Abstract:
A process is provided for producing a printed circuit board comprising at least two elementary circuit boards drilled with metallized holes the mouth of which is covered with a first metal, and at least one first intermediate layer, made of a compressible material, drilled with holes facing the elementary circuit boards and the mouth of which is covered with a second metal, which layer is placed between the two elementary circuit boards and soldered to each of the circuits by thermodiffusion of two metals forming an alloy at a formation temperature of the alloy. At least two second intermediate layers, the second layers not covering the first and second metal, being thermoplastics and having a melting point above the formation temperature of the alloy, are placed between the first intermediate layer and the elementary circuit boards.
Abstract:
The inventive concepts provide package-on-package (PoP) devices. In the PoP devices, an interposer substrate and a thermal boundary material layer may be disposed between a lower semiconductor package and an upper semiconductor package to rapidly exhaust heat generated from a lower semiconductor chip included in the lower semiconductor package. The interposer substrate may be formed of one or more insulating layers, conductive vias, heat dissipating members, protection layers, and various conductive patterns.
Abstract:
A circuit board upon which to mount an integrated circuit chip may include a first interconnect zone on the surface of the circuit board having first contacts with a first pitch, and a second interconnect zone, surrounding the first zone, having second contacts or traces with a second pitch that is smaller than the first pitch. The first contacts may have a design rule (DR) for direct chip attachment (DCA) to an integrated circuit chip. The first contacts may be formed by bonding a sacrificial substrate having the first contacts to a surface of the board; or by laser scribing trenches where the conductor will be plated to create the first contacts. Such a board allows DCA of smaller footprint processor chips for devices, such as tablet computers, cell phones, smart phones, and value phone devices.
Abstract:
Electrical characteristics of a mounting board over which a semiconductor device is mounted is improved. A mounting board (wiring board) includes a plurality of first through holes and second through holes extending from its upper surface bearing a semiconductor device (semiconductor package) to its lower surface and through-hole wirings formed in the respective through holes. The mounting board has a capacitor arranged on its lower surface and electrically connected with the semiconductor device via second electrodes. Among a plurality of first electrodes formed on the upper surface of the mounting board, the several first electrodes to be connected with the capacitor are connected with one wiring formed in a first through hole with a larger diameter than a signal transmission path.
Abstract:
Disclosed herein is an interposer substrate, including: a core layer and a through core via (TCV) penetrating through the core layer; circuit wirings formed on both surfaces of the core layer and a TCV upper pad and a TCV lower pad which are each bonded to upper and lower surfaces of the TCV formed on both surfaces of the core layer; upper insulating layers covering the TCV upper pad and the circuit wiring formed on one surface of the core layer and having the circuit wirings formed on upper surfaces thereof; a stack via penetrating through the upper insulating layers of each layer and having one end connected to the TCV upper pad; and a lower insulating layer covering the TCV lower pad and the circuit wiring formed on the other surface of the core layer and provided with an opening which exposes the TCV lower pad.
Abstract:
An electronics module is provided for utilization onboard an airborne object. In one embodiment, the electronics module includes a housing having a cavity therein, a first printed circuit board (PCB) disposed in the cavity, a second PCB disposed in the cavity above the first PCB, and a supportive interconnect structure. The supportive interconnect structure includes a substantially annular insulative body and a plurality of vias. The substantially annular insulative body extends around an inner circumferential portion of the housing between the first PCB and the second PCB to support the second PCB and to axially space the second PCB from the first PCB. The plurality of vias is formed through the substantially annular insulative body and electrically couples the first PCB to the second PCB.
Abstract:
A probe card for conducting an electrical test on a test subject includes a substrate body including a first surface, which faces toward the test subject, and a second surface, which is opposite to the first surface. A through electrode extends through the substrate body between the first surface and the second surface. A contact bump is formed in correspondence with the electrode pad and electrically connected to the through electrode. An elastic body is filled in an accommodating portion, which is formed in the substrate body extending from the first surface toward the second surface. The contact bump is formed on the elastic body.
Abstract:
A computing device has a motherboard circuit substrate having at least one layer of electrical interconnects and a socket arranged to receive a main processor for the computing device, the socket electrically coupled to at least a portion of the layer of electrical interconnects, wherein the circuit substrate has no memory interconnects.
Abstract:
Some novel features pertain to a substrate that includes a first core layer, a second core layer laterally located to the first core layer in the substrate, a first inorganic core layer (e.g., glass, silicon, ceramic) laterally positioned between the first core layer and the second core layer, the first inorganic core layer configured to be vertically aligned with a die configured to be coupled to the substrate, and a dielectric layer covering the first core layer, the second core layer and the first inorganic core layer. In some implementations, the first inorganic core layer has a first coefficient of thermal expansion (CTE), the die has a second coefficient of thermal expansion, and the first core layer has a third coefficient of thermal expansion (CTE). The first CTE of the first inorganic core layer closely matches the second CTE of the die in order to reduce the likelihood of warpage.
Abstract:
Embodiments of the present disclosure are directed towards techniques and configurations for dual surface finish package substrate assemblies. In one embodiment a method includes depositing a first surface finish on one or more electrical routing features located on a first side of a package substrate and on one or more lands located on a second side of the package substrate, the second side being opposite the first side of the substrate. The method may further include removing the first surface finish on the first side of the package substrate; and depositing a second surface finish on the one or more electrical routing features of the first side. The depositing of the second surface finish may be accomplished by one of a Direct Immersion Gold (DIG) process or an Organic Solderability Preservative (OSP) process. Other embodiments may be described and/or claimed.