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    Spectral imaging
    114.
    发明授权
    Spectral imaging 有权
    光谱成像

    公开(公告)号：US09523609B2

    公开(公告)日：2016-12-20

    申请号：US14783616

    申请日：2014-04-08

    Applicant: BAE SYSTEMS plc

    Inventor： Ivan Vallejo Veiga ,  Leslie Charles Laycock ,  Michael Stewart Griffith

    IPC: G01J3/28 ,  G01J3/02

    CPC classification number: G01J3/2823 ,  G01J3/0208 ,  G01J3/0237 ,  G01J2003/2826

    Abstract: There is disclosed a spectral imaging apparatus for processing electromagnetic (EM) radiation, the EM radiation originating from a target scene and comprising a wide range of frequencies, the system comprising:A dispersive element for receiving EM radiation from the target scene and promoting differing amounts of dispersion depending on the frequency of the EM radiation,A deformable lens arranged to receive EM radiation from the dispersive element,An imaging sensor for detecting EM radiation across the wide range of frequencies, and arranged to receive EM radiation from the deformable lens,Wherein the deformable lens is operable to adopt any one of a plurality of focal conditions, each focal condition tending to focus a different range of the EM radiation at the imaging sensor, each focal condition thereby defining a component band for the EM radiation.

    Abstract translation: 其中可变形透镜可操作以采用多个焦点条件中的任何一个，每个焦点条件倾向于将成像传感器上的EM辐射的不同范围聚焦，从而每个聚焦条件限定EM辐射的分量带。

    Apparatus, method and system for spectrometry with a displaceable waveguide structure
    115.
    发明授权
    Apparatus, method and system for spectrometry with a displaceable waveguide structure 有权
    具有位移波导结构的光谱仪的装置，方法和系统

    公开(公告)号：US09500827B2

    公开(公告)日：2016-11-22

    申请号：US14317132

    申请日：2014-06-27

    Applicant: Intel Corporation

    Inventor： David N. Hutchison ,  Kyu Hyun Kim ,  Haisheng Rong ,  John Heck ,  Shengbo Xu

    IPC: G01J3/28 ,  G02B6/42 ,  G01J3/32 ,  G01J3/02 ,  G01J3/18

    CPC classification number: G02B6/4295 ,  G01J3/0218 ,  G01J3/0237 ,  G01J3/0259 ,  G01J3/0297 ,  G01J3/1809 ,  G01J3/1895 ,  G01J3/20 ,  G01J3/32 ,  G02B6/00 ,  G02B6/12033

    Abstract: Techniques and mechanisms for a monolithic photonic integrated circuit (PIC) to provide spectrometry functionality. In an embodiment, the PIC comprises a photonic device, a first waveguide and a second waveguide, wherein one of the first waveguide and the second waveguide includes a released portion which is free to move relative to a substrate of the PIC. During a metering cycle to evaluate a material under test, control logic operates an actuator to successively configure a plurality of positions of the released portion relative to the photonic device. In another embodiment, light from the first waveguide is variously diffracted by a grating of the photonic device during the metering cycle, where portions of the light are directed into the second waveguide. Different wavelengths of light diffracted into the second waveguide may be successively detected, for different positions of the released portion, to determine spectrometric measurements over a range of wavelength.

    Abstract translation: 单片光子集成电路（PIC）提供光谱功能的技术和机制。 在一个实施例中，PIC包括光子器件，第一波导和第二波导，其中第一波导和第二波导中的一个包括相对于PIC的衬底自由移动的释放部分。 在用于评估被测材料的计量循环期间，控制逻辑操作致动器以相对于光子器件连续配置释放部分的多个位置。 在另一个实施例中，来自第一波导的光在计量周期期间由光子器件的光栅进行各种衍射，其中光的一部分被引导到第二波导中。 对于释放部分的不同位置，可以连续地检测衍射到第二波导中的不同波长的光，以确定波长范围上的光谱测量。

    Spectroscopic measurement device having diffraction grating at conjugate plane of relay lens
    116.
    发明授权
    Spectroscopic measurement device having diffraction grating at conjugate plane of relay lens 有权
    在中继透镜的共轭平面处具有衍射光栅的光谱测量装置

    公开(公告)号：US09488524B2

    公开(公告)日：2016-11-08

    申请号：US14430658

    申请日：2013-10-02

    Applicant: NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

    Inventor： Ichiro Ishimaru

    IPC: G01J3/02 ,  G01J3/45 ,  G01J3/28 ,  G01J3/453 ,  G01N21/35

    CPC classification number: G01J3/45 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/2803 ,  G01J3/4531 ,  G01J3/4532 ,  G01N2021/3595

    Abstract: A spectroscopic measurement device includes: a dividing optical system for dividing a measurement beam emitted from each of a plurality of measurement points located within a measurement area of an object to be measured, into a first measurement beam and a second measurement beam; an imaging optical system; an optical path length difference providing means; a detector including a plurality of pixels; a processor for acquiring an interferogram of a measurement point of the object to be measured; a conjugate plane imaging optical system located between the object to be measured and the dividing optical system; and a periodicity providing means located on the conjugate plane.

