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    METHOD OF COMPENSATING FREQUENCY DRIFT IN AN INTERFEROMETER
    32.
    发明申请
    METHOD OF COMPENSATING FREQUENCY DRIFT IN AN INTERFEROMETER 有权
    在干扰仪中补偿频率干扰的方法

    公开(公告)号：US20140336972A1

    公开(公告)日：2014-11-13

    申请号：US14345471

    申请日：2011-10-17

    Applicant: Henrik Vilstrup Juhl

    Inventor： Henrik Vilstrup Juhl

    IPC: G01J3/45

    CPC classification number: G01J3/45 ,  G01J2003/283

    Abstract: A method of compensating for frequency drift of a reference energy source in an FT interferometer based spectrometer instrument, the method further comprising comparing in an arithmetic unit data representing a reference interferogram and data representing a target interferogram to determining a phase shift between the interferograms in a window W in at least one region away from center-burst and generating in the arithmetic unit a mathematical transform dependent on the determined shift or shifts to be subsequently applied to control the operation of the spectrometer instrument in order to generate data representing a frequency stabilized interferogram of an unknown sample recorded by the FT interferometer.

    Abstract translation: 一种在基于FT干涉仪的光谱仪器中补偿参考能量源的频率漂移的方法，该方法还包括在运算单元中比较代表参考干涉图的数据和表示目标干涉图的数据，以确定干涉图中的相移 窗口W在远离中心突发的至少一个区域中，并且在算术单元中产生依赖于所确定的移位或移位的数学变换，以随后应用于控制光谱仪仪器的操作，以便生成表示频率稳定干涉图 由FT干涉仪记录的未知样本。

    SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING STATE MAPPING
    33.
    发明申请
    SYSTEMS AND METHOD FOR LASER VOLTAGE IMAGING STATE MAPPING 有权
    用于激光电压成像状态映射的系统和方法

    公开(公告)号：US20100277159A1

    公开(公告)日：2010-11-04

    申请号：US12772899

    申请日：2010-05-03

    Applicant: Yin Shyang NG ,  Dmitry Skvortsov

    Inventor： Yin Shyang NG ,  Dmitry Skvortsov

    IPC: G01R13/40 ,  G01N21/55

    CPC classification number: G01R31/311 ,  G01J3/28 ,  G01J2003/283

    Abstract: An apparatus and method for laser probing of a DUT is disclosed. The system enables laser voltage imaging state mapping of devices within the DUT. A selected area of the DUT is illuminating a while the DUT is receiving test signals causing certain of the active devices to modulate. Light reflected from the DUT is collected and is converted into an electrical signal. Phase information is extracting from the electrical signal and a two-dimensional image is generated from the phase information, wherein the two-dimensional image spatially correlates to the selected area.

    Abstract translation: 公开了一种用于DUT的激光探测的装置和方法。 该系统实现DUT内的器件的激光电压成像状态映射。 DUT的选定区域在DUT正在接收到导致某些有源器件调制的测试信号的同时点亮。 从DUT被反射的光被收集并转换成电信号。 从电信号提取相位信息，并从相位信息生成二维图像，其中二维图像与所选择的区域空间相关。

    System for distributing and controlling color reproduction at multiple sites
    35.
    发明申请
    System for distributing and controlling color reproduction at multiple sites 有权
    用于分布和控制多个站点色彩再现的系统

    公开(公告)号：US20030020703A1

    公开(公告)日：2003-01-30

    申请号：US10209431

    申请日：2002-07-31

    Inventor： Richard A. Holub

    IPC: G09G005/00

    CPC classification number: H04N9/646 ,  G01B11/002 ,  G01J3/02 ,  G01J3/0218 ,  G01J3/0224 ,  G01J3/0262 ,  G01J3/0291 ,  G01J3/1838 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/46 ,  G01J3/462 ,  G01J3/463 ,  G01J3/465 ,  G01J3/505 ,  G01J3/51 ,  G01J3/524 ,  G01J2003/283 ,  G01J2003/2866 ,  G03F7/70058 ,  G06T5/005 ,  G06T5/40 ,  G06T7/90 ,  G09G5/02 ,  G09G2320/0276 ,  G09G2320/043 ,  G09G2320/0606 ,  G09G2320/0626 ,  G09G2320/066 ,  G09G2320/0666 ,  G09G2320/0693 ,  G09G2320/08 ,  H04N1/6055 ,  H04N1/6058 ,  H04N9/643 ,  H04N9/69 ,  H04N17/02

