公开(公告)号：US20120105830A1

公开(公告)日：2012-05-03

申请号：US13276487

申请日：2011-10-19

Applicant: Richard H. Pierce, JR. ,  Gary J. Kirkpatrick ,  Alan R. Hails ,  Michael S. Henry

Inventor： Richard H. Pierce, JR. ,  Gary J. Kirkpatrick ,  Alan R. Hails ,  Michael S. Henry

IPC: G01J3/427

CPC classification number: G01N30/88 ,  G01N30/74 ,  G01N33/1886 ,  G01N2030/009 ,  G01N2030/8804

Abstract: The present invention provides apparatuses for in situ chemical analysis of liquid samples.

Abstract translation: 本发明提供液体样品的原位化学分析装置。

公开(公告)号：US20110299073A1

公开(公告)日：2011-12-08

申请号：US13087631

申请日：2011-04-15

Applicant: Kazunori SAKURAI

Inventor： Kazunori SAKURAI

IPC: G01J3/427

CPC classification number: G01J3/51 ,  G01J3/10 ,  G01J3/502 ,  G01J3/513

Abstract: A colorimetric instrument includes a power control section adapted to vary the power to be applied to the light source between the wavelengths in accordance with at least one of spectral characteristics of the light source, spectral characteristics of the measurement optical system, and light receiving sensitivity characteristics of the light receiving section.

Abstract translation: 比色仪包括功率控制部分，其适于根据光源的光谱特性，测量光学系统的光谱特性和光接收灵敏度特性中的至少一个来改变在波长之间施加到光源的功率 的光接收部。

公开(公告)号：US20110249255A1

公开(公告)日：2011-10-13

申请号：US13132629

申请日：2009-12-02

Applicant: Anders Bentien

Inventor： Anders Bentien

IPC: G01J3/427 ,  G01N15/14

CPC classification number: G01N15/1459 ,  G01N15/1434

Abstract: A sensor system for capturing and specifying individual particles (16) in a fluid includes a measurement cell (14) through which the fluid can flow, a light source (2; 30) that is arranged on the measurement cell (14) and creates a light beam (4; 36) passing through the measurement cell (14), and an intensity sensor (26; 44) that is arranged on the measurement cell (14) opposite the light source (2; 30) such that it captures the light beam exiting the measurement cell (14) and is designed for separately capturing the intensity (IA, IB) of the light beam in at least two different wavelength regions (λA, λB).

Abstract translation: 用于捕获和指定流体中的单个颗粒（16）的传感器系统包括流体可以流过的测量单元（14），布置在测量单元（14）上的光源（2; 30） 通过测量单元（14）的光束（4; 36）和布置在与光源（2; 30）相对的测量单元（14）上的强度传感器（26; 44），以便它捕获光 离开测量单元（14）的光束被设计成分别捕获至少两个不同波长区域（λA，λB）中的光束的强度（IA，IB）。

公开(公告)号：US07688454B1

公开(公告)日：2010-03-30

申请号：US12200325

申请日：2008-08-28

Applicant: Gary R. Janik

Inventor： Gary R. Janik

IPC: G01B11/30 ,  G01B11/14 ,  G01J3/44 ,  G01J3/427 ,  G01J3/28

CPC classification number: G01B11/0616 ,  G01N21/65 ,  G01N2021/653

Abstract: A system for characterizing material properties in miniature semiconductor structures performs a scatterometry analysis on inelastically scattered light. The system can include a narrowband probe beam generator and a detector. A single wavelength probe beam from the narrowband probe beam generator produces scattered light from a measurement pattern on a test sample. The scattered light is measured by the detector, and the measurement data (e.g., Raman spectrum) is used in a scatterometry analysis to determine material properties for the measurement pattern. The detector can measure either incoherent inelastically scattered light (e.g., using a spectrometer) or coherent inelastically scattered light (e.g., using an array detector). If the measurement pattern dimensions are substantially similar to actual device dimensions, the material property distributions determined for the measurement pattern can be applied to the actual devices on the test sample.

