Abstract:
A system architecture for a measurement data processing system specifically designed under the aspect of application in an Internet of Things device is presented. The disclosed system is particularly well suited for application to spectroscopy. The measurement data processing system (1) comprises at least one measuring device (2), comprising an embedded operating system (22), accessing and being accessible by a remote instrument backend (3), and a user device with a user accessible application (51), accessing and being accessible by a remote application backend (6), wherein the instrument backend (3) and the application backend (6) are cloud-based, and wherein the instrument backend (3) and the application backend (6) are set up to make use of cloud computing resources to store and retrieve and process data.
Abstract:
Various embodiments disclosed herein describe a divided-aperture infrared spectral imaging (DAISI) system that is adapted to acquire multiple IR images of a scene with a single-shot (also referred to as a snapshot). The plurality of acquired images having different wavelength compositions that are obtained generally simultaneously. The system includes at least two optical channels that are spatially and spectrally different from one another. Each of the at least two optical channels are configured to transfer IR radiation incident on the optical system towards an optical FPA unit comprising at least two detector arrays disposed in the focal plane of two corresponding focusing lenses. The system further comprises at least one temperature reference source or surface that is used to dynamically calibrate the two detector arrays and compensate for a temperature difference between the two detector arrays.
Abstract:
An optical wavelength calibrator is configured to be used on premises with instrumentation such as an optical spectrum analyzer. The on-premises calibrator includes both a fixed wavelength source and a tunable wavelength source, with a variable optical attenuator controlling the power level of a calibration beam provided as an output. A controller within the on-premises calibrator is used to generate the control signals for the various components in response to received external commands, typically via from an external GUI of the user's computer system. The controller is used in combination with the tunable wavelength source to provide a series of output calibration signals at different wavelengths, providing the ability to performance calibration across a desired spectral region and not just a single wavelength. The on-premises calibrator maintains real-time wavelength stability of the instrument to minimize down time when compared off-site extensive re-calibration services.
Abstract:
A polarized Raman Spectrometric system for defining parameters of a polycrystalline material, said system comprising: a polarized Raman Spectrometric apparatus, a computer-controlled sample stage for positioning a sample at different locations, and a computer comprising a processor and an associated memory.
Abstract:
The present disclosure relates to assistive mechanisms and methods that aid an operator of a spectrometer to make spectral measurements of a sample, the measurements having a desired quality. The method enables quality spectral measurements quickly and simply, without a prior understanding of a sample's spectrum or of the details as to how the spectrum is measured. Data quality is improved, and the time required to collect the data is reduced. While a specific example of sample optic focus is disclosed in detail, the optimization of numerous other parameters is possible.
Abstract:
An initial system and a constraint condition are established. All freeform surfaces are obtained by surface fitting the feature data points to form a first freeform surface imaging optical system. The first freeform surface imaging optical system is taken as the initial system for multiple iterations to obtain a second freeform surface imaging optical system. The second freeform surface imaging optical system is taken as a first base system. A first surface freedom of the first base system is selected, the values nearby the first surface freedom is selected, and surface positions and tilts of the first base system are changed to obtain a third freeform surface imaging optical system that satisfies the constraint condition. A second base system is selected and the method above is repeated. The freeform surface imaging optical system is obtained until all freedoms for surface positions and tilts have been used.
Abstract:
A processing apparatus, comprises: a first acquirer configured to acquire a first specific information distribution of an object based on acoustic waves propagating from the object onto which light is irradiated; a second acquirer configured to acquire a characteristic value of the first specific information distribution of the object; a third acquirer configured to acquire information indicating a correspondence between an optical coefficient and the characteristic value of the first specific information distribution; and a fourth acquirer configured to acquire the optical coefficient of the object using the characteristic value of the first specific information distribution of the object and the information indicating the correspondence.
Abstract:
A measuring device includes a first light receiving element that receives measurement light and outputs a first output value, and a second light receiving element that receives the measurement light and outputs a second output value which is different from the first output value. A weighted composition is performed on the first output value and the second output value.
Abstract:
The present disclosure generally relates to systems and methods for spectral demixing. An example technique includes obtaining empirical spectroscopic data representing a plurality of frequencies of electromagnetic energy that has interacted with a specimen, accessing a computer readable representation of a hierarchal spectral cluster tree representing a spectral library, demixing, with data on each of a plurality of levels of the hierarchal spectral cluster tree, foveated spectroscopic data derived from the empirical spectroscopic data, identifying at least one node in the hierarchal spectral cluster tree as corresponding to the empirical spectroscopic data, and outputting an endmember abundance assessment of the specimen corresponding to at least the at least one node.
Abstract:
An evanescent wave microspectrometer includes a planar diopter separating two transparent media, an optical sensor with a pixel array, and disposed in the second transparent medium, and an interference device disposed such that at least a part of the interference device is in contact with evanescent waves generated at the surface of the diopter. The micro-spectrometer also includes a memory storing a map having a set of set of data grids including the optical response of said sensor for a set of quasi-monochromatic wavelengths of a calibration light source, and a calculator configured to determine the spectrum (ψ) of a test light source configured to generate evanescent waves at the surface of the diopter, on the basis of the map and the optical response of the sensor.