Arrangement and method for compensation of the temperature dependency of detectors in spectrometers
    81.
    发明授权
    Arrangement and method for compensation of the temperature dependency of detectors in spectrometers 失效
    用于补偿光谱仪中检测器的温度依赖性的布置和方法

    公开(公告)号:US07573023B2

    公开(公告)日:2009-08-11

    申请号:US11335937

    申请日:2006-01-20

    CPC classification number: G01J3/02 G01J3/0286 G01J3/2803

    Abstract: The present invention is directed to an arrangement and the associated method for the compensation of the temperature dependency of detectors in spectrometers. In the solution according to the invention, the arrangement for compensation of the temperature dependency of detectors in spectrometers comprises an illumination unit, an entrance slit, an imaging grating, a detector and a controlling and evaluating unit. A second temperature gauge for the ambient temperature is provided in addition to an existing first temperature gauge and a temperature regulating unit. In the method according to the invention, a temperature regulating unit is controlled in such a way by a controlling and evaluating unit in the evaluation of the measurement values determined by two temperature gauges that the temperature of the detector remains constant. With the arrangement according to the invention, the cross-influence of the environment on the detector can be compensated so that the stabilization of the detector temperature is improved. Improved stabilization of the detector temperature is ensured by the additional component of ambient temperature.

    Abstract translation: 本发明涉及一种用于补偿光谱仪中检测器的温度依赖性的布置和相关方法。 在根据本发明的解决方案中,用于补偿光谱仪中检测器的温度依赖性的装置包括照明单元,入口狭缝,成像光栅,检测器和控制和评估单元。 除了现有的第一温度计和温度调节单元之外,还提供了用于环境温度的第二温度计。 在根据本发明的方法中,温度调节单元通过控制和评估单元在由两个温度计确定的测量值的评估中被控制,使得检测器的温度保持恒定。 利用根据本发明的布置,可以补偿环境对检测器的交叉影响,从而提高检测器温度的稳定性。 通过环境温度的附加组件确保提高检测器温度的稳定性。

    Broad band referencing reflectometer
    84.
    发明申请
    Broad band referencing reflectometer 审中-公开
    宽带参考反射计

    公开(公告)号:US20090002711A1

    公开(公告)日:2009-01-01

    申请号:US12231350

    申请日:2008-09-02

    Inventor: Dale A. Harrison

    Abstract: A spectroscopy system is provided which is optimized for operation in the VUV region and capable of performing well in the DUV-NIR region. Additionally, the system incorporates an optical module which presents selectable sources and detectors optimized for use in the VUV and DUV-NIR. As well, the optical module provides common delivery and collection optics to enable measurements in both spectral regions to be collected using similar spot properties. The module also provides a means of quickly referencing measured data so as to ensure that highly repeatable results are achieved. The module further provides a controlled environment between the VUV source, sample chamber and VUV detector which acts to limit in a repeatable manner the absorption of VUV photons. The use of broad band data sets which encompass VUV wavelengths, in addition to the DUV-NIR wavelengths enables a greater variety of materials to be meaningfully characterized. Array based detection instrumentation may be exploited to permit the simultaneous collection of larger wavelength regions.

    Abstract translation: 提供了一种光谱系统,其被优化用于在VUV区域中的操作并且能够在DUV-NIR区域中表现良好。 此外,该系统还包含一个光学模块,该模块提供可用于VUV和DUV-NIR中优化的可选择的源和检测器。 同样,光学模块提供通用的传送和收集光学器件,以使得能够使用类似的光点特性来收集两个光谱区域中的测量。 该模块还提供了快速参考测量数据的方法,以确保实现高度可重复的结果。 该模块还在VUV源,样品室和VUV检测器之间提供受控的环境,其作用是以可重复的方式限制VUV光子的吸收。 除了DUV-NIR波长之外,使用包含VUV波长的宽带数据集使得可以有意义地表征更多种类的材料。 可以利用基于阵列的检测仪器来允许同时收集更大的波长区域。

