Abstract:
본 발명은 아날로그/디지탈 변환 장치에 관한 것으로써, 특히, SOC(System-On-Chip) 구조에 포함되는 아날로그/디지탈 변환기에서 데이타 샘플링 시점의 전후 데이타를 프리 샘플링하여 출력되는 디지탈 변환값을 정확히 제어할 수 있도록 하는 기술을 개시한다. 이를 위해, 본 발명은 긴 주기를 가지는 디지탈 데이타를 프리 샘플링하여 저장하고 저장된 프리 샘플링 데이타의 연속성 성향을 확인하여 데이타의 유효성을 판단하며, 샘플링된 디지탈 데이타의 평균값과 유효한 프리 샘플링 데이타 값을 비교함으로써 최종적으로 출력되는 디지탈 데이타의 최하위 비트의 정확도를 향상시킬 수 있도록 한다.
Abstract:
본 발명은 아날로그 디지털 컨버터에 관한 것으로서, 보다 상세하게는 칩 내부의 입력라인에 차지되어 있는 전하를 디스차지 또는 프리차지시켜, 입력라인의 전압과 아날로그 입력전압의 차이에 따른 노이즈 발생을 방지할 수 있도록 하는데 있다. 이를 위해, 본 발명은 복수개의 채널의 아날로그 입력전압을 선택적으로 출력하는 스위칭그룹과, 입력라인의 전위를 상기 아날로그 입력전압과 동전위로 프리차지시키는 프리차지수단과, 상기 프리차지수단에 의해 프리차지된 후에 구동되어 상기 아날로그 입력전압을 전달하는 인에이블수단과, 상기 인에이블수단으로부터 전달된 상기 아날로그 입력전압을 기준전압과 비교 증폭하여 출력하는 비교부를 포함하여 구성함을 특징으로 한다.
Abstract:
PURPOSE: An analog-to-digital converter suitable for preventing a malfunction and reducing power consumption is provided to prevent an operational error by modifying high-bit data. CONSTITUTION: A partial voltage generation circuit generates a plurality of partial voltages for the N bits by dividing a reference voltage. A plurality of high-bits side comparators(11-1 to 11-7) are used for comparing the input voltage with each partial voltage. Each partial voltage is in a part of the plural partial voltages, which becomes data of high bits whose bit number is more than half of the N bits. A high-bits side encoding circuit(20) encodes the comparison results from the high-order comparators and outputs the encoded comparison results as high-bit data having the bit number of the high bits. A plurality of selection circuits(16-1 to 16-3) are used for selecting a part of the partial voltages, which becomes data of low bits with a bit number being defined as half of the plurality of N bits, in accordance with the comparison results of the high-bits side comparators. A plurality of low-bits side comparators(13-1 to 13-3) are used for comparing each partial voltage of the partial voltages selected by the selection circuits with the input voltage. A low-bits side encoding circuit(30) encodes the comparison outputs from the low-bits side comparators and outputs the encoded comparison results as low-bit data having the bit number of the low bits. A logic circuit(40) outputs N bits data based on a matching being made between the high-bit data and the low-bit data. When the matching stands between the high-bit data and the low-bit data, the N bits data are outputted in accordance with predetermined conditions. When the matching does not stands therebetween, the high-bit data are modified according to the low-bit data and the N bits data are outputted in accordance with predetermined conditions.
Abstract:
PURPOSE: An analog-digital converting device is provided to improve the speed for converting an analog signal into digital signal as a effective SAR design. CONSTITUTION: The analog-digital converting device comprises: a first unit(30) to generate a conversion starting signal informing a start of the analog-digital conversion and a channel selection signal in response to a first control signal and a plurality of address signals input from a core; a second unit(32) to generate an enable signal for enabling the analog-digital converting device in response to a second control signal and the address signals; a third unit(34) to receive a test clock signal for the analog-digital conversion and then select one from the two clock signals, and to divide the selected clock signal for using as a reference clock of a SAR unit; a fourth unit(36) which is a block to inform the start and the end of an operation of the SAR unit and to generate a conversion completion signal informing the completion of a analog-digital conversion for outputting to a result storing unit; and a fifth unit(40) to generate a digital signal of a reference voltage input to a comparison unit in response to the reference clock and the enable signal.
Abstract:
디지털 아날로그 컨버터의 정적 선형성 향상을 위한 분할 계층적 대칭 스위칭 기법 및 그를 위한 장치에 관한 것이다. 더욱 상세하게는, 시스템 에러의 대칭성을 이용하여 스위칭 순서를 제어하여 시스템 에러의 크기를 줄일 수 있는 디지털 아날로그 컨버터의 정적 선형성 향상을 위한 분할 계층적 대칭 스위칭 기법 및 그를 위한 장치에 관한 것이다.
Abstract:
PURPOSE: An analog to digital conversion system and a method for reducing noise in a touch sensor by integrating an analog signal are provided to measure time reaching a reference value by integrating a sample and a held signal. CONSTITUTION: A CDS(Correlated Double Sampling) circuit(110) extracts a signal factor generated by deducting a premeasured reference value from an analog wave signal received from an input terminal connected to a touch panel(200). A sampling circuit(120) changes an analog signal factor inputted from the CDS circuit into a signal of a step waveform. An integrator(130) integrates the signal of the step waveform for a predetermined time period. An output circuit(140) outputs a binary code according to sensing time by comparing a preset first reference value with an integrated value. The output circuit reduces noise from a touch sensor by integrating the analog signal.
Abstract:
PURPOSE: A WCDAC(Weighted Capacitor Digital-To-Analog Converter) using a charge sharing technique is provided to ensure a reduced chip area by reducing the size of a capacitor at the time of design of the WCDAC. CONSTITUTION: A WCDAC comprises an electric charge-non sharing charge unit(110), an electric charge-sharing charge unit(120), and an output unit(130). The electric charge-non sharing charge unit converts upper bits of digital data into analogue data. The electric charge-sharing charge unit is charged with electric charges corresponding to the data amount of the upper bits for the digital-to-analogue conversion. The electric charge-non sharing charge unit outputs the charged electric charges to the output unit. The electric charge-sharing charge unit converts lower bits of the digital data into analogue data. The output unit outputs the analog signal corresponding to the digital data based on the electric charges outputted the electric charge-non sharing charge unit.
Abstract:
PURPOSE: According to the condition automatic following circuit of the analog-digital converter is measurement the signal-noise ratio of the signal of the analog-digital converter and signal of computer signal it best suites, by sweeping the reference voltage although the external environment is used for the other place, the reliability can be offered. CONSTITUTION: The mag signal is when input signal is compared with high-low limit reference voltage created. When compared with the signal of computer signal standard voltage, the signal of computer signal is created The signal-noise ratio measuring unit(30) measures the signal-noise ratio of two inputs signal from the mag signal and the correlator(20) which is input the signal of computer signal of the analog/converter. If it falls less than the fixed threshold, it is enabled and in the control unit(40), the signal-noise ratio signal outputs the sweep signal for the generating reference voltage.