公开(公告)号：US3610922A

公开(公告)日：1971-10-05

申请号：US3610922D

申请日：1969-10-16

Applicant: PHILIPS CORP

Inventor： WERNER HELMUT WILHELM WERNER

IPC: G01L21/30 ,  G01N27/62 ,  H01J49/14 ,  H01J49/26 ,  H01J49/28 ,  H01J49/30 ,  H01J39/34

CPC classification number: H01J49/28 ,  H01J49/14 ,  H01J49/30

Abstract: A mass spectrometer of the sector type which can be changed to an ionization manometer in which the ion collector current is a measure of the overall pressure of the gas to be analyzed utilizes a supply circuit for the system of accelerating electrodes in the ion source. The supply circuit provides the system of accelerating electrodes with a constant voltage or a pulsatory voltage in accordance with use as a mass spectrometer or an ionization manometer respectively.

公开(公告)号：US3445650A

公开(公告)日：1969-05-20

申请号：US3445650D

申请日：1965-10-11

Applicant: APPLIED RES LAB

Inventor： LIEBL HELMUT J

IPC: G01Q10/00 ,  G01Q30/06 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/02 ,  H01J49/14 ,  H01J49/20 ,  H01J49/28 ,  H01J49/30 ,  H01J49/32 ,  H01J39/34 ,  B01D59/44 ,  H01J37/26

CPC classification number: H01J49/30 ,  H01J29/58 ,  H01J37/05 ,  H01J37/252 ,  H01J37/256 ,  H01J49/022 ,  H01J49/142 ,  H01J49/20 ,  H01J49/286 ,  H01J49/32 ,  H01J49/322

公开(公告)号：US3194961A

公开(公告)日：1965-07-13

申请号：US26153863

申请日：1963-02-27

Applicant: HEINZ EWALD ,  SIEGFRIED NEUMANN

Inventor： HEINZ EWALD ,  SIEGFRIED NEUMANN

IPC: H01J49/28

CPC classification number: H01J49/286

公开(公告)号：US2667582A

公开(公告)日：1954-01-26

申请号：US1172948

申请日：1948-02-27

Applicant: BACKUS JOHN G

Inventor： BACKUS JOHN G

IPC: H01J49/28

CPC classification number: H01J49/282

公开(公告)号：US2551544A

公开(公告)日：1951-05-01

申请号：US55496544

申请日：1944-09-20

Applicant: NICR ALFRED O C ,  INGHRAM MARK G

Inventor： NICR ALFRED O C ,  INGHRAM MARK G

IPC: H01J49/28

CPC classification number: H01J49/282

公开(公告)号：US20240063004A1

公开(公告)日：2024-02-22

申请号：US18497323

申请日：2023-10-30

Applicant: ADAPTAS SOLUTIONS PTY LTD

Inventor： Russell Jurek ,  Kevin Hunter

IPC: H01J43/18 ,  H01J43/10 ,  H01J43/28 ,  H01J47/00 ,  H01J49/02 ,  H01J49/28

CPC classification number: H01J43/18 ,  H01J43/10 ,  H01J43/28 ,  H01J47/002 ,  H01J47/005 ,  H01J49/025 ,  H01J49/288

Abstract: Components of scientific analytical equipment. More particularly, ion detectors of the type which incorporate electron multipliers and modifications thereto for extending the operational lifetime or otherwise improving performance. The ion detector may be embodied in the form of a particle detector having one or more electron emissive surfaces and/or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and/or the electron collector surface is/are different to the environment immediately external to the detector.

公开(公告)号：US11887832B2

公开(公告)日：2024-01-30

申请号：US17703899

申请日：2022-03-24

Applicant: Thermo Fisher Scientific (Bremen) GmbH

Inventor： Johannes Schwieters ,  Gerhard Jung

IPC: H01J49/28 ,  H01J49/06 ,  H01J49/10

CPC classification number: H01J49/288 ,  H01J49/067 ,  H01J49/105

Abstract: An isotope ratio mass spectrometer has an ion source, a static field mass filter, a reaction cell to induce a mass shift reaction, and a sector field mass analyser for spatially separating ions from the reaction cell according to their m/z. A detector platform detects a plurality of different ion species separated by the sector field mass analyser. The static field mass filter has a first Wien filter that deflects ions away from a longitudinal symmetry axis of the spectrometer in accordance with the ions' m/z, and a second Wien filter that deflects ions back towards the longitudinal symmetry axis in accordance with the ions' m/z. An inverting lens is positioned along the longitudinal axis between the Wien filters to invert the direction of deflection of the ions from the first Wien filter. The static field mass filter provides high transmission and improved spectrometer sensitivity. The first and second Wien filters permit simple tuning.

公开(公告)号：US20230411134A1

公开(公告)日：2023-12-21

申请号：US18459749

申请日：2023-09-01

Applicant: Northrop Grumman Systems Corporation

Inventor： Vivian W. Ryan ,  Sameh S. Wanis ,  Carl B. Freidhoff ,  Clinton Ung

IPC: H01J49/06 ,  H01J49/28

CPC classification number: H01J49/066 ,  H01J49/063 ,  H01J49/284

Abstract: An apparatus for particle collection is provided. The apparatus includes a magnetic element configured to generate a tapered magnetic ion transport tunnel that collects particles from a local environment, a detector configured to perform one or more measurements of the collected particles, and ion optics configured to transport the collected particles to the detector.

公开(公告)号：US11587777B2

公开(公告)日：2023-02-21

申请号：US17225558

申请日：2021-04-08

Applicant: SHARP KABUSHIKI KAISHA

Inventor： Masamitsu Moritani ,  Katsuhiko Kyuhken ,  Shohei Komaru ,  Tadashi Iwamatsu ,  Satoshi Morimoto

IPC: H01J49/00 ,  H01J49/28 ,  G01N27/622

Abstract: An analysis device includes an electron emission element, a collector, an electric field former, a power source, and a controller. The electron emission element includes a bottom electrode, a surface electrode, and an intermediate layer arranged between the bottom electrode and the surface electrode. The power source and the controller allow application of a voltage between the bottom electrode and the surface electrode. The electric field former forms an electric field in an ion movement region where anions directly or indirectly generated by electrons emitted from the electron emission element move toward the collector. The collector and the controller allow measurement of a current waveform of an electric current made to flow by arrival of anions at the collector. The controller regulates, based on the current waveform, a voltage applied between the bottom electrode and the surface electrode.

公开(公告)号：US11531011B1

公开(公告)日：2022-12-20

申请号：US17026587

申请日：2020-09-21

Applicant: United States of America as represented by the Administrator of NASA

Inventor： Daniel J. Gershman ,  Levon Avanov ,  Corey J. Tucker

IPC: H01J31/50 ,  H01J43/24 ,  G01N30/72 ,  H01J49/28 ,  H01J37/22

Abstract: The present invention relates to an imaging device that includes a gating element which receives incident photons and releases pulsed electrons; a single microchannel-plate (MCP) which receives the pulsed electrons and amplifies the pulsed electrons as an amplified pulsed electron flux; a collection element which receives the amplified pulsed electron flux; a high-pass filter; and a gated integrator; wherein the high-pass filter element receives the amplified pulsed electron flux from the collection element and alternate current (AC) couples the amplified pulsed electron flux as a charge pulse to the gated integrator; and wherein the gating element and the gated integrator are time-synchronized to allow charge-integration only while the AC-coupled charge pulse is unipolar. A feedback loop can provide an auto-gating function. The imaging device can be used in night vision goggles or a mass spectrometer.