    INFRARED SPECTROMETER
    85.
    发明申请
    INFRARED SPECTROMETER 有权
    红外光谱仪

    公开(公告)号:US20080315102A1

    公开(公告)日:2008-12-25

    申请号:US12197859

    申请日:2008-08-25

    Inventor: Damien WEIDMANN

    Abstract: Method and apparatus for detecting, by absorption spectroscopy, an isotopic ratio of a sample, by passing first and second laser beams of different frequencies through the sample. Two IR absorption cells are used, a first containing a reference gas of known isotopic ratio and the second containing a sample of unknown isotopic ratio. An interlacer or reflective chopper may be used so that as the laser frequencies are scanned the absorption of the sample cell and the reference cell are detected alternately. This ensures that the apparatus is continuously calibrated and rejects the baseline noise when phase sensitive detection is used.

    Abstract translation: 通过吸收光谱法,通过使不同频率的第一和第二激光束通过样品来检测样品的同位素比的方法和装置。 使用两个IR吸收单元,首先含有已知同位素比的参考气体,第二个包含未知同位素比例的样品。 可以使用隔行扫描器或反射式斩波器,使得当扫描激光频率时,交替检测样品池和参考池的吸收。 这确保了当使用相敏检测时,该设备被连续地校准并且拒绝基线噪声。

    Wavelength measuring device, light receiving unit, and wavelength measuring method
    86.
    发明申请
    Wavelength measuring device, light receiving unit, and wavelength measuring method 审中-公开
    波长测量装置,光接收单元和波长测量方法

    公开(公告)号:US20080315078A1

    公开(公告)日:2008-12-25

    申请号:US12216409

    申请日:2008-07-03

    Applicant: Haruyoshi Ono

    Inventor: Haruyoshi Ono

    CPC classification number: G01J3/02 G01J3/0256 G01J3/0286 G01J3/0291 G01J9/00

    Abstract: A wavelength measuring device includes: light receiving elements that receive light to be measured; a temperature controller that maintains the light receiving elements at different temperatures from one another; and a calculation unit that determines the wavelength of the light to be measured, based on outputs of the light receiving elements.

    Abstract translation: 波长测量装置包括:接收待测光的光接收元件; 温度控制器,其将光接收元件彼此保持在不同的温度; 以及计算单元,其基于光接收元件的输出来确定待测光的波长。

    Methods and apparatuses for applying different color calibrations at different locations in an imaging photometer measurement
    88.
    发明授权
    Methods and apparatuses for applying different color calibrations at different locations in an imaging photometer measurement 有权
    在成像光度计测量中在不同位置应用不同颜色校准的方法和装置

    公开(公告)号:US07394540B2

    公开(公告)日:2008-07-01

    申请号:US11314959

    申请日:2005-12-20

    Abstract: Systems and methods for applying different color calibrations at different locations in an imaging photometer measurement are disclosed herein. In one embodiment, a method for measuring a light source having a first area with a first spectral distribution and a second area having a second spectral power distribution can include selecting one or more data points in the first area for measurement. The method then includes applying a calibration to the selected data points in the first area such that a desired colorimetric result is displayed for each data point in a single colorimetric measurement of the first area. In several embodiments, the method can further include selecting one or more data points in the second area, and applying a different calibration to the selected portions of the second area such that a desired colorimetric result is also displayed for each data point in the second area.

    Abstract translation: 本文公开了在成像光度计测量中在不同位置处应用不同颜色校准的系统和方法。 在一个实施例中,一种用于测量具有第一光谱分布的第一区域和具有第二光谱功率分布的第二区域的光源的方法可以包括选择第一区域中的一个或多个数据点用于测量。 该方法然后包括对第一区域中的所选数据点应用校准,使得在第一区域的单个比色测量中为每个数据点显示期望的比色结果。 在几个实施例中,该方法还可以包括选择第二区域中的一个或多个数据点,以及对第二区域的选定部分应用不同的校准,使得还显示针对第二区域中的每个数据点的期望的比色结果 。

