FIBER OPTIC PROBE FOR REMOTE SPECTROSCOPY
    82.
    发明申请
    FIBER OPTIC PROBE FOR REMOTE SPECTROSCOPY 审中-公开
    用于远程光谱的光纤探针

    公开(公告)号:US20150377701A1

    公开(公告)日:2015-12-31

    申请号:US14766068

    申请日:2014-02-05

    Abstract: A fiber optic probe assembly is provided. The probe comprises a first optical system and a second optical system, a delivery light guide comprising one or more than one delivery optical fiber for transmitting excitation radiation from a radiation source disposed at a proximal end of the light guide to the first optical system. The first optical system comprising one or more than one first optical element for forming a substantially collimated illumination beam from the excitation radiation. An optically opaque tubular sleeve is fitted over the first optical system to optically isolate the first optical system and the delivery light guide from the second optical system. The second optical system comprising one or more than one second optical element for gathering optical radiation scattered from a sample and forming the optical radiation into a collection beam. A collection light guide comprising one or more than one collection optical fiber receives the collection beam and transmits the collection beam to an analyzer. The first and second optical systems are disposed within a housing so that an emission cone of the first optical system and an acceptance cone of the second optical system substantially overlap. A spectroscopic measurement system comprising the optic fiber probe is also provided.

    Abstract translation: 提供了光纤探针组件。 探针包括第一光学系统和第二光学系统,输送光导,其包括一个或多于一个的输送光纤,用于将设置在光导的近端处的辐射源的激发辐射传输到第一光学系统。 第一光学系统包括用于从激发辐射形成基本准直的照明光束的一个或多于一个的第一光学元件。 光学不透明的管状套管装配在第一光学系统上以将第一光学系统和输送光导从第二光学系统光学隔离。 第二光学系统包括一个或多于一个第二光学元件,用于收集从样品散射的光辐射并将光辐射形成收集束。 包括一个或多于一个收集光纤的收集光导件接收收集光束并将收集光束传输到分析器。 第一和第二光学系统设置在壳体内,使得第一光学系统的发射锥体和第二光学系统的接收锥体基本上重叠。 还提供了包括光纤探针的光谱测量系统。

    Terahertz wave detection device, terahertz wavelength filter, imaging device, and measurement device
    84.
    发明授权
    Terahertz wave detection device, terahertz wavelength filter, imaging device, and measurement device 有权
    太赫兹波检测装置,太赫兹波长滤波器,成像装置和测量装置

    公开(公告)号:US08946633B2

    公开(公告)日:2015-02-03

    申请号:US13405804

    申请日:2012-02-27

    Applicant: Hiroto Tomioka

    Inventor: Hiroto Tomioka

    Abstract: A terahertz wave detection device includes a wavelength filter transmitting terahertz waves having a predetermined wavelength, and a detection portion detecting the terahertz waves having the predetermined wavelength that have passed through the wavelength filter by converting the terahertz waves into heat, wherein the wavelength filter includes a metal layer having a plurality of holes communicating with an incident surface onto which the terahertz waves are incident and an emission surface from which the terahertz waves having the predetermined wavelength are emitted, and a dielectric portion filling in the plurality of holes and made of a dielectric, wherein the plurality of holes are formed with a predetermined pitch along a direction that is perpendicular to a normal line of the incident surface.

    Abstract translation: 一种太赫兹波检测装置包括:发送具有预定波长的太赫兹波的波长滤波器,以及检测部分,通过将太赫兹波转换成热量来检测已经通过波长滤波器的具有预定波长的太赫兹波,其中波长滤波器包括 金属层具有多个与太赫波入射的入射面连通的孔,并且发射出具有预定波长的太赫兹波的发射面,以及填充在多个孔中并由电介质构成的电介质部 ,其中所述多个孔沿着垂直于入射表面的法线的方向以预定间距形成。

    Spectral module
    86.
    发明授权
    Spectral module 有权
    光谱模块

    公开(公告)号:US08804118B2

    公开(公告)日:2014-08-12

    申请号:US12992398

    申请日:2009-05-07

    Abstract: A spectral module 1 comprises a substrate 2 for transmitting light L1 incident thereon from a front face 2a, a lens unit 3 for transmitting the light L1 incident on the substrate 2, a spectroscopic unit 4 for reflecting and spectrally resolving the light L1 incident on the lens unit 3, and a photodetector 5 for detecting light L2 reflected by the spectroscopic unit 4. The substrate 2 is provided with a recess 19 having a predetermined positional relationship with alignment marks 12a, 12b and the like serving as a reference unit for positioning the photodetector 5, while the lens unit 3 is mated with the recess 19. The spectral module 1 achieves passive alignment between the spectroscopic unit 4 and photodetector 5 when the lens unit 3 is simply mated with the recess 19.

