Abstract:
An optical arrangement for spectral decomposition of light is disclosed. In an embodiment the optical arrangement includes a reflection diffraction grating, a first medium with a refractive index nin arranged on a light incidence side of the reflection diffraction grating; and a second medium with a refractive index nG arranged on a side of the reflection diffraction grating that faces away from the light incidence side, with nin>nG, wherein the optical arrangement is configured in such a way that light impinges on the reflection diffraction grating from the first medium at an angle of incidence α, wherein a condition sin(α)>nG/nin is satisfied, wherein the reflection diffraction grating comprises a layer system with at least one unstructured layer and at least one structured layer, wherein the at least one structured layer has a periodic structure with a period p in lateral direction, and wherein the period p meets the following conditions: p λ/[nin*sin(α)+nin].
Abstract:
A spectrometer (100) for analyzing the spectrum of an upstream light beam (1) includes an entrance slit (101) and angular dispersing elements (130). The angular dispersing elements include at least one polarization-dependent diffraction grating that is suitable for, at the plurality of wavelengths (1, 2, 3), diffracting a corrected light beam (20) into diffracted light beams (31, 32, 33) in a given particular diffraction order of the polarization-dependent diffraction grating, which is either the +1 diffraction order or the −1 diffraction order, when the corrected light beam has a preset corrected polarization state that is circular; and the spectrometer includes elements for modifying polarization (1100) placed between the entrance slit and the angular dispersion elements, which are suitable for modifying the polarization state of the upstream light beam in order to generate the corrected light beam with a preset corrected polarization state.
Abstract:
A spectrometer including: a spectral dispersion mechanism of an initial light beam; and a photodetector. The spectral dispersion mechanism includes at least three reflective diffraction gratings parallel to consecutive sides of a convex polygon, arranged such that a portion of the initial light beam is diffracted once by each diffraction grating in turn and is diffracted at least a second time by at least one of the diffraction gratings.
Abstract:
The present invention provides a spectral apparatus for spectrally separating light including a predetermined wavelength, including a slit that the light enters, a first optical system configured to collimate the light from the slit, a transmissive type diffraction element configured to diffract the light from the first optical system, and a second optical system including a first mirror configured to reflect the light diffracted by the transmissive type diffraction element, and a second mirror configured to reflect the light reflected by the first mirror and diffracted by the transmissive type diffraction element, and configured to make the light reciprocally travel between the first mirror and the second mirror via the transmissive type diffraction element.
Abstract:
A dispersive element is incorporated with an optical sensor as a spectrometer. The dispersive element includes a guided-mode resonance filter having a plurality of resonance regions. The resonance regions respectively have different filter characteristics, each reflecting a first light beam of a tested light source or transmitting a second light beam of the tested light source light source to the optical sensor, wherein the wavelength of the first light beam is different from that of the second light beam. In one embodiment, the dispersive element is incorporated with an optical sensor to form a miniature, high-resolution and low-cost spectrometer. The spectrometer makes use of the transmission efficiencies of the resonance regions of the guided-mode resonance filter and the light intensity distribution detected by the photosensitive regions of the optical sensor to acquire the spectral data of the tested light source.
Abstract:
The present disclosure relates to a self-aligned spectrometer according to claim 1, comprising: a fixing device composed of light-transmittable materials, and which includes an air lens placed within the fixing device, and an optical waveguide of which at least a partial part is inserted and fixed in place within the fixing device through the first face of the fixing device.
Abstract:
Wavenumber linear spectrometers are provided including an input configured to receive electromagnetic radiation from an external source; collimating optics configured to collimate the received electromagnetic radiation; a dispersive assembly including first and second diffractive gratings, wherein the first diffraction grating is configured in a first dispersive stage to receive the collimated electromagnetic radiation and wherein the dispersive assembly includes at least two dispersive stages configured to disperse the collimated input; and an imaging lens assembly configured to image the electromagnetic radiation dispersed by the at least two dispersive stages onto a linear detection array such that the variation in frequency spacing along the linear detection array is no greater than about 10%.
Abstract:
A spectra shaping apparatus for chirped pulse amplification(CPA) comprises a CTSI spectral decomposition system and a CTSI spectral synthesizing system being symmetrical, and a spectral modulating system composed of a diaphragm (10) and a plane spectra modulating reflector (5), wherein the CTSI spectral decomposition system totally expands a laser chirped pulse to a spectra plane, the spectral modulating system performs a spectra modulation on the image plane, and the CTSI spectral synthesizing system reverts the modulated spectra into the chirped pulse without distortion, thereby realizing spectra shaping. The apparatus has the feature of manufacturing easy, compacting structure, requiring less space, and cheap in cost etc., which can be different types of configuration for different circumstance application, and which can be utilized in a general laser spectrum shaping and spectrum modulation, especially for a high energy and ultra-high peak-power laser system with a large caliber and a broadband of pulse.
Abstract:
The invention concerns an optical system. The optical system comprises an input for receiving an optical signal, a predetermined output plane, and a diffraction grating for separating the optical signal received at the input into spectral elements thereof. The grating has a diffraction surface, which is formed by a photolithography process. The diffraction surface has a first predetermined profile. The first profile is formed by a plurality of points each conducted by different equations. Consequently, each spectral component is focused on the predetermined output plane.
Abstract:
The optical module (1) comprises—a first member (O) having a first face (F1) which is substantially planar;—a second member (P) having a second face (F2) facing the first face (F1), which is substantially planar and is aligned substantially parallel to the first face;—a third member (S) comprised in the first member (O) or comprised in the second member (P) or distinct from and located between these, which comprises an opening (4);—a mirror element (31′; 31′″) present on the second face (F2); and—an active optical component (26) present on the second face (F2) and electrically connected to the second member (P); wherein at least one of the first and second members comprises one or more transparent portions (t) through which light can pass. The method for manufacturing the optical module (1) comprises the steps of a) providing a first wafer; b) providing a second wafer on which the mirror elements (31′. . . ) are present; c) providing a third wafer, wherein the third wafer is comprised in the first wafer or is comprised in the second wafer or is distinct from these, and wherein the third wafer comprises openings (4); e) forming a wafer stack comprising these wafers; wherein at least one of the first wafer and the second wafer comprises transparent portions (t) through which light can pass.