公开(公告)号：US08269191B2

公开(公告)日：2012-09-18

申请号：US12940228

申请日：2010-11-05

Applicant: David Lawrence Rosen ,  Ronald Everett Meyers

Inventor： David Lawrence Rosen ,  Ronald Everett Meyers

IPC: G01J1/58

CPC classification number: G01J1/58 ,  G01J1/0429 ,  G01J1/0488 ,  G01J3/0224 ,  G01J3/44 ,  G01J3/443 ,  G01J4/00

Abstract: An apparatus for determining the depolarization efficiency of a environment includes a transmitter, a receiver, and signal processing circuitry. A reference object is located within the environment at a reference distance. The transmitter includes a radiation source providing incident radiation that has an initial polarization as it enters the environment. The receiver receives returned radiation from the reference, which may be diffuse reflection or photoluminescence. The signal processing circuitry calculates the depolarization efficiency of the environment from the initial polarization, luminescence or final polarization, and the reference distance. A method of determining depolarization efficiency includes directing incident radiation having initial polarization through an environment onto a reference, detecting returned radiation from the reference, and calculating the depolarization efficiency using the initial polarization and the luminescence or final polarization.

Abstract translation: 用于确定环境的去极化效率的装置包括发射器，接收器和信号处理电路。 参考对象位于环境中的参考距离处。 发射机包括提供入射辐射的辐射源，入射辐射在其进入环境时具有初始极化。 接收器接收来自参考物的返回辐射，其可以是漫反射或光致发光。 信号处理电路从初始极化，发光或最终极化以及参考距离计算环境的去极化效率。 确定去极化效率的方法包括将具有通过环境的初始极化的入射辐射引导到参考，检测来自参考物的返回辐射，以及使用初始极化和发光或最终极化来计算去极化效率。

公开(公告)号：US08264681B2

公开(公告)日：2012-09-11

申请号：US12639393

申请日：2009-12-16

Applicant: Anupam Kumar Misra ,  Shiv Kumar Sharma ,  Paul Grandmont Lucey

Inventor： Anupam Kumar Misra ,  Shiv Kumar Sharma ,  Paul Grandmont Lucey

IPC: G01J3/44

CPC classification number: G01J3/44 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0227 ,  G01J3/0289 ,  G01J3/10 ,  G01J3/443

Abstract: An spectrometer including Raman and LIBS spectroscopy capabilities is disclosed. The spectrometer includes a laser source configurable to produce a lased light directable towards a target substance, the laser source having a single wavelength and having sufficient power to cause a portion of the target to emit Raman scattering and sufficient to ablate a portion of the target substance to produce a plasma plume. A separate remote light collector is optically configurable to collect light emitted from the portion of the target emitting Raman scattering and from the portion of the target producing the plasma plume. A filter is optically coupled to the remote light collector to remove reflected light and Rayleigh-scattered light, and a spectroscope is optically coupled to the filter and configured to separate the collected and filtered light into a frequency spectrum comprising a Raman spectrum and a laser-induced breakdown spectrum. Finally, an electronic light sensor is used to record the frequency spectrum.

Abstract translation: 公开了包括拉曼和LIBS光谱能力的光谱仪。 光谱仪包括可配置为产生可朝向目标物质定向的激光的激光源，激光源具有单一波长并具有足够的功率以使靶的一部分发射拉曼散射并足以消除目标物质的一部分 以产生等离子体羽流。 单独的远程收光器是可光学配置的，以收集从发射拉曼散射的目标的部分和从产生等离子体羽流的目标的部分发射的光。 滤光器光耦合到远程光收集器以去除反射光和瑞利散射光，并且光谱仪光学耦合到滤光器并且被配置为将收集的和经过滤光的光分离成包括拉曼光谱和激光 - 诱发击穿光谱。 最后，使用电子光传感器来记录频谱。

公开(公告)号：US08218141B2

公开(公告)日：2012-07-10

申请号：US12838804

申请日：2010-07-19

Applicant: Oleg Zimenkov ,  Xavier Amouretti ,  Robert M. Gifford ,  Mark R. Kennedy ,  Michael Kontorovich ,  Ben Norris ,  Richard N. Sears ,  Dan Venditti ,  Christopher Many

