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公开(公告)号:MY144397A
公开(公告)日:2011-09-15
申请号:MYPI20045299
申请日:2004-12-22
Applicant: LAM RES CORP
Inventor: DAVIS GLENN W , WOODS CARL , PARKS JOHN , REDEKER FRED C , RAVKIN MIKE , ORBOCK MICHAEL L
IPC: B08B5/04 , H01L21/00 , H01L21/687
Abstract: AN APPARATUS FOR DRYING A SUBSTRATE (10) INCLUDES A VACUUM MANIFOLD (120) POSITIONED ADJACENT TO AN EDGE WHEEL (102). THE EDGE WHEEL INCLUDES AN EDGE WHEEL GROOVE (104) FOR RECEIVING A PERIPHERAL EDGE OF A SUBSTRATE, AND THE EDGE WHEEL IS CAPABLE OF ROTATING THE SUBSTRATE AT A DESIRED SET VELOCITY. THE VACUUM MANIFOLD INCLUDES A PROXIMITY END (126) HAVING ONE OR MORE VACUUM PORTS (128) DEFINED THEREIN. THE PROXIMITY END IS POSITIONED AT LEAST PARTIALLY WITHIN THE EDGE WHEEL GROOVE, AND USING SUPPLIED VACUUM REMOVES FLUIDS THAT ACCUMULATE IN THE EDGE WHEEL GROOVE AND PREVENTS RE-DEPOSIT OF TRAPPED FLUIDS AROUND THE PERIPHERAL EDGE OF THE SUBSTRATE.
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公开(公告)号:IL176467A
公开(公告)日:2011-06-30
申请号:IL17646706
申请日:2006-06-21
Applicant: LAM RES CORP , REDEKER FRED C , DAVIS GLENN W , WOODS CARL , PARKS JOHN , RAVKIN MIKE , ORBOCK MICHAEL L
Inventor: REDEKER FRED C , DAVIS GLENN W , WOODS CARL , PARKS JOHN , RAVKIN MIKE , ORBOCK MICHAEL L
IPC: H01L21/00 , H01L21/687
Abstract: A apparatus for drying a substrate includes a vacuum manifold positioned adjacent to an edge wheel. The edge wheel includes an edge wheel groove for receiving a peripheral edge of a substrate, and the edge wheel is capable of rotating the substrate at a desired set velocity. The vacuum manifold includes a proximity end having one or more vacuum ports defined therein. The proximity end is positioned at least partially within the edge wheel groove, and using supplied vacuum removes fluids that accumulate in the edge wheel groove and prevents re-deposit of trapped fluids around the peripheral edge of the substrate.
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33.
公开(公告)号:PL208012B1
公开(公告)日:2011-03-31
申请号:PL37450203
申请日:2003-09-30
Applicant: LAM RES CORP
Inventor: DE LARIOS JOHN M , GARCIA JAMES P , WOODS CARL , RAVKIN MIKE , REDEKER FRITZ , BOYD JOHN , NICKHOU AFSHIN
IPC: H01L21/00
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公开(公告)号:MY141428A
公开(公告)日:2010-04-30
申请号:MYPI20051479
申请日:2005-04-01
Applicant: LAM RES CORP
Inventor: WOODS CARL
IPC: B08B3/00 , H01L21/304 , H01L21/00
Abstract: AN APPARATUS FOR PROCESSING A SUBSTRATE (108) WITH A FLUID MENISCUS TO BE APPLIED TO A SURFACE OF THE SUBSTRATE IS PROVIDED WHICH INCLUDES A DOCKING SURFACE (120A) CONFIGURED TO BE PLACED ADJACENT TO AN EDGE OF THE SUBSTRATE WHERE THE DOCKING SURFACE IS IN THE SAME PLANE AS THE SUBSTRATE. THE DOCKING SURFACE PROVIDES A TRANSITION INTERFACE TO ALLOW THE FLUID MENISCUS TO ENTER AND EXIT THE SURFACE OF THE SUBSTRATE.
