公开(公告)号：US10018508B2

公开(公告)日：2018-07-10

申请号：US15262061

申请日：2016-09-12

Applicant: Spectro Analytical Instruments GmbH

Inventor： Wolfram Bohle ,  Alexander Morlang

IPC: G01J3/28 ,  G01J3/02 ,  G02B7/18 ,  G02B7/182 ,  G01J3/443 ,  G01J3/18

CPC classification number: G01J3/021 ,  G01J3/0286 ,  G01J3/06 ,  G01J3/18 ,  G01J3/20 ,  G01J3/443 ,  G01J2003/064 ,  G02B7/181 ,  G02B7/1827

Abstract: A spectrometer for examining the spectrum of an optical emission source may include: an optical base body, a light entry aperture connected to the optical base body to couple light into the spectrometer, at least one dispersion element to receive the light as a beam of rays and generate a spectrum, and at least one detector for measuring the generated spectrum. A light path may run from the light entry aperture to the detector. A mirror group with at least two mirrors may be provided in a section of the light path between the light entry aperture and the at least one detector, in which the beam does not run parallel, which may compensate for temperature effects. In the mirror group, at least one mirror or the entire mirror group may be moveable relative to the optical base body and may be coupled to a temperature-controlled drive.

公开(公告)号：US09176282B2

公开(公告)日：2015-11-03

申请号：US14350140

申请日：2012-10-05

Applicant: VALORBEC S.E.C.

Inventor： Pierre Pottier ,  Muthukumaran Packirisamy

IPC: G02B6/34 ,  G02B6/12 ,  G02B6/28 ,  G02B27/42 ,  G01J3/20 ,  G02B6/293 ,  G02B6/124 ,  G02B5/18 ,  G01J3/02 ,  G01J3/18

CPC classification number: G02B6/34 ,  G01J3/0256 ,  G01J3/18 ,  G01J3/20 ,  G02B5/1814 ,  G02B5/1861 ,  G02B6/12007 ,  G02B6/124 ,  G02B6/29328 ,  G02B27/4244

Abstract: A concave diffraction grating for integrated optics is constructed by replacing the reflective metallic part by either multiple thin elements of metal or multiple elements of dielectric material, each partially reflecting the light, and arranged on elliptical fashion in order to distribute the diffraction/reflection of light and provide aberration-free focusing, by combining diffraction condition and Bragg condition of these curved reflectors.

Abstract translation: 用于集成光学器件的凹面衍射光栅通过用金属或多个介电材料元件的多个薄元件代替反射金属部件来构造，每个元件均部分地反射光，并以椭圆形方式布置，以分布光的衍射/反射 并通过组合这些弯曲反射器的衍射条件和布拉格条件，提供无像差聚焦。

公开(公告)号：US09146155B2

公开(公告)日：2015-09-29

申请号：US12966083

申请日：2010-12-13

Applicant: Cheng-Hao Ko

Inventor： Cheng-Hao Ko

IPC: G01J3/28 ,  G01J3/02 ,  G01J3/18 ,  G01J3/20 ,  G01J3/24 ,  G02B5/18

CPC classification number: G01J3/02 ,  G01J3/0218 ,  G01J3/0291 ,  G01J3/1804 ,  G01J3/1838 ,  G01J3/20 ,  G01J3/24 ,  G02B5/1861

Abstract: The invention concerns an optical system. The optical system comprises an input for receiving an optical signal, a predetermined output plane, and a diffraction grating for separating the optical signal received at the input into spectral elements thereof. The grating has a diffraction surface, which is formed by a photolithography process. The diffraction surface has a first predetermined profile. The first profile is formed by a plurality of points each conducted by different equations. Consequently, each spectral component is focused on the predetermined output plane.