Inventor： Oleg Zimenkov ,  Xavier Amouretti ,  Robert M. Gifford ,  Mark R. Kennedy ,  Michael Kontorovich ,  Ben Norris ,  Richard N. Sears ,  Dan Venditti ,  Christopher Many

IPC: G01J3/18 ,  G01J3/42 ,  G01J3/44 ,  G01N21/64

CPC classification number: G01J3/42 ,  G01J3/0224 ,  G01J3/0294 ,  G01J3/10 ,  G01J3/4406 ,  G01J3/443 ,  G01N21/6452 ,  G01N21/76 ,  G01N2021/6463

Abstract: An apparatus and a method for optically analyzing a sample are provided. The apparatus includes a first optical device that transmits a narrow waveband of light and has a first filter and a first monochromator that provide different paths for the narrow waveband of the light. The apparatus may also include a light source that generates the light as broadband excitation light, in which case the first optical device transmits a narrow waveband of the broadband excitation light through the first filter or the first monochromator. Further, the apparatus may include a second optical device that directs the narrow waveband of the broadband excitation light onto the sample and receives emission light from the sample, a third optical device that transmits a narrow waveband of the emission light, and a detector that converts the narrow waveband of the emission light into an electrical signal.

Abstract translation: 提供了用于光学分析样品的装置和方法。 该装置包括发射窄波段光的第一光学装置，并具有为光的窄波段提供不同路径的第一滤光器和第一单色仪。 该装置还可以包括产生作为宽带激发光的光的光源，在这种情况下，第一光学装置通过第一滤光器或第一单色器传输宽带激发光的窄波段。 此外，该装置可以包括第二光学装置，其将宽带激发光的窄波段引导到样本上并接收来自样品的发射光，透射发射光的窄波段的第三光学装置，以及转换 将发射光的窄波段变成电信号。

公开(公告)号：US20120170039A1

公开(公告)日：2012-07-05

申请号：US13415763

申请日：2012-03-08

Applicant: Vijayakumar C. Venugopal ,  Eric Pape ,  Jean-Paul Booth

Inventor： Vijayakumar C. Venugopal ,  Eric Pape ,  Jean-Paul Booth

IPC: G01J3/42

CPC classification number: G01N21/274 ,  G01J3/02 ,  G01J3/0205 ,  G01J3/0218 ,  G01J3/0294 ,  G01J3/443 ,  G01N21/68

Abstract: A processing system having a chamber for in-situ optical interrogation of plasma emission to quantitatively measure normalized optical emission spectra is provided. The processing chamber includes a confinement ring assembly, a flash lamp, and a set of quartz windows. The processing chamber also includes a plurality of collimated optical assemblies, the plurality of collimated optical assemblies are optically coupled to the set of quartz windows. The processing chamber also includes a plurality of fiber optic bundles. The processing chamber also includes a multi-channel spectrometer, the multi-channel spectrometer is configured with at least a signal channel and a reference channel, the signal channel is optically coupled to at least the flash lamp, the set of quartz windows, the set of collimated optical assemblies, the illuminated fiber optic bundle, and the collection fiber optic bundle to measure a first signal.

Abstract translation: 提供一种具有用于等离子体发射的原位光询问室以定量测量归一化光发射光谱的处理系统。 处理室包括限制环组件，闪光灯和一组石英窗。 处理室还包括多个准直光学组件，多个准直光学组件光学耦合到该组石英窗口。 处理室还包括多个光纤束。 处理室还包括多通道光谱仪，多通道光谱仪配置有至少一个信号通道和一个参考通道，信号通道光学耦合到至少闪光灯，该组石英窗，该组 准直光学组件，照明光纤束和收集光纤束以测量第一信号。

公开(公告)号：US08134128B2

公开(公告)日：2012-03-13

申请号：US12634282

申请日：2009-12-09

Applicant: Xi-Cheng Zhang ,  Jianming Dai ,  Xu Xie

Inventor： Xi-Cheng Zhang ,  Jianming Dai ,  Xu Xie

IPC: G01J5/02

CPC classification number: G01J3/42 ,  G01J3/443 ,  G01N21/3581 ,  G01N21/718 ,  G01N2021/1761 ,  G01N2021/1795 ,  G01N2201/0697

Abstract: A method of analyzing a remotely-located object includes the step of illuminating at least a portion of a targeted object with electromagnetic radiation to induce a phase transformation in the targeted object, wherein the phase transformation produces an emitter plasma, which emits terahertz radiation. The method also includes the step of ionizing a volume of an ambient gas to produce a sensor plasma by focusing an optical probe beam in the volume and the step of detecting an optical component of resultant radiation produced from an interaction of the focused optical probe beam and the terahertz radiation in the sensor plasma. Detecting an optical component of the resultant radiation emitted by the sensor plasma facilitates detection of a characteristic fingerprint of the targeted object imposed onto the terahertz radiation produced as a result of the induced phase transformation.

