Abstract:
A charged particle emitting assembly comprises an emitter member (5) for emitting charged particles of one polarity. A tubular shield electrode (6) circumferentially surrounds the emitter member and is held in use at the same polarity as the charged particles. A tubular accelerating electrode (7) is positioned substantially coaxially with the shield electrode (6) and is held in use at the opposite polarity to the shield electrode. The arrangement is such that charged particles from the emitter member (5) initially spread laterally outwardly and then are focused into a beam which passes through the tubular accelerating electrode (7).
Abstract:
PROBLEM TO BE SOLVED: To provide an electron beam source device reducing an interaction between emitted electrons.SOLUTION: An electron beam source device 200 comprises a cold field or heat support type cold field emitter tip 201, an aperture opening 203, a suppressor electrode 204 and an extractor electrode 202 extracting an electron beam. An opening angle 102 of an electron beam is determined to be 2° or below the aperture angle being defined by a width of the aperture opening 203 and a distance ranged from 0.1 mm to 2 mm between the emitter tip 201 and the extractor electrode 202. The emitter tip 201 protrudes through the suppressor electrode 204.
Abstract:
The source of electrons is a nanotip in a vacuum as used in near field microscopy. The source of ions is a similar nanotip in vacuum supplied with liquid metal (gallium) as in a liquid-metal ion source. Electrons or ions from this nanometre-sized tip are extracted by centralising the tip over an aperture plate and applying a suitable voltage to the tip. The electrons (ions) pass through this plate and are accelerated up to several keV using a nanoscale/microscale accelerating column before being focussed using further microscale (or nanoscale) cylindrical lenses. The final element is an aberration corrected miniature (or sub-miniature) einzel lens which can focus the beam at several millimetres from the end of the instrument.
Abstract:
PURPOSE:To improve brightness and the throughput of an exposure device by accelerating an electron beam from an LaB6 cathode through an anode to which the higher voltage than the required acceleration voltage is applied and decelerating this electron beam through the anode to which required acceleration voltage is applied. CONSTITUTION:A secondary anode 8 is arranged between a first anode 5 and a cathode 1 (and a Wehnelt electrode 4) and a high voltage power supply 9 with the polarity shown in the figure is connected between this anode 8 and the first anode 5. Then the higher acceleration voltage V2 than the voltage V1 of the first anode 5 is applied to the second anode 8 and an electron from an LaB6 cathode 1 is accelerated through the second anode 8 and then this accelerated electron beam is decelerated through the first anode 5. As a result, the brightness of an electron gun is exceedingly increased and the throughput of the electron beam exposure device can be improved.
Abstract:
The present application relates to an electron beam emission device which is provided with a concave cathode and a holder and may operate more stably and produce a high output by inhibiting the occurrence of an arc, and an exemplary embodiment of the present application discloses an electron beam emission device including: a housing which defines a space in which electron beams are emitted; a cathode which is disposed at one side in the housing, and emits the electrons; an anode which is positioned in the housing so as to be spaced apart from the cathode toward the other side, and accelerates the electrons emitted from the cathode; and an insulation holder which insulates a portion between the cathode and the housing, and fixes the cathode, in which the cathode has a surface which faces the anode and is formed concavely to have a gradient, and a rim of the surface of the cathode, which has the gradient, is formed to be rounded.
Abstract:
The invention relates to an apparatus for generating a plurality of charged particle beamlets and a charged particle beam lithography system comprising such an apparatus, said apparatus comprising: a charged particle source (1) for generating a diverging charged particle beam; a collimating means (4) for collimating said diverging charged particle beam, wherein said collimating means comprises at least one deflector array, said deflector array adapted for having a voltage applied to each deflector of said deflector array for deflecting a beamlet (8),
wherein at least one deflector of said deflector array is adapted to assert a deflecting effect proportional to its distance with respect the optical axis of the beam.
Abstract:
An emitter assembly for emitting a charged particle beam along an optical axis is described. The emitter assembly being housed in a gun chamber and includes an emitter having an emitter tip, wherein the emitter tip is positioned at a first plane perpendicular to the optical axis and wherein the emitter is configured to be biased to a first potential, an extractor having an opening, wherein the opening is positioned at a second plane perpendicular to the optical axis and wherein the extractor is configured to be biased to a second potential, wherein the second plane has a first distance from the first plane of 2.25 mm and above.
Abstract:
An electron gun includes a cathode (1), a bias electrode (4a,4b), and an anode (6) disposed along a common axis in order thereof. In the electron gun, an electron emitting surface of the cathode has such an aspherical shape that brightness of a crossover is more uniform than that in a case that both a first region including a point on the axis and a second region located outside the first region have a first radius of curvature.