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    Systems, Methods, and Apparatus for Radiation Detection
    11.
    发明申请
    Systems, Methods, and Apparatus for Radiation Detection 有权
    用于辐射检测的系统，方法和装置

    公开(公告)号：US20160258807A1

    公开(公告)日：2016-09-08

    申请号：US15061308

    申请日：2016-03-04

    Applicant: Brandt Christopher Pein ,  Harold Young Hwang ,  Wendi Chang ,  Keith A. Nelson ,  Vladimir Bulovic ,  Nathaniel C. Brandt

    Inventor： Brandt Christopher Pein ,  Harold Young Hwang ,  Wendi Chang ,  Keith A. Nelson ,  Vladimir Bulovic ,  Nathaniel C. Brandt

    IPC: G01J1/04 ,  G01J1/42

    CPC classification number: G01J5/046 ,  G01J1/58 ,  G01J3/0216 ,  G01J3/0245 ,  G01J3/04 ,  G01J3/42 ,  G01J5/0815 ,  G01J5/0837

    Abstract: A radiation detection technique employs field enhancing structures and electroluminescent materials to converts incident Terahertz (THz) radiation into visible light and/or infrared light. In this technique, the field-enhancing structures, such as split ring resonators or micro-slits, enhances the electric field of incoming THz light within a local area, where the electroluminescent material is applied. The enhanced electric field then induces the electroluminescent material to emit visible and/or infrared light via electroluminescent process. A detector such as avalanche photodiode can detect and measure the emitted light. This technique allows cost-effective detection of THz radiation at room temperatures.

    Abstract translation: 放射线检测技术采用场增强结构和电致发光材料将入射的太赫兹（THz）辐射转换成可见光和/或红外光。 在这种技术中，诸如开环谐振器或微缝隙的场增强结构增强了施加电致发光材料的局部区域内的进入的THz光的电场。 增强的电场然后诱导电致发光材料通过电致发光工艺发射可见光和/或红外光。 诸如雪崩光电二极管的检测器可以检测和测量发射的光。 这种技术允许在室温下对THz辐射进行成本有效的检测。

    Illumination device and reflection characteristic measuring device
    12.
    发明授权
    Illumination device and reflection characteristic measuring device 有权
    照明装置和反射特性测量装置

    公开(公告)号：US09429472B2

    公开(公告)日：2016-08-30

    申请号：US14894821

    申请日：2014-05-15

    Applicant: KONICA MINOLTA, INC.

    Inventor： Shinichi Iida ,  Wataru Yamaguchi

    IPC: G01J3/00 ,  G01J3/42 ,  G01J3/10 ,  G01J3/50 ,  G01J1/42 ,  G01J3/04

    CPC classification number: G01J3/42 ,  G01J1/0271 ,  G01J1/1626 ,  G01J1/42 ,  G01J3/0262 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/10 ,  G01J3/50 ,  G01J3/504 ,  G01J2001/1636 ,  G01J2003/425

    Abstract: An illumination device is provided with a light source, a photodetector, and a support structure. The light source, which emits light, has light distribution in which a reference axis serves as an axis of symmetry or light distribution in which a plane including the reference axis serves as a plane of symmetry. A first light beam in the light is guided to the object to be illuminated. A second light beam in the light is guided to the photodetector. The photodetector detects intensity of the second light beam. The light source and the photodetector are supported by the support structure in positions and postures that allow the first light beam and the second light beam to be guided in an aforementioned manner. A traveling direction of the first light beam and a traveling direction of the second light beam make the same angle with the reference axis.

    Abstract translation: 照明装置设置有光源，光电检测器和支撑结构。 发光的光源具有光分布，其中参考轴用作对称轴或光分布，其中包括基准轴的平面用作对称平面。 光中的第一光束被引导到被照明的物体。 光中的第二光束被引导到光电检测器。 光检测器检测第二光束的强度。 光源和光电检测器由支撑结构支撑在允许以上述方式引导第一光束和第二光束的位置和姿势。 第一光束的行进方向和第二光束的行进方向与参考轴线成相同的角度。

    Control apparatus and control method having a slit selection based upon acquired half value wavelength of incident spectrum
    13.
    发明授权
    Control apparatus and control method having a slit selection based upon acquired half value wavelength of incident spectrum 有权
    控制装置和控制方法具有基于获取的入射光谱的半值波长的狭缝选择

    公开(公告)号：US09404798B2

    公开(公告)日：2016-08-02

    申请号：US14468900

    申请日：2014-08-26

    Applicant: NEC Corporation

    Inventor： Hideya Tomita

    IPC: G01J3/04 ,  G01J3/18

    CPC classification number: G01J3/04 ,  G01J3/18 ,  G01J2003/042 ,  G01J2003/045

    Abstract: A control apparatus includes a slit plate including a plurality of rectangular slits with different widths. The control apparatus also includes an acquisition unit which acquires an incident spectrum from the rectangular slit. The apparatus also includes a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum, and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength.

