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公开(公告)号:FR2779572A1
公开(公告)日:1999-12-10
申请号:FR9807059
申请日:1998-06-05
Applicant: ST MICROELECTRONICS SA
Inventor: CHANTRE ALAIN , MARTY MICHEL , DUTARTRE DIDIER , MONROY AUGUSTIN , LAURENS MICHEL , GUETTE FRANCOIS
IPC: H01L21/331 , H01L29/08 , H01L29/737 , H01L29/73 , H01L29/732
Abstract: A vertical bipolar transistor production process comprises epitaxy of a single crystal silicon emitter region in direct contact with the upper layer of a silicon germanium heterojunction base. Production of a vertical bipolar transistor comprises (a) forming an intrinsic collector (4) on an extrinsic collector layer buried in a semiconductor substrate (1); (b) forming a lateral insulation region (5) around the upper part of the intrinsic collector and an offset extrinsic collector well (60); (c) forming an silicon germanium heterojunction base above the intrinsic collector (4) and the lateral insulation region (5) by non-selective epitaxy of a multilayer (8) including a silicon germanium layer; and (e) forming an in-situ doped emitter by epitaxy on a window of the surface of the multilayer located above the intrinsic collector to obtain, above the window, a single crystal silicon emitter region in direct contact with the upper layer of the multilayer (8). An Independent claim is also included for a vertical bipolar transistor produced by the above process.
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公开(公告)号:FR3027731A1
公开(公告)日:2016-04-29
申请号:FR1460236
申请日:2014-10-24
Applicant: ST MICROELECTRONICS SA
Inventor: DUTARTRE DIDIER
IPC: H01L27/146 , H01L31/0248
Abstract: L'invention est relative à un capteur d'image de type « face avant », comprenant un substrat (22-1) en matériau semi-conducteur ; une couche active (10) en matériau semi-conducteur ; une matrice de photodiodes (14, 18) réalisée dans la couche active ; et une couche d'isolant (22-2) entre le substrat (22-1) et la couche active (10).
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公开(公告)号:FR2974236A1
公开(公告)日:2012-10-19
申请号:FR1153319
申请日:2011-04-15
Applicant: ST MICROELECTRONICS SA , IBM
Inventor: DUTARTRE DIDIER , BREIL NICOLAS , SHEPARD JOSEPH
Abstract: L'invention concerne un procédé de fabrication d'un transistor MOS sur silicium-germanium comprenant les étapes consistant à former par épitaxie sur le silicium-germanium (21) une mince couche de silicium (24) ; et procéder à une oxydation thermique propre à oxyder toute la mince couche de silicium et seulement cette mince couche de silicium.
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公开(公告)号:DE60314203D1
公开(公告)日:2007-07-19
申请号:DE60314203
申请日:2003-04-28
Applicant: ST MICROELECTRONICS SA
Inventor: MONFRAY STEPHANE , DUTARTRE DIDIER , BOEUF FREDERIC
Abstract: An integrated circuit, incorporating a semiconductor device forming the source of a single photon, comprises on a silicon substrate (SB): (a) a MOS transistor (TR) having a grid in the shape of a mushroom, capable of delivering on its drain, in a controlled manner, a single electron in response to a control voltage applied on its grid; (b) at least one compatible silicon quantum box (BQ), electrically coupled to the drain region (D) of the transistor, and capable of emitting a single photon on the reception of a single electron emitted by the transistor. Independent claims are also included for: (a) a cryptographic device incorporating this integrated circuit; (b) a method for the fabrication of this integrated circuit; (c) a method for the emission of a single photon using this integrated circuit.
