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    Protein structure
    341.
    发明申请
    Protein structure 审中-公开
    蛋白质结构

    公开(公告)号：US20080097080A1

    公开(公告)日：2008-04-24

    申请号：US11807922

    申请日：2007-05-30

    Applicant: John Sinclair ,  Martin Noble

    Inventor： John Sinclair ,  Martin Noble

    IPC: C07K14/00 ,  C12N1/00 ,  C12N15/62 ,  C12N15/63 ,  G06F19/00

    CPC classification number: C07K14/001 ,  C07K14/24 ,  C07K14/47 ,  C07K19/00 ,  C07K2319/00 ,  H01J37/20 ,  H01J37/295 ,  H01J2237/201

    Abstract: Protein structures 1 repeating regularly in one, two or three dimensions comprise protein protomers 2 which each comprise at least two monomers 5, 6 genetically fused together. The monomers 5, 6 are monomers of respective oligomer assemblies 3, 4 into which the monomers are assembled to assembly of the protein structure. The first oligomer assembly 3 has rotational symmetry axes including a set of rotational symmetry axes of order N, where N equals 2, 3, 4 or 6. The second oligomer assembly 4 has a rotational symmetry axis of the same order N as said set of rotational symmetry axes of said first oligomer assembly 3. Due to the symmetry of the oligomer assemblies 3, 4, the rotational symmetry axis axes of each second oligomer assembly 4 is aligned with one of said set of rotational symmetry axes of a first oligomer assembly 3 with N protomers being arranged symmetrically therearound. Thus, an N-fold fusion between the oligomer assemblies 3, 4 is produced and the arrangements of the rotational symmetry axes of the oligomer assemblies 3, 4 cause the protein structure to repeat regularly. The protein structure has many uses, for example to support molecular entities for x-ray crystallography or electron microscopy.

    Abstract translation: 在一个，两个或三个维度上规则重复的蛋白质结构1包含蛋白质反转录剂2，其每个包含至少两个遗传融合在一起的单体5,6。 单体5,6是相应低聚物组件3,4的单体，其中单体被组装成蛋白质结构的组装。 第一低聚物组件3具有旋转对称轴，其包括一组N级的旋转对称轴，其中N等于2,3,4或6.第二低聚物组件4具有与所述一组 所述第一低聚物组件3的旋转对称轴。 由于低聚物组件3,4的对称性，每个第二低聚物组件4的旋转对称轴线与第一低聚物组件3的所述一组旋转对称轴线中的一个对准，其中N个探测器对称地布置。 因此，产生低聚物组件3,4之间的N折融合，并且低聚物组件3,4的旋转对称轴的布置导致蛋白质结构定期重复。 蛋白质结构具有许多用途，例如用于支持X射线晶体学或电子显微镜的分子实体。

    DEVICE FOR PREPARING MICROSCOPY SAMPLES
    342.
    发明申请
    DEVICE FOR PREPARING MICROSCOPY SAMPLES 有权
    制备微观样品的装置

    公开(公告)号：US20080068707A1

    公开(公告)日：2008-03-20

    申请号：US11752570

    申请日：2007-05-23

    Applicant: Steven L. Goodman

    Inventor： Steven L. Goodman

    IPC: G02B21/00

    CPC classification number: G01N1/31 ,  B01L3/0275 ,  B01L3/502 ,  B01L2300/042 ,  B01L2300/0609 ,  B01L2300/0681 ,  G01N1/36 ,  G01N2035/0427 ,  G01N2035/1048 ,  G02B21/34 ,  H01J2237/20 ,  H01J2237/2007 ,  H01J2237/201

    Abstract: A device, method and system for preparing and storing samples for microscopic analysis is disclosed. The device provides a reservoir that can be attached to a displacement pipette thereby filling the reservoir with reagents desired for preparing the samples for microscopic analysis. In some embodiments, the specimen may be contained on a transmission electron microscope (TEM) grid. In other embodiments, the sample may be a light microscope (LM) specimen or a scanning electron microscope (SEM) specimen. In yet another embodiment, the invention provides a method of preparing samples for microscopic examination including a device for preparing TEM grids with, a device for preparing TEM, SEM or LM specimens with and a device for storing both grids and specimens in. In yet another embodiment, the invention provides a system for tracking the preparation, analysis and histological evaluation of multiple samples while also providing for their long term storage.