Abstract translation: 分析遥远物体的方法包括用电磁辐射照射目标物体的至少一部分以引起目标物体中的相变的步骤，其中相变产生发射太赫兹辐射的发射体等离子体。 该方法还包括使体积的环境气体电离以通过将光学探针束聚焦在体积中来产生传感器等离子体的步骤，以及检测由聚焦的光学探针光束和 传感器等离子体中的太赫兹辐射。 检测由传感器等离子体发射的所得辐射的光学部件有助于检测施加在由感应相变所产生的太赫兹辐射上的目标物体的特征指纹。

公开(公告)号：US08125627B2

公开(公告)日：2012-02-28

申请号：US12597761

申请日：2008-04-28

Applicant: Ed Dottery ,  Rob Waterbury ,  Chris Stefano ,  Roy Walters ,  Jeremy Rose ,  Frank Vilardi

Inventor： Ed Dottery ,  Rob Waterbury ,  Chris Stefano ,  Roy Walters ,  Jeremy Rose ,  Frank Vilardi

IPC: G01N21/00

CPC classification number: G01N21/65 ,  G01J3/443 ,  G01N21/718 ,  G01N2021/1793 ,  G01N2021/637 ,  G01N2021/655

Abstract: A spectroscopy system including first and second lasers. The first laser is triggered to induce a plasma, such as on a surface of a target at a stand-off distance from the target. The second laser stimulates amplified emissions from the plasma detected by one or more spectroscopes. The gain induced by the second laser detects traces of explosives and other substances on surfaces at stand-off distances. The spectroscopy systems use the same telescopic optics to collect emissions from the detection surface and activated at or just before the peak emission intensity useful for detecting element signatures and intensity ratios from the trace elements in the plasma.

Abstract translation: 包括第一和第二激光的光谱系统。 触发第一激光以诱导等离子体，例如在与目标的隔离距离处的靶的表面上。 第二激光器刺激由一个或多个分光镜检测到的等离子体的放大发射。 由第二台激光器引起的增益在距离距离处检测表面上的爆炸物和其他物质的痕迹。 光谱系统使用相同的伸缩光学器件来收集来自检测表面的发射，并且在用于检测来自等离子体中的微量元素的元件特征和强度比的峰值发射强度之前或之前激活。

公开(公告)号：US20120044488A1

公开(公告)日：2012-02-23

申请号：US13131461

申请日：2009-11-03

Applicant: Stéphane Senac

Inventor： Stéphane Senac

IPC: G01J3/30

CPC classification number: G01J3/443 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/0291 ,  G01N21/718 ,  G01N2201/0221

Abstract: A device for analyzing materials by plasma spectroscopy is of the portable and independent type, comprising a housing (10) containing a laser generator (18) that emits laser pulses that are focused on the surface of a material to be analyzed by means of a parabolic mirror (32) that is movable in translation inside the housing in order to perform a series of spot measurements along a scan line on the surface of the material to be analyzed and in order to take a measurement from a calibration sample (50) mounted in the measurement endpiece (22) of the housing (10).

Abstract translation: 用于通过等离子体光谱法分析材料的装置是便携式和独立型的装置，包括：壳体（10），其包含激光发生器（18），激光发生器（18）发射激光脉冲，所述激光脉冲通过抛物面方式聚焦在待分析材料的表面上 反射镜（32），其可在壳体内平移地移动，以便沿着要分析的材料的表面上的扫描线执行一系列点测量，并且为了从安装在所述待校准样品中的校准样品（50）进行测量 壳体（10）的测量端部（22）。

