Abstract:
An apparatus includes a virtual memory manager that moves data from a first block (A) to a second block (B) in memory. When the virtual memory manager is ready to transfer data from the first block to the second block, a third, temporary block (C) of memory is defined. The translation table in a DMA controller is changed to point DMA transfers that target the first block to instead target the temporary block. The virtual memory manager then transfers data from the first block to the second block. When the transfer is complete, a check is made to see if the DMA transferred data to the temporary block while the data from the first block was being written to the second block. If so, the data written to the temporary block is written to the second block. A hardware register is preferably used to efficiently detect changes to the temporary block.
Abstract:
PROBLEM TO BE SOLVED: To provide a multilevel memory architecture with data prioritization. SOLUTION: In a method of controlling computer-readable memory that includes a plurality of memory locations, a usage frequency of a data unit stored in a first memory location is determined. The data unit is moved to a second memory location different from the first memory location that is selected based on a correspondence between a known latency of the second memory location and the usage frequency of the data unit, in which the second memory location is the primary data storage location for the data unit. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a method and an apparatus enabling an electronic system implemented using a field effect transistor (FET) to reduce a threshold voltage shift due to bias temperature instability (BTI). SOLUTION: The VT shift due to BTI is accumulated when a FET is in a particular voltage stress state. A number of memory elements in the electronic system store the same data over substantially the life of the system. As a result, the VT shift due to BTI significantly occurs in a FET in the memory element. An embodiment of the present invention guarantees that a specific memory element is in a first state for a first portion of the time for which the electronic system is operated, and data is stored in a first phase in the memory element for the period of time, and a specific memory element is in a second state for a second portion of the time for which the electronic system is operated, and data is stored in a second phase in the memory element for the period of time. COPYRIGHT: (C)2006,JPO&NCIPI
Abstract:
PROBLEM TO BE SOLVED: To provide a structure and a method for implementing power saving in addressing of a DRAM device. SOLUTION: A random access memory device includes an array of individual memory cells arranged into rows and columns, and each memory cell has a corresponding access device. Assuming N as the number corresponding to the number of independently accessible partitions of the array, each row of the array further includes a corresponding plurality of N word lines, and each access device in a given row is coupled to only one of the N word lines of the rows. An address decoder communicating with the array receives a plurality of row address bits, and determines which of the N partitions in a requested row must be accessed on the requested row identified by the row address bits, and does not activate the access device within the selected row but not within the partition to be accessed. COPYRIGHT: (C)2009,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a clocked memory device that contains programming mechanisms to set a write recovery time as a function of input clocks. SOLUTION: The clocked memory device contains programming mechanisms that permit setting the write recovery time dynamically as some function of input clocks. In one of the preferred implementations, the programming mechanisms contain a control register, which has programmable bits that can specify the write recovery time responding to their bit value. For instance, it can specify the write recovery time as a multiple of integer or fraction of clock cycles. Specifying a write recovery time as a function of clock that can be specified dynamically makes it possible to use the clocked memory device at its highest performing capability over a wide range of operating frequency.
Abstract:
A DRAM having on-chip ECC (30) and both bit and word redundancy that have been optimized to support the on-chip ECC. The bit line redundancy features a switching network that provides an any-for-any substitution for the bit lines in the associated memory array. The word line redundancy is provided in a separate array section (20), and has been optimized to maximize signal while reducing soft errors. The array stores data in the form of error correction words (ECWs) on each word line. A first set of data lines (formed in a zig-zag pattern to minimize unequal capacitive loading on the underlying bit lines) are coupled to read out an ECW as well as the redundant bit lines. A second set of data lines receive the ECW as corrected by bit line redundancy, and a third set of data lines receive the ECW as corrected by the word line redundancy. The third set of data lines are coupled to the ECC block, which corrects errors encountered in the ECW. The ECC circuitry (30) is optimized to reduce the access delays introduced by carrying out on-chip error correction. The ECC block (30) provides both the corrected data bits and the check bits to an SRAM (40). Thus, the check bits can be externally accessed, improving testability of the memory chip. At the same time, having a set of interrelated bits in the SRAM (40) improves access performance when using multi-bit access modes, which compensates for whatever access delays are introduced by the ECC. To maximize the efficiency of switching from mode to mode, the modes are set as a function of received address signals.