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公开(公告)号:DE60329978D1
公开(公告)日:2009-12-24
申请号:DE60329978
申请日:2003-09-30
Applicant: LAM RES CORP
Inventor: WOODS CARL , GARCIA JAMES P , DE LARIOS JOHN , RAVKIN MIKE , REDEKER FRED C , NICKHOU AFSHIN
Abstract: A manifold for use in preparing a surface of a substrate, comprising: the manifold defined by a head that includes, a first portion in the manifold having a plurality of conduits to deliver a first fluid onto the surface of the substrate and a plurality of conduits for removing the first fluid from the surface of the substrate to define a first process window in the first portion of the manifold, a first fluid meniscus configured to be maintained in the first process window of the manifold; and a second portion in the manifold having a plurality of conduits to deliver a second fluid onto the surface of the substrate and a plurality of conduits for removing the second fluid from the surface of the substrate to define a second process window in the second portion of the manifold, a second fluid meniscus configured to be maintained in the second process window of the manifold; wherein the head is operable to be placed in proximity to the surface of the substrate so as to orient the first process window and the second process window toward the surface of the substrate.
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公开(公告)号:MY137975A
公开(公告)日:2009-04-30
申请号:MYPI20051477
申请日:2005-04-01
Applicant: LAM RES CORP
Inventor: WOODS CARL , SMITH MICHAEL G R , PARKS JOHN , GARCIA JAMES P , LARIOS JOHN M DE
IPC: B05C9/02 , B05D1/00 , B05D3/12 , H01L21/00 , H01L21/02 , H01L21/027 , H01L21/304 , H01L21/306
Abstract: AN APPARATUS FOR PROCESSING A SUBSTRATE (108) IS PROVIDED WHICH INCLUDES A FIRST MANIFOLD MODULE (106) TO GENERATE A FLUID MENISCUS (140) ON A SUBSTRATE SURFACE. THE APPARATUS ALSO INCLUDES A SECOND MANIFOLD MODULE (102) TO CONNECT WITH THE FIRST MANIFOLD MODULE (106) AND ALSO TO MOVE THE FIRST MANIFOLD MODULE (106) INTO CLOSE PROXIMITY TO THE SUBSTRATE SURFACE TO GENERATE THE FLUID MENISCUS (140).
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公开(公告)号:AT365375T
公开(公告)日:2007-07-15
申请号:AT03798815
申请日:2003-09-30
Applicant: LAM RES CORP
Inventor: DE LARIOS JOHN , GARCIA JAMES , WOODS CARL , RAVKIN MIKE , REDEKER FRITZ , BOYD JOHN , NICKHOU AFSHIN
IPC: H01L21/00
Abstract: One of many embodiments of a substrate preparation system is provided which includes a head having a head surface where the head surface is proximate to a surface of the substrate. The system also includes a first conduit for delivering a first fluid to the surface of the substrate through the head, and a second conduit for delivering a second fluid to the surface of the substrate through the head, where the second fluid is different than the first fluid. The system also includes a third conduit for removing each of the first fluid and the second fluid from the surface of the substrate where the first conduit, the second conduit and the third conduit act substantially simultaneously. In an alternative embodiment, a method for processing a substrate is provided that includes generating a fluid meniscus on a surface of the substrate and applying acoustic energy to the fluid meniscus. The method also includes moving the fluid meniscus over the surface the substrate to process the surface of the substrate.
