31.
    发明专利
    未知

    公开(公告)号:DE60314203D1

    公开(公告)日:2007-07-19

    申请号:DE60314203

    申请日:2003-04-28

    Abstract: An integrated circuit, incorporating a semiconductor device forming the source of a single photon, comprises on a silicon substrate (SB): (a) a MOS transistor (TR) having a grid in the shape of a mushroom, capable of delivering on its drain, in a controlled manner, a single electron in response to a control voltage applied on its grid; (b) at least one compatible silicon quantum box (BQ), electrically coupled to the drain region (D) of the transistor, and capable of emitting a single photon on the reception of a single electron emitted by the transistor. Independent claims are also included for: (a) a cryptographic device incorporating this integrated circuit; (b) a method for the fabrication of this integrated circuit; (c) a method for the emission of a single photon using this integrated circuit.

    32.
    发明专利
    未知

    公开(公告)号:FR2812764B1

    公开(公告)日:2003-01-24

    申请号:FR0010176

    申请日:2000-08-02

    Abstract: Processes are provided for fabricating a substrate having a silicon-on-insulator (SOI) or silicon-on-nothing (SON) architecture, which are applicable to the manufacture of semiconductor devices, especially transistors such as those of the MOS, CMOS, BICMOS, and HCMOS types. In the fabrication processes, a multilayer stack is grown on a substrate by non-selective full-wafer epitaxy. The multilayer stack includes a silicon layer on a Ge or SiGe layer. Active regions are defined and masked, and insulating pads are formed so as to be located around the perimeter of each of the active regions at predetermined intervals and placed against the sidewalls of the active regions. The insulating trenches are etched, and the SiGe or Ge layer is laterally etched so as to form an empty tunnel under the silicon layer. The trenches are filled with a dielectric. In the case of an SOI archiutecture, the tunnel is filled with a dielectric.

    36.
    发明专利
    未知

    公开(公告)号:FR2806831A1

    公开(公告)日:2001-09-28

    申请号:FR0003845

    申请日:2000-03-27

    Abstract: A method for the fabrication of a bipolar transistor consists of forming, using non-selective epitaxy, a semiconductor region with a silicon-germanium heterojunction (1) extending over an active region (ZA) of a semiconductor substrate and an insulating region (STI) delimiting the active region, and incorporating the region of the intrinsic base of the transistor; an emitter region (8) situated above the active region and coming into contact with the upper surface of the heterojunction semiconductor region (1); a layer of polysilicon (30) forming the region of the extrinsic base of the transistor, situated either side of the emitter region (8) and separated from the heterojunction semiconductor region by a separation layer incorporating an electrical liaison conductor (74) part situated in the external neighbourhood of the emitter region, this liaison part assuring an electrical contact between the extrinsic base and the intrinsic base. An Independent claim is included for such a bipolar transistor.

    38.
    发明专利
    未知

    公开(公告)号:FR2801420A1

    公开(公告)日:2001-05-25

    申请号:FR9914746

    申请日:1999-11-23

    Abstract: Preparation of a bipolar vertical transistor comprises: (a) making an intrinsic collector on a layer of extrinsic collector in a semiconductor substrate; (b) making a lateral isolating region; (c) making a base next to he intrinsic collector and the lateral isolating region; and (d) making a bipartite dope emitter in situ. Preparation of a bipolar vertical transistor comprises: (a) making an intrinsic collector (4) on a layer of extrinsic collector (2) in a semiconductor substrate (1); (b) making a lateral isolating region (5) surrounding the upper part of the intrinsic collector and of wells of the imprisoned extrinsic collector (60); (c) making a base (8) next to he intrinsic collector and the lateral isolating region and comprising a non-selective epitaxy of a semiconductor region (8) comprising at least one layer of silicon; (d) making a bipartite dope emitter (11) in situ comprising: (i) making a first layer (110) of the emitter formed from microcrystalline silicon and directly in contact with a part (800) of the upper surface of the semiconductor region situated on top of the intrinsic collector; and (ii) making a second part (111) of emitter from polycrystalline silicon; the two parts (110, 111) being separated by an oxide layer (112).

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