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公开(公告)号:KR101720373B1
公开(公告)日:2017-03-27
申请号:KR1020130066588
申请日:2013-06-11
Applicant: 도쿄엘렉트론가부시키가이샤
IPC: H05H1/46 , H01L21/205 , H01L21/3065
Abstract: 장치의구성을간소화할수 있음과아울러, 플라즈마의생성효율의저하를방지할수 있는플라즈마처리장치를제공한다. 플라즈마처리장치(10)는, 챔버(11)와, 상기챔버(11)의내부에배치되어기판 S를탑재하는탑재대(12)와, 챔버(11)의외부에있어서탑재대(12)와대향하도록배치되어고주파전원(26)에접속되는 ICP 안테나(13)와, 탑재대(12) 및 ICP 안테나(13)의사이에개재하는, 도전체로이루어지는창 부재(14)를구비하며, 창부재(14)는복수의분할편(27)으로분할되고, 복수의분할편(27)은서로절연됨과아울러도선(29)이나콘덴서부착된도선(30)으로접속되어폐회로(31)를형성한다.
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公开(公告)号:KR1020130141397A
公开(公告)日:2013-12-26
申请号:KR1020130068486
申请日:2013-06-14
Applicant: 도쿄엘렉트론가부시키가이샤
IPC: H01L21/687 , C23C16/455 , C23C16/509 , H01L21/02
CPC classification number: H01L21/02104 , C23C16/45519 , C23C16/4554 , C23C16/45551 , C23C16/509 , H01L21/02164 , H01L21/02167 , H01L21/0217 , H01L21/02274 , H01L21/0228 , H01L21/0234 , H01L21/68764 , H01L21/68771
Abstract: The present invention installs a plasma processing unit which is separated to the rotation direction of a rotation table for each processing gas nozzle. The present invention installs a bias electrode unit in a position which is touched to the plasma processing unit through a rotation table in order not to be touched to the rotation table. The present invention is provided to apply bias voltage from a voltage applying unit to the bias electrode unit, thereby applying a non-touch bias voltage to a wafer (W) on the rotation table. [Reference numerals] (120) Bias electrode unit;(AA) Plasma generation gas;(BB) O_2 gas;(CC,DD) N_2 gas
Abstract translation: 本发明安装一个等离子体处理单元,该等离子体处理单元与每个处理气体喷嘴的旋转台的旋转方向分开。 本发明通过旋转台将偏置电极单元安装在与等离子体处理单元接触的位置,以便不与旋转台接触。 本发明提供用于将偏置电压从电压施加单元施加到偏置电极单元,从而对旋转台上的晶片(W)施加非触摸偏置电压。 (附图标记)(120)偏置电极单元;(AA)等离子体产生气体;(BB)O_2气体;(CC,DD)N_2气体
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公开(公告)号:KR101794380B1
公开(公告)日:2017-11-06
申请号:KR1020130068486
申请日:2013-06-14
Applicant: 도쿄엘렉트론가부시키가이샤
IPC: H01L21/687 , C23C16/455 , C23C16/509 , H01L21/02
CPC classification number: H01L21/02104 , C23C16/45519 , C23C16/4554 , C23C16/45551 , C23C16/509 , H01L21/02164 , H01L21/02167 , H01L21/0217 , H01L21/02274 , H01L21/0228 , H01L21/0234 , H01L21/68764 , H01L21/68771
Abstract: 본발명은각 처리가스노즐에대해회전테이블의회전방향으로이격시켜플라즈마처리부를설치하는동시에, 회전테이블을통해플라즈마처리부를면하는위치에, 당해회전테이블에접촉하지않도록바이어스전극부를설치하는것이다. 그리고, 이바이어스전극부에대해, 바이어스전압인가부로부터바이어스전압을인가함으로써, 회전테이블상의웨이퍼(W)에대해비접촉으로바이어스전압을인가한다.
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4.
