SCANNING TESTER FOR DIGITAL SYSTEM WITH DYNAMIC RANDOM ACCESS MEMORY

    公开(公告)号:JPS6446293A

    公开(公告)日:1989-02-20

    申请号:JP9332888

    申请日:1988-04-15

    Abstract: PURPOSE: To test a memory system functionally by synchronizing the refresh period of a DRAM with a testing cycle and initially setting the DRAM such that its content is uniquely determined even at pseudo random. CONSTITUTION: A system to be tested by a scanning testing device 10 includes a central processing unit(CPU) 14 connected to a memory system 16 via address and data busses 18 and 20. The memory system 16 includes a support circuit in the form of a memory controller 32 connected to a DRAM array 30 via address, data and control lines 33. The testing device 10 is permitted to access a refresh counter included in the memory controller 32 and including the setting of a refreshing period, the refreshing speed of the DRAM array 30 is synchronized with the starting of a testing mode. Thus, at least the digital system having the memory system including the DRAM is tested functionally.

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