    Abstract translation: 光谱模块1包括用于透射从前面2a入射的光L1的基板2,用于透射入射到基板2上的光L1的透镜单元3,用于反射和光谱分辨入射在基板2上的光L1的分光单元4 透镜单元3和用于检测由分光单元4反射的光L2的光检测器5.基板2设置有与作为用于定位的基准单元的对准标记12a,12b等具有预定位置关系的凹部19 光电检测器5,而透镜单元3与凹槽19配合。当透镜单元3简单地与凹部19配合时,光谱模块1实现分光单元4和光电检测器5之间的无源对准。

    TERAHERTZ WAVE DETECTION DEVICE, TERAHERTZ WAVELENGTH FILTER, IMAGING DEVICE, AND MEASUREMENT DEVICE
    88.
    发明申请
    TERAHERTZ WAVE DETECTION DEVICE, TERAHERTZ WAVELENGTH FILTER, IMAGING DEVICE, AND MEASUREMENT DEVICE 有权
    TERAHERTZ波检测装置,TERAHERTZ波长滤波器,成像装置和测量装置

    公开(公告)号:US20120241615A1

    公开(公告)日:2012-09-27

    申请号:US13405804

    申请日:2012-02-27

    Applicant: Hiroto TOMIOKA

    Inventor: Hiroto TOMIOKA

    Abstract: A terahertz wave detection device includes a wavelength filter transmitting terahertz waves having a predetermined wavelength, and a detection portion detecting the terahertz waves having the predetermined wavelength that have passed through the wavelength filter by converting the terahertz waves into heat, wherein the wavelength filter includes a metal layer having a plurality of holes communicating with an incident surface onto which the terahertz waves are incident and an emission surface from which the terahertz waves having the predetermined wavelength are emitted, and a dielectric portion filling in the plurality of holes and made of a dielectric, wherein the plurality of holes are formed with a predetermined pitch along a direction that is perpendicular to a normal line of the incident surface.

    Abstract translation: 一种太赫兹波检测装置包括:发送具有预定波长的太赫兹波的波长滤波器,以及检测部分,通过将太赫兹波转换成热量来检测已经通过波长滤波器的具有预定波长的太赫兹波,其中波长滤波器包括 金属层具有多个与太赫波入射的入射面连通的孔,并且发射出具有预定波长的太赫兹波的发射面,以及填充在多个孔中并由电介质构成的电介质部 ,其中所述多个孔沿着垂直于入射表面的法线的方向以预定间距形成。

    Imaging Spectrometer
    89.
    发明申请
    Imaging Spectrometer 有权
    成像光谱仪

    公开(公告)号:US20120105845A1

    公开(公告)日:2012-05-03

    申请号:US13275698

    申请日:2011-10-18

    Applicant: Esko Herrala

    Inventor: Esko Herrala

    CPC classification number: G01J3/021 G01J3/0208 G01J3/0243

    Abstract: Optical radiation from a sample is received by the slit and it is passed through an aperture in a reflective plane of a folding mirror towards a curved reflective surface of a collimating mirror. The slit and the curved reflective surface have a common optical axis. The reflective plane and the curved reflective surface face each other. The optical radiation passed through the folding mirror is collimated by the curved reflective surface. The collimated optical radiation is directed to the reflective plane of the folding mirror by the curved reflective surface. The collimated optical radiation is reflected in a direction other than the common optical axis of the slit and the curved reflective surface by the reflective plane.

    Abstract translation: 来自样品的光辐射由狭缝接收,并且将其穿过折射镜的反射平面中的孔朝向准直镜的弯曲反射表面。 狭缝和弯曲的反射表面具有共同的光轴。 反射面和弯曲反射面相互面对。 通过折叠镜的光学辐射被弯曲的反射表面准直。 准直光学辐射通过弯曲的反射表面被引导到折叠反射镜的反射平面。 准直光学辐射沿着狭缝的共同光轴和反射平面的弯曲反射表面以外的方向反射。

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