公开(公告)号:KR1020130139779A
公开(公告)日:2013-12-23
申请号:KR1020130066588
申请日:2013-06-11
Applicant: 도쿄엘렉트론가부시키가이샤
IPC: H05H1/46 , H01L21/205 , H01L21/3065
CPC classification number: H01J37/321 , H01J37/3211 , H01J37/32119 , H01J37/32183 , H05H1/46
Abstract: A plasma treatment apparatus is provided, which is capable of simplifying the configuration thereof and preventing the deterioration of plasma generation efficiency. The plasma treatment apparatus (10) comprises: a chamber (11); a mount (12) arranged inside the chamber (11) to mount a substrate (S); an ICP antenna (13) arranged to be opposite to the mount (12) outside the chamber (11) and connected to a high-frequency power source (26); and a window member (14) interposed between the mount (12) and the ICP antenna (13) and made up of a conductor, wherein the window member (14) is divided into a plurality of segments (27) and the segments (27) are insulated from each other and connected to a wire (29) or a wire (30) having a condenser attached thereto to form a closed circuit (31).
Abstract translation: 提供了一种等离子体处理装置,其能够简化其构造并且防止等离子体产生效率的劣化。 等离子体处理装置(10)包括:腔室(11); 布置在所述腔室(11)内部以安装衬底(S)的安装件(12); ICP天线(13),布置成与腔室(11)外部的安装件(12)相对并连接到高频电源(26); 以及插入在所述安装件(12)和所述ICP天线(13)之间并由导体构成的窗构件(14),其中所述窗构件(14)被分成多个段(27)和所述段(27) )彼此绝缘并且连接到具有连接到其上的冷凝器的线(29)或线(30)以形成闭合回路(31)。
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5.
公开(公告)号:KR101718182B1
公开(公告)日:2017-03-20
申请号:KR1020130067634
申请日:2013-06-13
Applicant: 도쿄엘렉트론가부시키가이샤
Abstract: 장치의구성을간소화할수 있음과아울러, 플라즈마의생성효율의저하를방지할수 있는플라즈마처리장치를제공한다. 플라즈마처리장치(10)는, 챔버(11)와, 해당챔버(11)의내부에배치되고기판 S를탑재하는탑재대(12)와, 챔버(11)의외부에서탑재대(12)와대향하도록배치되고고주파전원(26)에접속되는 ICP 안테나(13)와, ICP 안테나(13)와대향하는챔버(11)의벽부를구성하고, 탑재대(12) 및 ICP 안테나(13)의사이에개재되는, 도전체로이루어지는창 부재(14)와, 창부재(14)에양단이접속되는도선(28)을구비하며, 창부재(14) 및도선(28)은폐회로를형성하고, 도선(28)은콘덴서(29)를가진다.
Abstract translation: 提供一种能够简化装置结构并防止等离子体产生效率降低的等离子体处理装置。 等离子体处理装置10包括腔室11,配置在腔室11内用于载置基板S的载置台12, 以及连接到RF电源26和腔室11的面向ICP天线13的壁部分的ICP天线13.ICT天线13连接到ICP天线13, 窗部件14由导电材料制成,导线28连接到窗部件14的两端。窗部件14和导线28形成隐藏电路, 它有一个29。
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公开(公告)号:KR101672078B1
公开(公告)日:2016-11-02
申请号:KR1020130153691
申请日:2013-12-11
Applicant: 도쿄엘렉트론가부시키가이샤
IPC: H01L21/687 , C23C16/458 , C23C16/455 , H01J37/32 , H01L21/02
CPC classification number: H01J37/321 , C23C16/45536 , C23C16/45551 , C23C16/4584 , H01J37/32082 , H01J37/3211 , H01J37/3244 , H01J37/32651 , H01J37/32715 , H01J37/32733 , H01J37/32752 , H01L21/02164 , H01L21/02167 , H01L21/0217 , H01L21/02211 , H01L21/02214 , H01L21/02219 , H01L21/02274 , H01L21/0228 , H01L21/68764 , H01L21/68771
Abstract: 진공용기내에서기판에대해성막처리를행하도록구성된성막장치는, 상기기판을적재하도록구성된기판적재영역을공전시키도록구성된회전테이블과, 상기기판적재영역에처리가스를공급하도록구성된처리가스공급부를포함하고, 상기회전테이블의회전에수반하여상기기판상에분자층혹은원자층을순차적층하여박막을형성하도록구성된성막영역과, 상기성막영역에대해상기회전테이블의회전방향으로이격되어형성된플라즈마발생영역에서, 플라즈마발생용가스의플라즈마화에의해생성된플라즈마에의해상기분자층혹은원자층을개질처리하도록구성된플라즈마처리부와, 플라즈마중의이온을상기기판의표면에인입시키기위해, 상기회전테이블상의상기기판의높이보다도하방측에설치된하측바이어스전극및 상기높이와동일하거나혹은당해높이보다도상방측에배치된상측바이어스전극과, 상기하측바이어스전극및 상기상측바이어스전극중 적어도한쪽에접속되고, 상기하측바이어스전극및 상기상측바이어스전극이상기플라즈마발생영역을사이에두고용량결합되어상기기판에바이어스전위를형성하도록구성된고주파전원부와, 상기진공용기내를배기하도록구성된배기기구를구비한다.
