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公开(公告)号:DE60314203D1
公开(公告)日:2007-07-19
申请号:DE60314203
申请日:2003-04-28
Applicant: ST MICROELECTRONICS SA
Inventor: MONFRAY STEPHANE , DUTARTRE DIDIER , BOEUF FREDERIC
Abstract: An integrated circuit, incorporating a semiconductor device forming the source of a single photon, comprises on a silicon substrate (SB): (a) a MOS transistor (TR) having a grid in the shape of a mushroom, capable of delivering on its drain, in a controlled manner, a single electron in response to a control voltage applied on its grid; (b) at least one compatible silicon quantum box (BQ), electrically coupled to the drain region (D) of the transistor, and capable of emitting a single photon on the reception of a single electron emitted by the transistor. Independent claims are also included for: (a) a cryptographic device incorporating this integrated circuit; (b) a method for the fabrication of this integrated circuit; (c) a method for the emission of a single photon using this integrated circuit.
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公开(公告)号:FR2812764B1
公开(公告)日:2003-01-24
申请号:FR0010176
申请日:2000-08-02
Applicant: ST MICROELECTRONICS SA
Inventor: SKOTNICKI THOMAS , HAOND MICHEL , DUTARTRE DIDIER
IPC: H01L21/762 , H01L21/328
Abstract: Processes are provided for fabricating a substrate having a silicon-on-insulator (SOI) or silicon-on-nothing (SON) architecture, which are applicable to the manufacture of semiconductor devices, especially transistors such as those of the MOS, CMOS, BICMOS, and HCMOS types. In the fabrication processes, a multilayer stack is grown on a substrate by non-selective full-wafer epitaxy. The multilayer stack includes a silicon layer on a Ge or SiGe layer. Active regions are defined and masked, and insulating pads are formed so as to be located around the perimeter of each of the active regions at predetermined intervals and placed against the sidewalls of the active regions. The insulating trenches are etched, and the SiGe or Ge layer is laterally etched so as to form an empty tunnel under the silicon layer. The trenches are filled with a dielectric. In the case of an SOI archiutecture, the tunnel is filled with a dielectric.
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公开(公告)号:FR2822292A1
公开(公告)日:2002-09-20
申请号:FR0103469
申请日:2001-03-14
Applicant: ST MICROELECTRONICS SA
Inventor: CHANTRE ALAIN , BAUDRY HELENE , DUTARTRE DIDIER
IPC: H01L21/331 , H01L29/737
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公开(公告)号:FR2798195B1
公开(公告)日:2001-11-16
申请号:FR9911142
申请日:1999-09-02
Applicant: ST MICROELECTRONICS SA
Inventor: DUTARTRE DIDIER , OBERLIN JEAN CLAUDE
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公开(公告)号:FR2807208A1
公开(公告)日:2001-10-05
申请号:FR0003983
申请日:2000-03-29
Applicant: ST MICROELECTRONICS SA
Inventor: SKOTNICKI THOMAS , FOURNEL RICHARD , DUTARTRE DIDIER , RIBOT PASCAL , PAOLI MARYSE
IPC: H01L21/28 , H01L21/336 , H01L29/423 , H01L21/8239
Abstract: Non-volatile memory semiconductor device comprises silicon based semiconductor substrate (SB) containing a source region (S) and a drain region (D), a control gate (GC) and a floating gate (GF). The floating gate extends between the source and drain regions formed in the substrate, and the control gate is situated above the floating gate and juts out with respect to source and drain regions. An Independent claim is included for the fabrication of the non-volatile memory semiconductor device.
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公开(公告)号:FR2806831A1
公开(公告)日:2001-09-28
申请号:FR0003845
申请日:2000-03-27
Applicant: ST MICROELECTRONICS SA
Inventor: CHANTRE ALAIN , DUTARTRE DIDIER , BAUDRY HELENE
IPC: H01L21/331 , H01L29/737
Abstract: A method for the fabrication of a bipolar transistor consists of forming, using non-selective epitaxy, a semiconductor region with a silicon-germanium heterojunction (1) extending over an active region (ZA) of a semiconductor substrate and an insulating region (STI) delimiting the active region, and incorporating the region of the intrinsic base of the transistor; an emitter region (8) situated above the active region and coming into contact with the upper surface of the heterojunction semiconductor region (1); a layer of polysilicon (30) forming the region of the extrinsic base of the transistor, situated either side of the emitter region (8) and separated from the heterojunction semiconductor region by a separation layer incorporating an electrical liaison conductor (74) part situated in the external neighbourhood of the emitter region, this liaison part assuring an electrical contact between the extrinsic base and the intrinsic base. An Independent claim is included for such a bipolar transistor.
