter being interposed between the first optical system and the first photodetector, the spatial filter comprising a window which transmits the said first optical signal towards the said first photodetector, the window being disposed in a conjugate focal plane of the object focal plane of the first optical system; wherein the method also comprises the following steps: determining an optical scattering property of the sample; applying a correction function to the first measured signal so as to generate a first corrected signal, the said correction function taking into account the said optical scattering property.

Abstract translation: 本发明涉及一种用于校正由样品产生的光学信号的方法，包括以下步骤：通过由第一光源产生的第一光束照射样品的表面，所述第一光源耦合到第一光学 系统，将所述第一光束聚焦在第一光学系统的物体焦平面中，所述物体焦平面位于样品中，距离样品表面的测量深度z; 利用第一光电检测器响应于第一光束由样品反向散射的第一光信号，第一光电检测器产生表示所述第一光信号的第一测量信号，空间滤光器插入在第一光学系统 并且所述第一光电检测器包括将所述第一光信号朝向所述第一光电检测器传输的窗口，所述窗口设置在所述第一光学系统的物体焦平面的共轭焦平面中; 其中所述方法还包括以下步骤：确定所述样品的光学散射性质; 对第一测量信号应用校正函数，以产生第一校正信号，所述校正函数考虑所述光散射特性。

公开(公告)号：US20150369750A1

公开(公告)日：2015-12-24

申请号：US14691966

申请日：2015-04-21

Applicant: KLA-Tencor Corporation

Inventor： Mark S. Wang ,  Chris Kirk ,  Andrey Kharisov

IPC: G01N21/88 ,  G01N21/95 ,  G02B21/00

CPC classification number: G01N21/8851 ,  G01N21/9501 ,  G01N2201/068 ,  G01N2201/10 ,  G01N2201/121 ,  G02B21/0028 ,  G02B21/0032 ,  G02B21/0072 ,  G02B21/365 ,  H01L22/12

Abstract: A line scan wafer inspection system includes a confocal slit aperture filter to remove sidelobes and enhance resolution in the scanning direction. A position detector associated with the slit aperture filter monitors and corrects illumination line image positions relative to the slit aperture to keep image position variations within tolerable limits. Each detector measures a line position and then uses the line position signal to adjust optical, mechanical, and electronic components in the collection path in a feedback loop. The feedback loop may be employed in a runtime calibration process or during inspection to enhance stability.

Abstract translation: 线扫描晶片检查系统包括共焦狭缝孔径滤光器以去除旁瓣并增强扫描方向上的分辨率。 与狭缝孔径滤波器相关联的位置检测器监测和校正相对于狭缝孔径的照明线图像位置，以将图像位置变化保持在可容许的极限内。 每个检测器测量线路位置，然后使用线路位置信号在反馈回路中调整收集路径中的光学，机械和电子部件。 反馈回路可用于运行时校准过程或检查期间以增强稳定性。

公开(公告)号：US20150300951A1

公开(公告)日：2015-10-22

申请号：US14648874

申请日：2013-12-04

Applicant: SP3H

Inventor： Sylvain OBERTI ,  Johan FOURNEL

IPC: G01N21/3577 ,  G01N21/27

CPC classification number: G01N21/3577 ,  G01N21/274 ,  G01N21/3504 ,  G01N2021/3181 ,  G01N2201/062 ,  G01N2201/0624 ,  G01N2201/121 ,  G01N2201/1211 ,  G01N2201/124 ,  G01N2201/1242 ,  G01N2201/1247 ,  G01N2201/127 ,  G01N2201/12723

Abstract: The present invention relates to a method for controlling a spectrometer for analyzing a product, the spectrometer including a light source including several light-emitting diodes having respective emission spectra covering in combination an analysis wavelength band, the method including steps of: supplying at least one of the light-emitting diodes with a supply current to switch it on, measuring a light intensity emitted by the light source by measuring a current at a terminal of at least another of the light-emitting diodes maintained off, determining, according to each light intensity measurement, a setpoint value of the supply current of each diode that is on, and regulating the supply current of each diode that is on so that it corresponds to the setpoint value.

Abstract translation: 本发明涉及一种用于分析产品的光谱仪的控制方法，该光谱仪包括具有多个发光二极管的光源，该发光二极管具有组合分析波长带的各发射光谱，该方法包括以下步骤：将至少一个 的发光二极管与供电电流接通，通过测量至少另一个发光二极管的端子上的电流来测量由光源发射的光强度，根据每个光 强度测量，导通的每个二极管的电源电流的设定值，以及调节导通的每个二极管的电源电流，使其对应于设定值。

公开(公告)号：US20150177148A1

公开(公告)日：2015-06-25

申请号：US14573950

申请日：2014-12-17

Applicant: Luminex Corporation

Inventor： Arnold Estrada

IPC: G01N21/64

CPC classification number: G01N21/6428 ,  G01N21/274 ,  G01N21/6408 ,  G01N21/6452 ,  G01N21/6486 ,  G01N2021/6441 ,  G01N2201/121

Abstract: Techniques are disclosed relating to analysis and reduction of crosstalk between signals. These techniques may be applicable in many fields, such as single-tube PCR or DNA melt analysis, PCR or melt data from neighboring wells of a multi-well plate, capillary electrophoresis data (e.g., DNA sequencing), gas chromatography, multispectral imaging, dual-color fluorescence correlation spectrometry, electrical crosstalk, etc. According to one embodiment, crosstalk between fluorescence signals from different species may be determined based on a correlation between the time derivatives of the fluorescence signals from the fluorescent species.

Abstract translation: 公开了关于分析和减少信号之间的串扰的技术。 这些技术可以应用于许多领域，例如单管PCR或DNA熔解分析，PCR或来自多孔板的相邻孔的熔融数据，毛细管电泳数据（例如DNA测序），气相色谱，多光谱成像， 双色荧光相关光谱，电串扰等。根据一个实施例，可以基于来自荧光物种的荧光信号的时间导数之间的相关性来确定来自不同物种的荧光信号之间的串扰。

公开(公告)号：US20150177141A1

公开(公告)日：2015-06-25

申请号：US14513386

申请日：2014-10-14

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Yeong-bae YEO ,  Hyun-soo JANG

IPC: G01N21/59 ,  G01N21/75

CPC classification number: G01N21/59 ,  G01N21/75 ,  G01N2201/0612 ,  G01N2201/0621 ,  G01N2201/0696 ,  G01N2201/105 ,  G01N2201/121 ,  G01N2201/127

Abstract: An optical detection apparatus for measuring detection chambers of a specimen cartridge includes: a light source unit including light sources which are arranged along a scan line on which the detection chambers are aligned to be scanned, and configured to emit light rays to the detection chambers; and an optical detector configured to detect the light rays having passed through corresponding detection chambers disposed on the scan line. The light sources include main wavelength light sources which are used for measuring samples disposed in the detection chambers, and a sub-wavelength light source which is used for correcting a measuring error.

Abstract translation: 一种用于测量样本盒的检测室的光学检测装置，包括：光源单元，包括沿扫描线布置的光源，检测室对准扫描线，并且被配置为向检测室发射光线; 以及光检测器，被配置为检测通过设置在扫描线上的相应检测室的光线。 光源包括用于测量设置在检测室中的样品的主波长光源和用于校正测量误差的亚波长光源。