Abstract:
A method and structure for an integrated circuit structure that utilizes complementary fin-type field effect transistors (FinFETs) is disclosed. The invention has a first-type of FinFET which includes a first fin (100), and a second-type of FinFET which includes a second fin (102) running parallel to the first fin (100). The invention also has an insulator fin positioned between the source/drain regions (130) of the first first-type of FinFET and the second-type of FinFET. The insulator fin has approximately the same width dimensions as the first fin (100) and the second fin (102), such that the spacing between the first-type of FinFET and the second-type of FinFET is approximately equal to the width of one fin. The invention also has a common gate (106) formed over channel regions of the first-type of FinFET and the second-type of FinFET. The gate (106) includes a first impurity doping region adjacent the first-type of FinFET and a second impurity doping region adjacent the second-type of FinFET. The differences between the first impurity doping region and the second impurity doping region provide the gate with different work functions related to differences between the first-type of FinFET and the second-type of FinFET. The first fin (100) and the second fin (102) have approximately the same width.
Abstract:
PROBLEM TO BE SOLVED: To provide a pixel sensor cell enhanced in dynamic range ability. SOLUTION: The pixel sensor cell including a column circuit, a design structure for fabricating the pixel sensor cell including the column circuit and a method for operating the pixel sensor cell including the column circuit are predicated upon the measurement of multiple reference data point and signal data point pairs from a floating diffusion at a variable capacitance. The variable capacitance is provided by excluding or including a transfer gate transistor capacitance in addition to a floating diffusion capacitance. Such a variable capacitance provides variable dynamic ranges for the pixel sensor cell including the column circuit. COPYRIGHT: (C)2011,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide an isolation structure used to isolate a pixel sensor device including a selectively doped sidewall. SOLUTION: A new pixel sensor structure formed on a first conductive-type substrate includes a second conductive-type photosensitive device and a first conductive-type surface pinning layer 180a. The isolation structure 101a is formed adjacent to a photosensitive device pinning layer. The isolation structure includes a dopant region containing a first conductive-type material selectively formed along sidewalls 105a, 105b of the isolation structure where the surface pinning layer is adapted so as to electrically connected to a substrate 150 located beneath. A suitable method for forming the dopant region selectively formed along the sidewall of the isolation structure includes an externally diffusing process that the dopant material present in a material layer formed and doped along a selected portion of the isolation structure is driven into the substrate located beneath during annealing. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide CMOS image sensor pixel sensor cells, methods for fabricating the pixel sensor cells, and design structures for fabricating the pixel sensor cells. SOLUTION: The CMOS image sensor cells are designed to allow for back side illumination in global shutter mode by providing light shielding from back side illumination of at least one transistor within each pixel sensor cell. In a first particular generalized embodiment, a light blocking layer is located and formed interposed between a first semiconductor layer including a photoactive region and a second semiconductor layer including at least a second transistor or a floating diffusion region shielded by the light blocking layer. In a second generalized embodiment, a thin film transistor and a metal-insulator-metal capacitor are used in place of the floating diffusion region, and are arranged, shielded in a dielectric-isolated metallization stack over a carrier substrate. COPYRIGHT: (C)2010,JPO&INPIT
Abstract:
PROBLEM TO BE SOLVED: To provide a pixel array in an image sensor, the image sensor and a digital camera including the image sensor. SOLUTION: The image sensor includes a pixel array with colored pixels and unfiltered (color filter-free) pixels. Each unfiltered pixel occupies one or a plurality of array locations. The colored pixels may be arranged in uninterrupted rows and columns with unfiltered pixels disposed between the uninterrupted rows and columns. The image sensor may be of a CMOS type with the unfiltered pixels reducing low-light noise and improving low-light sensitivity. COPYRIGHT: (C)2007,JPO&INPIT
Abstract:
An image sensor (20) and method of fabrication wherein the sensor includes Copper (Cu) metallization levels (135a, 135b) allowing for incorporation of a thinner interlevel dielectric stack (130a-130c) to result in a pixel array (100) exhibiting increased light sensitivity. The image sensor includes structures having a minimum thickness of barrier layer metal (132a, 132b) that traverses the optical path of each pixel in the sensor array or, that have portions (50) of barrier layer metal selectively removed from the optical paths of each pixel, thereby minimizing reflectance. That is, by implementing various block or single mask methodologies, portions of the barrier layer metal are completely removed at locations of the optical path for each pixel in the array. In a further embodiment, the barrier metal layer (142) may be formed atop the Cu metallization by a self-aligned deposition.
Abstract:
A silicon device 100 includes an active silicon layer 106, a buried oxide (BOX) layer 104 beneath the active silicon layer 106 and a high-resistivity silicon layer 102 beneath the BOX layer. The device also includes a harmonic suppression layer 110 at a boundary of the BOX layer 104 and the high-resistivity silicon layer 102.
Abstract:
Disclosed herein are embodiments of an interface device (100, 200) (e.g., a display, touchpad, touchscreen display, etc.) with integrated power collection functions. In one embodiment, a solar cell (110, 210) or solar cell array can be located within a substrate (10) at a first surface (11) and an array (120, 220) of interface elements can also be located within the substrate (10) at the first surface (11) such that portions of the solar cell(s) (110, 210) laterally surround the individual interface elements (121, 221) or groups thereof. In another embodiment, a solar cell (110, 210) or solar cell array (120, 220) can be located within the substrate (10) at a first surface (11) and an array of interface elements (120, 220) can be located within the substrate (10) at a second surface (12) opposite the first surface (11) (i.e., opposite the solar cell or solar cell array). In yet another embodiment, an array of diodes, which can function as either solar cells (110, 210) or sensing elements, can be within a substrate (10) at a first surface (11) and can be wired to allow for selective operation in either a power collection mode or sensing mode.