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公开(公告)号:DE10034085C2
公开(公告)日:2002-05-08
申请号:DE10034085
申请日:2000-07-13
Applicant: INFINEON TECHNOLOGIES AG
Inventor: AIGNER ROBERT , ELBRECHT LUEDER , MARKSTEINER STEPHAN
IPC: H01L21/304 , H01L21/78 , H01L37/02 , H01L41/311 , H03H3/02 , H01L21/70 , H01L37/00 , H01L41/22 , H03H9/00
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公开(公告)号:DE10045090A1
公开(公告)日:2002-03-28
申请号:DE10045090
申请日:2000-09-12
Applicant: INFINEON TECHNOLOGIES AG
Inventor: AIGNER ROBERT , ELBRECHT LUEDER , MARKSTEINER STEPHAN , NESSLER WINFRIED , TIMME HANS-JOERG
Abstract: The resonator comprises a first electrode (E1), a second electrode (E2) and a piezoelectric layer (P) arranged between the above. A first acoustic compression layer (V1) is arranged between the piezoelectric layer (E1) and the first electrode (E1) with a higher acoustic impedance than the first electrode (E1).
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公开(公告)号:DE10035423C1
公开(公告)日:2001-11-22
申请号:DE10035423
申请日:2000-07-20
Applicant: INFINEON TECHNOLOGIES AG
Inventor: AIGNER ROBERT , LUEDER ELBRECHT , HERZOG THOMAS RAINER , MARKSTEINER STEPHAN , NESSLER WINFRIED
IPC: H01L21/28 , H01L37/02 , H01L41/08 , H01L41/09 , H01L41/22 , H01L41/319 , H03H3/02 , H03H9/17 , H01L21/20 , H01L37/00 , H01L41/047 , H03H9/25
Abstract: Semiconductor element has an auxiliary layer (H) arranged between a lower electrode (U) and a piezoelectric or pyroelectric layer (S). The auxiliary layer promotes the growth of the piezoelectric or pyroelectric layer and consists of amorphous silicon, amorphous silicon oxide or amorphous silicon nitride. An Independent claim is also included for a process for the production of the semiconductor element. Preferred Features: The piezoelectric or pyroelectric layer is made from AlN. The lower electrode and an upper electrode (O) in the layer succession are made from W, Mo, Pt and/or an Al alloy.
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公开(公告)号:DE19940581C2
公开(公告)日:2001-07-26
申请号:DE19940581
申请日:1999-08-26
Applicant: INFINEON TECHNOLOGIES AG
Inventor: AIGNER ROBERT , KAPELS HERGEN , MECKES ANDREAS , OPPERMANN KLAUS-GUENTER
IPC: B81B3/00 , B81B7/02 , H01L27/06 , H01L21/822 , H01L21/8232 , B81C1/00
Abstract: The manufacturing method has at least one electronic component (7) formed in the surface of a semiconductor body (1), before forming a recess in the surface of the latter, by selective removal of semiconductor material and formation of a layer (10) in this recess, which is structured to provide the micromechanical sensor component. The electronic component can be covered by a protective layer (9) before formation of the recess, with the layer provided in the recess formed from poly-silicon.
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公开(公告)号:DE19962231A1
公开(公告)日:2001-07-12
申请号:DE19962231
申请日:1999-12-22
Applicant: INFINEON TECHNOLOGIES AG
Inventor: AIGNER ROBERT , PLOETZ FLORIAN , MICHAELIS SVEN , BRAUER MICHAEL
Abstract: A micromechanical structure (17) disposed on a base body (1) requires protection from environmental influences by means of a covering (2) while at the same time electrical contacts (9) for connecting the micromechanical structure are required. The inventive method makes it possible to bare the electric contact (9) by partially (19) or completely (20) sawing through the structure.
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公开(公告)号:DE19940581A1
公开(公告)日:2001-04-19
申请号:DE19940581
申请日:1999-08-26
Applicant: INFINEON TECHNOLOGIES AG
Inventor: AIGNER ROBERT , KAPELS HERGEN , MECKES ANDREAS , OPPERMANN KLAUS-GUENTER
IPC: B81B3/00 , B81B7/02 , H01L27/06 , H01L21/822 , H01L21/8232 , B81C1/00
Abstract: The manufacturing method has at least one electronic component (7) formed in the surface of a semiconductor body (1), before forming a recess in the surface of the latter, by selective removal of semiconductor material and formation of a layer (10) in this recess, which is structured to provide the micromechanical sensor component. The electronic component can be covered by a protective layer (9) before formation of the recess, with the layer provided in the recess formed from poly-silicon.
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公开(公告)号:DE19947081A1
公开(公告)日:2001-04-05
申请号:DE19947081
申请日:1999-09-30
Applicant: INFINEON TECHNOLOGIES AG
Inventor: AIGNER ROBERT , ELBRECHT LUEDER , MARKSTEINER STEPHAN , SAENGER ANNETTE , TIMME HANS-JOERG
Abstract: The acoustic mirror is essentially comprised of at least one first insulating layer (Il'), a first metal layer (M1') arranged thereon, a second insulating layer arranged thereon (I2') and a second metal layer (M2') arranged thereon. An auxiliary layer (H') is produced on the first insulating layer (I1') whereby a recess (V') extending as far as the first insulating layer (I1') is created therein. The first metal layer (M1') is substantially deposited and removed by chemical/mechanical polishing until the parts of the first metal layer (M1') arranged outside the recess (V') are no longer present. The second metal layer (M2') is also produced in a recess (V') with the aid of chemical/mechanical polishing. More than two insulating layers (I1', I2') and two metal layers (M1', M2') can be provided. The first metal layer (M1') and the second metal layer (M2') can be produced in the same recess (V').
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公开(公告)号:DE10234686B4
公开(公告)日:2008-09-11
申请号:DE10234686
申请日:2002-07-30
Applicant: INFINEON TECHNOLOGIES AG
Inventor: HANDTMANN MARTIN , TIMME HANS-JOERG , AIGNER ROBERT
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公开(公告)号:DE50212077D1
公开(公告)日:2008-05-21
申请号:DE50212077
申请日:2002-08-22
Applicant: INFINEON TECHNOLOGIES AG
Inventor: AIGNER ROBERT , MARKSTEINER STEPHAN , NESSLER WINFRIED
Abstract: A piezoelectric component comprises at least two stacked crystal filters on a substrate. Each stacked crystal filter comprises a bottom electrode, a first piezoelectric layer arranged above the bottom electrode, a central electrode arranged above the first piezoelectric layer, a second piezoelectric layer arranged above the central electrode, and a top electrode arranged above the second piezoelectric layer. The bottom electrodes are directly connected to one another and the central electrodes are directly connected to one another.
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公开(公告)号:AT383662T
公开(公告)日:2008-01-15
申请号:AT01967197
申请日:2001-07-17
Applicant: INFINEON TECHNOLOGIES AG
Inventor: AIGNER ROBERT , ELBRECHT LUEDER , HERZOG THOMAS , MARKSTEINER STEPHAN , NESSLER WINFRIED
IPC: H01L37/02 , H01L41/22 , H01L41/319 , H03H3/02
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