    Abstract: In the color imaging system, multiple rendering devices are provided at different nodes along a network. Each rendering device has a color measurement instrument for calibrating the color presented by the rendering device. A rendering device may represent a color display in which a member surrounds the outer periphery of the screen of the display and a color measuring instrument is coupled to the first member. The color measuring instrument includes a sensor spaced from the screen at an angle with respect to the screen for receiving light from an area of the screen. A rendering device may be a printer in which the measuring of color samples on a sheet rendered by the printer is provided by a sensor coupled to a transport mechanism which moves the sensor and sheet relative to each other, where the sensor provides light from the sample to a spectrograph. The color measuring instruments provide for non-contact measurements of color samples either displayed on a color display, or printed on a sheet, and are self-calibrating by the use of calibration references in the instrument.

    Abstract translation: 在彩色成像系统中，沿网络的不同节点提供多个渲染设备。 每个渲染设备具有用于校准由渲染设备呈现的颜色的颜色测量仪器。 渲染设备可以表示其中元件围绕显示器的屏幕的外周边并且颜色测量仪器耦合到第一构件的彩色显示器。 色彩测量仪器包括一个与屏幕相对于屏幕以一定角度与屏幕隔开接收来自屏幕区域的光的传感器。 渲染装置可以是其中由打印机呈现的片材上的颜色样本的测量由耦合到传送机构的传感器提供的传感器和片材相对于彼此移动的打印机，其中传感器提供来自样品的光 到一个光谱仪。 色彩测量仪器可以对彩色样品进行非接触式测量，显示在彩色显示屏上，或打印在纸张上，并通过在仪器中使用校准参考进行自校准。

    Systems for the direct analysis of solid samples by atomic emission spectroscopy
    36.
    发明授权
    Systems for the direct analysis of solid samples by atomic emission spectroscopy 失效
    通过原子发射光谱直接分析固体样品的系统

    公开(公告)号：US4824249A

    公开(公告)日：1989-04-25

    申请号：US165261

    申请日：1987-12-01

    Applicant: Michael A. Lucas ,  Terry C. Hughes

    Inventor： Michael A. Lucas ,  Terry C. Hughes

    IPC: G01J3/28 ,  G01J3/443 ,  G01N21/67 ,  G01J3/30

    CPC classification number: G01N21/67 ,  G01J2003/283 ,  G01J3/443

    Abstract: An analysis system for directly analyzing solid samples by atomic emission spectroscopy wherein the system includes an atomic spectral lamp (1) of the type which enables a solid sample to be analyzed to be demountably located as a cathode of the lamp (1), means (2) for producing a primary electric discharge by cathodic sputtering from the sample via connection (8) and a secondary boosted discharge for analytical emission via connection (9), spectral wave length analysis device (4) being arranged to receive and determine the intensity of spectral lines emitted by the lamp (1), and control means (3) for controlling the system, the current level of the sample cathode and the operation of the spectral wave length analysis device (4) being controlled on the basis of output from the photomultiplier tube (7) such that the intensity of the spectral lines is maximized and the relationship between spectral line intensity and concentration of the corresponding element in the sample is maintained in a region which is substantially linear.

