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    Modulation mask for an image display device
    21.
    发明授权
    Modulation mask for an image display device 失效
    用于图像显示设备的调制掩码

    公开(公告)号：US4001619A

    公开(公告)日：1977-01-04

    申请号：US641502

    申请日：1975-12-17

    Applicant: John Guiry Endriz ,  Carmen Anthony Catanese

    Inventor： John Guiry Endriz ,  Carmen Anthony Catanese

    IPC: H01J3/40 ,  H01J29/46 ,  H01J43/18 ,  H01J43/00

    CPC classification number: H01J3/40 ,  H01J29/467 ,  H01J43/18

    Abstract: A metal sheet is provided with a plurality of slots which are disposed in parallel rows and columns. Charge sensing pads are disposed on an insulating layer on one surface of the metal sheet with a separate pair of the charge sensing pads being in abutting relation and sandwiching a separate slot. The sensing pads include a portion which extends beyond the length of the slot and is of a material having a high secondary emission ratio. The sensing pads have a capacitance to the metal layer such that they can be electrically charged to a common voltage level which permits a substantially uniform maximum electrical charge to pass into each one of the slots when the abutting sensing pads are discharged by line electron sources. The charge sensing pads may be repetitively charged, i.e., brought back to the common level, through secondary emission from the portions of the pads which extend beyond the slots. A plurality of substantially parallel modulating electrodes are disposed on, but insulated from, the other surface of the metal sheet. Each one of the modulating electrodes extends around one of the parallel columns of slots. The modulating electrodes control the charge which exits from each one of the slots during a charge-discharge cycle. The modulating mask is suitable for use with line electron sources to form a display having desirable characteristics. The modulation mask can be used in conjunction with feedback multiplier line sources as long as high energy electrons are eliminated through the use of high energy electron filters.

    SYSTEM AND METHOD FOR IDENTIFYING, SELECTING AND PURIFYING PARTICLES
    22.
    发明公开
    SYSTEM AND METHOD FOR IDENTIFYING, SELECTING AND PURIFYING PARTICLES 审中-公开

    公开(公告)号：US20240050895A1

    公开(公告)日：2024-02-15

    申请号：US17766388

    申请日：2020-10-09

    Applicant: THE TRUSTEES OF INDIANA UNIVERSITY

    Inventor： Brooke A. BROWN ,  David E. CLEMMER ,  Martin F. JARROLD

    IPC: B01D59/46 ,  H01J49/26 ,  H01J3/40

    CPC classification number: B01D59/46 ,  H01J49/26 ,  H01J3/40

    Abstract: A method for purifying particles generates charged particles from a sample, measures at least at least one of masses, charge magnitudes and mobilities of the generated charged particles, and selectively passes to a particle collection target each of the measured charged particles having at least one of (a) a measured mass equal to a selected mass or within a selected range of particle masses, (b) a measured charge magnitude equal to a selected charge magnitude or within a selected range of charge magnitudes, (c) a mass-to-charge ratio equal to a selected mass-to-charge ratio or within a selected range of mass-to-charge ratios, and (d) a measured mobility equal to a selected mobility or within a selected range of mobilities. In some embodiments, the collected particles may be harvested and amplified.

    Multiple electrode field electron emission device and method of manufacture
    26.
    发明授权
    Multiple electrode field electron emission device and method of manufacture 失效
    多电极场电子发射装置及其制造方法

    公开(公告)号：US5386172A

    公开(公告)日：1995-01-31

    申请号：US882436

    申请日：1992-05-13

    Applicant: Hiroshi Komatsu

    Inventor： Hiroshi Komatsu

    IPC: H01J1/304 ,  H01J1/46 ,  H01J1/52 ,  H01J3/08 ,  H01J3/40 ,  H01J9/02 ,  H01J19/24 ,  H01J19/38 ,  H01J21/10 ,  H01J1/02 ,  H01J1/16

    CPC classification number: H01J21/105 ,  H01J1/3042 ,  H01J9/025

    Abstract: A multiple electrode field electron emission device is formed on an insulating layer disposed on a surface of an insulated flat substrate and has a cathode with multiple of emission projections each having a projection tip that overhangs the insulating layer. The device further includes an anode for collecting electrons ejected from the cathode emission projections formed on the surface of the substrate. Control electrodes, having one of several alternate configurations, are formed between the cathode and the anode. The device is fabricated using over-etching and directional particulate deposition techniques.

