Abstract:
본 발명은 외부 접촉 탭에 구멍이 형성된 인쇄 회로 기판에 관한 것으로서, 인쇄 회로 기판을 테스트 소켓에 삽입하여 테스트할 때 외부 접촉 탭과 소켓 리드 사이의 접촉 불량에 따른 문제를 해결하기 위한 것이다. 본 발명의 인쇄 회로 기판은 한쪽 가장자리에 일렬로 배열된 복수개의 외부 접촉 탭을 포함하며, 각각의 외부 접촉 탭은 원형의 접촉 구멍을 포함한다. 접촉 구멍은 소켓 리드와 원형 접촉을 이루므로 기존의 점 접촉에 비하여 접촉 면적이 증가하고 밀착성이 높아져 전기적 접촉성이 향상된다. 따라서, 재테스트 비율이 현저하게 줄어들며 생산 시간이 단축되는 효과가 있다.
Abstract:
PURPOSE: A data storage device and a manufacturing method thereof are provided to form a guide for guiding an insertion direction of a cable through a process which arranges an insulating material on a dummy tab, thereby inexpensively the data storage device without a separate connector. CONSTITUTION: A memory chip(120) is mounted on a PCB(Printed Circuit Board)(110). A connection tab(142) is formed on a first side of the PCB and connects the PCB to a cable. A dummy tab(144) is formed on a first side of the PCB. A guide(148) is formed on the dummy tab and guides an insertion direction of the cable. The cable includes an SATA(Serial Advanced Technology Attachment) cable. The connection tab is formed between a pair of guide members.
Abstract:
A printed circuit board and a semiconductor memory module using the same are provided to increase integration density of a memory device by enlarging an implementation space of the semiconductor memory module. A printed circuit board includes a rigid PCB(Printed Circuit Board) portion(110) and an FPCB portion(130). The rigid PCB portion has first and second surfaces. The second surface is opposed to the first surface. The FPCB(Flexible Printed Circuit Board) portion has an overlap portion and a non-overlap portion. The overlap portion is overlapped with the rigid PCB portion, while the non-overlap portion is not overlapped with the rigid PCB portion. The FPCB portion has a lamination structure having at least one hemispheric curved portion.
Abstract:
신뢰성을 개선할 수 있는 반도체 장치 및 그 제조방법에 관해 개시한다. 이를 위해 본 발명에 의한 반도체 장치는 모듈용 인쇄회로기판의 패드 표면에 OSP(Organic Solderability Preservative) 처리를 하고, 관통홀 측벽에는 니켈 및 금 도금층을 형성한다. 따라서 온도변화에 따른 신뢰성 검사(temperature cycle)에서 관통홀 내부에서 발생하는 크랙(crack)과 같은 결함을 억제할 수 있다. 신뢰성 검사, 인쇄회로기판, 관통홀, OSP.
Abstract:
반도체저항요소를제공할수 있다. 이를위해서, 절연기판이준비될수 있다. 상기절연기판상에저항패턴들을형성할수 있다. 상기저항패턴들은서로에대해서직각을이루는평면들상에배치될수 있다. 상기저항패턴들상에전극들이배치될수 있다. 상기전극들의일 단들은저항패턴들과전기적으로접속할수 있다. 상기전극들의타 단들은선택된평면상에위치할수 있다. 상기반도체저항요소는반도체모듈상에배치될수 있다. 상기반도체모듈은프로세서베이스드시스템(Processor-based system)에배치될수 있다.
Abstract:
A printed circuit board for surface mount and a method for forming the same are provided to increase a degree of integration by arranging a part or the whole of a passive element to be covered with a semiconductor package. A printed circuit board for surface mount includes a passive element(150) and a semiconductor package(160). The passive element is buried in a printed circuit board(110) and is protruded from an upper part of the printed circuit board. The semiconductor package is mounted on an upper part of the printed circuit board. A part or an entire part of the passive element is overlapped with the semiconductor package. The semiconductor package is mounted on the printed circuit board by solder balls(165). The passive element is buried in a non-penetrating hole(120) of the printed circuit board.
Abstract:
A semiconductor apparatus with an improved reliability and a method for manufacturing the same are provided to suppress a crack in a temperature cycle according to a temperature variation by treating a pad surface of a printed circuit board with an OSP process and forming a nickel and gold plating layer on a lateral side of a through hole. In a semiconductor apparatus with an enhanced reliability, a printed circuit board(142) includes a pad formed on a surface of an insulation material and a through hole(150) penetrating the insulation material up and down. A surface of the pad of the printed circuit board(142) is treated with an OSP(Organic Solderability Preservative) process and a lateral side of the through hole(150) is treated with a gold plating. A semiconductor element is mounted on an upper side of the printed circuit board(142) though the pad.
Abstract:
A printed circuit board and a semiconductor memory module using the same are provided to effectively radiate heat from the semiconductor memory module to the outside by applying a PCB(Printed Circuit Board) with a metal core on the semiconductor memory module. A printed circuit board includes a board unit(110) and a metal core(130). The board unit includes first and second surfaces, which are opposed to each other. The metal core includes an insertion portion(130i) and an elongation portion(130e). The insertion portion is inserted into an inner portion of the board unit. The elongation portion is elongated from at least one side portion of the board unit. The elongation portions of a pair of metal cores are elongated from both sides of the board unit, respectively. The metal core contains a thermally conductive material, which is selected from the group consisting of aluminum, copper, silver, and gold.
Abstract:
A method of manufacturing a capacitor for a semiconductor device and a capacitor using the same are provided to improve contact between molten solder and external electrodes by forming OSP(Organic Solderability Preservation) coating films on copper electrodes of a laminate of dielectric sheets. A method of manufacturing a capacitor for a semiconductor device includes the steps of: forming a laminate of a plurality of dielectric sheets on which internal electrodes are printed(S20); forming external electrodes on side surfaces of the laminate to be electrically connected to the internal electrodes(S40); and forming OSP coating films on the external electrodes to prevent oxidation of the external electrodes(S50). The external electrode contains copper, and the OSP coating film contains alkylbenzimidazole.
Abstract:
A semiconductor memory module with a chip resistor reversely mounted is provided to prevent electrical open defect due to the damage of a resistance by protecting a resistance element. A chip resistor(20) comprises an insulating substrate(22), a resistance element part on the insulating substrate, and a metal electrode(26). The metal electrode is electrically connected to the resistor part and arranged on the insulating substrate. A connecting pad(12a) of the chip resistor is formed higher than another connecting pad of a module substrate so that the resistance part of the chip resistor is not touched to the module substrate. An insulating dam is arranged between the connecting pads of the chip resistor on the module substrate to prevent a short. The resistance element part of the chip resistor includes a thin film resistance on the insulating substrate and a protective layer on the thin film resistance.