公开(公告)号：US20120029836A1

公开(公告)日：2012-02-02

申请号：US13128061

申请日：2009-10-19

Applicant: Jörg Hermann

Inventor： Jörg Hermann

IPC: G06F19/00

CPC classification number: G01N21/718 ,  G01J3/443 ,  G01N21/71

Abstract: A system and method for measuring elemental concentrations of a material from a sample containing several elements by LIBS analysis. The material is heated to generate plasma and its chemical composition is determined from spectral analysis of its radiation. The spectral lines of interest are identified among those emitted by the constituents of each element composing sample. The intensities of the spectral lined identified are measured. From an estimate of temperature, electron density and relative concentration values, the chemical composition of the plasma is calculated. The absorption coefficient according to wavelength is calculated for the spectral zones of the lines of interest. From an estimate of the plasma width, the spectral radiance of the plasma is calculated for the same spectral zones and then a comparison of the intensity and shape of the spectrum thus calculated with those of the spectrum measured is performed. These calculations and this comparison are repeated iteratively in order to adjust the temperature, electron density, relative values of the elemental concentrations and width of the plasma.

Abstract translation: 用于通过LIBS分析测量含有若干元素的样品的材料的元素浓度的系统和方法。 将材料加热以产生等离子体，并且其化学组成由其辐射的光谱分析确定。 感兴趣的谱线在由构成样品的每个元素的成分发出的谱线中被识别。 测量所确定的光谱线的强度。 从温度，电子密度和相对浓度值的估计，计算等离子体的化学组成。 对于感兴趣的线的光谱区域计算根据波长的吸收系数。 从等离子体宽度的估计，对于相同的光谱区域计算等离子体的光谱辐射，然后进行如此计算的光谱的强度和形状与所测量的光谱的比较。 为了调整温度，电子密度，元素浓度和等离子体宽度的相对值，迭代地重复这些计算和该比较。

公开(公告)号：US08106360B2

公开(公告)日：2012-01-31

申请号：US12789823

申请日：2010-05-28

Applicant: Richard A. Rosenberg

Inventor： Richard A. Rosenberg

IPC: G01J5/02

CPC classification number: G01J3/108 ,  G01J3/443

Abstract: An infrared (IR) emission spectroscopy and microscopy apparatus with X-ray excitation or electron excitation and an improved process for extending spatial relation of infrared (IR) microscopy and performing microscopic infrared (IR) analysis by X-ray or electron radiation are provided. By utilizing nanometer sized X-ray beams or electron beams to produce IR emission, the spatial resolution of IR microscopy is extended. Simultaneously performing X-ray or electron-based spectroscopy as well as structural studies are enabled.

Abstract translation: 提供了具有X射线激发或电子激发的红外（IR）发射光谱和显微镜装置，以及用于扩展红外（IR）显微镜的空间关系和通过X射线或电子辐射进行微观红外（IR）分析的改进方法。 通过利用纳米尺寸的X射线束或电子束产生IR发射，IR显微镜的空间分辨率得到延长。 同时执行X射线或电子基光谱学以及结构研究。

公开(公告)号：US20110235033A1

公开(公告)日：2011-09-29

申请号：US13050701

申请日：2011-03-17

Applicant: TOSHIYA HABU ,  Eizo Kawato

Inventor： TOSHIYA HABU ,  Eizo Kawato

IPC: G01J3/42

CPC classification number: G01N21/67 ,  G01J3/443

Abstract: An emission spectrophotometer capable of inhibiting non-uniformity of spectral intensities of component elements is provided. The emission spectrophotometer generates pulse light emission by supplying an energy accumulated in an electricity accumulating and discharging unit to a gap between an electrode and a test material, and the emission spectrophotometer includes a detection unit, for detecting an energy charged to the electricity accumulating and discharging unit before the pulse light emission; and a detection unit, for detecting an energy remaining in the electricity accumulating and discharging unit after the pulse light emission. It is determined whether the detected light is emitted by fully using the energy accumulated in the electricity accumulating and discharging unit.

Abstract translation: 提供能够抑制组分元素的光谱强度不均匀的发射分光光度计。 发射分光光度计通过将累积在蓄电单元中的能量供给到电极和测试材料之间的间隙来产生脉冲发光，并且发射分光光度计包括检测单元，用于检测充电到蓄电和放电的能量 单位前脉冲发光; 以及检测单元，用于检测在脉冲发光之后积蓄和排出单元中剩余的能量。 通过充分利用蓄积在蓄电单元中的能量来判断检测出的光是否发出。