Abstract:
A non- volatile content addressable memory cell comprises: a first phase change material element, the first phase change material element having one end connected to a match-line; a first transistor, the first transistor having a gate connected to a word-line, a source connected to a true bit-read- write-search-line, and a drain connected to another end of the first phase change material element; a second phase change material element, the second phase change material element having one end connected to the match-line; and a second transistor, the second transistor having a gate connected to the word-line, a source connected to a complementary bit- read-write-search-line, and a drain connected to another end of the second phase change material element.
Abstract:
A magnetic random access memory (MRAM) device includes a magnetic tunnel junction (MTJ) stack formed over a lower wiring level, a hardmask formed on the MTJ stack, and an upper wiring level formed over the hardmask. The upper wiring level includes a slot via bitline formed therein, the slot via bitline in contact with the hardmask and in contact with an etch stop layer partially surrounding sidewalls of the hardmask.
Abstract:
A magnetic random access memory (MRAM) device includes a magnetic tunnel junction (MTJ) stack formed over a lower wiring level, a hardmask formed on the MTJ stack, and an upper wiring level formed over the hardmask. The upper wiring level includes a slot via bitline formed therein, the slot via bitline in contact with the hardmask and in contact with an etch stop layer partially surrounding sidewalls of the hardmask.
Abstract:
A charge pump generator system and method is provided in which on or more charge pumps are operated at multiple charging rates depending upon the level reached by a voltage supply. The system includes a limiter which provides a control signal based upon the level of the voltage supply. The control signal selects the frequency of a multiple frequency oscillator coupled thereto. The selected frequency determines the charge transfer rate of a charge pump used to maintain the voltage supply.
Abstract:
PROBLEM TO BE SOLVED: To provide a method for forming a topography extremely reduced on a semiconductor surface formed by a damascene process. SOLUTION: A diamond or diamond like carbon film is adhered to the surface of a substrate as a polishing stop layer before a metal level pattern is formed. Next, a protective film is adhered on the diamond or diamond like carbon polishing stop layer. The protective film can be used as another polishing stop layer. Both the diamond or diamond like carbon film and the protective film are used as a hard mask so that a pattern is formed in a trench that has metallic features. The protective film protects the diamond or diamond like carbon polishing stop layer during a pattern forming process. After a conductive metal layer is adhered, the substrate is polished, and redundant conducting materials and the topography are removed.
Abstract:
PROBLEM TO BE SOLVED: To obtain a small trench capacitor having sufficiently low parasitic leakage. SOLUTION: A transistor, which includes a gate and first and second diffused regions are provided. A trench capacitor in a substrate electrically connects a dielectric color part 168 at the upper-side part of a trench, a diffused region embedded in a substrate surrounding the lower part of the trench capacitor, a transitor and the capacitor. A node diffused region is included on a collar part. A third diffused region 269 is provided in a substrate neighboring the color part. In order to decrease the leakage, an adequate concentration of doping agent for enhancing the threshold voltage of the gate of a parasitic transistor, which is formed of the color part, the embedded diffused region and node diffusion, is provided.
Abstract:
A method of fabricating a lateral transistor is provided, including the steps of: providing a body of semiconductor material including a device region of a first conductivity type; patterning the surface of the device region to define a first transistor region; filling the patterned portion of the device region surrounding the first transistor region with an insulating material to a height generally equal to the surface of with first transistor region; removing portions of the insulating material so as to define a pair of trenches generally bounding opposite sides of the first transistor region; filling the pair of trenches with doped conductive material of opposite conductivity type to the first transistor region; and annealing the semiconductor body whereby to form second and third transistor regions of opposite conductivity type to the first transistor region in the opposing sides of the first transistor region.