    Abstract translation: 公开了用于制备和存储用于显微镜分析的样品的装置，方法和系统。 该装置提供一个可以连接到移液移液管的储液器，从而用准备用于显微镜分析的样品所需的试剂填充储存器。 在一些实施例中，样品可以包含在透射电子显微镜（TEM）网格上。 在其他实施方案中，样品可以是光学显微镜（LM）样品或扫描电子显微镜（SEM）样品。 在另一个实施方案中，本发明提供了一种制备用于显微镜检查的样品的方法，包括用于制备TEM格栅的装置，用于制备TEM，SEM或LM样品的装置以及用于储存两个栅格和标本的装置。另外 本发明提供了一种用于跟踪多个样品的制备，分析和组织学评估的系统，同时还提供其长期储存。

    APPARATUS AND METHOD FOR ION BEAM IMPLANTATION USING RIBBON AND SPOT BEAMS
    343.
    发明申请
    APPARATUS AND METHOD FOR ION BEAM IMPLANTATION USING RIBBON AND SPOT BEAMS 有权
    使用RIBBON和SPOT BEAMS进行离子束植入的装置和方法

    公开(公告)号：US20080029716A1

    公开(公告)日：2008-02-07

    申请号：US11759876

    申请日：2007-06-07

    Applicant: Jiong CHEN

    Inventor： Jiong CHEN

    IPC: H01J37/08

    CPC classification number: H01J37/3171 ,  H01J37/05 ,  H01J37/08 ,  H01J37/1472 ,  H01J2237/04756 ,  H01J2237/057 ,  H01J2237/083 ,  H01J2237/1503 ,  H01J2237/201 ,  H01J2237/20221 ,  H01J2237/30472 ,  H01J2237/31701

    Abstract: An ion implantation apparatus with multiple operating modes is disclosed. The ion implantation apparatus has an ion source and an ion extraction means for extracting a ribbon-shaped ion beam therefrom. The ion implantation apparatus includes a magnetic analyzer for selecting ions with specific mass-to-charge ratio to pass through a mass slit to project onto a substrate. Multipole lenses are provided to control beam uniformity and collimation. A two-path beamline in which a second path incorporates a deceleration or acceleration system incorporating energy filtering is disclosed. Finally, methods of ion implantation are disclosed in which the mode of implantation may be switched from one-dimensional scanning of the target to two-dimensional scanning.

    Abstract translation: 公开了一种具有多种工作模式的离子注入装置。 离子注入装置具有离子源和用于从其提取带状离子束的离子提取装置。 离子注入装置包括用于选择具有特定质荷比的离子的磁分析器，以通过质量狭缝投影到基底上。 提供多极镜头以控制光束的均匀性和准直。 公开了一种二路光束线，其中第二路径包括并入能量过滤的减速或加速系统。 最后，公开了离子注入的方法，其中注入模式可以从目标的一维扫描切换到二维扫描。

    Method and apparatus for specimen fabrication
    345.
    发明授权
    Method and apparatus for specimen fabrication 有权
    用于样品制造的方法和装置

    公开(公告)号：US06828566B2

    公开(公告)日：2004-12-07

    申请号：US10395237

    申请日：2003-03-25

    Applicant: Satoshi Tomimatsu ,  Kaoru Umemura ,  Yuichi Madokoro ,  Yoshimi Kawanami ,  Yasunori Doi

    Inventor： Satoshi Tomimatsu ,  Kaoru Umemura ,  Yuichi Madokoro ,  Yoshimi Kawanami ,  Yasunori Doi

    IPC: H01J3720

    CPC classification number: G01N1/32 ,  G01N1/28 ,  G01N2001/028 ,  G01N2001/045 ,  G01N2001/282 ,  H01J37/20 ,  H01J37/302 ,  H01J37/3056 ,  H01J2237/2007 ,  H01J2237/201 ,  H01J2237/202 ,  H01J2237/31732 ,  H01J2237/31745 ,  H01J2237/31749

    Abstract: A specimen fabrication apparatus including a movable sample stage on which a specimen substrate is mounted, a probe connector for firmly joining a tip of a probe to a portion of the specimen substrate in a vicinity of an area on the specimen substrate to be observed in an observation apparatus, a micro-specimen separator for separating from the specimen substrate a micro-specimen to which the tip of the probe is firmly joined, the micro-specimen including the area on the specimen substrate to be observed and the portion of the specimen substrate to which the tip of the probe is firmly joined, a micro-specimen fixer for fixing the micro-specimen separated from the specimen substrate to a specimen holder of the observation apparatus, and a probe separator for separating the tip of the probe from the micro-specimen fixed to the specimen holder.