    Abstract translation: 光谱测量装置包括：分割光学系统，用于将位于待测物体的测量区域内的多个测量点中的每一个发射的测量光束分成第一测量光束和第二测量光束; 成像光学系统; 光路长度差提供装置; 检测器，包括多个像素; 用于获取待测量对象的测量点的干涉图的处理器; 位于待测物体与分光光学系统之间的共轭平面成像光学系统; 以及位于共轭平面上的周期性提供装置。

    FINE FOCUS MICROSCOPE CONTROL
    117.
    发明申请
    FINE FOCUS MICROSCOPE CONTROL 审中-公开
    精细聚焦显微镜控制

    公开(公告)号：US20160313546A1

    公开(公告)日：2016-10-27

    申请号：US15136465

    申请日：2016-04-22

    Applicant: Martin Feldman

    Inventor： Martin Feldman

    IPC: G02B21/24 ,  G01N21/65 ,  G01J3/44 ,  G02B21/02

    CPC classification number: G02B21/242 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0256 ,  G01J3/0272 ,  G01J3/44 ,  G01N21/658 ,  G02B21/02

    Abstract: According to some embodiments of the present invention, a fine focus microscope includes an objective lens for collecting light from an object being imaged, and a tube lens for forming a first image from light received from the objective lens. The fine focus microscope further includes a fine focus lens for forming a second image from the first image, and an eyepiece for forming a third image from the second image, wherein the third image is viewable by a user. The fine focus microscope further includes a field lens for directing light from the second image to the eyepiece, and a positioning system mechanically coupled to the fine focus lens, the eyepiece, and the field lens. The positioning system changes a position of the fine focus lens, the eyepiece, and the field lens with respect to the objective lens to provide a change in focus of the object being imaged.

    Abstract translation: 根据本发明的一些实施例，精细对焦显微镜包括用于收集来自被成像物体的光的物镜和用于从物镜接收的光形成第一图像的管透镜。 精细对焦显微镜还包括用于从第一图像形成第二图像的精细聚焦透镜和用于从第二图像形成第三图像的目镜，其中第三图像可由用户观看。 精细对焦显微镜还包括用于将来自第二图像的光引导到目镜的场透镜，以及机械耦合到微调透镜，目镜和场透镜的定位系统。 定位系统相对于物镜改变微调透镜，目镜和场透镜的位置，以提供被成像物体的焦点变化。

    Optical relay with adjustable magnification
    118.
    发明授权
    Optical relay with adjustable magnification 有权
    光学继电器具有可调放大

    公开(公告)号：US09459145B1

    公开(公告)日：2016-10-04

    申请号：US14212489

    申请日：2014-03-14

    Applicant: Thomas A. Mitchell

    Inventor： Thomas A. Mitchell

    IPC: G01J3/28 ,  G01J3/02 ,  G02B15/14

    CPC classification number: G01J3/0237 ,  G01J3/0208 ,  G02B13/24 ,  G02B15/14 ,  G02B15/155

    Abstract: The present disclosure provides an optical imaging system with adjustable magnification. In one aspect, the optical imager, which defines an optical axis, includes an object plane and an image plane, an optical sub-system located along the optical axis and optically disposed between the object plane and the image plane, the optical sub-system being configured to substantially image electromagnetic radiation emanating from the object plane onto the image plane, and at least one detecting element located substantially at the image plane. In one example, the object plane and the image plane are separated by a fixed distance. In one example, the optical sub-system is configured to mechanically translate along the optical axis.

    Abstract translation: 本公开提供了具有可调放大倍数的光学成像系统。 在一个方面，限定光轴的光学成像器包括物平面和像平面，沿着光轴定位并光学地设置在物平面和像平面之间的光学子系统，光学子系统 被配置为将从物体平面发射的电磁辐射基本上成像到图像平面上，以及至少一个基本上位于像面处的检测元件。 在一个示例中，物平面和图像平面被分开固定的距离。 在一个示例中，光学子系统被配置为沿着光轴机械平移。

    SPECTROSCOPY APPARATUS AND METHODS
    119.
    发明申请
    SPECTROSCOPY APPARATUS AND METHODS 审中-公开
    光谱仪器和方法

    公开(公告)号：US20160238533A1

    公开(公告)日：2016-08-18

    申请号：US15025464

    申请日：2014-09-30

    Applicant: RENISHAW PLC

    Inventor： Thomas Anthony MASON

    IPC: G01N21/65

    CPC classification number: G01N21/65 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/0248 ,  G01J3/2803 ,  G01J3/2823 ,  G01J3/44 ,  G01J2003/2826 ,  G01N2201/025 ,  G01N2201/06113 ,  G01N2201/103 ,  G01N2201/11 ,  G01N2201/117 ,  G01N2201/122

    Abstract: This invention concerns spectroscopy apparatus comprising a light source arranged to generate a light profile on a sample, a photodetector having at least one photodetector element for detecting characteristic light generated from interaction of the sample with light from the light source, a support for supporting the sample, the support movable relative to the light profile, and a processing unit. The processing unit is arranged to associate a spectral value recorded by the photodetector element at a particular time with a point on the sample predicted to have generated the characteristic light recorded by the photodetector element at the particular time based on relative motion anticipated to have occurred between the support and the light profile.

    Abstract translation: 本发明涉及光谱装置，其包括被配置为在样品上产生光分布的光源，具有至少一个光电探测元件的光电检测器，该光电检测元件用于检测由样品与来自光源的光的相互作用产生的特征光;支撑样品 ，相对于光轮廓可移动的支撑件，以及处理单元。 处理单元被布置为将由特定时间的光电检测器元件记录的光谱值与预测的样品上的点相关联，以在特定时间基于由光电检测器元件记录的特征光，基于预期发生在 支持和光线。

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