Abstract:
An infrared source for use in an infrared spectrometer includes an insulator core having a containment cavity, an outlet port in communication with the containment cavity, and an electrically heated infrared element mounted in the containment cavity with a portion thereof facing the outlet port and with the walls of the containment cavity closely spaced to the infrared element. The insulator core is formed of a ceramic fiber material which has excellent resistance to heat and very low thermal conductivity so that very little heat from the infrared element escapes from the insulator core except as infrared radiation through the outlet port. The insulator core is preferably mounted within a central cavity of a metal housing, and may be sealed off from the ambient atmosphere by an infrared transmissive window sealed to an outlet opening in the housing. The electrical supply lines from the infrared element may extend through an opening in the housing which is closed and sealed to inhibit the passage of gases from the ambient atmosphere into the interior of the housing. Where the infrared element is sealed off from the ambient atmosphere in this manner, potentially corrosive gases will be inhibited from reaching the hot infrared element. This containment of the infrared element within the insulator core allows the element to be maintained at a desired temperature for radiating infrared for use in analytical instruments such as infrared spectrometers, while consuming very low amounts of electrical power.
Abstract:
A method and means for generating synthetic spectra allowing quantitative measurement utilizes dual chip alternatively energized IREDs with optical bandpass filter(s) passing two optical bands which could be combined with curvilinear interpolation to be utilized in a low cost small size quantitative measuring instrument.
Abstract:
An infrared source suitable for use as a remote source for infrared interferometer spectrometers. This device is composed of a heat source, a black body radiating element and a concave reflector. A support to maintain the heat source and black body radiating elements in proper position is also preferably included. The device of the present invention enhances the accuracy and sensitivity of gas sensing devices based upon measurement of background infrared radiation, and allows the remote infrared source to be used in locations in which ignitable materials may be present.
Abstract:
Infrared radiation source arrangement, in particular for use in infrared spectral analysis. To an electrically insulating substrate (2) there is applied one and preferably at least two separate electrically conductive films (2a, 2b) adapted to be heated by application of a time dependent electric current thereto. Tow or more films may form a radiation group (array) in which each film (2a, 2b) is adapted to be energized separately with electric current from an electric drive circuit (1) for applying a time dependent, preferably pulse shaped electric current to the film or films, so that infrared radiation pulses are emitted. The electric current is time controlled in order that the radiation pulses from the respective films may be distinguished from each other in a detector (6). The thickness of the substrate and the thermal conductivity, specific heat and density of the substrate material are so chosen that the thermal time constant is adapted to the pulse frequency range of the drive circuit.
Abstract:
A novel structure for a small, inexpensive, and easily replaced infrared source having near blackbody emission over a spectrum of 2-20 micron wavelengths is disclosed. The source element is self-starting and has a life expectancy in excess of 1000 hours at 1700 degrees K, which requires only 22 watts of power to maintain. Because the source is energy efficient, there is no need of auxilliary cooling or added thermal isolation from adjacent components when the source is used in an instrument such as a spectrophotometer.
Abstract:
Systems and methods for determining one or more properties of a sample are disclosed. The systems and methods disclosed can be capable of measuring along multiple locations and can reimage and resolve multiple optical paths within the sample. The system can be configured with one-layer or two-layers of optics suitable for a compact system. The optics can be simplified to reduce the number and complexity of the coated optical surfaces, et al. on effects, manufacturing tolerance stack-up problems, and interference-based spectroscopic errors. The size, number, and placement of the optics can enable multiple simultaneous or non-simultaneous measurements at various locations across and within the sample. Moreover, the systems can be configured with an optical spacer window located between the sample and the optics, and methods to account for changes in optical paths due to inclusion of the optical spacer window are disclosed.
Abstract:
A spectrometer comprises a plurality of isolated optical channels comprising a plurality of isolated optical paths. The isolated optical paths decrease cross-talk among the optical paths and allow the spectrometer to have a decreased length with increased resolution. In many embodiments, the isolated optical paths comprise isolated parallel optical paths that allow the length of the device to be decreased substantially. In many embodiments, each isolated optical path extends from a filter of a filter array, through a lens of a lens array, through a channel of a support array, to a region of a sensor array. Each region of the sensor array comprises a plurality of sensor elements in which a location of the sensor element corresponds to the wavelength of light received based on an angle of light received at the location, the focal length of the lens and the central wavelength of the filter.
Abstract:
This invention addresses the abovementioned problem, and the purpose of this invention is to provide a far-infrared spectroscopy device that uses an is-TPG method to generate far-infrared light, and is capable of efficiently detecting is-TPG light without a detection optical system being fine-tuned. Even if the far-infrared light incidence angles on an Si prism for detection are the same when far-infrared light having a first frequency is incident on a non-linear optical crystal for detection and when far-infrared light having a second frequency is incident on the non-linear optical crystal for detection, this far-infrared spectroscopy device adjusts the incidence surface angle of pump light in relation to the non-linear optical crystal for detection such that the angle of the far-infrared light in relation to the pump light within the non-linear optical crystal for detection can be appropriately set for each far-infrared light frequency (see FIG. 1A).
Abstract:
An absorption spectrometer with self-referencing calibration takes two measurements along a first and second path having different distances through a sample while largely preserving all other aspects of the optical path and system constant. Comparing these two measurements allows extraction of the spectrum largely free from instrument-specific artifacts.
Abstract:
A mirror unit 2 includes a mirror device 20 including a base 21 and a movable mirror 22, an optical function member 13, and a fixed mirror 16 that is disposed on a side opposite to the mirror device 20 with respect to the optical function member 13. The mirror device 20 is provided with a light passage portion 24 that constitutes a first portion of an optical path between the beam splitter unit 3 and the fixed mirror 16. The optical function member 13 is provided with a light transmitting portion 14 that constitutes a second portion of the optical path between the beam splitter unit 3 and the fixed mirror 16. A second surface 21b of the base 21 and a third surface 13a of the optical function member 13 are joined to each other.