    Abstract translation: 在设置在绝缘平坦基板的表面上的绝缘层上形成多电极场电子发射装置，并且具有多个发射突起的阴极，每个发射突起均具有突出绝缘层的突出端。 该装置还包括用于收集从形成在基板的表面上的阴极发射突起喷出的电子的阳极。 在阴极和阳极之间形成具有若干备选配置之一的控制电极。 该器件使用过蚀刻和定向微粒沉积技术制造。

    Dust collector in a cathode ray tube
    27.
    发明授权
    Dust collector in a cathode ray tube 失效
    阴极射线管中的集尘器

    公开(公告)号：US5371432A

    公开(公告)日：1994-12-06

    申请号：US889968

    申请日：1992-05-29

    Applicant: Myoung Ho Park ,  Cheol Ho Whang

    Inventor： Myoung Ho Park ,  Cheol Ho Whang

    IPC: H01J29/50 ,  H01J3/40 ,  H01J29/84

    CPC classification number: H01J3/40 ,  H01J29/84

    Abstract: A dust collector for collecting dust in a cathode ray tube includes collecting parts which form a collecting space for collecting dust in the cathode ray tube. One of the collecting parts is formed by a retainer for retaining the collecting parts in the cathode ray tube. The dust collector improves the internal voltage characteristics of the CRT and the picture quality.

    Abstract translation: 用于在阴极射线管中收集灰尘的集尘器包括形成用于收集阴极射线管中的灰尘的收集空间的收集部分。 其中一个收集部分由用于将收集部分保持在阴极射线管中的保持器形成。 集尘器改善了CRT的内部电压特性和图像质量。

    Arrangement for preventing the alteration of the primary beam by unwanted particles, such as sputter products, charged ions and electrons and their secondary processes
    28.
    发明授权
    Arrangement for preventing the alteration of the primary beam by unwanted particles, such as sputter products, charged ions and electrons and their secondary processes 失效
    用于防止由不需要的颗粒（例如溅射产物，带电离子和电子）改变主光束的布置及其二次工艺

    公开(公告)号：US4123655A

    公开(公告)日：1978-10-31

    申请号：US827307

    申请日：1977-08-24

    Applicant: Uwe Maixner ,  Dieter Milferstadt

    Inventor： Uwe Maixner ,  Dieter Milferstadt

    IPC: G01N23/227 ,  G01N23/00 ,  G21K1/02 ,  H01J3/40 ,  H01J5/02 ,  H01J37/09 ,  H01J37/30 ,  H01J49/44 ,  H01J49/48 ,  H01J39/00

    CPC classification number: H01J3/40 ,  G21K1/025 ,  H01J37/09 ,  H01J37/3002 ,  H01J49/482

    Abstract: An arrangement relating to the prevention of the alteration of the primaryeam by unwanted particles, such as sputter products, charged ions and electrons and their secondary processes, and to the resulting local improvement in the operational vacuum in electron-beam devices, ion-beam devices and in electron-energy analyzers and ion-mass analyzers using only three-dimensional metallic microstructures known as particle traps. Substantially all the flat parts of the components of the instrument seen by the beams, such as electrodes, diaphragms, screening plates, housing walls and the like, consist of a metal having a low atomization rate and a very low desorption rate, such as titanium or zirconium or similar substances and their alloys. Apertures of less than 0.5 mm in diameter, situated close beside one another and extending substantially perpendicular to the surface, are provided in the surfaces of the components of the instrument, between which apertures a lattice structure remains located in the surface, the depth of the apertures being equal to or larger than their opening cross-section and the total cross-sectional area of the apertures corresponding to at least half the metal surface occupied thereby.

    Abstract translation: 与防止由不需要的颗粒（例如溅射产物，带电离子和电子）及其次要过程的主要束的改变以及由此导致的电子束装置中的操作真空的局部改进，离子束 器件和电子能量分析仪和离子质量分析仪仅使用三维金属微结构称为颗粒捕集阱。 基本上由梁观察到的仪器部件的所有平面部分，例如电极，隔膜，筛板，壳体壁等都由具有低雾化速率和非常低的解吸速率的金属组成，例如钛 或锆或类似物质及其合金。 在仪器部件的表面中设置直径小于0.5mm的孔径，彼此靠近并且基本上垂直于表面延伸，在孔的表面中，格子结构保持位于表面中，孔的深度 孔径等于或大于其开口横截面，并且孔的总横截面积对应于由此占据的金属表面的至少一半。

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