    Abstract translation: PCT No.PCT / AU87 / 00101 Sec。 371 1987年12月1日第 102（e）1987年12月1日PCT PCT 1987年4月15日PCT公布。 公开号WO87 / 06341 日本1987年10月22日。用于通过原子发射光谱直接分析固体样品的分析系统，其中所述系统包括能够使固体样品被分析的类型的原子光谱灯（1）可拆卸地定位为 灯（1），用于通过连接（8）从样品通过阴极溅射产生一次放电的装置（2）和经由连接（9）进行分析发射的次级升压放电，光谱波长分析装置（4）被布置 接收和确定由灯（1）发射的光谱线的强度，以及用于控制系统的控制装置（3），样品阴极的电流水平和光谱波长分析装置（4）的操作被控制 基于光电倍增管（7）的输出，使得光谱线的强度最大化，并且光谱线强度与sa中相应元素的浓度之间的关系 mple保持在基本上线性的区域中。

    Analog-to-digital conversion and averaging system for an optical analyzing instrument
    37.
    发明授权
    Analog-to-digital conversion and averaging system for an optical analyzing instrument 失效
    用于光学分析仪器的模数转换和平均系统

    公开(公告)号：US4602243A

    公开(公告)日：1986-07-22

    申请号：US489022

    申请日：1983-04-27

    Applicant: Kenneth P. Von Bargen ,  Kenneth A. Taschner

    Inventor： Kenneth P. Von Bargen ,  Kenneth A. Taschner

    IPC: G01J1/44 ,  G01J3/12 ,  G01J3/28 ,  H03M1/06 ,  H03M1/12 ,  H03K5/00

    CPC classification number: H03M1/0658 ,  G01J3/28 ,  G01J2003/123 ,  G01J2003/283 ,  G01J2003/2853 ,  H03M1/12

    Abstract: In an optical instrument which provides an analog signal representing the intensity of the reflected light from a sample, the sample is irradiated with narrow band wavelength light with the wavelength being repeatedly swept through a range of values to produce a repeating analog signal. Sampling pulses are produced simultaneously with the repeating analog signal to determine a sampling interval. An analog-to-digital converter is connected to receive the analog signal and converts the analog signal to a binary value several times in response to each sampling pulse. The binary values produced in response to each sampling signal are averaged and fed to a digital computer. In the digital computer, the received values are again averaged with other values produced in response to the sampling pulse produced at the same point in the scan of the wavelength irradiating the sample.

    Abstract translation: 在提供表示来自样品的反射光的强度的模拟信号的光学仪器中，用窄带波长的光照射样品，其中波长被反复扫过一定范围的值，以产生重复的模拟信号。 与重复的模拟信号同时产生采样脉冲以确定采样间隔。 连接模数转换器以接收模拟信号，并响应于每个采样脉冲将模拟信号转换成二进制值多次。 对每个采样信号响应产生的二进制值进行平均并馈送到数字计算机。 在数字计算机中，接收的值再次与响应于在照射样品的波长的扫描中的相同点产生的采样脉冲而产生的其它值进行平均。

    OPTICAL FREQUENCY SENSORS BASED ON PRE-MODULATED QUADRATURE-SELF-HETERODYNE INTEFEROMETRY
    39.
    发明公开
    OPTICAL FREQUENCY SENSORS BASED ON PRE-MODULATED QUADRATURE-SELF-HETERODYNE INTEFEROMETRY 审中-公开

    公开(公告)号：US20240183714A1

    公开(公告)日：2024-06-06

    申请号：US18527210

    申请日：2023-12-01

    Applicant: Technion Research & Development Foundation Limited

    Inventor： Moshe Nazarathy ,  Anna Kodanev

    IPC: G01J3/45 ,  G01J3/32

    CPC classification number: G01J3/45 ,  G01J3/32 ,  G01J2003/283

    Abstract: An optical frequency sensor that includes (i) a heterodyne modulation and splitting unit that is configured to receive a first laser signal, modulate the first laser signal to provide a modulated laser signal and split the modulated laser signal to provide pre-processed optical signals; (ii) a self-coherent interferometer that includes (ii.1) a first optical processor that is configured to process the pre-processed optical signals to provide processed optical signals, and (ii.2) a detection unit that is configured to electro-optically mix the processed optical signals and photodetect an outcome of the mixing to provide detection signalsm and (iii) a signal processor configured to process the one or more digital signals to provide digital information about the first laser signal.

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