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    Microfluidics delivery systems
    1.
    发明授权
    Microfluidics delivery systems 有权
    微流体输送系统

    公开(公告)号：US09044781B2

    公开(公告)日：2015-06-02

    申请号：US13693938

    申请日：2012-12-04

    Applicant: FEI Company

    Inventor： Aurélien Philippe Jean Maclou Botman ,  Steven Randolph ,  Mark W. Utlaut

    IPC: B05D1/26 ,  C25D5/02 ,  C25F3/14 ,  G01N23/225

    CPC classification number: B05D1/26 ,  C25D5/024 ,  C25F3/14 ,  G01N23/225 ,  Y10T137/0324

    Abstract: Methods of dispensing a small amount of liquid onto a work piece includes in some embodiments known providing a microscopic channel for the liquid to flow from the nanodispenser. In some embodiments, dispensing the liquid includes dispensing the liquid using a nanodispenser have at least one slit extending to the tip. Some methods include controlling the rate of evaporation or the rate of liquid flow to establish an equilibrium producing a bubble of a desired size.

    Abstract translation: 将少量液体分配到工件上的方法包括在一些实施例中已知提供用于使液体从纳米二分配器流出的微细通道。 在一些实施例中，分配液体包括使用具有延伸到尖端的至少一个狭缝的纳米分配器来分配液体。 一些方法包括控制蒸发速率或液体流速以建立产生所需尺寸的气泡的平衡。

    System and method for simultaneous detection of secondary electrons and light in a charged particle beam system
    2.
    发明授权
    System and method for simultaneous detection of secondary electrons and light in a charged particle beam system 有权
    在带电粒子束系统中同时检测二次电子和光的系统和方法

    公开(公告)号：US09040909B2

    公开(公告)日：2015-05-26

    申请号：US13681746

    申请日：2012-11-20

    Applicant: FEI Company

    Inventor： N. William Parker ,  Mark W. Utlaut

    IPC: G01N23/00 ,  G01N23/225 ,  G01N21/64 ,  H01J37/22 ,  H01J37/28

    CPC classification number: G01N21/6428 ,  G01N21/6458 ,  G01N21/6486 ,  G01N23/225 ,  H01J37/228 ,  H01J37/28 ,  H01J37/285 ,  H01J2237/206 ,  H01J2237/2443 ,  H01J2237/24455 ,  H01J2237/2448 ,  H01J2237/2803 ,  H01J2237/2857

    Abstract: A method and system for the imaging and localization of fluorescent markers such as fluorescent proteins or quantum dots within biological samples is disclosed. The use of recombinant genetics technology to insert “reporter” genes into many species is well established. In particular, green fluorescent proteins (GFPs) and their genetically-modified variants ranging from blue to yellow, are easily spliced into many genomes at the sites of genes of interest (GoIs), where the GFPs are expressed with no apparent effect on the functioning of the proteins of interest (PoIs) coded for by the GoIs. One goal of biologists is more precise localization of PoIs within cells. The invention is a method and system for enabling more rapid and precise PoI localization using charged particle beam-induced damage to GFPs. Multiple embodiments of systems for implementing the method are presented, along with an image processing method relatively immune to high statistical noise levels.

    Abstract translation: 公开了用于生物样品中荧光标记如荧光蛋白或量子点的成像和定位的方法和系统。 使用重组遗传学技术将“记者”基因插入许多物种已经很成熟。 特别地，绿色荧光蛋白（GFP）及其从蓝色到黄色的遗传修饰的变体易于在感兴趣的基因（GoI）的位点处接合到许多基因组中，其中GFP表达对功能没有明显的影响 的由GoI编码的感兴趣的蛋白质（PoI）。 生物学家的一个目标是更精确地定位细胞内的PoI。 本发明是一种方法和系统，用于使得能够使用带电粒子束对GFP的损伤进行更快速和精确的PoI定位。 提出了用于实现该方法的系统的多个实施例，以及相对不受高统计噪声水平影响的图像处理方法。