Abstract translation: 用于对基板进行成膜处理的成膜装置包括旋转台,成膜区域,被配置为包括处理气体供给部,等离子体处理部,设置在位置的下侧的下偏置电极 位于旋转台上的基板的高度,布置在高度位置的相同位置的上偏置电极或高度位置的上侧;高频电源部分,连接到下偏置电极和下偏置电极中的至少一个; 所述上偏置电极并且被配置为以所述下偏置电极和所述上偏置电极电容耦合的方式在所述衬底上形成偏置电位,以及排气机构。
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公开(公告)号:KR101654968B1
公开(公告)日:2016-09-06
申请号:KR1020140013114
申请日:2014-02-05
Applicant: 도쿄엘렉트론가부시키가이샤
IPC: H01L21/687 , H01J37/32 , C23C16/455
CPC classification number: C23C16/45519 , C23C16/4554 , C23C16/45551 , H01J37/32541 , H01J37/32568 , H01J37/32715 , H01J37/32733
Abstract: 회전테이블(2)의하방측에서개질영역(S1)에대향하는위치에바이어스전극(120)을배치함과함께, 개질영역(S1)의상방측에패러데이실드(95)를배치하고, 이들바이어스전극(120)과패러데이실드(95)를용량결합시켜상기개질영역(S1)에바이어스전계를형성한다. 그리고, 바이어스전극(120)에대해서, 회전테이블(2)의회전방향에서의폭 치수(t)가서로인접하는웨이퍼(W)끼리의이격치수(d)보다도작게되도록형성하여, 서로인접하는웨이퍼(W)에대해동시에바이어스전계가가해지는것을방지하면서, 각웨이퍼(W)에대해개별로바이어스전계를형성한다.
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公开(公告)号:KR1020140100442A
公开(公告)日:2014-08-14
申请号:KR1020140013114
申请日:2014-02-05
Applicant: 도쿄엘렉트론가부시키가이샤
IPC: H01L21/687 , H01J37/32 , C23C16/455
CPC classification number: C23C16/45519 , C23C16/4554 , C23C16/45551 , H01J37/32541 , H01J37/32568 , H01J37/32715 , H01J37/32733 , H01L21/68714
Abstract: A bias electrode (120) is arranged in a position which faces a reforming region (S1) in the lower part of a rotation table (2). A faraday shield (95) is arranged in the front part of the reforming region (S1). A bias electric field is formed in the reforming region (S1) by the capacitive coupling of the bias electrode (120) and the faraday shield (95). And, with regard to the bias electrode (120), a width dimension (t) in the rotation direction of the rotation table (2) is smaller than the separation demission (d) between adjacent wafers, thereby preventing the bias electric field from being simultaneously applied to the adjacent wafers and individually forming a bias electric field with regard to each wafer.