Abstract:
A method and device for setting at lease three operating modes of a memory device is provided. The voltage signal is sensed at a first input and an enable signal is sensed at a second input. When an enable signal is received at a second input the memory device operates at the first operating mode if the voltage state at the first input is low; it operates at a second mode if the voltage state at the second is high; and it operates at a third operating mode if the voltage at the first input changes after the enable signal is received at the input. Also a four mode operation can be achieved.
Abstract:
Low power addressing systems are provided which include a given number of memory segments (26, 28, 30, 32, 34, 38), each having word and bit/sense lines, a given number of decoders (42, 44, 46, 48, 50, 52, 54, 56) coupled to the given number of memory segments (26, 28, 30, 32, 34, 36, 38) for selecting one word line in each of the memory segments (26, 28, 30, 32, 34, 36, 38), a first plurality of transmission gate systems (58, 60, 62, 64), each having first (92) and second (94) transmission gates, with each of the gates being coupled to a different one of the decoders (42, 44, 46, 48, 50, 52, 56), a second decoder (66) having the first plurality of outputs, each of the outputs being coupled to a respective one of the transmission gate systems (58, 60, 62, 64), first control circuits for selectively activating the first (92) and second (94) gates in each of the first plurality of transmission gate systems (58, 60, 62, 64), a third given number of decoders (68, 70, 72, 74, 76, 80, 82) coupled to the given number of memory segments (26, 28, 30, 32, 34, 36, 38) for selecting one bit/sense line in each of the memory segments (26, 28, 30, 32, 34, 36, 38), a second plurality of transmission gate systems (84, 86, 88, 90), each having first (102) and second (104) transmission gates, with each of the gates of the second plurality of transmission gate systems (84, 86, 88, 90) being coupled to a different one of the third given number of decoders (26, 28, 30, 32, 34, 36, 38), and second control circuits for selectively activating the first (102) and second (104) gates of each of the third plurality of transmission gate systems (26, 28, 30, 32, 34, 36, 38).
Abstract:
Low power addressing systems are provided which include a given number of memory segments (26, 28, 30, 32, 34, 38), each having word and bit/sense lines, a given number of decoders (42, 44, 46, 48, 50, 52, 54, 56) coupled to the given number of memory segments (26, 28, 30, 32, 34, 36, 38) for selecting one word line in each of the memory segments (26, 28, 30, 32, 34, 36, 38), a first plurality of transmission gate systems (58, 60, 62, 64), each having first (92) and second (94) transmission gates, with each of the gates being coupled to a different one of the decoders (42, 44, 46, 48, 50, 52, 56), a second decoder (66) having the first plurality of outputs, each of the outputs being coupled to a respective one of the transmission gate systems (58, 60, 62, 64), first control circuits for selectively activating the first (92) and second (94) gates in each of the first plurality of transmission gate systems (58, 60, 62, 64), a third given number of decoders (68, 70, 72, 74, 76, 80, 82) coupled to the given number of memory segments (26, 28, 30, 32, 34, 36, 38) for selecting one bit/sense line in each of the memory segments (26, 28, 30, 32, 34, 36, 38), a second plurality of transmission gate systems (84, 86, 88, 90), each having first (102) and second (104) transmission gates, with each of the gates of the second plurality of transmission gate systems (84, 86, 88, 90) being coupled to a different one of the third given number of decoders (26, 28, 30, 32, 34, 36, 38), and second control circuits for selectively activating the first (102) and second (104) gates of each of the third plurality of transmission gate systems (26, 28, 30, 32, 34, 36, 38).