Abstract translation: 本发明涉及一种光学系统。 光学系统包括用于接收光信号，预定输出平面的输入端和用于将在输入处接收的光信号分离为其光谱元件的衍射光栅。 光栅具有通过光刻工艺形成的衍射表面。 衍射面具有第一预定轮廓。 第一轮廓由多个点组成，每个点由不同方程式进行。 因此，每个频谱分量聚焦在预定的输出平面上。

公开(公告)号：US08767300B2

公开(公告)日：2014-07-01

申请号：US12776649

申请日：2010-05-10

Applicant: Yoshihiro Ishibe

Inventor： Yoshihiro Ishibe

IPC: G02B27/44 ,  G02B5/18 ,  G01J3/40 ,  G01J3/447 ,  B23B3/00

CPC classification number: B23C3/00 ,  B23C2226/31 ,  G01J3/18 ,  G01J3/20 ,  G01J3/50 ,  G02B5/1842 ,  G02B5/1861 ,  G02B27/0944

Abstract: Objects are to obtain a highly accurate diffraction element that may prevent an intensity decrease of a light beam entering a light receiving unit without a decrease in diffraction efficiency and without a problem of flare or the like, a manufacturing method for the diffraction element, and a spectrometer using the same. A diffraction element (2) includes a diffraction grating formed on a substrate having a curved surface. In the diffraction element (2), the curved surface (3) has an anamorphic shape formed by pivoting a curved line (I) in a plane about a straight line (II) in the same plane serving as a rotation axis, and gratings (10a) of the diffraction grating (10) exist in cross sections orthogonal to the rotation axis.

Abstract translation: 目的是获得高精度的衍射元件，其可以防止进入光接收单元的光束的强度降低，而不会降低衍射效率，并且不存在耀斑等的问题，衍射元件的制造方法和 光谱仪使用相同。 衍射元件（2）包括形成在具有曲面的基板上的衍射光栅。 在衍射元件（2）中，弯曲表面（3）具有通过在与旋转轴线相同的平面上围绕直线（II）的平面中的曲线（I）旋转而形成的变形形状， 衍射光栅（10）的10a）位于与旋转轴正交的横截面中。

公开(公告)号：US08717560B2

公开(公告)日：2014-05-06

申请号：US13100495

申请日：2011-05-04

Applicant: David Roger Labrecque

Inventor： David Roger Labrecque

IPC: G01J3/40 ,  G01J3/18 ,  G01J3/28 ,  G01J3/02

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0243 ,  G01J3/20 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/2846 ,  G01J3/4406 ,  Y10T29/49826

Abstract: The present invention provides apparatuses including a point light source, a diffraction grating oriented in a light path generated from the point light source wherein the diffraction grating diffracts and concentrates light from the point light source into one or more rings of light, a detector positioned to detect one or more of the rings of light or light transmitted from a sample exposed to said rings of light, and a computer operably connected to the detector to analyze the intensity of one or more of the rings of light or said light transmitted from said sample. Variations including samples and additional components and methods of making the apparatuses of the present invention are also disclosed.

Abstract translation: 本发明提供了一种装置，包括点光源，衍射光栅，其定向在从点光源产生的光路中，其中衍射光栅将来自点光源的光衍射并集中到一个或多个光环中，检测器定位成 检测从暴露于所述光环的样品透射的光或光的一个或多个环，以及可操作地连接到所述检测器的计算机，以分析从所述样品透射的一个或多个所述光或所述光的强度 。 还公开了包括样品和附加组分的变化以及制备本发明的装置的方法。

公开(公告)号：US20130242299A1

公开(公告)日：2013-09-19

申请号：US13889714

申请日：2013-05-08

Applicant: CANON KABUSHIKI KAISHA

Inventor： Hisanori Kobayashi ,  Shin Komori ,  Mitsuhiro Obara

IPC: G01J3/50

CPC classification number: G01J3/502 ,  G01J3/02 ,  G01J3/0237 ,  G01J3/0248 ,  G01J3/04 ,  G01J3/20 ,  G01J3/28 ,  G01J3/2803 ,  G01J3/50 ,  G01J2003/2866

Abstract: A spectral colorimetric apparatus includes a housing which includes a side wall. An outer surface of the side wall is an adjustment surface capable of adjusting a position of a linear sensor by moving while attaching the linear sensor to the adjustment surface. The linear sensor is supported by the side wall of the housing while abutting on the adjustment surface and receives alight beam that is dispersed by a concave surface reflection type diffraction element and passes through an opening portion. The adjustment surface is parallel to a tangential line at a part of a Rowland circle of the concave surface reflection type diffraction element, through which a light beam received by the linear sensor passes.

