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    Photo-ionization detector and method for continuous operation and real-time self-cleaning
    21.
    发明申请
    Photo-ionization detector and method for continuous operation and real-time self-cleaning 有权
    光电离检测器及连续操作方法及实时自清洁

    公开(公告)号：US20020179846A1

    公开(公告)日：2002-12-05

    申请号：US09870179

    申请日：2001-05-29

    Inventor： Hong T. Sun ,  Peter C. Hsi

    IPC: H01J001/08

    CPC classification number: G01N33/0026 ,  G01N27/66 ,  G01N33/0029 ,  G01N33/0047 ,  H01J41/02

    Abstract: A photo-ionization detector (PID) includes a microprocessor, a first gas detection unit, and a second gas detection unit. The microprocessor controls the first and second gas detection units such that ambient gas always flows through the ionization chamber of one of the gas detection units while the flow of the ambient gas is closed in the ionization chamber of the other one of the gas detection units. The UV lamp converts oxygen in the closed ambient gas to ozone, which removes contamination in the ionization chamber with the closed ambient gas. When the PID includes only one gas detection unit, the microprocessor controls the gas detection unit such that the flow of the ambient gas in the ionization chamber is intermittently interrupted. A method of real-time self-cleaning and measuring of a volatile gas concentration with the PID includes flowing the ambient gas through the ionization chamber of the first gas detection unit, so that the PID measures the volatile gas concentration, and stopping the ambient gas through the ionization chamber of the second gas detection unit so that the ambient gas is closed in the ionization chamber of the second gas detection unit while the ambient gas flows through the ionization chamber of the first gas detection unit. The UV lamp converts oxygen contained in the ambient gas in the ionization chamber of the second gas detection unit to ozone, which removes contamination in the ionization chamber of the second gas detection unit.

    Abstract translation: 光电离检测器（PID）包括微处理器，第一气体检测单元和第二气体检测单元。 微处理器控制第一和第二气体检测单元，使得环境气体总是流过气体检测单元之一的电离室，同时环境气体的流动在气体检测单元的另一个的离子化室中关闭。 UV灯将封闭的环境气体中的氧气转化为臭氧，从而消除了电离室中封闭环境气体的污染。 当PID仅包括一个气体检测单元时，微处理器控制气体检测单元，使得电离室中的环境气体的流动被间歇地中断。 利用PID实时自清洁和测量挥发性气体浓度的方法包括使环境气体流过第一气体检测单元的离子化室，使得PID测量挥发性气体浓度，并且停止环境气体 通过第二气体检测单元的电离室，使得环境气体在第一气体检测单元的离子化室内流过的同时，在第二气体检测单元的离子化室中封闭环境气体。 UV灯将第二气体检测单元的电离室中的环境气体中包含的氧转换为臭氧，从而去除第二气体检测单元的电离室中的污染物。

    Portable device for detecting UV light ionizable gas or vapor
    22.
    发明授权
    Portable device for detecting UV light ionizable gas or vapor 失效
    用于检测UV光可电离气体或蒸气的便携式设备

    公开(公告)号：US5572137A

    公开(公告)日：1996-11-05

    申请号：US182041

    申请日：1994-01-25

    Applicant: Christopher D. Jones

    Inventor： Christopher D. Jones

    IPC: G01N27/64 ,  G01N27/66 ,  G01N33/00 ,  H01J41/02

    CPC classification number: G01N27/66 ,  G01N33/0011 ,  H01J41/02

    Abstract: An improved ionizable gas or vapor detector device and method are provided which are capable in preferred forms of sampling 4.times.10.sup.-3 cubic meters or more of air sec.sup.-1 and are responsive to ionizable gas fluctuations at a rate of up to 100Hz. Use of the device of the present invention has proved to provide sensitivity to UV ionizable gas or vapor of over 500 times that of prior devices, giving detection of propylene tracer gas at concentrations of 2 parts per 1,000,000,000 and thus increasing the range from the gas source at which the device may be reliably used. Use for detection of leaks of volatile UV ionizable compounds and for monitoring processes where vapors are emitted is also provided.

