-
191.发明授权公开(公告)号：US10071205B2
公开(公告)日：2018-09-11
申请号：US15315621
申请日：2015-06-09
Applicant: SANOFI-AVENTIS DEUTSCHLAND GMBH
Inventor： Gertrud Blei , Gunter Heumann
CPC classification number: A61M5/31 , A61M5/168 , A61M5/1723 , A61M2005/3126 , A61M2205/3306 , A61M2205/3313 , A61M2205/50 , A61M2205/502 , A61M2205/52 , A61M2205/6081 , A61M2205/8206 , G01J3/0208 , G01J3/021 , G01J3/0229 , G01J3/0256 , G01J3/0289 , G01J3/10 , G01J2003/104 , G01J2003/106 , G01N21/55 , G01N2201/062 , G01N2201/08 , G06K9/2018 , G06K9/2027 , G06K9/4652 , G06K2209/01
Abstract: Apparatus for determining information associated with reflection characteristics of a surface comprising a sensor (60) configured to generate sensor output dependent on an intensity of light incident on the sensor and having a field of view directed at an external surface (57) in use; an illumination source (58) configured to emit light onto the external surface in use; an optically transparent window (61) located such as to allow light to pass from the illumination source to the external surface and to allow light to pass to the sensor from the external surface in use; a light concentrator (66) fixed to or integral with the window, the light concentrator being configured to concentrate at least some light from the illumination source onto the external surface in use such that the concentrated light may be reflected from the external surface onto the sensor via the window; and a processor (40) configured to use the sensor output to determine information associated with reflection characteristics of the external surface.
-
公开(公告)号：US20180191967A1
公开(公告)日：2018-07-05
申请号：US15789811
申请日：2017-10-20
Applicant: REBELLION PHOTONICS, INC.
Inventor： Robert Timothy Kester
IPC: H04N5/33 , G01J3/02 , G01J3/28 , G01J5/00 , G01J5/08 , G01N21/3504 , G02B5/20 , G06K9/00 , G06K9/20 , H04N5/225
CPC classification number: H04N5/33 , G01J3/0208 , G01J3/0232 , G01J3/0256 , G01J3/0289 , G01J3/0297 , G01J3/2803 , G01J5/0014 , G01J5/026 , G01J5/047 , G01J5/0834 , G01J5/089 , G01J2003/104 , G01J2003/1217 , G01J2003/1221 , G01N21/3504 , G02B5/201 , G02B5/208 , G06K9/00624 , G06K9/209 , H04N5/2258
Abstract: In one embodiment, an infrared (IR) imaging system for determining a concentration of a target species in an object is disclosed. The imaging system can include an optical system including an optical focal plane array (FPA) unit. The optical system can have components defining at least two optical channels thereof, said at least two optical channels being spatially and spectrally different from one another. Each of the at least two optical channels can be positioned to transfer IR radiation incident on the optical system towards the optical FPA. The system can include a processing unit containing a processor that can be configured to acquire multispectral optical data representing said target species from the IR radiation received at the optical FPA. Said optical system and said processing unit can be contained together in a data acquisition and processing module configured to be worn or carried by a person.
-
193.发明授权公开(公告)号：US10012541B2
公开(公告)日：2018-07-03
申请号：US15517323
申请日：2015-10-07
Applicant: TECHNISCHE UNIVERSITÄT DRESDEN
Inventor： Maik Langner , Hartmut Fröb , Vadim G. Lyssenko , Markas Sudzius , Karl Leo
CPC classification number: G01J3/26 , G01J3/0256 , G01J3/0289 , G01J3/28 , G01J3/2803 , G01J3/36 , G01J2003/1234 , G02B5/288
Abstract: An optical filter element for devices for converting spectral information into location information, uses a connected detector for detecting signals. The element has at least two microresonators, each comprising at least two superposed reflective layer structures of a material layer having a high refractive index and a material layer having a low refractive index in an alternating sequence, and at least one superposed resonance layer arranged between the two superposed reflective layer structures. The filter element comprises at least one transparent plane-parallel substrate for optically decoupling the two microresonators; the first microresonator being located on a first of two opposing surfaces of said substrate, and the second microresonator being located on said substrate on a second surface thereof that lies opposite the first surface. The resonance layer of at least one microresonator, and/or the reflective layer structure that surrounds said resonance layer, has a layer thickness which can vary along a horizontal axis of said filter element.