Abstract translation: 偏置电极(120)配置在与旋转台(2)的下部的重整区域(S1)相对的位置。 在重整区域(S1)的前部设有法拉第罩(95)。 通过偏置电极(120)和法拉第屏蔽(95)的电容耦合,在重整区(S1)中形成偏置电场。 并且,关于偏置电极(120),旋转台(2)的旋转方向的宽度尺寸(t)小于相邻晶片间的分离离子(d),从而防止偏置电极 同时施加到相邻晶片并且相对于每个晶片分别形成偏置电场。
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公开(公告)号:KR1020140077841A
公开(公告)日:2014-06-24
申请号:KR1020130153691
申请日:2013-12-11
Applicant: 도쿄엘렉트론가부시키가이샤
IPC: H01L21/687 , C23C16/458 , C23C16/455 , H01J37/32 , H01L21/02
CPC classification number: H01J37/321 , C23C16/45536 , C23C16/45551 , C23C16/4584 , H01J37/32082 , H01J37/3211 , H01J37/3244 , H01J37/32651 , H01J37/32715 , H01J37/32733 , H01J37/32752 , H01L21/02164 , H01L21/02167 , H01L21/0217 , H01L21/02211 , H01L21/02214 , H01L21/02219 , H01L21/02274 , H01L21/0228 , H01L21/68764 , H01L21/68771
Abstract: A film formation apparatus, which is configured to conduct a film formation process for a substrate in a vacuum chamber, includes a rotating table configured to revolve a substrate loading area configured to load a substrate thereon; a film formation area configured to include a process gas supply part configured to supply a process gas to the substrate mounting area and sequentially laminate a molecular layer or an atomic layer on the substrate with rotation of the rotating table to form a thin film; a plasma processing part configured to conduct modification processing on the molecular layer or the atomic layer by plasma produced through plasma formation of a gas for plasma generation in a plasma generation area formed separately from the film formation area in a direction of rotation of the rotating table; a lower bias electrode provided at a lower side of the height position of the substrate on the rotating table to attract ions in the plasma to a surface of the substrate; an upper bias electrode arranged at the same height position or an upper side of the height position of the substrate; a high-frequency power source part connected to at least one of the lower bias electrode and the upper bias electrode and configured to form a bias electric potential on the substrate in such a manner that the lower bias electrode and the upper bias electrode are capacitively coupled through the plasma generation area; and an exhaust device configured to evacuate inside of the vacuum chamber.
Abstract translation: 构造成在真空室中进行基板的成膜处理的成膜装置包括旋转台,被配置为旋转被配置为在其上装载基板的基板装载区域; 成膜区域,其被配置为包括处理气体供给部,其被配置为向所述基板安装区域提供处理气体,并且通过所述旋转台的旋转顺序地将所述基板上的分子层或原子层层叠以形成薄膜; 等离子体处理部,其被配置为通过等离子体形成等离子体形成等离子体生成等离子体生成等离子体生成区域,使其在分子层或原子层上进行改性处理,所述等离子体产生区域与所述成膜区域分开地形成在所述旋转台的旋转方向上 ; 下偏置电极,设置在旋转台上的基板的高度位置的下侧,以将等离子体中的离子吸引到基板的表面; 布置在所述基板的高度位置的相同高度位置或上侧的上偏置电极; 连接到所述下偏置电极和所述上偏置电极中的至少一个的高频电源部,并且被配置为以所述下偏置电极和所述上偏置电极电容耦合的方式在所述基板上形成偏置电位 通过等离子体发生区域; 以及构造成在真空室内抽真空的排气装置。
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10.
公开(公告)号:KR1020130140571A
公开(公告)日:2013-12-24
申请号:KR1020130067634
申请日:2013-06-13
Applicant: 도쿄엘렉트론가부시키가이샤
CPC classification number: H01J37/321 , H01J37/3211 , H01J37/32119 , H01J37/32192 , H05H1/46
Abstract: A plasma treatment apparatus is provided, which is capable of simplifying the configuration thereof and preventing the deterioration of plasma generation efficiency. The plasma treatment apparatus (10) comprises: a chamber (11); a mount (12) arranged inside the chamber (11) to mount a substrate (S); an ICP antenna (13) arranged to be opposite to the mount (12) outside the chamber (11) and connected to a high-frequency power source (26); a window member (14) forming a wall portion of the chamber (11) facing the ICP antenna (13), interposed between the mount (12) and the ICP antenna (13) and made up of a conductor; a wire (28) having both ends connected to the window member (14), wherein the window member (14) and the wire (28) form a closed circuit and the wire (28) has a condenser (29).
Abstract translation: 提供了一种等离子体处理装置,其能够简化其构造并且防止等离子体产生效率的劣化。 等离子体处理装置(10)包括:腔室(11); 布置在所述腔室(11)内部以安装衬底(S)的安装件(12); ICP天线(13),布置成与腔室(11)外部的安装件(12)相对并连接到高频电源(26); 窗口构件(14),形成面对ICP天线(13)的室(11)的壁部,插入在安装件(12)和ICP天线(13)之间并由导体构成; 具有连接到窗构件(14)的两端的线(28),其中窗构件(14)和线(28)形成闭合回路,并且线(28)具有冷凝器(29)。
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