    Abstract translation: PCT No.PCT / GB92 / 01313 Sec。 371日期：1994年1月25日 102（e）日期1994年1月25日PCT提交1992年7月17日PCT公布。 公开号WO93 / 02354 日期1994年2月4日提供了一种改进的可电离气体或蒸汽检测装置和方法，其能够以4×10 -3立方米或更多的空气sec-1采样的优选形式，并且以可达到的气体波动 100Hz。 已经证明使用本发明的装置可以提供超过现有装置的500倍以上的可紫外可电离气体或蒸气的灵敏度，从而检测浓度为每1,000,000,000份2份的丙烯示踪气体，从而增加了气源 可以可靠地使用该装置。 用于检测挥发性紫外线可电离化合物的泄漏以及用于发出蒸气的监测过程。

    Ionization gauge for high pressure operation
    29.
    发明授权
    Ionization gauge for high pressure operation 有权
    用于高压操作的电离计

    公开(公告)号：US09593996B2

    公开(公告)日：2017-03-14

    申请号：US14377449

    申请日：2013-02-07

    Applicant: MKS Instruments, Inc.

    Inventor： Gerardo A. Brucker

    IPC: H01J27/02 ,  B01D59/44 ,  G01L19/06 ,  G01L21/32 ,  H01J41/04 ,  G01L21/30 ,  H01J1/52 ,  H01J41/02

    CPC classification number: G01L21/32 ,  G01L19/0627 ,  G01L21/30 ,  H01J1/52 ,  H01J41/02 ,  H01J41/04

    Abstract: An ionization gauge to measure pressure, while controlling the location of deposits resulting from sputtering when operating at high pressure, includes at least one electron source that emits electrons, and an anode that defines an ionization volume. The ionization gauge also includes a collector electrode that collects ions formed by collisions between the electrons and gas molecules and atoms in the ionization volume, to provide a gas pressure output. The electron source can be positioned at an end of the ionization volume, such that the exposure of the electron source to atom flux sputtered off the collector electrode and envelope surface is minimized. Alternatively, the ionization gauge can include a first shade outside of the ionization volume, the first shade being located between the electron source and the collector electrode, and, optionally, a second shade between the envelope and the electron source, such that atoms sputtered off the envelope are inhibited from depositing on the electron source.

    Abstract translation: 用于测量压力的电离计，同时控制在高压下操作时由溅射产生的沉积物的位置，包括至少一个发射电子的电子源和限定电离体积的阳极。 电离计还包括收集电极，其收集由电子和气体分子之间的碰撞形成的离子和电离体积中的原子，以提供气体压力输出。 电子源可以位于电离体积的末端，使得电子源暴露于从集电极电极和包膜表面溅射的原子通量被最小化。 或者，电离计可以包括离子化体积外的第一阴影，第一阴影位于电子源和集电极之间，以及可选地，在封套和电子源之间的第二阴影，使得原子溅射 该封套被禁止沉积在电子源上。

    SYSTEM AND METHOD FOR IDENTIFYING OPERATING TEMPERATURES AND MODIFYING OF INTEGRATED CIRCUITS
    30.
    发明申请
    SYSTEM AND METHOD FOR IDENTIFYING OPERATING TEMPERATURES AND MODIFYING OF INTEGRATED CIRCUITS 有权
    识别操作温度的系统和方法以及整合电路的修改

    公开(公告)号：US20160240479A1

    公开(公告)日：2016-08-18

    申请号：US14624907

    申请日：2015-02-18

    Applicant: GLOBALFOUNDRIES INC.

    Inventor： Jeanne P. Bickford ,  Nazmul Habib ,  Baozhen Li ,  Tad J. Wilder

    IPC: H01L23/525 ,  G01K7/16 ,  H01L23/532 ,  G01N25/00

    CPC classification number: G01K7/16 ,  G01L21/30 ,  G01N17/00 ,  G01N27/62 ,  G01N27/64 ,  G01R31/00 ,  H01J41/00 ,  H01J41/02 ,  H01L23/34

    Abstract: Aspects of the present disclosure include a computer-implemented method for identifying an operating temperature of an integrated circuit (IC), the method including using a computing device for: applying a test voltage to a test circuit embedded within the IC, the test circuit including a phase shift memory (PSM) element therein, wherein the PSM element crystallizes at a crystallization temperature from an amorphous phase having a first electrical resistance into a crystalline phase having a second electrical resistance, the second electrical resistance being less than the first electrical resistance; and identifying the IC as having operated above the crystallization temperature in response to a resistance of the test circuit at the test voltage being outside of the target operating range.

    Abstract translation: 本公开的方面包括用于识别集成电路（IC）的工作温度的计算机实现的方法，所述方法包括使用计算设备：将测试电压施加到嵌入在所述IC内的测试电路，所述测试电路包括 在其中的相移存储器（PSM）元件，其中所述PSM元件在结晶温度下从具有第一电阻的非晶相结晶成具有第二电阻的晶相，所述第二电阻小于所述第一电阻; 以及响应于所述测试电压在所述测试电压处于目标工作范围之外的电阻而将所述IC识别为高于所述结晶温度的IC。

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