Abstract:
PURPOSE: A phase change memory device and a method for manufacturing the same are provided to prevent a thermal cross talk phenomenon by forming a phase change material pattern in a diagonal direction. CONSTITUTION: Word lines(20) are arranged in a second direction. The second direction is orthogonal to a first direction. Bottom electrodes(40) are arranged on the word lines. The bottom electrodes are arranged with a first tilt angle in the first direction. Phase change material patterns(50) are arranged on the bottom electrodes. [Reference numerals] (AA) First direction; (BB) Second direction
Abstract:
PURPOSE: A method for manufacturing a semiconductor device is provided to prevent material reaction between a sacrificial layer and a bottom electrode by forming a conformal silicide preventing layer in the inner wall of an opening part. CONSTITUTION: A sacrificial layer(151,153) and a support layer(152,154) are successively laminated on a composite layer(150). The composite layer is formed on a substrate(100). A plurality of opening passing through the composite layer are formed. The opening unit exposes a lower contact plug(130) via the composite layer and an etch stop layer(140). A bottom electrode(180) is formed in the plurality of opening parts. A part of a support layer and a part or the entire of the sacrificial layer are removed. A silicide preventing layer(170) is formed in the inner wall of the opening part.
Abstract:
PURPOSE: A method for precisely aligning a wafer stage, a device thereof, and an exposure device including the same are provided to form a photoresist pattern with a desirable shape by improving overlay accuracy between a wafer stage and a reticle holder. CONSTITUTION: Diagonal directions of a wafer stage are arranged in an X axis and a Y axis(ST150). The wafer stage moves along the X axis(ST152). A first coordinate of the wafer stage is measured in a first location inclined to the X-axis(ST154). The wafer stage moves along the Y axis(ST156). A second coordinate of the wafer stage is measured in a second location inclined to the Y axis(ST158).
Abstract:
PURPOSE: A tub and a washing machine including the same are provided to reduce manufacturing costs by screwed combining a front tub and a rear tub without a plurality of screws. CONSTITUTION: A washing machine comprises a tub which is composed of a front tub(21) and a rear tub(26). The front tub and the rear tub are combined each other and form a screw part, respectively. The front tub and the rear tub are screwed. One or more stopper(24) is formed on the exterior of one among the front tub and the rear tub and forms a combining hole(25). One or more protrusion(29) which is inserted in the combining hole is formed on the exterior of the other among the front tub and the rear tub.
Abstract:
A unit for cleaning a rotation body and a vacuum pump having the same are provided to form a layer for preventing process byproducts from being adhered by employing a cleaning unit that is placed between protrusions prepared on the rotation body. A rotation body(100) has protrusions(120) and a rotation shaft(110). A cleaning unit(300) is arranged near to the protrusions to clean the rotation body. The cleaning unit is comprised of a cleaning body(310) with a chamber formed therein, injection holes(350) communicating the chamber with the outside and being formed on an outer circumference of the cleaning body toward the rotation body, a supply channel(330) being formed on the cleaning body to couple the chamber to the outside, and a supplier(320) being connected to the supply channel to supply a cleaning material into the chamber. The cleaning body is arranged to wrap the rotation shaft. The chamber has inclined surfaces which are symmetrical to each other on the basis of a perpendicular with respect to the rotation shaft.
Abstract:
기판 노광 공정에 사용되는 레티클에 있어서, 이미지 패턴이 형성된 유리 기판과, 상기 이미지 패턴의 오염을 방지하기 위한 보호 기판과 상기 유리 기판과 보호 기판 사이에 구비되며, 상기 기판들 사이에서 진공 상태로 유지되며, 그 내부에는 불활성 가스가 충진되어 있는 공간을 형성하기 위한 개스킷과 상기 보호 기판 이 오염되는 것을 방지하기 위한 펠리클막을 포함한다. 상기 밀폐 공간은 진공 상태로 유지되며, 그 내부에는 불활성 가스가 충진되어 있다. 따라서, 상기 유리 기판과 보호 기판 사이의 오염 물질의 제거 및 성장성 이물질 발생을 억제하며, 상기 기판들 사이이 탈부착의 용이성을 확보할 수 있다.