-
公开(公告)号：US10012536B2
公开(公告)日：2018-07-03
申请号：US15046562
申请日：2016-02-18
Applicant: OCEAN OPTICS, INC.
Inventor： Kenneth D. White , Warren H. Miller , Reeder N. Ward
CPC classification number: G01J3/0289 , G01J3/0202 , G01J3/0208 , G01J3/18
Abstract: An optical system design using Morse Taper mounted optical components for improving alignment performance, and more specifically a spectrometer design wherein the components include Morse Taper male tapers and the spectrometer bench include Morse Taper female openings that eases alignment and improves alignment stability, both physical and temperature related, of optical components while simplifying manufacture and maintaining a compact footprint is disclosed.
-
公开(公告)号：US09995922B2
公开(公告)日：2018-06-12
申请号：US14773057
申请日：2013-03-08
Applicant: SHIMADZU CORPORATION
Inventor： Akira Noda
IPC: G02B21/36 , G01J3/02 , G01J3/10 , G01J3/453 , G01N21/35 , G06K9/00 , G06T7/00 , G06T7/11 , G06K9/62
CPC classification number: G02B21/361 , G01J3/0248 , G01J3/0275 , G01J3/0289 , G01J3/108 , G01J3/28 , G01J3/453 , G01N21/35 , G01N2021/3595 , G02B21/365 , G06K9/0014 , G06K9/6202 , G06T7/0004 , G06T7/11 , G06T2207/10048 , G06T2207/10056 , G06T2207/20056 , G06T2207/30164
Abstract: Provided is an analysis target region setting apparatus that can accurately set an analysis target region, based on an observation image of a sample obtained with an optical microscope and the like irrespective of texture on the sample surface when the analysis target region is set therein. The analysis target region setting apparatus according to the present invention divides the observation image into a plurality of sub-regions based on pixel information on each pixel constituting the observation image. Subsequently, consolidation information on each sub-region is calculated, and two adjacent sub-regions themselves are consolidated based on the consolidation information. According to this, it is possible to divide the observation image into sub-regions having similar pixel information with a disregard of noise attributed to the shape of a surface and the like. A user designates one sub-region from among the sub-regions finally obtained, as the analysis target region.
-
Patent Agency Ranking
196.发明申请公开(公告)号：US20180136118A1
公开(公告)日：2018-05-17
申请号：US15802286
申请日：2017-11-02
Applicant: Verity Instruments, Inc.
Inventor： Andrew Weeks Kueny , Mike Whelan , Mark Anthony Meloni , John D. Corless , Rick Daignault , Sean Lynes
CPC classification number: G01N21/274 , G01J3/0289 , G01J3/0297 , G01J3/10 , G01J3/2823 , G01J3/443 , G01N21/66 , G01N21/73 , G01N2021/8416 , H01J37/32963 , H01J37/32972 , H01J2237/2482 , H01L21/681 , H01L22/26 , H05H1/0006
Abstract: The disclosure provides an optical calibration device for in-chamber calibration of optical signals associated with a processing chamber, a characterization system for plasma processing chambers, methods of characterizing plasma processing chambers, and a chamber characterizer. In one example, the optical calibration device includes: (1) an enclosure, (2) an optical source located within the enclosure and configured to provide a source light having a continuous spectrum, and (3) optical shaping elements located within the enclosure and configured to form the source light into a calibrating light that approximates a plasma emission during an operation within the processing chamber.