    Abstract translation: 控制装置包括具有不同宽度的多个矩形狭缝的狭缝板。 控制装置还包括从矩形狭缝获取入射光谱的获取单元。 该设备还包括：狭缝选择单元，其基于入射光谱获取入射光谱的半值波长，并且基于半值波长执行多个矩形狭缝之一的选择。

    Hyperspectral imaging systems and methods for imaging a remote object
    14.
    发明授权
    Hyperspectral imaging systems and methods for imaging a remote object 有权
    用于成像远程物体的高光谱成像系统和方法

    公开(公告)号：US09267843B2

    公开(公告)日：2016-02-23

    申请号：US14093814

    申请日：2013-12-02

    Applicant: Corning Incorporated

    Inventor： Lovell Elgin Comstock, II ,  James Dixon Cornell ,  Jeffry John Santman ,  Kenneth Smith Woodard

    IPC: G01J3/28 ,  G01J3/04 ,  H04N9/04 ,  H04N5/347 ,  G01J3/02 ,  G01J3/36

    CPC classification number: G01J3/2823 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/0256 ,  G01J3/04 ,  G01J3/2803 ,  G01J3/36 ,  G01J2003/042 ,  G01J2003/045 ,  G01J2003/2813 ,  G01J2003/2826 ,  H04N5/347 ,  H04N9/04

    Abstract: A hyperspectral imaging system and a method are described herein for providing a hyperspectral image of an area of a remote object. In one aspect, the hyperspectral imaging system includes a fore optic with optics for acquiring and projecting an image from a remote object, a scannable slit mechanism with a plurality of slits for receiving the projected image, where the projected image simultaneously illuminates two or more of the plurality of slits, a spectrometer for receiving and dispersing images passing through the two or more simultaneously-illuminated slits, and a two-dimensional image sensor for recording images received from the spectrometer, where the images received from different slits are recorded on different sets of detection elements of the two-dimensional image sensor.

    Abstract translation: 本文描述了一种高光谱成像系统和方法，用于提供远程物体的区域的高光谱图像。 一方面，高光谱成像系统包括具有用于从远程物体获取和投影图像的光学器件的前视镜，具有用于接收投影图像的多个狭缝的可扫描狭缝机构，其中投影图像同时照亮两个或更多个 多个狭缝，用于接收和分散通过两个或更多个同时照射的狭缝的图像的光谱仪，以及用于记录从光谱仪接收的图像的二维图像传感器，其中从不同狭缝接收的图像被记录在不同的组上 的二维图像传感器的检测元件。

    AIRBORNE HYPERSPECTRAL SCANNING SYSTEM WITH REFLECTIVE TELECENTRIC RELAY
    15.
    发明申请
    AIRBORNE HYPERSPECTRAL SCANNING SYSTEM WITH REFLECTIVE TELECENTRIC RELAY 有权
    具有反射式电力继电器的AIRBORNE高精度扫描系统

    公开(公告)号：US20160041033A1

    公开(公告)日：2016-02-11

    申请号：US14451545

    申请日：2014-08-05

    Applicant: BAE Systems Information and Electronic Systems Integration Inc.

    Inventor： Mark L. Oskotsky ,  Daniel Engheben ,  John J. MacEachin ,  Jacinto E. Malabuyoc ,  Shawn C. Reven ,  Michael J. Russo, JR.

    IPC: G01J3/28 ,  G01J3/04 ,  G01J3/02

    CPC classification number: G01J3/2823 ,  G01J3/0205 ,  G01J3/0208 ,  G01J3/04

    Abstract: An airborne hyperspectral scanning system with a reflective telecentric relay including a system housing fore-optics, mounted in the housing, an imaging spectrometer mounted in the housing, the imaging spectrometer comprising a spectrometer slit, the spectrometer slit having an exit side and an entrance side, a focal plane array, a fold mirror, and at least three spectrometer mirrors, ordered sequentially, and in optical alignment with each other, and a reflective telecentric relay, mounted in the housing between the fore-optics and the imaging spectrometer, the reflective telecentric relay comprising a collimator module, a scanning mirror module, and an objective module, the objective module being situated to receive intermediate image from the fore-optics and reflect a collimated beam to the scanning mirror image between the collimator module and the objective module, wherein the objective module is situated to form a telecentric image at the entrance of the spectrometer slit.

    Abstract translation: 一种具有反射远心继电器的机载超光谱扫描系统，包括安装在壳体中的前置光学系统的系统，安装在壳体中的成像光谱仪，成像光谱仪包括光谱仪狭缝，光谱仪狭缝具有出射侧和入射侧 ，反射远心继电器，安装在前置光学器件和成像光谱仪之间的壳体中的反射远心继电器，反射型的反射镜 远心继电器包括准直器模块，扫描镜模块和目标模块，所述物镜模块位于从前光学器件接收中间图像并将准直光束反射到准直器模块和目标模块之间的扫描镜像， 其中物镜模块位于在光谱仪狭缝的入口处形成远心图像。

    SPECTROMETER
    16.
    发明申请
    SPECTROMETER 有权
    光谱仪

    公开(公告)号：US20150241275A1

    公开(公告)日：2015-08-27

    申请号：US14419576

    申请日：2013-07-29

    Applicant: HAMAMATSU PHOTONICS K.K.

