Abstract:
Provided is an apparatus for optical emission spectroscopy. The apparatus for the optical emission spectroscopy includes a light collection unit configured to collect light within a plasma process chamber in which plasma is generated to process a substrate, a light transmission unit configured to transmit the collected light, and an analysis unit configured to analyze the light provided through the light transmission unit, thereby analyzing a plasma state. The light collection unit includes a light collection part configured to concentrate the light generated in the plasma process chamber and provide the concentrated light to the light transmission unit.
Abstract:
A nebulizer characterized in being provided with: an inner tube, which is disposed coaxially with an outer tube in which a nebulizing outlet is formed and which, together with the outer tube, forms a gas channel therebetween; a sample channel, which is formed inside the inner tube and through which a liquid sample to be nebulized flows; and a reticular membrane disposed with a gap from the sample outlet that is formed at one end of the inner tube and in which multiple holes, through which liquid sample drops flowing out from the sample outlet pass along with a gas, are formed. Using the nebulizer, the particle size of the nebulized liquid droplets can be made uniformly fine over a broad range of sample liquid flow volumes while retention of sample liquid in the nebulizer is reduced.
Abstract:
Methods and apparatus for laser induced breakdown spectroscopy (LIBS) sample chamber. An apparatus includes a sample chamber, a laser source connected to an excitation optics assembly, the excitation optics assembly connected to a first port on the sample chamber, a collimator assembly connected to a spectrometer, the collimator assembly connected to a second port on the sample chamber, and a first lens tube positioned on the first port and a second lens tube positioned on the second port, the first lens tube protecting the first port connected to the excitation optics assembly and the second lens tube protecting the second port connected to the collimator assembly from particles emitted when a laser pulse from the laser source ablates a surface of a target sample and generates a plasma.
Abstract:
An apparatus includes a single laser source configurable to produce laser pulses directable towards a target substance, a focusing lens optically positionable between the single laser source and the target substance, the focusing lens focusing a first laser pulse to ablate at least a portion of the target substance when in a first focusing lens position to generate a plasma plume, the plume emitting atomic emission lines characteristic of elements including the target substance, the focusing lens focusing a second laser pulse in the target substance when in a second focusing lens position, resulting in Raman scattering, a collection optics assembly to detect signals representing the atomic emission lines characteristic of the target substance and the Raman scattering, and a spectrometer to detect signals received from the collection optics assembly.
Abstract:
A laser ablation system and methods are disclosed for performing material analysis. The laser ablation system includes a sample chamber which holds and encloses a sample material to be ablated; a laser source that produces a laser beam which is directed into the sample chamber to a surface of the sample material to cause laser ablation; a laser measuring device which is physically attached to the sample chamber to measure a power/energy value of the laser beam; and a material analyzing module that is coupled to the sample chamber to receive the ablated material from laser ablation of the sample material.
Abstract:
A dual source system and method includes a high power laser used to determine elemental concentrations in a sample and a lower power device used to determine compounds present in the sample. A detector subsystem receives photons from the sample after laser energy from the high power laser strikes the sample and provides a first signal. The detector subsystem then receives photons from the sample after energy from the lower power device strikes the sample and provides a second signal. The high power laser is pulsed and the first signal is processed to determine elemental concentrations present in the sample. The lower power device is energized and the second signal is processed to determine compounds present in the signal. Based on the elemental concentrations and the compounds present, the compounds present in the sample are quantified.
Abstract:
Provided are: a method for brazing an aluminum alloy, which is characterized in that brazing is carried out by heating an aluminum brazing sheet without using flux in a furnace that is in an argon gas-containing atmosphere, said aluminum brazing sheet comprising a core material that is composed of aluminum or an aluminum alloy and a brazing filler material that is composed of an aluminum alloy and clad on one surface or both surfaces of the core material, and said core material and/or said brazing filler material containing Mg; and a brazing apparatus which is used in the method for brazing an aluminum alloy. The brazing method has good and stable brazing properties and is applicable in industrial practice.
Abstract:
This invention discloses a laser induced breakdown spectroscopy (LIBS) apparatus and method for performing spectral imaging of a sample surface. A high repetition rate pulsed laser is employed to produce a train of laser pulses. The laser beam is then scanned by a scanning mechanism over a surface of the subject sample. Each laser pulse produces a LIBS signal from a specific position of the sample surface, which is then measured by a spectrometer device to obtain a LIBS spectrum. The position of the laser beam is recorded and correlated to the corresponding LIBS spectrum. A two dimensional (2-D) mapping of the sample surface to its LIBS spectra is acquired in this manner to construct a LIBS spectral image of the sample surface.
Abstract:
The present invention relates to a process control system which can measure the physical properties of a CIGS thin film in real-time in a continuous production line of a CIGS thin film solar cell, more specifically to a system for real-time analysis of material distribution of a CIGS thin film comprising: a header, which comprises a laser irradiation unit producing plasma from the CIGS thin film by irradiating a laser beam to a part of the CIGS thin film; and a spectrum detection optical unit detecting a spectrum generated from the plasma; a transfer unit, which transfers the header at the same rate and to the direction with the transfer rate and direction of the CIGS thin film; and a spectrum analysis unit, which analyzes the spectrum detected by the spectrum detection optical unit.
Abstract:
A hand-held instrument includes a sample probe for evaluating at least one constituent of a sample; a processor configured with machine executable code stored on machine readable media for controlling the instrument; a display for providing output of the instrument; and, a pointing device for selecting output of the display and providing input to the processor, the pointing device configured for facilitating the selecting while holding the instrument. A method of use, a computer program product and embodiments of sample analyzers are disclosed.