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公开(公告)号:FR2812764B1
公开(公告)日:2003-01-24
申请号:FR0010176
申请日:2000-08-02
Applicant: ST MICROELECTRONICS SA
Inventor: SKOTNICKI THOMAS , HAOND MICHEL , DUTARTRE DIDIER
IPC: H01L21/762 , H01L21/328
Abstract: Processes are provided for fabricating a substrate having a silicon-on-insulator (SOI) or silicon-on-nothing (SON) architecture, which are applicable to the manufacture of semiconductor devices, especially transistors such as those of the MOS, CMOS, BICMOS, and HCMOS types. In the fabrication processes, a multilayer stack is grown on a substrate by non-selective full-wafer epitaxy. The multilayer stack includes a silicon layer on a Ge or SiGe layer. Active regions are defined and masked, and insulating pads are formed so as to be located around the perimeter of each of the active regions at predetermined intervals and placed against the sidewalls of the active regions. The insulating trenches are etched, and the SiGe or Ge layer is laterally etched so as to form an empty tunnel under the silicon layer. The trenches are filled with a dielectric. In the case of an SOI archiutecture, the tunnel is filled with a dielectric.
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公开(公告)号:FR2822292A1
公开(公告)日:2002-09-20
申请号:FR0103469
申请日:2001-03-14
Applicant: ST MICROELECTRONICS SA
Inventor: CHANTRE ALAIN , BAUDRY HELENE , DUTARTRE DIDIER
IPC: H01L21/331 , H01L29/737
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公开(公告)号:FR2798195B1
公开(公告)日:2001-11-16
申请号:FR9911142
申请日:1999-09-02
Applicant: ST MICROELECTRONICS SA
Inventor: DUTARTRE DIDIER , OBERLIN JEAN CLAUDE
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公开(公告)号:FR2807208A1
公开(公告)日:2001-10-05
申请号:FR0003983
申请日:2000-03-29
Applicant: ST MICROELECTRONICS SA
Inventor: SKOTNICKI THOMAS , FOURNEL RICHARD , DUTARTRE DIDIER , RIBOT PASCAL , PAOLI MARYSE
IPC: H01L21/28 , H01L21/336 , H01L29/423 , H01L21/8239
Abstract: Non-volatile memory semiconductor device comprises silicon based semiconductor substrate (SB) containing a source region (S) and a drain region (D), a control gate (GC) and a floating gate (GF). The floating gate extends between the source and drain regions formed in the substrate, and the control gate is situated above the floating gate and juts out with respect to source and drain regions. An Independent claim is included for the fabrication of the non-volatile memory semiconductor device.
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公开(公告)号:FR2806831A1
公开(公告)日:2001-09-28
申请号:FR0003845
申请日:2000-03-27
Applicant: ST MICROELECTRONICS SA
Inventor: CHANTRE ALAIN , DUTARTRE DIDIER , BAUDRY HELENE
IPC: H01L21/331 , H01L29/737
Abstract: A method for the fabrication of a bipolar transistor consists of forming, using non-selective epitaxy, a semiconductor region with a silicon-germanium heterojunction (1) extending over an active region (ZA) of a semiconductor substrate and an insulating region (STI) delimiting the active region, and incorporating the region of the intrinsic base of the transistor; an emitter region (8) situated above the active region and coming into contact with the upper surface of the heterojunction semiconductor region (1); a layer of polysilicon (30) forming the region of the extrinsic base of the transistor, situated either side of the emitter region (8) and separated from the heterojunction semiconductor region by a separation layer incorporating an electrical liaison conductor (74) part situated in the external neighbourhood of the emitter region, this liaison part assuring an electrical contact between the extrinsic base and the intrinsic base. An Independent claim is included for such a bipolar transistor.
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公开(公告)号:FR2803091A1
公开(公告)日:2001-06-29
申请号:FR9916283
申请日:1999-12-22
Applicant: ST MICROELECTRONICS SA
Inventor: MARTY MICHEL , DUTARTRE DIDIER , CHANTRE ALAIN , FELLOUS CYRIL
IPC: H01L21/223 , H01L21/331 , H01L21/8222
Abstract: Doping of the extrinsic base of a bipolar transistor is effected in the vapor phase by putting into hot contact the region of the extrinsic base (8) with a flow of doping gas (FLX).
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