    SYSTEM AND METHOD FOR SIMULTANEOUS DETECTION OF SECONDARY ELECTRONS AND LIGHT IN A CHARGED PARTICLE BEAM SYSTEM
    5.
    发明申请
    SYSTEM AND METHOD FOR SIMULTANEOUS DETECTION OF SECONDARY ELECTRONS AND LIGHT IN A CHARGED PARTICLE BEAM SYSTEM 审中-公开
    用于同时检测充电颗粒束系统中二次电子和光的系统和方法

    公开(公告)号：US20140131573A1

    公开(公告)日：2014-05-15

    申请号：US13681746

    申请日：2012-11-20

    Applicant: FEI COMPANY

    Inventor： N. William Parker ,  Mark W. Utlaut

    IPC: G01N23/225

    CPC classification number: G01N21/6428 ,  G01N21/6458 ,  G01N21/6486 ,  G01N23/225 ,  H01J37/228 ,  H01J37/28 ,  H01J37/285 ,  H01J2237/206 ,  H01J2237/2443 ,  H01J2237/24455 ,  H01J2237/2448 ,  H01J2237/2803 ,  H01J2237/2857

    Abstract: A method and system for the imaging and localization of fluorescent markers such as fluorescent proteins or quantum dots within biological samples is disclosed. The use of recombinant genetics technology to insert “reporter” genes into many species is well established. In particular, green fluorescent proteins (GFPs) and their genetically-modified variants ranging from blue to yellow, are easily spliced into many genomes at the sites of genes of interest (GoIs), where the GFPs are expressed with no apparent effect on the functioning of the proteins of interest (PoIs) coded for by the GoIs. One goal of biologists is more precise localization of PoIs within cells. The invention is a method and system for enabling more rapid and precise PoI localization using charged particle beam-induced damage to GFPs. Multiple embodiments of systems for implementing the method are presented, along with an image processing method relatively immune to high statistical noise levels.

    Abstract translation: 公开了用于生物样品中荧光标记如荧光蛋白或量子点的成像和定位的方法和系统。 使用重组遗传学技术将“记者”基因插入许多物种已经很成熟。 特别地，绿色荧光蛋白（GFP）及其从蓝色到黄色的遗传修饰的变体易于在感兴趣的基因（GoI）的位点处接合到许多基因组中，其中GFP表达对功能没有明显的影响 的由GoI编码的感兴趣的蛋白质（PoI）。 生物学家的一个目标是更精确地定位细胞内的PoI。 本发明是一种方法和系统，用于使得能够使用带电粒子束对GFP的损伤进行更快速和精确的PoI定位。 提出了用于实现该方法的系统的多个实施例，以及相对不受高统计噪声水平影响的图像处理方法。

    High aspect ratio X-ray targets and uses of same
    6.
    发明授权
    High aspect ratio X-ray targets and uses of same 有权

    公开(公告)号：US10366860B2

    公开(公告)日：2019-07-30

    申请号：US15901858

    申请日：2018-02-21

    Applicant: FEI Company

    Inventor： N. William Parker ,  Mark W. Utlaut ,  Laurens Franz Taemsz Kwakman ,  Thomas G. Miller

    IPC: H01J35/08 ,  G01N23/046 ,  G21K7/00 ,  H01J35/14

    Abstract: An x-ray target, a method of using the x-ray target, and a computer program product with instructions for carrying out a method of using the x-ray target. The x-ray target includes a substrate made from a soft x-ray producing material and a high aspect ratio structure made from a hard x-ray producing material. The hard x-ray producing material is embedded in the substrate, formed on the substrate, cantilevered out from the edge of the substrate, or any combination thereof. The high aspect ratio structure comprises a plurality of high aspect ratio structures arranged in one or more grids or arrays, and the high aspect ratio structures in one of the one or more grids or arrays are arranged to form a Hadamard matrix structure.

