Apparatus, system, and method for laser-induced breakdown spectroscopy
    91.
    发明授权
    Apparatus, system, and method for laser-induced breakdown spectroscopy 有权
    用于激光诱发击穿光谱的装置,系统和方法

    公开(公告)号:US08891073B2

    公开(公告)日:2014-11-18

    申请号:US13183228

    申请日:2011-07-14

    CPC classification number: G01J3/18 G01J3/26 G01J3/443 G01N21/718

    Abstract: In laser-induced breakdown spectroscopy (LIBS), an apparatus includes a pulsed laser configured to generate a pulsed laser signal toward a sample, a constructive interference object and an optical element, each located in a path of light from the sample. The constructive interference object is configured to generate constructive interference patterns of the light. The optical element is configured to disperse the light. A LIBS system includes a first and a second optical element, and a data acquisition module. The data acquisition module is configured to determine an isotope measurement based, at least in part, on light received by an image sensor from the first and second optical elements. A method for performing LIBS includes generating a pulsed laser on a sample to generate light from a plasma, generating constructive interference patterns of the light, and dispersing the light into a plurality of wavelengths.

    Abstract translation: 在激光诱发击穿光谱(LIBS)中,一种装置包括脉冲激光器,其经配置以产​​生朝向样品的脉冲激光信号,构造干涉物体和光学元件,每个位于来自样品的光的路径中。 构造性干扰对象被配置为产生光的建设性干涉图案。 光学元件构造成分散光。 LIBS系统包括第一和第二光学元件,以及数据采集模块。 数据采集​​模块被配置为至少部分地基于图像传感器从第一和第二光学元件接收的光来确定同位素测量。 用于执行LIBS的方法包括在样本上产生脉冲激光以产生来自等离子体的光,产生光的建设性干涉图案,以及将光分散成多个波长。

    METHOD FOR MEASURING REFRACTIVE INDEX, AND REFRACTOMETER
    92.
    发明申请
    METHOD FOR MEASURING REFRACTIVE INDEX, AND REFRACTOMETER 有权
    测量折射指数的方法和压力计

    公开(公告)号:US20140268115A1

    公开(公告)日:2014-09-18

    申请号:US14162083

    申请日:2014-01-23

    Applicant: Janesko Oy

    Inventor: Ville VOIPIO

    Abstract: An exemplary method for measuring a refractive index of a substance being measured through an optical window, includes arranging the optical window in contact with the substance being measured, directing light to the interface of the optical window and substance being measured, where part of the light is absorbed by the substance being measured and part of it is reflected from the substance being measured to form an image, in which the location of the boundary of light and dark areas expresses a critical angle of the total reflection dependent on the refractive index of the substance being measured, and examining the formed image. Light is directed on a first structure and to desired angles on an interface between the optical window and substance being measured. Light reflected from the interface of the optical window and substance being measured is directed on a second structure.

    Abstract translation: 用于测量通过光学窗口测量的物质的折射率的示例性方法包括将光学窗口与待测量的物质接触,将光引导到所述光学窗口和所测量的物质的界面,其中部分光 被被测量的物质吸收,并且其一部分被被测量的物质反射以形成图像,其中光和黑色区域的边界的位置表示全反射的临界角,其取决于折射率 测量物质,并检查形成的图像。 光被引导在第一结构上,并且在光学窗口和被测量的物质之间的界面上被指向所需的角度。 从光学窗口的接口反射的光和被测量的物质指向第二结构。

    HIGH EFFICIENCY MONO-ORDER CONCAVE DIFFRACTION GRATING
    93.
    发明申请
    HIGH EFFICIENCY MONO-ORDER CONCAVE DIFFRACTION GRATING 有权
    高效单声道折射衍射

    公开(公告)号:US20140233891A1

    公开(公告)日:2014-08-21

    申请号:US14350140

    申请日:2012-10-05

    Abstract: A concave diffraction grating for integrated optics is constructed by replacing the reflective metallic part by either multiple thin elements of metal or multiple elements of dielectric material, each partially reflecting the light, and arranged on elliptical fashion in order to distribute the diffraction/reflection of light and provide aberration-free focusing, by combining diffraction condition and Bragg condition of these curved reflectors.

    Abstract translation: 用于集成光学器件的凹面衍射光栅通过用金属或多个介电材料元件的多个薄元件代替反射金属部件来构造,每个元件均部分地反射光,并以椭圆形方式布置,以分布光的衍射/反射 并通过组合这些弯曲反射器的衍射条件和布拉格条件,提供无像差聚焦。

    Spectrometer, Assembling Method Thereof, And Assembling System
    97.
    发明申请
    Spectrometer, Assembling Method Thereof, And Assembling System 有权
    光谱仪,组装方法及组装系统

    公开(公告)号:US20140139833A1

    公开(公告)日:2014-05-22

    申请号:US13747216

    申请日:2013-01-22

    Abstract: A spectrometer comprising a waveguide module, a diffractive component, and a light sensor is provided. The waveguide module has a first reflective surface, a second reflective surface opposite to the first reflective surface, and a light channel between the first reflective surface and the second reflective surface. The diffractive component has a diffractive surface and a plurality of strip-shaped diffractive structures located on the diffractive surface. The sharpness of the profile of the strip-shaped diffractive structures on a first side of the diffractive surface is greater than that on a second side of the diffractive surface. When viewed along a direction perpendicular to the second reflective surface, the first side of the diffractive surface is positioned between the first reflective surface and the second reflective surface with a distance away from the second reflective surface. A method for assembling the spectrometer and an assembling system are also provided.

    Abstract translation: 提供了包括波导模块,衍射元件和光传感器的光谱仪。 波导模块具有第一反射表面,与第一反射表面相对的第二反射表面,以及在第一反射表面和第二反射表面之间的光通道。 衍射部件具有衍射面和位于衍射面上的多个条状衍射结构。 衍射表面的第一面上的带状衍射结构的轮廓的锐度大于衍射表面的第二侧的锐度。 当沿着垂直于第二反射表面的方向观察时,衍射表面的第一侧位于第一反射表面和第二反射表面之间,距离第二反射表面一定距离。 还提供了一种用于组装光谱仪和组装系统的方法。

    Phase Grating For Mask Inspection System
    98.
    发明申请
    Phase Grating For Mask Inspection System 有权
    相位光栅面罩检测系统

    公开(公告)号:US20140131586A1

    公开(公告)日:2014-05-15

    申请号:US13786049

    申请日:2013-03-05

    Abstract: Spectral Purity Filters, or SPFs, are disclosed. Such SPFs are designed to block out the 1030 nm drive laser and other undesired out of band light in a EUV mask inspection system. Different phase grating configurations for near normal incidence and grazing incidence are provided in the present disclosure and are configured specifically for EUV mask inspection.

    Abstract translation: 公开了光谱纯化过滤器或SPF。 这样的SPF被设计为在EUV掩模检查系统中阻挡1030nm驱动激光器和其它不期望的带外光。 在本公开内容中提供了用于近似法向入射和掠入射的不同相位光栅配置,并且被专门用于EUV掩模检查。

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