-
公开(公告)号：US20180120157A1
公开(公告)日：2018-05-03
申请号：US15568913
申请日：2016-04-29
Applicant: OSRAM OPTO SEMICONDUCTORS GMBH
Inventor： Nils Kaufmann , Alexander Martin
CPC classification number: G01J3/108 , G01J3/0289 , G01J3/10 , G01J3/18 , G01J3/42 , H01L33/50 , H01L33/505 , H01L33/58
Abstract: An optoelectronic arrangement includes an optoelectronic semiconductor chip, a wavelength-converting element and a detector component, wherein the optoelectronic arrangement is configured to emit light with a first peak wavelength and to emit light with a second peak wavelength, the first peak wavelength is in the visible spectral range and the second peak wavelength is in the non-visible spectral range or the first peak wavelength is in the non-visible spectral range and the second peak wavelength is in the visible spectral range, and the optoelectronic arrangement emits the light whose peak wavelength is in the non-visible spectral range into a target area, and the detector component is configured to detect light backscattered from the target area and the peak wavelength of which is in the non-visible spectral range.
-
公开(公告)号：US20180095304A1
公开(公告)日：2018-04-05
申请号：US15192811
申请日：2016-06-24
Applicant: QUALCOMM Incorporated
Inventor： Linda Irish , Russell Gruhlke , Manav Raina
CPC classification number: G02F1/113 , G01J3/0289 , G01J3/44 , G01N21/359 , G01N2021/1738 , G01S7/4814 , G01S7/4817 , G01S7/4818 , G02B26/103 , G06F3/0423 , G06T2207/10052
Abstract: Disclosed herein are techniques for determining the position of a light beam on a beam shaping device. A feature can be formed on the beam shaping device to affect at least a portion of a light beam when the feature is illuminated by the light beam. When the light beam is directed onto the feature on the beam shaping device, a feature detection signal may be generated by a detector in response to detecting at least the portion of the light beam affected by the feature that has been illuminated by the light beam. The position of the light beam on the beam shaping device at a time instant can then be determined based, at least in part, on the feature detection signal.
-
199.发明申请公开(公告)号：US20180086097A1
公开(公告)日：2018-03-29
申请号：US15714582
申请日：2017-09-25
Applicant: SEIKO EPSON CORPORATION
Inventor： Masako FUKUDA , Masashi KANAI
CPC classification number: B41J2/2103 , B41J11/009 , B41J13/0009 , G01J1/0228 , G01J1/0242 , G01J3/0289 , G01J3/502 , G01N21/25
Abstract: A liquid ejecting apparatus includes a liquid ejecting head that ejects a liquid onto a medium, a color measuring unit configured to measure color of a surface of the medium, having a light projecting unit emits a light flux to the surface of the medium and a light receiving unit receiving light obtained by reflecting light emitted from the light projecting unit on the surface of the medium, a changing unit configured to change a reflection position of light, which matches the central axis of the light flux from the light projecting unit, on the medium, and a control unit configured to set the reflection position where color measurement data indicating the highest lightness of the color measurement data pieces of the surface of the medium is obtained as a color measurement position.
-
公开(公告)号：US09927296B2
公开(公告)日：2018-03-27
申请号：US14307975
申请日：2014-06-18
Applicant: Rosemount Analytical Inc.
Inventor： Peter Schachinger
CPC classification number: G01J3/0202 , G01J3/0289 , G01J3/28 , G01N21/15 , G01N21/39 , G02B7/1824 , G02B7/1825
Abstract: An adjustable mount for an optical device in a laser spectroscopy system is provided. The adjustable mount includes body configured to mount to a process and a reflector mount having a feature configured to mount an optical device. An interface between the body and the reflector mount allows relative motion between the reflector mount and the body. At least one alignment device is configured to engage the reflector mount and the body to fix a position of the reflector mount relative to the body. An optical device is removably mounted to the reflector mount independent of the alignment device and is sealed to the reflector mount.
-
-
-
-
-
-
-
-
-
Search Results
507
records
(took 0.027 seconds)
