Abstract:
The present invention is intended to make reduction of interference influence and reduction of a measurement error compatible in a quantitative analysis of one or more measurement target components and to provide a analyzing device (100) that quantitatively analyzes one or more measurement target components in a sample using a spectral spectrum obtained by irradiating light to the sample, wherein the analyzing device is adapted to switch the library data between a first generation condition in a period of a predetermined time lapse after starting the sample gas generation and a second generation condition after the predetermined time lapse, wherein under the first generation condition, a plurality of measurement target components are quantitatively analyzed using the first library data obtained by compensating interference influence of measurement extra-target components; and under the second generation condition, the quantitative analysis of a plurality of measurement target components is performed using second library data obtained without compensating interference influence of the measurement extra-target components.
Abstract:
Various implementations of enabling spectroscopy on infrared (IR) sensors are disclosed. The disclosed implementations may include an array of resonant absorbers that may facilitate spectroscopy, such as, for example, IR related spectrometry.
Abstract:
Application of digital light processor (DLP) systems in an imaging ellipsometer or imaging polarimeter with a focusing means, sample and detector arranged to meet the Scheimpflug condition.
Abstract:
The innovation uses the response of media to electromagnetic (EM) signals in order to identify them. When EM sources are directed at a target medium, a response is obtained from an EM detector observing the event. By comparing a measured response to a library of known profiles, one or more likely candidates for the target medium can be determined.
Abstract:
The color measurement device and an image forming apparatus using the same includes a light source for irradiating a color measurement object with white light; a diffraction grating for dispersing the light reflected from the color measurement object; and a line sensor formed of multiple pixels that generate an electric signal corresponding to the intensity of the light dispersed by the diffraction grating, wherein the light source includes a light-emitting diode having a peak value of emission intensity in a wavelength zone of 380 nm to 420 nm, and a plural types of fluorescent members each having a peak value of fluorescence intensity in a wavelength zone of 420 nm to 730 nm.
Abstract:
The present invention provides a terahertz wave measuring apparatus and measurement method capable of improving the quantitativeness of obtained frequency spectrum information. In a measurement method in which a terahertz wave measuring apparatus is used, the terahertz wave measuring apparatus measures a time waveform of a terahertz wave relating to a calibration sample whose shape of a calibration spectrum is already known and obtains a measurement spectrum by transforming the time waveform. The calibration spectrum and the measurement spectrum are compared, and, on the basis of results of the comparison, time intervals of measurement data that form a time waveform are adjusted in order to calibrate the terahertz wave measuring apparatus.
Abstract:
A WDM transmission apparatus to receive or relay WDM light in a WDM transmission system, includes a measuring unit configured to measure an optical level of each channel transmitted by the WDM light; an adjusting unit configured to adjust a resolution of the measuring unit; and a processing unit configured to obtain, for each channel, optical level information which represents an optical level respectively measured with a resolution corresponding to a bit rate of a transmission signal of each channel.
Abstract:
Provided is a small, highly accurate Fourier spectrometer which enables highly accurate detection of an optical path difference in an interferometer. An element for changing to a narrow band is provided to return reflected light to a second light source (4), and the wavelength of light emitted by the second light source is locked, whereby the position of a movable mirror (8) is measured highly accurately and an optical path length (1) and an optical path length (2) match highly accurately.
Abstract:
An optical spectrum analyzer includes a diffraction-grating control unit configured to change an angle of a diffraction grating to change a wavelength of a dispersed light beam extracted from incident light, a calculator unit configured to calculate an angle of the diffraction grating such that the wavelength of the dispersed light beam has a sampling wavelength, and to store the data indicating the angle, a FIFO memory configured such that part of the data is inputted to it, for outputting the data at each reception of a trigger signal indicating timing of sampling, and an FIFO memory control unit configured to output the subsequent data to the FIFO memory, when a remaining data amount of the FIFO memory reaches a predetermined value or lower.
Abstract:
A correction algorithm may be applied for correcting misalignment of a radially-aligned array of sensors. Due to the tilt, signals from sensors that are further away from the media, may become slightly attenuated, while signals from sensors that are closer to the media are slightly increased. The error appears periodic and largely sinusoidal in nature around the array given the circular nature of the array of sensor elements. The algorithm determines the magnitude and phase of a sinusoidal function that best fits the wavelength data. In one embodiment, a discrete Fourier transform may be performed at the ‘frequency’ equivalent to one period around the array to determine the magnitude and phase estimate thereof. Then, a sinusoidal correction function may be generated using the magnitude and the phase in order to correct the reflectance data.