Abstract translation: 光谱比色装置包括包括侧壁的壳体。 侧壁的外表面是能够通过在将线性传感器附接到调节表面的同时通过移动来调节线性传感器的位置的调节表面。 线性传感器由壳体的侧壁支撑，同时抵靠调节表面并且接收由凹面反射型衍射元件分散并穿过开口部分的光束。 调整面平行于凹面反射型衍射元件的Rowland圆的一部分的切线，由线性传感器接收的光束通过该切线。

公开(公告)号：US20120105851A1

公开(公告)日：2012-05-03

申请号：US13281248

申请日：2011-10-25

Applicant: Hisanori Kobayashi ,  Shin Komori ,  Mitsuhiro Obara

Inventor： Hisanori Kobayashi ,  Shin Komori ,  Mitsuhiro Obara

IPC: G01J3/46

CPC classification number: G01J3/502 ,  G01J3/02 ,  G01J3/0237 ,  G01J3/0248 ,  G01J3/04 ,  G01J3/20 ,  G01J3/28 ,  G01J3/2803 ,  G01J3/50 ,  G01J2003/2866

Abstract: A spectral colorimetric apparatus includes a housing which includes a side wall. An outer surface of the side wall is an adjustment surface capable of adjusting a position of a linear sensor by moving while attaching the linear sensor to the adjustment surface. The linear sensor is supported by the side wall of the housing while abutting on the adjustment surface and receives a light beam that is dispersed by a concave surface reflection type diffraction element and passes through an opening portion. The adjustment surface is parallel to a tangential line at a part of a Rowland circle of the concave surface reflection type diffraction element, through which a light beam received by the linear sensor passes.

Abstract translation: 光谱比色装置包括包括侧壁的壳体。 侧壁的外表面是能够通过在将线性传感器附接到调节表面的同时通过移动来调节线性传感器的位置的调节表面。 线性传感器由壳体的侧壁支撑，同时抵靠在调节面上并且接受由凹面反射型衍射元件分散并通过开口部分的光束。 调整面平行于凹面反射型衍射元件的Rowland圆的一部分的切线，由线性传感器接收的光束通过该切线。

公开(公告)号：US20110273707A1

公开(公告)日：2011-11-10

申请号：US13100495

申请日：2011-05-04

Applicant: David Roger LABRECQUE

Inventor： David Roger LABRECQUE

IPC: G01J3/40 ,  B23P11/00 ,  G01J3/28

CPC classification number: G01J3/18 ,  G01J3/02 ,  G01J3/0229 ,  G01J3/0243 ,  G01J3/20 ,  G01J3/28 ,  G01J3/2823 ,  G01J3/2846 ,  G01J3/4406 ,  Y10T29/49826

Abstract: The present invention provides apparatuses including a point light source, a diffraction grating oriented in a light path generated from the point light source wherein the diffraction grating diffracts and concentrates light from the point light source into one or more rings of light, a detector positioned to detect one or more of the rings of light or light transmitted from a sample exposed to said rings of light, and a computer operably connected to the detector to analyze the intensity of one or more of the rings of light or said light transmitted from said sample. Variations including samples and additional components and methods of making the apparatuses of the present invention are also disclosed.