    Abstract translation: 一种试样制造装置，包括：安装有试样基板的可动试样台;探针连接器，用于将探针的前端牢固地接合到试样基板的一部分附近，以在待观察的样品基板上的区域 观察装置，用于从试样基板分离与探针的前端牢固接合的微型试样的微量试样分离体，包括待观察的试样基板上的区域的微量试样和试样基板的一部分 探针的尖端牢固地接合到其上的微型试样固定器，用于将从试样基板分离的微量样品固定到观察装置的试样支架上的探针分离器和用于将探针的尖端从微型 固定在样品架上。

    Method and apparatus for specimen fabrication
    346.
    发明申请
    Method and apparatus for specimen fabrication 有权
    用于样品制造的方法和装置

    公开(公告)号：US20030183776A1

    公开(公告)日：2003-10-02

    申请号：US10395237

    申请日：2003-03-25

    Inventor： Satoshi Tomimatsu ,  Kaoru Umemura ,  Yuichi Madokoro ,  Yoshimi Kawanami ,  Yasunori Doi

    IPC: H01J037/28 ,  G01N001/28

    CPC classification number: G01N1/32 ,  G01N1/28 ,  G01N2001/028 ,  G01N2001/045 ,  G01N2001/282 ,  H01J37/20 ,  H01J37/302 ,  H01J37/3056 ,  H01J2237/2007 ,  H01J2237/201 ,  H01J2237/202 ,  H01J2237/31732 ,  H01J2237/31745 ,  H01J2237/31749

    Abstract: A specimen fabrication apparatus including a movable sample stage on which a specimen substrate is mounted, a probe connector for firmly joining a tip of a probe to a portion of the specimen substrate in a vicinity of an area on the specimen substrate to be observed in an observation apparatus, a micro-specimen separator for separating from the specimen substrate a micro-specimen to which the tip of the probe is firmly joined, the micro-specimen including the area on the specimen substrate to be observed and the portion of the specimen substrate to which the tip of the probe is firmly joined, a micro-specimen fixer for fixing the micro-specimen separated from the specimen substrate to a specimen holder of the observation apparatus, and a probe separator for separating the tip of the probe from the micro-specimen fixed to the specimen holder.

    Abstract translation: 一种试样制造装置，包括：安装有试样基板的可动试样台;探针连接器，用于将探针的前端牢固地接合到试样基板的一部分附近，以在待观察的样品基板上的区域 观察装置，用于从试样基板分离与探针的前端牢固接合的微型试样的微量试样分离体，包括待观察的试样基板上的区域的微量试样和试样基板的一部分 探针的尖端牢固地接合到其上的微型试样固定器，用于将从试样基板分离的微量样品固定到观察装置的试样支架上的探针分离器和用于将探针的尖端从微型 固定在样品架上。

    AUTOMATED SAMPLE PREPARATION
    347.
    发明授权
    AUTOMATED SAMPLE PREPARATION 有权

    公开(公告)号：EP2699886B1

    公开(公告)日：2018-06-20

    申请号：EP12773637.9

    申请日：2012-04-23

    Applicant: FEI Company

    Inventor： GOTTLIEB, Paul

    IPC: G01N1/28 ,  H01J37/20 ,  G01N1/06 ,  G01N1/36

    CPC classification number: G01N1/28 ,  G01N1/06 ,  G01N1/286 ,  G01N1/36 ,  H01J2237/2007 ,  H01J2237/201

    Abstract: Mineral samples for use in analytical instruments are created by a system that greatly reduces the sample preparation time and facilitates automation. For example, in some implementations, rather than grinding to expose the interior of mineral particles in sample plug containing mineral particles in an epoxy compound, the sample plug is sliced with a saw, which more rapidly provides in many applications a sufficiently smooth surface on the exposed particle surfaces for observation. Rather than slowly mixing a slow curing epoxy to avoid introducing bubbles into the sample plug, some implementations use a fast settle fixative and a mechanical mixture that avoid bubbles.

    Preparation of sample for charged-particle microscopy
    348.
    发明授权
    Preparation of sample for charged-particle microscopy 有权
    带电粒子显微镜的样品制备

    公开(公告)号：EP3062082B1

    公开(公告)日：2018-04-18

    申请号：EP15156546.2

    申请日：2015-02-25

    Applicant: FEI COMPANY

    Inventor： Rémigy, Hervé-William

    IPC: G01N1/28 ,  H01J37/26 ,  H01J37/20 ,  G01N1/42

    CPC classification number: G01N1/2813 ,  G01N1/42 ,  H01J37/20 ,  H01J37/26 ,  H01J2237/002 ,  H01J2237/2001 ,  H01J2237/2002 ,  H01J2237/201 ,  H01J2237/208

    Abstract: A method of preparing a sample for study in a charged-particle microscope, comprising the following steps: - Providing a substantially planar sample holder having opposed faces substantially parallel to one another, comprising at least one aperture that connects said faces and across which a membrane has been mounted, which membrane comprises at least one perforation; - Spanning a film of aqueous liquid across said perforation, which liquid comprises at least one study specimen suspended therein, particularly comprising the following steps: - Prior to said spanning step, placing a blotting sheet of blotting material in intimate contact with a first surface of said membrane, at a side distal from said sample holder; - Depositing said aqueous liquid through said aperture and onto a second surface of said membrane, opposite said first surface; - Subsequently removing said blotting sheet from said membrane.

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