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公开(公告)号:FR2803091A1
公开(公告)日:2001-06-29
申请号:FR9916283
申请日:1999-12-22
Applicant: ST MICROELECTRONICS SA
Inventor: MARTY MICHEL , DUTARTRE DIDIER , CHANTRE ALAIN , FELLOUS CYRIL
IPC: H01L21/223 , H01L21/331 , H01L21/8222
Abstract: Doping of the extrinsic base of a bipolar transistor is effected in the vapor phase by putting into hot contact the region of the extrinsic base (8) with a flow of doping gas (FLX).
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公开(公告)号:FR2801420A1
公开(公告)日:2001-05-25
申请号:FR9914746
申请日:1999-11-23
Applicant: ST MICROELECTRONICS SA
Inventor: MARTY MICHEL , DUTARTRE DIDIER , CHANTRE ALAIN , JOUAN SEBASTIEN , LLINARES PIERRE
IPC: H01L21/331 , H01L21/8249 , H01L29/73 , H01L27/06 , H01L29/08 , H01L29/165 , H01L29/737 , H01L29/732
Abstract: Preparation of a bipolar vertical transistor comprises: (a) making an intrinsic collector on a layer of extrinsic collector in a semiconductor substrate; (b) making a lateral isolating region; (c) making a base next to he intrinsic collector and the lateral isolating region; and (d) making a bipartite dope emitter in situ. Preparation of a bipolar vertical transistor comprises: (a) making an intrinsic collector (4) on a layer of extrinsic collector (2) in a semiconductor substrate (1); (b) making a lateral isolating region (5) surrounding the upper part of the intrinsic collector and of wells of the imprisoned extrinsic collector (60); (c) making a base (8) next to he intrinsic collector and the lateral isolating region and comprising a non-selective epitaxy of a semiconductor region (8) comprising at least one layer of silicon; (d) making a bipartite dope emitter (11) in situ comprising: (i) making a first layer (110) of the emitter formed from microcrystalline silicon and directly in contact with a part (800) of the upper surface of the semiconductor region situated on top of the intrinsic collector; and (ii) making a second part (111) of emitter from polycrystalline silicon; the two parts (110, 111) being separated by an oxide layer (112).
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公开(公告)号:FR3027156A1
公开(公告)日:2016-04-15
申请号:FR1459727
申请日:2014-10-10
Applicant: STMICROELECTRONICS (CROLLES 2) SAS , ST MICROELECTRONICS SA
Inventor: FAVENNEC LAURENT , DUTARTRE DIDIER , ROY FRANCOIS
IPC: H01L31/0248 , H01L27/146
Abstract: L'invention concerne un procédé de fabrication d'une photodiode pincée, comprenant : la formation d'une région (13) de conversion de photons en charges électriques d'un premier type de conductivité sur un substrat (11, 12) du deuxième type de conductivité ; le revêtement de ladite région par une couche d'un isolant (22) fortement dopé du deuxième type de conductivité ; et un recuit assurant une diffusion de dopants en provenance de la couche d'isolant fortement dopé.
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公开(公告)号:FR2981502A1
公开(公告)日:2013-04-19
申请号:FR1159404
申请日:2011-10-18
Applicant: ST MICROELECTRONICS CROLLES 2 , ST MICROELECTRONICS SA
IPC: H01L21/76
Abstract: Procédé de réalisation d'au moins une tranchée d'isolation profonde (TI1, TI2, TI3) au sein d'un support semi-conducteur (SC) comprenant du silicium et ayant une face avant (F), ledit procédé comprenant : - une formation d'au moins une cavité (CV) dans le support semi-conducteur à partir de la face avant, - un dépôt conforme d'atomes dopants (SD1, SD2, SD3) sur les parois de la cavité, - une formation au voisinage des parois de la cavité d'une région de silicium dopé à partir desdits atomes dopants, - un remplissage de la cavité par un matériau de comblement de manière à former ladite au moins une tranchée d'isolation profonde.
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