    Echelle Spectometer with Improved Use of the Detector by Means of Two Spectrometer Arrangements
    89.
    发明申请
    Echelle Spectometer with Improved Use of the Detector by Means of Two Spectrometer Arrangements 有权
    通过两个光谱仪布置改进使用检测器的Echelle光谱仪

    公开(公告)号:US20080094626A1

    公开(公告)日:2008-04-24

    申请号:US11629143

    申请日:2005-06-02

    Abstract: The invention relates to a spectrometer arrangement (10) comprising a spectrometer (14) for producing a spectrum of a first wavelength range of radiation from a radiation source on a detector (42). Said arrangement also comprises: an Echelle grating (36) for the spectral decomposition of the radiation penetrating the spectrometer arrangement (10) in a main dispersion direction (46); a dispersing element (34) for separating the degrees by means of spectral decomposition of the radiation in a transversal dispersion direction (48) which forms an angle with the main dispersion direction of the Echelle grating (36), in such a way that a two-dimensional spectrum (50) can be produced with a plurality of separated degrees (52); an imaging optical element (24, 38) for imaging the radiation penetrating through an inlet gap (20) into the spectrometer arrangement (10), in an image plane (40); and a surface detector (42) comprising a two dimensional arrangement of a plurality of detector elements in the image plane (40). The inventive arrangement is characterised in that another spectrometer (12) comprising at least one other dispersing element (64) and another imaging optical element (60,66) is provided in order to produce a spectrum (68) of a second wavelength range of radiation, which is different from the first wavelength range, from a radiation source on the same detector (42). The spectra can be spatially or temporally separated on the detector.

    Abstract translation: 本发明涉及一种分光计装置(10),其包括用于产生来自检测器(42)上的辐射源的第一波长范围的光谱仪(14)。 所述布置还包括:用于在主色散方向(46)上穿透光谱仪装置(10)的辐射的光谱分解的梯形光栅(36); 分散元件(34),用于通过在与梯形光栅(36)的主色散方向形成角度的横向色散方向(48)上的辐射的光谱分解来分离度数,使得两个 可以用多个分离的度数(52)产生维度谱(50); 用于在图像平面(40)中将穿过入口间隙(20)的辐射成像到成像光学装置(10)中的成像光学元件(24,38); 以及包括所述图像平面(40)中的多个检测器元件的二维布置的表面检测器(42)。 本发明的装置的特征在于,提供包括至少一个其它分散元件(64)和另一成像光学元件(60,66)的另一个光谱仪(12),以产生第二波长范围的辐射(68) ,其与第一波长范围不同,来自相同检测器(42)上的辐射源。 光谱可以在检测器上进行空间或时间分离。

    Industrially robust non-contact color measurement device
    90.
    发明申请
    Industrially robust non-contact color measurement device 有权
    工业坚固的非接触式测色装置

    公开(公告)号:US20080002204A1

    公开(公告)日:2008-01-03

    申请号:US11820089

    申请日:2007-06-18

    Abstract: A color measurement device designed for use at various stages of an industrial process is provided. The device offers enhanced insensitivity to ambient light, measurement depth variations, and/or ambient or environmental temperature variations. The device may be embodied as an LED-based, non-contact color measurement spectrophotometer. Over-illumination in full-spectrum of the target object facilitates effective color measurements over varying depths of view. Collected light is measured at discrete wavelengths across the entire visual spectrum. The hardened, rugged design and packaging of the measurement device allows color measurement to be performed at various stages of industrial processes wherein the device can add value by enabling enhanced detection of color errors.

    Abstract translation: 提供了一种设计用于工业过程各个阶段的颜色测量装置。 该设备提高了对环境光,测量深度变化和/或环境或环境温度变化的不敏感性。 该装置可以实现为基于LED的非接触式彩色测量分光光度计。 目标对象的全光谱过度照明有助于在不同深度的视角进行有效的颜色测量。 在整个视觉光谱上以离散波长测量所收集的光。 测量设备的硬化,坚固的设计和封装允许在工业过程的各个阶段执行颜色测量,其中通过实现增强的颜色误差检测,该装置可以增加价值。

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