    Inventor： Katsumi Shibayama ,  Takafumi Yokino

    IPC: G01J3/02 ,  G01J3/28

    CPC classification number: G01J3/02 ,  G01J3/0256 ,  G01J3/0291 ,  G01J3/04 ,  G01J3/18 ,  G01J3/28

    Abstract: A spectrometer comprises a package having a stem and a cap, an optical unit arranged on the stem, and a lead pin penetrating through the stem. The optical unit has a dispersive part for dispersing and reflecting light entering from a light entrance part of the cap, a light detection element for detecting the light dispersed and reflected by the dispersive part, a support for supporting the light detection element such as to form a space between the dispersive part and the light detection element, a projection projecting from the support, and a wiring electrically connected to the light detection element. The projection is arranged at such a position as to be in contact with the stem. The lead pin is electrically connected to a second terminal part of the wiring arranged in the projection.

    Abstract translation: 光谱仪包括具有杆和帽的封装，布置在杆上的光学单元和穿过杆的引脚。 光学单元具有用于分散和反射从灯的入射部分入射的光的分散部分，用于检测由分散部分分散和反射的光的光检测元件，用于支撑光检测元件的支撑件，以形成 色散部和光检测元件之间的空间，从支撑体突出的突起，以及电连接到光检测元件的布线。 突出部布置在与杆接触的位置。 导引销电连接到布置在突起中的布线的第二端子部分。

    SPECTROMETER AND A FLUID ANALYSIS SYSTEM
    17.
    发明申请
    SPECTROMETER AND A FLUID ANALYSIS SYSTEM 有权
    光谱仪和流体分析系统

    公开(公告)号：US20150219495A1

    公开(公告)日：2015-08-06

    申请号：US14607745

    申请日：2015-01-28

    Applicant: Buerkert Werke GmbH

    Inventor： Martin GARBOS ,  Christoph SCHOLL

    IPC: G01J3/28 ,  G01J3/02 ,  G01N21/25 ,  G01J3/18

    CPC classification number: G01J3/28 ,  G01J3/0208 ,  G01J3/0229 ,  G01J3/04 ,  G01J3/18 ,  G01J2003/2866 ,  G01N21/255 ,  G01N21/85 ,  G01N2201/061 ,  G01N2201/068

    Abstract: A spectrometer, in particular for being installed in a sensor module of a fluid analysis system, including a radiation source and the following components defining a beam path or being arranged along the beam path: a sample chamber for a fluid to be examined, a first lens, a diffraction element, a second lens and a detector. A restriction aperture for restricting the effective diameter of the light beam incident on the diffraction element is provided between the sample chamber and the diffraction element.

    Abstract translation: 一种光谱仪，特别是用于安装在流体分析系统的传感器模块中，包括辐射源和限定光束路径或沿着光束路径布置的以下部件：用于待检查流体的样品室，第一 透镜，衍射元件，第二透镜和检测器。 在样品室和衍射元件之间设置用于限制入射在衍射元件上的光束的有效直径的限制孔。

    Spectrum measuring apparatus
    19.
    发明授权
    Spectrum measuring apparatus 有权
    光谱测量仪

    公开(公告)号：US09036147B2

    公开(公告)日：2015-05-19

    申请号：US13322019

    申请日：2009-05-29

    Applicant: Ryuji Funayama ,  Shinya Kawamata ,  Yasukata Yokochi ,  Masato Endo ,  Yasuhiro Yoshida ,  Kenichi Kitahama

    Inventor： Ryuji Funayama ,  Shinya Kawamata ,  Yasukata Yokochi ,  Masato Endo ,  Yasuhiro Yoshida ,  Kenichi Kitahama

    IPC: G01J3/28 ,  G01J3/02 ,  G01J3/04 ,  G01J3/32 ,  G01J3/36

    CPC classification number: G01J3/0229 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0235 ,  G01J3/0294 ,  G01J3/04 ,  G01J3/32 ,  G01J3/36

    Abstract: Disclosed is a spectrum measuring apparatus for shortening such a measurement time period for an object being measured including two or more mutually different measurement portions as is required for the spectrum measurements of the lights from individual measurement portions. The spectrum measuring apparatus comprises a slit group having two or more slits, a spectroscope for separating the lights extracted by the slit group, for the individual slits, and a measuring unit for measuring the intensities of the individual components, which are separated by the spectroscope, for the slits. The individual slits extract such ones of the lights coming from an object being measured including two or more mutually different measurement portions, as come from the individual measurement portions.

    Abstract translation: 本发明公开了一种频谱测量装置，用于根据来自各个测量部分的光的光谱测量所需的，缩短测量对象的测量时间段，包括两个或更多个相互不同的测量部分。 光谱测量装置包括具有两个或更多个狭缝的狭缝组，用于分离由狭缝组提取的光的分光镜，用于各狭缝的测量单元，以及用于测量由分光镜分离的各个部件的强度的测量单元 ，为狭缝。 各个狭缝从各个测量部分提取来自被测量物体的那些光，包括两个或更多个相互不同的测量部分。

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