Abstract:
PROBLEM TO BE SOLVED: To provide a controlled erasing method in a flash EEPROM device which does not require structural change of memory. SOLUTION: A controlled erasing method comprises at least a step (40) of supplying at least one erase pulse to cell of memory array, a step of comparing a threshold value voltage of cell erased with a certain lower threshold value, a step of performing selectively soft programming to the erased cell having the threshold value voltage lower than the lower threshold value voltage and a step (42) of verifying that the erased cell has the threshold value higher than the lower threshold value. When the erased cells of the predetermined number, which is at least one, have the threshold value higher than the first threshold value, only one erase pulse is given to all cells (44), and the selective soft programming and verify step are repeated.
Abstract:
The invention relates to a programming method of a multilevel memory cell able to store a plurality of bits in a plurality of levels (N), the method comprising at least a step of writing a logic value in the multilevel memory cell by setting one of the programming levels (LA) thereof, these levels being included in the plurality of levels (N), with respect to a reference level (LR) according to the symbol to be written and to a previous programming level. The writing step is repeated until a highest possible value (Lmax) for the levels (LS, LR) is reached. The invention relates also to a multilevel memory device comprising a plurality of multilevel memory cells organised into sectors, split into a plurality of data units (UD) whereon a programming operation is performed in parallel according to the method of the invention.
Abstract:
The method includes restoring the charge lost from memory cells, such as to restore the original voltage levels, within a time equivalent to the retention time. The decision concerning when the memory is to be restored is taken for example when the memory is switched on, based on the time elapsed since the previous programming/restoration, or based on the difference between the present threshold voltage of the reference cells and the original threshold voltage of the (suitably stored) reference cells, or when predetermined operating conditions occur. This makes it possible to prolong the life of nonvolatile memories, in particular of multilevel type, wherein the retention time decreases as the number of levels (bits/cell) is increased.
Abstract:
It is described a programming method for a multilevel memory cell able to store a plurality of bits in a plurality of levels. The method comprises the phases of: initially programming a cell threshold value to a first set of levels [0;(m-1)] being m a submultiple of the plurality of levels of the multilevel cell; reprogramming without erasing another set of levels [m;(2m-1)] containing the same number m of levels as the first set; reiterating the reprogramming without erasing phase until the levels of the multilevel cell are exhausted. It is also described a multilevel memory device of the type comprising a plurality of multilevel memory cells organized into sectors, the sectors being themselves split into a plurality of data units wherein a data updating operation is performed in parallel, the data units being programmed by means of the programming method.