Abstract:
A memory device having a reading configuration and including a plurality of memory cells (3), arranged in rows and columns, memory cells (3) arranged on the same column having respective first terminals (3a) connected to a same bit line (12) and memory cells (3) arranged on the same row having respective second terminals (3b) selectively connectable to a same word line (13); a supply line (9) providing a supply voltage (V DD ); a column addressing circuit (4) and a row addressing circuit (5) for respectively addressing a bit line (12) and a word line (13) corresponding to a memory cell (3) selected for reading in the reading configuration. The column addressing circuit (4) is configured to bias the addressed bit line (12) corresponding to the selected memory cell (3) substantially at the supply voltage (V DD ) in the reading configuration. A row driving circuit (6) biases the addressed word line (13) corresponding to the selected memory cell (3) at a non-zero word line read voltage (V WL ), so that a predetermined cell voltage (V CELL ), lower than a phase change voltage (V PHC ), is applied between the first terminal (3a) and the second terminal (3b) of the selected memory cell (3) in the reading configuration.
Abstract:
A memory device includes a plurality of memory cells (3), arranged in row and columns, memory cells (3) arranged on the same column having respective first terminals (3a) connected to a same bit line (12) and memory cells (3) arranged on the same row having respective second terminals (3b) selectively connectable to a same word line (13); a supply line (9) providing a supply voltage (V A ); a column addressing circuit (4) for addressing a bit line (12) corresponding to a memory cell (3) to be read; and a row addressing circuit (5) for addressing a word line (13) corresponding to the memory cell (3) to be read. Moreover, the column addressing circuit (4) is configured to bias the addressed bit line (12) corresponding to the memory cell (3) to be read substantially at the supply voltage (V A ).
Abstract:
A voltage regulating circuit for a capacitive load, being connected between first and second terminals of a supply voltage generator (VDD,GND) and having an input terminal (IN) and an output terminal (OUT), comprises an operational amplifier (OP) having an inverting (-) input terminal connected to the input terminal (IN) of the regulating circuit and a non-inverting (+) input terminal connected to an intermediate node of a voltage divider (R1,R2) which is connected between an output node connected to the output terminal (OUT) of the regulating circuit and the second terminal (GND) of the supply voltage generator, and having an output terminal connected, for driving a first field-effect transistor (MPU), between the output node and the first terminal (VDD) of the supply voltage generator, the output terminal of the operational amplifier being further connected to the output node through a compensation network (COMP), and comprises a second field-effect transistor (MPD1) connected between the output node and the second terminal of the supply voltage generator (GND) and having its gate terminal connected to a constant voltage generating circuit means (RB,CB,MB,IB).
Abstract:
The invention relates to a driving circuit for row decoding which is also useful in non-volatile memory devices of the multi-level Flash type and allows the overall capacitive load, as seen from the program voltage generator and the read/verify voltage generator, to be drastically reduced without involving segmentation of the decoding.