SAMPLE GAS ANALYZING DEVICE AND COMPUTER PROGRAM FOR THE SAME
    81.
    发明申请
    SAMPLE GAS ANALYZING DEVICE AND COMPUTER PROGRAM FOR THE SAME 审中-公开
    样品气体分析装置和计算机程序

    公开(公告)号:US20130166225A1

    公开(公告)日:2013-06-27

    申请号:US13724255

    申请日:2012-12-21

    Applicant: HORIBA, Ltd.

    Abstract: The present invention is intended to make reduction of interference influence and reduction of a measurement error compatible in a quantitative analysis of one or more measurement target components and to provide a analyzing device (100) that quantitatively analyzes one or more measurement target components in a sample using a spectral spectrum obtained by irradiating light to the sample, wherein the analyzing device is adapted to switch the library data between a first generation condition in a period of a predetermined time lapse after starting the sample gas generation and a second generation condition after the predetermined time lapse, wherein under the first generation condition, a plurality of measurement target components are quantitatively analyzed using the first library data obtained by compensating interference influence of measurement extra-target components; and under the second generation condition, the quantitative analysis of a plurality of measurement target components is performed using second library data obtained without compensating interference influence of the measurement extra-target components.

    Abstract translation: 本发明旨在减少在一个或多个测量目标组分的定量分析中兼容的干扰影响和减少测量误差,并且提供一种分析装置(100),其定量分析样品中的一个或多个测量目标组分 使用通过对样品照射光而获得的光谱,其中所述分析装置适于在开始所述样品气体产生之后的预定时间经过的时间段内的所述第一生成条件和所述预定时间后的第二生成条件之间切换所述库数据 时间流逝,其中在第一代条件下,使用通过补偿测量超目标分量的干扰影响而获得的第一库数据来定量分析多个测量目标分量; 并且在第二代条件下,使用在不补偿测量超目标分量的干扰影响的情况下获得的第二库数据来执行多个测量目标分量的定量分析。

    COLOR MEASUREMENT DEVICE AND IMAGE FORMING APPARATUS
    85.
    发明申请
    COLOR MEASUREMENT DEVICE AND IMAGE FORMING APPARATUS 有权
    颜色测量装置和图像形成装置

    公开(公告)号:US20120327405A1

    公开(公告)日:2012-12-27

    申请号:US13523807

    申请日:2012-06-14

    Abstract: The color measurement device and an image forming apparatus using the same includes a light source for irradiating a color measurement object with white light; a diffraction grating for dispersing the light reflected from the color measurement object; and a line sensor formed of multiple pixels that generate an electric signal corresponding to the intensity of the light dispersed by the diffraction grating, wherein the light source includes a light-emitting diode having a peak value of emission intensity in a wavelength zone of 380 nm to 420 nm, and a plural types of fluorescent members each having a peak value of fluorescence intensity in a wavelength zone of 420 nm to 730 nm.

    Abstract translation: 色彩测量装置和使用该彩色测量装置的图像形成装置包括:用白光照射彩色测量对象的光源; 用于分散从所述颜色测量对象反射的光的衍射光栅; 以及由多个像素构成的线传感器,其生成与由衍射光栅分散的光的强度对应的电信号,其中,所述光源包括具有380nm的波长区域中的发光强度的峰值的发光二极管 420nm的波长范围内的荧光强度的峰值的多种荧光体。

    TERAHERTZ WAVE MEASURING APPARATUS AND MEASUREMENT METHOD
    86.
    发明申请
    TERAHERTZ WAVE MEASURING APPARATUS AND MEASUREMENT METHOD 有权
    TERAHERTZ波测量装置和测量方法

    公开(公告)号:US20120318967A1

    公开(公告)日:2012-12-20

    申请号:US13582833

    申请日:2011-03-09

    Applicant: Takeaki Itsuji

    Inventor: Takeaki Itsuji

    CPC classification number: G01J3/42 G01J3/027 G01J3/28 G01N21/274 G01N21/3586

    Abstract: The present invention provides a terahertz wave measuring apparatus and measurement method capable of improving the quantitativeness of obtained frequency spectrum information. In a measurement method in which a terahertz wave measuring apparatus is used, the terahertz wave measuring apparatus measures a time waveform of a terahertz wave relating to a calibration sample whose shape of a calibration spectrum is already known and obtains a measurement spectrum by transforming the time waveform. The calibration spectrum and the measurement spectrum are compared, and, on the basis of results of the comparison, time intervals of measurement data that form a time waveform are adjusted in order to calibrate the terahertz wave measuring apparatus.

    Abstract translation: 本发明提供能够提高所获得的频谱信息的定量性的太赫兹波测量装置和测量方法。 在使用太赫兹波测量装置的测量方法中,太赫兹波测量装置测量与校准样品的形状已知的校准样品相关的太赫兹波的时间波形,并通过变换时间来获得测量光谱 波形。 比较校准光谱和测量光谱,并且基于比较结果,调整形成时间波形的测量数据的时间间隔,以便校准太赫兹波测量装置。

    WDM transmission apparatus
    87.
    发明授权
    WDM transmission apparatus 有权
    WDM传输设备

    公开(公告)号:US08331778B2

    公开(公告)日:2012-12-11

    申请号:US12546357

    申请日:2009-08-24

    CPC classification number: H04J14/0221 G01J3/02 G01J3/027 G01J3/04 H04B10/07955

    Abstract: A WDM transmission apparatus to receive or relay WDM light in a WDM transmission system, includes a measuring unit configured to measure an optical level of each channel transmitted by the WDM light; an adjusting unit configured to adjust a resolution of the measuring unit; and a processing unit configured to obtain, for each channel, optical level information which represents an optical level respectively measured with a resolution corresponding to a bit rate of a transmission signal of each channel.