Abstract translation: 用于表征微型半导体结构中的材料性质的系统对非弹性散射光进行散射分析。 该系统可以包括窄带探测光束发生器和检测器。 来自窄带探测光束发生器的单个波长探测光束从测试样品上的测量图形产生散射光。 通过检测器测量散射光，并且在散射分析中使用测量数据（例如，拉曼光谱）来确定测量图案的材料特性。 检测器可以测量非相干非弹性散射光（例如，使用光谱仪）或相干非弹性散射光（例如，使用阵列检测器）。 如果测量图形尺寸基本上类似于实际的装置尺寸，则可以将测量图案确定的材料特性分布应用于测试样品上的实际装置。

公开(公告)号：US20100067002A1

公开(公告)日：2010-03-18

申请号：US12561171

申请日：2009-09-16

Applicant: Shuichi ISHII

Inventor： Shuichi ISHII

IPC: G01J3/427 ,  G01J3/443

CPC classification number: A61B5/415 ,  A61B1/00009 ,  A61B1/043 ,  A61B1/0638 ,  A61B1/0669 ,  A61B5/0071 ,  A61B5/0086 ,  A61B5/418

Abstract: Emitting illumination light and auxiliary light having a wavelength range different from that of the illumination light onto an observation target simultaneously, obtaining an image formed of reflection light of the illumination light and reflection light of the auxiliary light reflected from the observation target, calculating, with respect to each pixel of the obtained image signal, estimated spectroscopic data in the wavelength range of the auxiliary light using a value of the image signal and estimated matrix data in the wavelength range of the auxiliary light stored in advance, obtaining quasi reflectivity information reflecting a reflectivity of the observation target in the wavelength range of the auxiliary light based on the estimated spectroscopic data in the wavelength range of the auxiliary light, and generating a special image based on the quasi reflectivity information.

Abstract translation: 将具有与照明光的波长范围不同的照明光和辅助光同时发射到观察对象上，获得由照明光的反射光和从观察对象反射的辅助光的反射光形成的图像，用 使用所获得的图像信号的每个像素，使用预先存储的辅助光的波长范围内的图像信号的值和估计的矩阵数据来估计辅助光的波长范围中的分光数据，获得反映 基于辅助光的波长范围内的估计分光数据，观察对象在辅助光的波长范围内的反射率，并且基于准反射率信息生成特殊图像。

公开(公告)号：US07436511B2

公开(公告)日：2008-10-14

申请号：US11188064

申请日：2005-07-22

Applicant: Timothy L. Ruchti ,  Alexander D. Lorenz ,  Kevin H. Hazen

Inventor： Timothy L. Ruchti ,  Alexander D. Lorenz ,  Kevin H. Hazen

IPC: G01J3/28 ,  G01J3/42 ,  G01J3/427 ,  G01N33/48 ,  A61B5/00

CPC classification number: G01N21/274 ,  G01J3/28 ,  G01J3/433 ,  G01N21/359 ,  G01N2201/129 ,  G01N2201/1293

Abstract: The invention comprises a method and apparatus for enhancing the analysis of noninvasive spectra, resulting in improved analytical performance. More particularly, the invention comprises a method and apparatus for processing noninvasive spectra with an analyte filter that preferably rejects variation likely to be detrimental to the measurement system, while passing signal that probabilistically is unique to the target analyte. Subsequently, the analyte filtered data are used to estimate an analyte property, such as a glucose concentration, in the presence of noise, interferences, state changes, and/or across analyzers.

Abstract translation: 本发明包括用于增强非侵入光谱分析的方法和装置，从而提高分析性能。 更具体地，本发明包括用分析物过滤器处理非侵入光谱的方法和装置，其优选地拒绝可能对测量系统有害的变化，同时传递概率地对目标分析物是唯一的信号。 随后，分析物过滤的数据用于在存在噪声，干扰，状态变化和/或跨分析仪的情况下估计分析物质（例如葡萄糖浓度）。

公开(公告)号：US20050274893A1

公开(公告)日：2005-12-15

申请号：US11141112

申请日：2005-06-01

Applicant: Rasmus Behring ,  Peter Dreyer ,  Horst-Dieter Hattendorff ,  Bernd-Michael Dicks ,  Hans Matthiessen

Inventor： Rasmus Behring ,  Peter Dreyer ,  Horst-Dieter Hattendorff ,  Bernd-Michael Dicks ,  Hans Matthiessen

IPC: G01J3/427 ,  G01N21/27 ,  G01N21/35 ,  G01N21/59 ,  H02H7/125

CPC classification number: G01N21/274 ,  G01N21/3504

Abstract: The invention relates to an apparatus and a method for improved correction of drift in an infrared measuring instrument. The measurement signal furnished by a thermal detector is split into a direct voltage component and an alternating voltage component. By means of calibration curves (24, 27), a calculated comparison variable T DC , korr 900 is formed from a measured, averaged concentration value c AC1 900 . The correction value ΔT for the drift correction is obtained from the difference between the corresponding measured size of the direct voltage component T DC 900 and the comparison variable T DC , korr 900 .

Abstract translation: 本发明涉及一种用于改进红外测量仪器漂移校正的装置和方法。 由热检测器提供的测量信号被分为直流电压分量和交流电压分量。 通过校准曲线（24,27），计算的比较变量