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    ATTENUATED TOTAL REFLECTION MEASURING APPARATUS CAPABLE OF RAMAN SPECTRAL MEASUREMENT
    93.
    发明公开
    ATTENUATED TOTAL REFLECTION MEASURING APPARATUS CAPABLE OF RAMAN SPECTRAL MEASUREMENT 审中-公开

    公开(公告)号：US20230145637A1

    公开(公告)日：2023-05-11

    申请号：US17979908

    申请日：2022-11-03

    Applicant: JASCO CORPORATION

    Inventor： Masateru USUKI ,  Yoshiko KUBO ,  Daisuke DOGOMI ,  Kento AIZAWA ,  Tsutomu INOUE

    IPC: G01J3/02 ,  G01J3/14 ,  G01J3/44 ,  G01N21/552

    CPC classification number: G01J3/0208 ,  G01J3/14 ,  G01J3/4412 ,  G01N21/552

    Abstract: An Attenuated total reflection measuring apparatus capable of Raman spectral measurement has an infrared optical instrument and a Raman module. The infrared optical instrument is disposed on an ATR prism side of a sample, and is provided to irradiate the ATR prism with an infrared light, and collect the infrared light from the ATR prism. The Raman module is disposed on a side opposite to the ATR prism side relative to the sample, and has a guide tube that outputs an excitation light from an excitation light source to the sample, and a lens portion disposed inside thereof. An end of the guide tube is in a position to push the sample to the ATR prism. The Raman module has a lens position adjustment mechanism that moves the lens portion along an optical axis, and a spectroscope that detects a Raman scattering light collected by the lens portion.

    RESONANT STIMULATED RAMAN SCATTERING MICROSCOPE
    95.
    发明申请
    RESONANT STIMULATED RAMAN SCATTERING MICROSCOPE 审中-公开

    公开(公告)号：US20180238738A1

    公开(公告)日：2018-08-23

    申请号：US15904089

    申请日：2018-02-23

    Applicant: ROBERT ALFANO ,  LINGYAN SHI

    Inventor： ROBERT ALFANO ,  LINGYAN SHI

    IPC: G01J3/44 ,  G01J3/10 ,  H01S3/30 ,  A61K49/00

    CPC classification number: G01J3/4412 ,  A61K49/0013 ,  A61K49/006 ,  G01J3/10 ,  G01J3/44 ,  H01S3/30

    Abstract: A nonlinear optical process on increasing the signal in SRS microscope by Resonant Stimulated Raman Scattering (RSRS) combines both RRS and SRS nonlinear processes, in absorber and host such a β-carotene-methanol solution, Flavins, or other key absorbers in tissues. The observed effect of enhanced RSRS in small signal gain is attributed to RR process in absorber β-carotene that transferring excess vibrations to host methanol from anharmonic vibrational interactions between the solute β-carotene in resonance with the solvent methanol vibrations. SRS microscopy signals are improved in RSRS microscope for imaging vibrational states in lipids CH2 and proteins CH3 in cancer tissues from RR in Flavins or other native chromophores in tissue and for applications in other areas of neuroscience and biomedicine, potentially enhancing signals in the RSRS microscope by 2 to 1000 times.

    Optical chemical analyser and liquid depth sensor
    96.
    发明授权
    Optical chemical analyser and liquid depth sensor 有权

    公开(公告)号：US10041880B2

    公开(公告)日：2018-08-07

    申请号：US14758914

    申请日：2014-01-09

    Applicant: International Moisture Analysers Limited

    Inventor： Paul Stockwell ,  David Widdup ,  Michael Foster ,  Jonathan Storey

    IPC: G01J3/44 ,  G01N21/45 ,  G01N21/65 ,  G01N21/85 ,  G01J3/45

    CPC classification number: G01N21/45 ,  G01J3/4412 ,  G01J3/45 ,  G01N21/65 ,  G01N21/85 ,  G01N21/8507

    Abstract: An optical chemical analyzer comprises a source of a first amount of radiation (46), an optics module configured to direct the first amount of radiation such that it is incident on or passes though a target (14) at a target location, the optics module further being configured to receive a second amount of Raman scattered radiation from the target and direct the second amount of radiation (206) to a Spatial Interference Fourier Transform (SIFT) module, the SIFT module including a first dispersive element (216) and a second dispersive element (218), the SIFT module being configured such that a portion of the second amount of radiation is received by the first dispersive element and interferes with a portion of the second amount of radiation received by the second dispersive element to form an interference pattern; the SIFT module further comprising a detector (48) configured to capture an image of at least a portion of the interference pattern and produce a detector signal (226) based on the captured image; and a processor configured to receive the detector signal from the detector and perform a Fourier transform on the detector signal to thereby obtain a frequency spectrum of the second amount of radiation.

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