Abstract:
본 발명은 다중 스텝 구조의 ADC에 관한 것으로서, 다중 스텝에서 비교기로 입력되는 입력전압과 비교하기 위해 비교기로 입력되는 램프 신호가 다중 스텝별로 생성되어 비교기에 입력되는 것을 특징으로 하며, 스텝 구간마다 그 구간에 대응되는 기울기를 갖는 램프 신호를 사용함으로써, 스텝 확장을 상대적으로 자유롭게 하고, 2 스텝 이상의 스텝을 갖는 다중-스텝 ADC의 구현이 용이하다.
Abstract:
본 발명은 고정 패턴 노이즈를 제거하기 위한 ADC에 관한 것으로서, 입력 전압(V IN )과 시간에 따라 일정한 기울기를 갖고 증가하는 램프(Ramp) 입력을 비교하고, 비교 결과를 싱크 시프트 출력부로 출력하는 비교부; C-FPN 제거용 메모리로부터 입력받은 C-FPN 제거용 정보와 비교부의 비교 결과에 기초하여 싱크 신호를 시프트하는 싱크 시프트 블록부; n 비트의 디지털 카운터 출력값을 n 비트 메모리 또는 C-FPN 제거용 메모리에 출력하는 n 비트 카운터; n 비트 카운터의 디지털 카운터 출력값을 시프트된 싱크 신호를 이용하여 저장하는 n 비트 메모리; 및 기준전압에 대응하는 n 비트 카운터의 디지털 카운터 출력값을 싱크 시프트 블록부에 제공하는 C-FPN 제거용 메모리를 포함하고, 싱크 신호는 n 비트 카운터의 디지털 카운터 출력값을 결정하는데 사용되는 신호인 것을 특징으로 하며, 컬럼 ADC 간의 변환특성 차이를 해결함으로써, CIS에서의 C-FPN 특성을 제거할 수 있어 향상된 이미지를 구현할 수 있다.
Abstract:
본 발명은 다중 스텝 구조의 ADC에 관한 것으로서, 다중 스텝에서 비교기로 입력되는 입력전압과 비교하기 위해 비교기로 입력되는 램프 신호가 다중 스텝별로 생성되어 비교기에 입력되는 것을 특징으로 하며, 스텝 구간마다 그 구간에 대응되는 기울기를 갖는 램프 신호를 사용함으로써, 스텝 확장을 상대적으로 자유롭게 하고, 2 스텝 이상의 스텝을 갖는 다중-스텝 ADC의 구현이 용이하다.
Abstract:
PURPOSE: A time interleaved preprocessing amplifying device and a folding-interpolation analog-digital converting device using the same are provided to effectively resolve the problem of speed limit generated by multiple parallel preprocessing amplifying devices. CONSTITUTION: A time interleaved preprocessing amplifying device (210) comprises a sampling amplifying part, a preprocessing amplifying device, and a multiplexer (216). The sampling amplifying part comprises a first sampling amplifying device (211) and a second sampling amplifying device (212) and performs a sample and hold operation with a sampling frequency which is half of the sampling frequency of an analog-digital converting device. The first and second sampling amplifying devices perform a sample and hold operation having the 90 degree of a phase difference. The preprocessing amplifying part performs preprocessing amplification for a signal outputted from the sampling amplifying part. The multiplexer selects a resulting signal outputted from the preprocessing amplifying part. [Reference numerals] (212) Sampling (sample & hold) amplifying device; (214) Preprocessing amplifying device; (216) Multiplexer; (220) Folding amplifying device; (230) Interpolation; (240) Comparing device; (250) Encoder; (AA) Analogue input; (BB) Upper analogue output; (CC,DD) 1/2 sampling frequency; (EE) Lower analogue output; (FF) Sampling frequency; (GG) Digital output
Abstract:
PURPOSE: A nonlinear single slope AD converter, an image sensor device using the same, a temperature sensor device using the same and a nonlinear slope AD conversion method are provided to acquire reliable nonlinear characteristics by using a digital circuit. CONSTITUTION: A ramp generating part generates a ramp input having a set gradient. A comparator(110) compares an input voltage with the ramp input. A control block(120) transfers information about a comparison time point between the input voltage and the ramp input to a memory unit(140). The control block generates the signal saved in the memory unit or the signal for calling information. The nonlinear counter generates a signal with difference sampling frequencies from inputted clock signals.
Abstract:
PURPOSE: A method for correcting errors at digital outputs and a folding-interpolation analog to digital converter using the same are provided to eliminate detected errors by detecting errors at a digital output. CONSTITUTION: An error correction unit is composed of a lower code estimating unit(210) and an error estimating unit(220). The lower code estimating unit estimates which one of a maximum value or a minimum value of a lower binary code corrects the lower binary code of an analog signal by referring to a first bit of the lower binary code. The lower code estimating unit estimates the minimum value of the lower binary code using the lower binary code of the analog signal according to the first bit of the lower binary code.
Abstract:
PURPOSE: A source follower of a fully differential structure is provided to reduce mismatching on design by designing a source follower in a fully differential structure. CONSTITUTION: A first input voltage is applied to a gate of a first PMOS(P-channel Metal Oxide Semiconductor). A second input voltage is applied to a second PMOS. A first output voltage corresponding to the first input voltage is outputted to a node which is connected to a source of the first PMOS and a drain of a third PMOS. A second output voltage corresponding to the second input voltage is connected to the source of the first PMOS and the drain of a fourth PMOS. The source of the first PMOS is connected to the first output voltage terminal. The drain of the first PMOS is connected to the source of an eighth NMOS(N-channel Metal Oxide Semiconductor). The source of the second PMOS is connected to a second output voltage terminal. The drain of second PMOS is connected to the source of seven NMOS. The drain of the third PMOS is connected to the gate of a seven NMOS. The source of the third PMOS is connected to power.
Abstract:
PURPOSE: An ADC(Analog-to-Digital Converter) of multi-step structure using a plurality of lamp signals and an analog-to-digital conversion method thereof are provided to reduce the number of switches, thereby reducing an error of a holding voltage due to switching. CONSTITUTION: A comparator comprises: an OTA(Operational Transconductance Amplifier) which compares a signal of inputted light with a lamp value; capacitances which performs coarse analog-to-digital conversion and fine analog-to-digital conversion; and switches. A comparator is designed to respectively apply lamp signals in a coarse section and a fine section to two lamp generators without Vref voltage of an existed structure. The comparator is able to remove f-ADC and c-ADC switches.