Abstract:
A radiation-emitting semiconductor chip, having a multilayer structure ( 100 ) containing a radiation-emitting active layer ( 10 ), and having a window layer ( 20 ), which is transmissive to a radiation emitted by the active layer ( 10 ) and is arranged downstream of the multilayer structure ( 100 ) in the direction of a main radiating direction of the semiconductor component. The window layer ( 20 ) has at least one peripheral side area ( 21 ), which, in the course from a first main area ( 22 ) facing the multilayer structure ( 100 ) in the direction toward a second main area ( 23 ) remote from the multilayer structure ( 100 ), firstly has a first side area region ( 24 ) which is beveled, curved or stepped in such a way that the window layer widens with respect to the size of the first main area ( 22 ). A peripheral side area ( 11 ) of the multilayer structure ( 100 ) and at least a part of the beveled, curved or stepped first side area region ( 24 ) are coated with a continuous electrically insulating layer ( 30 ). A radiation-emitting component is disclosed having a chip of this type, and also disclosed is a method for simultaneously producing a multiplicity of such chips.
Abstract:
Radiation-emitting semiconductor component comprises a semiconductor body (1) having a radiation-producing active layer (9) and a p-conducting contact layer (2) containing InxGa1-xN (where x = 0-1) or AlyInxGa1-x-yN (where x = 0-1; y = 0-1; and x + y = 0-1). A contact metallization (3) is formed on the contact layer. An Independent claim is also included for a process for the production of a radiation-emitting semiconductor comprising preparing a semiconductor surface, applying a p-conducting contact layer containing InxGa1-xN (where x = 0-1) or AlyInxGa1-x-yN (where x = 0-1; y = 0-1; and x + y = 0-1) on the surface, and applying a contact metallization on the contact layer. Preferred Features: The contact layer is doped with magnesium. The contact metallization contains Pd, Ni, Au or Pt or an alloy of these.
Abstract:
The invention relates to a radiation-emitting semiconductor component with an improved radiation yield and to a method for producing the same. The semiconductor element has a multilayer structure (2) with an active layer (3) for generating the radiation within the multilayer structure (2) and a window (1) with a first and a second primary surface. The multilayer structure adjoins the first primary surface (5) of the window (1). At least one recess is formed in the window (1), starting from the second primary surface (6), for increasing the radiation yield. The recess preferably has a trapezoidal cross-section, which tapers towards the first primary surface (5) and can be produced, for example, by sawing into the window.
Abstract:
The invention relates to a method for the production of a semiconductor component, comprising a number of GaN layers, preferably serving as a radiation generator. A number of GaN-based layers (4) are deposited on a composite substrate, comprising a substrate body (1) and an intermediate layer (2), whereby the thermal coefficient of expansion of the substrate body (1) is similar to, or preferably greater than the thermal coefficient of expansion of the layers (4) based on GaN and the GaN-based layers (4) are deposited on the intermediate layer (2). The intermediate layer and the substrate body are connected by means of a wafer bonding process.
Abstract:
The invention relates to a semiconductor chip (10), in which the active layer (3) is interrupted by cavities (11). In this way, the lateral surfaces (9) of the active layer (3) when viewed from a light generating point (6) appear at a greater solid angle and the light paths in the active layer (3) are shortened.
Abstract:
The device comprises alternate well layers (6a) and barrier layers (6b) made of different types of semiconductor layers. The well layers are formed from thin gallium indium nitride layers. The blocking layers are formed from thicker gallium nitride layers. An active quantum well made of gallium indium nitride (6c) adjoins the uppermost blocking layer. Super-lattices are formed by the well layers and the blocking layers. The well layers are thinner than 3 nm, and the blocking layers are 5 nm thick or thicker.
Abstract:
A white light source comprises a UV-/blue-emitting semi-conductor LED (1), an embedding mass with phosphor particles (6) and several light emitting zones. Said light emitting zones are arranged within a layered structure, on a common substrate (10, 20), whereby the emission maxima of the light emitting zones are energetically staggered by various choices of compound or semi-conductor material thickness.
Abstract:
The invention relates to a method for producing a semiconductor component, according to which a semiconductor layer (2) is separated from a substrate (1) by irradiation with laser pulses, the pulse duration of the laser pulses being less than or equal to 10 ns. The laser pulses have a spatial beam profile, whose flank slope is gentle enough to prevent cracks in the semiconductor layer (2) caused by thermally induced lateral stresses, during the separation of the semiconductor layer (2) from the substrate (1).
Abstract:
The invention relates to a method for producing a semiconductor component, according to which a semiconductor layer (2) is separated from a substrate (1) by irradiation with laser pulses (6), the pulse duration of the laser pulses (6) being less than or equal to 10 ns. The laser pulses (6) have a spatial beam profile (7), whose flank slope is gentle enough to prevent cracks in the semiconductor layer (2) caused by thermally induced lateral stresses, during the separation of the semiconductor layer (2) from the substrate (1).
Abstract:
The invention relates to an ohmic contact structure comprising a metallisation layer (14) which is arranged on a semiconductor material (10). A contact layer is formed in the semiconductor material (10, said contact layer comprising a first partial region which is adjacent to the metallisation layer (14) and a second partial region (18) following the first partial region. The contact layer is doped in such a way that the doping concentration (N2) in the first partial region (12) is higher than the doping concentration (N1) in the second partial region (18).