Abstract translation: 本发明提供了一种装置，包括点光源，衍射光栅，其定向在从点光源产生的光路中，其中衍射光栅将来自点光源的光衍射并集中到一个或多个光环中，检测器定位成 检测从暴露于所述光环的样品透射的光或光的一个或多个环，以及可操作地连接到所述检测器的计算机，以分析从所述样品透射的一个或多个所述光或所述光的强度 。 还公开了包括样品和附加组分的变化以及制备本发明的装置的方法。

公开(公告)号：US07965089B2

公开(公告)日：2011-06-21

申请号：US12398890

申请日：2009-03-05

Applicant: Ulrich Bonne ,  Fouad Nusseibeh ,  Robert Higashi

Inventor： Ulrich Bonne ,  Fouad Nusseibeh ,  Robert Higashi

IPC: G01R27/26

CPC classification number: G01J3/20 ,  G01F1/6845 ,  G01J3/02 ,  G01J3/0256 ,  G01J3/0291 ,  G01N21/05 ,  G01N21/65 ,  G01N21/658 ,  G01N27/02 ,  G01N2021/0346 ,  G01N2021/058 ,  G01N2021/651

Abstract: A chemical impedance detector having several electrodes situated on or across a dielectric layer of a substrate. The electrodes may be across or covered with a thin film polymer. Each electrode may have a set of finger-like electrodes. Each set of finger-like electrodes may be intermeshed, but not in contact, with another set of finger-like electrodes. The thin-film polymer may have a low dielectric constant and a high porous surface area. The chemical impedance detector may be incorporated in a micro fluid analyzer system.

Abstract translation: 化学阻抗检测器，其具有位于基板的介电层上或两者上的若干电极。 电极可以穿过或用薄膜聚合物覆盖。 每个电极可以具有一组手指状电极。 每组指状电极可以与另一组手指状电极相互啮合，但不接触。 薄膜聚合物可以具有低介电常数和高多孔表面积。 化学阻抗检测器可以并入微流体分析仪系统中。

公开(公告)号：US07623235B2

公开(公告)日：2009-11-24

申请号：US11872455

申请日：2007-10-15

Applicant: Seng-Tiong Ho ,  Seongsik Chang ,  Yingyan Huang

Inventor： Seng-Tiong Ho ,  Seongsik Chang ,  Yingyan Huang

IPC: G01J3/28

CPC classification number: G01J3/20 ,  G01J3/22

Abstract: The present application discloses a system comprising a compact curved grating (CCG) and its associated compact curved grating spectrometer (CCGS) or compact curved grating wavelength multiplexer/demultiplexer (WMDM) module and a method for making the same. The system is capable of achieving a very small (resolution vs. size) RS factor. In the invention, the location of the entrance slit and detector can be adjusted in order to have the best performance for a particular design goal. The initial groove spacing is calculated using a prescribed formula dependent on operation wavelength. The location of the grooves is calculated based on two conditions. The first one being that the path-difference between adjacent grooves should be an integral multiple of the wavelength in the medium to achieve aberration-free grating focusing at the detector or output slit (or output waveguide) even with large beam diffraction angle from the entrance slit or input slit (or input waveguide). The second one being specific for a particular design goal of a curved-grating spectrometer. In an embodiment, elliptical mirrors each with focal points at the slit and detector are used for each groove to obtain aberration-free curved mirrors.

Abstract translation: 本申请公开了一种包括紧凑弯曲光栅（CCG）及其相关联的紧凑弯曲光栅光谱仪（CCGS）或紧凑弯曲光栅波长多路复用器/解复用器（WMDM）模块的系统及其制造方法。 该系统能够实现非常小的（分辨率vs.尺寸）RS因子。 在本发明中，可以调整入口狭缝和检测器的位置，以便为特定设计目标具有最佳性能。 使用取决于工作波长的规定公式计算初始槽间距。 基于两个条件计算凹槽的位置。 第一个是相邻槽之间的路径差应该是介质中的波长的整数倍，以便即使在入口处具有大的光束衍射角，也可以在检测器或输出狭缝（或输出波导）处聚焦的无像差光栅 狭缝或输入狭缝（或输入波导）。 第二个特定于曲面光栅光谱仪的特定设计目标。 在一个实施例中，每个具有狭缝和检测器处的​​焦点的椭圆镜用于每个凹槽，以获得无像差的曲面镜。