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公开(公告)号:MY146073A
公开(公告)日:2012-06-29
申请号:MYPI20052713
申请日:2005-06-15
Applicant: LAM RES CORP
Inventor: DORDI YEZDI N , REDEKER FRED C , BOYD JOHN M , MARASCHIN ROBERT , WOODS CARL
IPC: C25D5/06
Abstract: AN ELECTROPLATING APPARATUS FOR ELECTROPLATING A SURFACE OF A WAFER IS PROVIDED. THE WAFER (W) IS CAPABLE OF BEING ELECTRICALLY CHARGED AS A CATHODE. THE ELECTROPLATING APPARATUS INCLUDES A PLATING HEAD (110) CAPABLE OF BEING POSITIONED EITHER OVER OR UNDER THE SURFACE OF A WAFER AND CAPABLE OF BEING ELECTRICALLY CHARGED AS IN ANODE. THE PLATING HEAD IS CAPABLE OF ENABLING METALLIC PLATING BETWEEN THE SURFACE OF THE WAFER AND THE PLATING HEAD WHEN THE WAFER AND PLATING HEAD ARE CHARGED. THE PLATING HEAD FURTHER COMPRISES A VOLTAGE SENSOR PAIR (126, 128) CAPABLE OF SENSING A VOLTAGE PRESENT BETWEEN THE PLATING HEAD AND THE SURFACE OF THE WAFER, AND A CONTROLLER CAPABLE OF RECEIVING DATA FROM THE VOLTAGE SENSOR PAIR. THE DATA RECEIVED FROM THE VOLTAGE SENSOR PAIR IS USED BY THE CONTROLLER TO MAINTAIN A SUBSTANTIALLY CONSTANT VOLTAGE TO BE APPLIED BY THE ANODE WHEN THE PLATING HEAD IS PLACED IN POSITIONS OVER THE SURFACE OF THE WAFER. A METHOD OF ELECTROPLATING A WAFER IS ALSO PROVIDED.
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公开(公告)号:MY143289A
公开(公告)日:2011-04-15
申请号:MYPI20051473
申请日:2005-03-31
Applicant: LAM RES CORP
Inventor: RAVKIN MICHAEL , LARIOS JOHN M DE , KOROLIK MIKHAIL , SMITH MICHAEL G R , WOODS CARL
IPC: A47L15/00 , A47L25/00 , B08B1/02 , B08B1/04 , B08B3/00 , B08B3/04 , B08B7/00 , B08B7/04 , H01L21/00
Abstract: A METHOD FOR CLEANING AND DRIYING A FRONT AND A BACK SURFACE OFA SUBSTRATE ( 102) IS PROVIDED. THE METHOD INCLUDES BRUSH SCRUBBING THE BACK SURFACE ( 102B) OF THE SUBSTRATE ( 102) USING A BRUSH SCRUBBING FLUID CHEMISTRY (121). THE METHOD FURTHER INCLUDES APPLYING A FRONT MENISCUS (150) ONTO THE FRONT SURFACE ( 102A) OF THE SUBSTRATE ( 102) UPON COMPLETING THE BRUSH SCRUBBING OF THE BACK SURFACE (102B). THE FRONT MENISCUS (150) INCLUDES A FRONT CLEANING CHEMISTRY THAT IS CHEMICALLY COMPATIBLE WITH THE BRUSH SCRUBBING FLUID CHEMISTRY (121). A METHOD FOR PREPARING A SURFACE OF A SUBSTRATE (102) IS ALSO PROVIDED. THE METHOD INCLUDES SCANNING THE SURFACE OF THE SUBSTRATE BY A MENISCUS ( 150). PREPARING THE SURFACE OF THE SUBSTRATE USING THE MENISCUS (150) (1102). AND PERFORMING A NEXT PREPARATION OPERATION ON THE SURFACE OF THE SUBSTRATE (102) THAT WAS PREPARED WITHOUT PERFORMING A RINSING OPERATION ( 1104).
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公开(公告)号:SG158117A1
公开(公告)日:2010-01-29
申请号:SG2009081449
申请日:2005-12-05
Applicant: LAM RES CORP
Inventor: WOODS CARL
Abstract: A multi-layered wafer support apparatus is provided for performing an electroplating process on a semiconductor wafer (107). The multi-layered wafer support apparatus includes a bottom film layer (201) and a top film layer (301). The bottom film layer includes a wafer placement area and a sacrificial anode surrounding the wafer placement area. The top film layer is defined to be placed- over the bottom film layer. The top film layer includes an open region to be positioned over a surface of the wafer to be processed, i.e., electroplated. The top film layer provides a liquid seal (313) between the top film layer and the wafer, about a periphery of the open region. The top film layer further includes first and second electric circuits (307a, 307b) that are each; defined to electrically contact a. peripheral top surface of the wafer at diametrically opposed locations about the wafer. Fig. 5A
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