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    A SURFACE REFRACTIVE INDEX SCANNING SYSTEM AND METHOD
    46.
    发明申请
    A SURFACE REFRACTIVE INDEX SCANNING SYSTEM AND METHOD 审中-公开

    公开(公告)号：US20170269002A1

    公开(公告)日：2017-09-21

    申请号：US15309732

    申请日：2015-05-08

    Applicant: Danmarks Tekniske Universitet

    Inventor： Anders Kristensen ,  Christoph Vannahme ,  Martin Dufva

    IPC: G01N21/77 ,  H01S3/08 ,  G01J3/18 ,  G01J3/28 ,  G01N21/41 ,  G01J3/02

    CPC classification number: G01N21/7743 ,  G01J3/0245 ,  G01J3/1895 ,  G01J3/2823 ,  G01J2003/064 ,  G01N21/4133 ,  G01N2021/7776 ,  G01N2021/7789 ,  G02B6/00 ,  G02B6/1225 ,  G02F1/39 ,  H01S3/0635 ,  H01S3/08009 ,  H01S3/168 ,  H01S3/2391

    Abstract: The invention relates to a surface refractive index scanning system for characterization of a sample. The system comprises a grating device for holding or receiving the sample, the device comprising at least a first grating region having a first grating width along a transverse direction, and a second grating region having a second grating width in the transverse direction. The first grating region and the second grating region are adjacent in the transverse direction, wherein the first grating region has a grating period Λ1 in a longitudinal direction, and the second grating region has a grating period Λ2 in the longitudinal direction, where the longitudinal direction is orthogonal to the transverse direction. A grating period spacing ΔΛ=Λ1-Λ2 is finite. Further, the first and second grating periods are chosen to provide optical resonances for light respectively in a first wavelength band and a second wavelength band, light is being emitted, transmitted, or reflected in an out-of-plane direction, wherein the first wavelength band and the second wavelength band are at least partially non-overlapping in wavelength. The system further comprises a light source for illuminating at least a part of the grating device with light at an illumination wavelength band. Additionally, the system comprises an imaging system for imaging the emitted, transmitted or reflected light from the grating device. The imaging system comprises an optical element, such as a cylindrical lens or a bended mirror, configured for focusing light in a transverse direction and for being invariant in an orthogonal transverse direction, the optical element being oriented such that the longitudinal direction of the grating device is oriented to coincide with the invariant direction of the optical element, and an imaging spectrometer comprising an entrance slit having a longitudinal direction oriented to coincide with the invariant direction of the optical element. The imaging spectrometer further comprises a 2-dimensional image sensor. The invention further relates to a method.

    Systems, Methods, and Apparatus for Radiation Detection
    48.
    发明申请
    Systems, Methods, and Apparatus for Radiation Detection 有权
    用于辐射检测的系统，方法和装置

    公开(公告)号：US20160258807A1

    公开(公告)日：2016-09-08

    申请号：US15061308

    申请日：2016-03-04

    Applicant: Brandt Christopher Pein ,  Harold Young Hwang ,  Wendi Chang ,  Keith A. Nelson ,  Vladimir Bulovic ,  Nathaniel C. Brandt

    Inventor： Brandt Christopher Pein ,  Harold Young Hwang ,  Wendi Chang ,  Keith A. Nelson ,  Vladimir Bulovic ,  Nathaniel C. Brandt

    IPC: G01J1/04 ,  G01J1/42

    CPC classification number: G01J5/046 ,  G01J1/58 ,  G01J3/0216 ,  G01J3/0245 ,  G01J3/04 ,  G01J3/42 ,  G01J5/0815 ,  G01J5/0837

    Abstract: A radiation detection technique employs field enhancing structures and electroluminescent materials to converts incident Terahertz (THz) radiation into visible light and/or infrared light. In this technique, the field-enhancing structures, such as split ring resonators or micro-slits, enhances the electric field of incoming THz light within a local area, where the electroluminescent material is applied. The enhanced electric field then induces the electroluminescent material to emit visible and/or infrared light via electroluminescent process. A detector such as avalanche photodiode can detect and measure the emitted light. This technique allows cost-effective detection of THz radiation at room temperatures.

    Abstract translation: 放射线检测技术采用场增强结构和电致发光材料将入射的太赫兹（THz）辐射转换成可见光和/或红外光。 在这种技术中，诸如开环谐振器或微缝隙的场增强结构增强了施加电致发光材料的局部区域内的进入的THz光的电场。 增强的电场然后诱导电致发光材料通过电致发光工艺发射可见光和/或红外光。 诸如雪崩光电二极管的检测器可以检测和测量发射的光。 这种技术允许在室温下对THz辐射进行成本有效的检测。

    SPECTROSCOPY SYSTEM USING WAVEGUIDE AND EMPLOYING A LASER MEDIUM AS ITS OWN EMISSIONS DETECTOR
    50.
    发明申请
    SPECTROSCOPY SYSTEM USING WAVEGUIDE AND EMPLOYING A LASER MEDIUM AS ITS OWN EMISSIONS DETECTOR 审中-公开
    使用波导的光谱系统和使用激光介质作为其自身的排放检测器

    公开(公告)号：US20150316414A1

    公开(公告)日：2015-11-05

    申请号：US14792252

    申请日：2015-07-06

    Applicant: EMX International, Inc.

    Inventor： Daniel Lee Graybeal ,  Alan Carey Rogers ,  Andrey Muraviev

    IPC: G01J3/10 ,  G01J3/02 ,  G01J3/42

    CPC classification number: G01J3/10 ,  G01J3/0205 ,  G01J3/021 ,  G01J3/0218 ,  G01J3/0245 ,  G01J3/108 ,  G01J3/42 ,  G01N21/3504 ,  G01N21/39 ,  G01N2021/399 ,  G01N2201/06113 ,  G01N2201/0612 ,  G01N2201/0691 ,  G01N2201/0697 ,  G01N2201/08 ,  H01S5/3401

    Abstract: An intracavity laser absorption infrared spectroscopy system for detecting trace analytes in vapor samples. The system uses a spectrometer in communications with control electronics, wherein the control electronics contain an analyte database that contains absorption profiles for each analyte the system is used to detect. The system can not only detect the presence of specific analytes, but identify them as well. The spectrometer uses a hollow cavity waveguide that creates a continuous loop inside of the device, thus creating a large path length and eliminating the need to mechanically adjust the path length to achieve a high Q-factor. In a preferred embodiment, the laser source may serve as the detector, thus eliminating the need for a separate detector.

    Abstract translation: 用于检测蒸汽样品中痕量分析物的腔内激光吸收红外光谱系统。 该系统使用光谱仪与控制电子设备进行通信，其中控制电子装置包含分析物数据库，其包含用于检测系统的每个分析物的吸收曲线。 该系统不仅可以检测特定分析物的存在，还可以识别它们。 光谱仪使用中空腔波导，其在器件内部产生连续环路，从而产生大的路径长度，并且不需要机械地调节路径长度以实现高Q因子。 在优选实施例中，激光源可以用作检测器，因此不需要单独的检测器。

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