    Abstract translation: 一种用于在WDM传输系统中接收或中继WDM光的WDM传输设备,包括:测量单元,被配置为测量由所述WDM光发射的每个信道的光学水平; 调整单元,被配置为调整测量单元的分辨率; 以及处理单元,被配置为针对每个通道获得表示以与每个通道的发送信号的比特率相对应的分辨率测量的光学水平的光学水平信息。

    Interferometer and Fourier Spectrometer using same
    88.
    发明申请
    Interferometer and Fourier Spectrometer using same 有权
    干涉仪和傅立叶光谱仪使用相同

    公开(公告)号:US20120287439A1

    公开(公告)日:2012-11-15

    申请号:US13515250

    申请日:2010-12-08

    Applicant: Yusuke Hirao

    Inventor: Yusuke Hirao

    CPC classification number: G01J3/4535 G01J3/02 G01J3/0208 G01J3/021 G01J3/027

    Abstract: Provided is a small, highly accurate Fourier spectrometer which enables highly accurate detection of an optical path difference in an interferometer. An element for changing to a narrow band is provided to return reflected light to a second light source (4), and the wavelength of light emitted by the second light source is locked, whereby the position of a movable mirror (8) is measured highly accurately and an optical path length (1) and an optical path length (2) match highly accurately.

    Abstract translation: 提供了一种小型,高精度的傅立叶光谱仪,其能够高精度地检测干涉仪中的光程差。 设置用于变换为窄带的元件以将反射光返回到第二光源(4),并且由第二光源发射的光的波长被锁定,由此高度地测量可移动镜(8)的位置 光路长度(1)和光路长度(2)准确地匹配。

    Optical spectrum analyzer
    89.
    发明授权
    Optical spectrum analyzer 有权
    光谱分析仪

    公开(公告)号:US08264682B2

    公开(公告)日:2012-09-11

    申请号:US13092305

    申请日:2011-04-22

    CPC classification number: G01J3/18 G01J3/027

    Abstract: An optical spectrum analyzer includes a diffraction-grating control unit configured to change an angle of a diffraction grating to change a wavelength of a dispersed light beam extracted from incident light, a calculator unit configured to calculate an angle of the diffraction grating such that the wavelength of the dispersed light beam has a sampling wavelength, and to store the data indicating the angle, a FIFO memory configured such that part of the data is inputted to it, for outputting the data at each reception of a trigger signal indicating timing of sampling, and an FIFO memory control unit configured to output the subsequent data to the FIFO memory, when a remaining data amount of the FIFO memory reaches a predetermined value or lower.

    Abstract translation: 光谱分析仪包括衍射光栅控制单元,被配置为改变衍射光栅的角度以改变从入射光提取的分散光束的波长;计算单元,被配置为计算衍射光栅的角度,使得波长 的分散光束具有采样波长,并且存储指示角度的数据,配置为使得部分数据被输入到其中的FIFO存储器,用于在每次接收指示采样定时的触发信号时输出数据, 以及FIFO存储器控制单元,被配置为当FIFO存储器的剩余数据量达到预定值或更低时,将后续数据输出到FIFO存储器。

    Correcting tilt-induced cyclic variations in signals from radially arrayed spectrophotometer sensors
    90.
    发明授权
    Correcting tilt-induced cyclic variations in signals from radially arrayed spectrophotometer sensors 有权
    校正来自径向排列的分光光度计传感器的信号中的倾斜引起的循环变化

    公开(公告)号:US08255181B2

    公开(公告)日:2012-08-28

    申请号:US12352018

    申请日:2009-01-12

    CPC classification number: G01J3/02 G01J3/027 G01J3/0278 G01J3/52 G01J3/524

    Abstract: A correction algorithm may be applied for correcting misalignment of a radially-aligned array of sensors. Due to the tilt, signals from sensors that are further away from the media, may become slightly attenuated, while signals from sensors that are closer to the media are slightly increased. The error appears periodic and largely sinusoidal in nature around the array given the circular nature of the array of sensor elements. The algorithm determines the magnitude and phase of a sinusoidal function that best fits the wavelength data. In one embodiment, a discrete Fourier transform may be performed at the ‘frequency’ equivalent to one period around the array to determine the magnitude and phase estimate thereof. Then, a sinusoidal correction function may be generated using the magnitude and the phase in order to correct the reflectance data.

    Abstract translation: 可以应用校正算法来校正径向对准的传感器阵列的未对准。 由于来自传感器远离介质的信号的倾斜可能变得稍微衰减,而来自更靠近介质的传感器的信号稍微增加。 给定传感器元件阵列的圆形性质,该误差本质上围绕阵列出现周期性并且很大程度上是正弦的。 该算法确定最适合波长数据的正弦函数的幅度和相位。 在一个实施例中,可以在等于阵列周围的一个周期的“频率”处执行离散付里叶变换,以确定其幅度和相位估计。 然后,可以使用幅度和相位来产生正弦校正功能,以便校正反射率数据。

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