    ADAPTIVE CONTROL FOR CHARGED PARTICLE BEAM PROCESSING
    7.
    发明申请
    ADAPTIVE CONTROL FOR CHARGED PARTICLE BEAM PROCESSING 审中-公开
    充电颗粒光束处理的自适应控制

    公开(公告)号：US20170002467A1

    公开(公告)日：2017-01-05

    申请号：US15201590

    申请日：2016-07-04

    Applicant: FEI Company

    Inventor： Marcus Straw ,  Chad Rue ,  Steven Randolph ,  Aurelien Philippe Jean Maclou Botman ,  Clive D. Chandler ,  Mark W. Utlaut

    IPC: C23C16/48 ,  C23C16/56 ,  C23C16/52

    CPC classification number: C23C16/52 ,  C23C16/047 ,  C23C16/4418 ,  H01J37/3023 ,  H01J37/3026 ,  H01J37/304 ,  H01J37/317 ,  H01J37/3178 ,  H01J2237/30416 ,  H01J2237/30455 ,  H01J2237/30472 ,  H01J2237/31735 ,  H01J2237/31749

    Abstract: An improved process control for a charged beam system is provided that allows the capability of accurately producing complex two and three dimensional structures from a computer generated model in a material deposition process. The process control actively monitors the material deposition process and makes corrective adjustments as necessary to produce a pattern or structure that is within an acceptable tolerance range with little or no user intervention. The process control includes a data base containing information directed to properties of a specific pattern or structure and uses an algorithm to instruct the beam system during the material deposition process. Feedback through various means such as image recognition, chamber pressure readings, and EDS signal can be used to instruct the system to make automatic system modifications, such as, beam and gas parameters, or other modifications to the pattern during a material deposition run.

    Abstract translation: 提供了一种用于带电束系统的改进的过程控制，其允许在材料沉积过程中从计算机生成的模型精确地产生复杂的二维和三维结构的能力。 过程控制主动监测材料沉积过程，并根据需要进行校正调整，以产生在可接受的公差范围内，甚至无需用户干预的图案或结构。 过程控制包括包含针对特定模式或结构的属性的信息的数据库，并且使用算法在材料沉积过程期间指示束系统。 可以使用诸如图像识别，室压读数和EDS信号的各种手段的反馈来指示系统在材料沉积运行期间进行自动系统修改，例如光束和气体参数或对图案的其它修改。

    Image-Enhancing Spotlight Mode for Digital Microscopy
    10.
    发明申请
    Image-Enhancing Spotlight Mode for Digital Microscopy 审中-公开
    数字显微镜的图像增强聚光灯模式

    公开(公告)号：US20130307960A1

    公开(公告)日：2013-11-21

    申请号：US13745100

    申请日：2013-01-18

    Applicant: FEI Company

    Inventor： Alan Bahm ,  N. William Parker ,  Mark W. Utlaut

    IPC: H04N5/232

    CPC classification number: H04N5/23216 ,  G02B21/365 ,  H01J37/265 ,  H01J2237/22 ,  H01J2237/28 ,  H04N1/62

    Abstract: An apparatus to permit a viewer of a digital microscopy original image to manipulate the display and/or the microscope to obtain an enhanced view of a region of interest within the original image. In one preferred embodiment a spotlight mode matches the gray shade scale for a spotlight region-of-interest to the pixel intensity variation present in the spotlight region. The gray shade scale used for the spotlight mode may then be generalized to the original image. In a preferred embodiment, spotlight mode provides an easy mechanism for permitting a user to command a re-imaging of a selected spotlight region from a displayed image. Such re-imaging may permit the use of imaging parameter selections that better fit the spotlight region.

    Abstract translation: 一种允许数字显微镜原始图像的观看者操纵显示器和/或显微镜以获得原始图像内的感兴趣区域的增强视图的装置。 在一个优选实施例中，聚光灯模式将焦点区域的灰度级别与聚光灯区域中存在的像素强度变化匹配。 然后可以将用于聚光灯模式的灰度级别广义化为原始图像。 在优选实施例中，聚光灯模式提供了一种容易的机构，用于允许用户从显示的图像命令对所选聚光灯区域的重新成像。 这种重新成像可以允许使用更适合聚光灯区域的成像参数选择。

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