Abstract:
Disclosed is a method and system for inserting redundant paths (40,50) into an integrated circuit. Particularly, the invention provides a method for identifying a single via (30) in a first path (40) connecting two elements, determining if an alternate route is available for connecting the two elements (10,20) (other than a redundant via (54)), and for inserting a second path (50)into the available alternate route (70). The combination of the first (40) and second paths (50) provides greater redundancy than inserting a redundant via (54) alone. More importantly, such redundant paths (50) provide for redundancy when congestion prevents a redundant via (54) from being inserted adjacent to the single via (30). An embodiment of the method further comprises removing the single via (30) and any redundant wire segments (51), if all of the additional vias (52) used to form the second path can be made redundant.
Abstract:
A structure and associated method of processing data on a semi-conductor device comprising an input island, a processing island, and an output island formed on the semiconductor device. The input island is adapted to accept a specified amount of data and enable a means for providing a first specified voltage for powering the processing island after accepting the specified amount of data. The processing island is adapted to receive and process the specified amount of data from the input island upon powering the processing island by the first specified voltage. The output island is adapted to be powered by a second specified voltage. The processing island is further adapted to transmit the processed data to the output island upon said powering by the second specified voltage. The first specified voltage is adapted to be disabled thereby removing power from processing island upon completion of transmission of the processed data to the output island.
Abstract:
A structure for a semiconductor chip which includes a first region having first cells for storing and processing data, and a second region outside the first region having OPC structures, wherein the OPC structures comprise decoupling capacitors. The line widths of the active gates of first cells are the same size or similar in size as the OPC structures. The OPC structures reduce proximity effects of active devices in the first cells, and comprise N-type FETs and P-type FETs, that are located in the second region. The OPC structures may have a width greater than the first cells. The second region can be multiple OPC structures, whereby the second region comprises multiple decoupling capacitors. The active devices in the first cells are separated by a first distance and the OPC structures are separated from the active devices by the first distance.
Abstract:
PROBLEM TO BE SOLVED: To provide a high-speed and precise method and a system for analyzing an electric power allocation in an integrated circuit chip. SOLUTION: The method comprises a step of splitting a clock cycle of the integrated circuit chip into a plurality of periods, a step of splitting the integrated circuit chip into a plurality of cells, a step of performing a static timing analysis to make the plurality of cells to acquire electric wave data by cell and by period and a step of performing the electric power allocation by using the wave data. COPYRIGHT: (C)2003,JPO
Abstract:
An integrated circuit, a method and a system for designing and a method fabricating the integrated circuit. The method including: (a) generating a photomask level design of an integrated circuit design (300) of the integrated circuit, the photomask level design comprising a multiplicity of integrated circuit element shapes; (b) designating regions of the photomask level design between adjacent integrated circuit element shapes, the designated regions large enough to require placement of fill shaped (305) between the adjacent integrated circuit elements based on fill shape rules (310), the fill shapes not required for the operation of the integrated circuit; and (c) placing one or more monitor structure shapes (320) of a monitor structure (315) in at least one of the designated regions, the monitor structure not required for the operation of the integrated circuit.
Abstract:
Disclosed is a method and system for inserting redundant paths (40,50) into an integrated circuit. Particularly, the invention provides a method for identifying a single via (30) in a first path (40) connecting two elements, determining if an alternate route is available for connecting the two elements (10,20) (other than a redundant via (54)), and for inserting a second path (50)into the available alternate route (70). The combination of the first (40) and second paths (50) provides greater redundancy than inserting a redundant via (54) alone. More importantly, such redundant paths (50) provide for redundancy when congestion prevents a redundant via (54) from being inserted adjacent to the single via (30). An embodiment of the method further comprises removing the single via (30) and any redundant wire segments (51), if all of the additional vias (52) used to form the second path can be made redundant.
Abstract:
PROBLEM TO BE SOLVED: To provide a design tool which improves manufacturability of a design, namely, gives such a design that a fabricated wafer more exactly meets intended/assumed/modeled properties, at lower manufacturing cost and risk. SOLUTION: A design system for designing complex integrated circuits (ICs), a method of IC design, and program products therefor are provided. A layout unit receives a circuit description representing portions in a grid and glyph format. A checking unit checks grid and glyph portions of the design. An elaboration unit generates a target layout from the checked design. A data preparatory unit prepares the target layout for mask making. A pattern caching unit selectively replaces portions of the design with previously cached results for improved design efficiency. COPYRIGHT: (C)2006,JPO&NCIPI