METHODS FOR DETECTING THE PRESENCE OF MICROBES
    103.
    发明申请
    METHODS FOR DETECTING THE PRESENCE OF MICROBES 审中-公开
    检测MICROBES存在的方法

    公开(公告)号:US20160138071A1

    公开(公告)日:2016-05-19

    申请号:US14898374

    申请日:2014-06-16

    Abstract: A method and instrument for detecting the presence or absence of a target organism in a test sample is provided. The instrument includes a carousel, a light source, alight detector, and a control system. The carousel is configured to hold a plurality of test sample containers, with each container held by the carousel at a container position. Each of the containers holds an admixture of a test mixture inoculated with the test sample. The light detector is operable to detect light emitted by the light source that has passed through the test sample disposed within the test container. The control system includes a processor. The control system is adapted to produce information indicative of the presence or absence of the target organism in the test sample using signals produced by the light detector.

    Abstract translation: 提供了用于检测测试样品中目标生物体存在或不存在的方法和仪器。 该仪器包括转盘,光源,检测器和控制系统。 转盘被构造成容纳多个测试样本容器,每个容器由转盘保持在容器位置。 每个容器保持接种测试样品的测试混合物的混合物。 光检测器可操作以检测已经通过设置在测试容器内的测试样品的光源发射的光。 控制系统包括处理器。 控制系统适于使用由光检测器产生的信号产生指示测试样品中目标生物体存在或不存在的信息。

    Fluid Analyzer Using Absorption Spectroscopy
    105.
    发明申请
    Fluid Analyzer Using Absorption Spectroscopy 有权
    流体分析仪使用吸收光谱

    公开(公告)号:US20160124112A1

    公开(公告)日:2016-05-05

    申请号:US14886092

    申请日:2015-10-19

    CPC classification number: G01V8/12 E21B49/10 G01N21/3103 G01N2201/061

    Abstract: A technique facilitates formation evaluation with downhole devices which may include fluid analyzers having atomic absorption spectroscopy (AAS) systems. According to an embodiment, a fluid analyzer of a downhole tool may be positioned in a wellbore penetrating a subterranean formation. The downhole tool comprises a downhole flowline for receiving a sample fluid. Additionally, the fluid analyzer comprises a flowline positioned to receive the sample fluid for analysis by the atomic absorption spectroscopy system. The atomic absorption spectroscopy system has a light source to generate light and to excite atoms of a substance in the sample fluid. The atomic absorption spectroscopy system also comprises a detector to measure how much light has been absorbed by the substance, thus enabling the atomic absorption spectroscopy analysis.

    Abstract translation: 一种技术有利于井下装置的地层评估,其中可能包括具有原子吸收光谱(AAS)系统的流体分析仪。 根据实施例,井下工具的流体分析器可以定位在穿透地下地层的井眼中。 井下工具包括用于接收样品流体的井下流线。 此外,流体分析器包括流线,其定位成接收用于由原子吸收光谱系统分析的样品流体。 原子吸收光谱系统具有产生光并激发样品流体中物质的原子的光源。 原子吸收光谱系统还包括用于测量物质吸收了多少光的检测器,从而能够进行原子吸收光谱分析。

    METHOD OF AND APPARATUS FOR CORRECTING FOR INTENSITY DEVIATIONS IN A SPECTROMETER
    106.
    发明申请
    METHOD OF AND APPARATUS FOR CORRECTING FOR INTENSITY DEVIATIONS IN A SPECTROMETER 有权
    用于校正光谱仪中强度偏差的方法和装置

    公开(公告)号:US20160123870A1

    公开(公告)日:2016-05-05

    申请号:US14895946

    申请日:2013-06-04

    Abstract: A method of determining a pathlength deviation of a sample (610), the method comprising: exposing the sample (610) to electromagnetic radiation at a plurality of wavenumbers, determining electromagnetic absorption in the sample (610) at the plurality of wavenumbers, determining a first wavenumber associated with a first absorption level of an absorption band and a second wavenumber associated with a second absorption level of the absorption band, wherein the second wavenumber is different from the first wavenumber, determining a difference between the first wavenumber and the second wavenumber, and determining the pathlength deviation based on the difference.

    Abstract translation: 一种确定样品(610)的路径长度偏差的方法,所述方法包括:将样品(610)暴露于多个波数处的电磁辐射,确定多个波数处的样品(610)中的电磁吸收,确定 第一波数与吸收带的第一吸收水平和与吸收带的第二吸收水平相关联的第二波数相关联,其中第二波数不同于第一波数,确定第一波数和第二波数之间的差, 以及基于所述差异确定所述路径长度偏差。

    FABRY-PEROT SPECTRAL IMAGE MEASUREMENT
    107.
    发明申请
    FABRY-PEROT SPECTRAL IMAGE MEASUREMENT 有权
    FABRY-PEROT光谱图像测量

    公开(公告)号:US20160123809A1

    公开(公告)日:2016-05-05

    申请号:US14581935

    申请日:2014-12-23

    Abstract: A system for wide-range spectral measurement includes one or more broadband sources, an adjustable Fabry-Perot etalon, and a detector. The one or more broadband sources is to illuminate a sample, wherein the one or more broadband sources have a short broadband source coherence length. The adjustable Fabry-Perot etalon is to optically process the reflected light to extract spectral information with fine spectral resolution. The detector is to detect reflected light from the sample, wherein the reflected light is comprised of multiple narrow-band subsets of the illumination light having long coherence lengths and is optically processed using a plurality of settings for the adjustable Fabry-Perot etalon, and wherein the plurality of settings includes a separation of the Fabry-Perot etalon plates that is greater than the broadband source coherence length but that is less than the long coherence lengths.

    Abstract translation: 用于宽范围光谱测量的系统包括一个或多个宽带源,可调节的法布里 - 珀罗标准具和检测器。 一个或多个宽带源是照亮样本,其中一个或多个宽带源具有短的宽带源相干长度。 可调节的法布里 - 珀罗标准具是光学处理反射光以提取具有精细光谱分辨率的光谱信息。 检测器用于检测来自样品的反射光,其中反射光由具有长相干长度的照明光的多个窄带子集构成,并且使用可调节法布里 - 珀罗标准具的多个设置进行光学处理,其中 多个设置包括法布里 - 珀罗标准具板的分离,其大于宽带源相干长度,但小于长相干长度。

    Solar cell inspection apparatus and solar cell processing apparatus
    108.
    发明授权
    Solar cell inspection apparatus and solar cell processing apparatus 有权
    太阳能电池检查装置和太阳能电池处理装置

    公开(公告)号:US09322786B2

    公开(公告)日:2016-04-26

    申请号:US14377725

    申请日:2012-02-10

    Applicant: Yoshio Takami

    Inventor: Yoshio Takami

    Abstract: An inspection apparatus 1 for solar cells 100 includes: a visible light source 11 adapted to irradiate visible light; a CCD camera 15 adapted to measure a reflection image based on the visible light reflected by an antireflective film of a solar cell 100; an infrared light source 13 adapted to irradiate the solar cell 100 with infrared light; and a CCD camera 16 adapted to measure a transmission image based on the infrared light transmitting through the solar cell 100. In the inspection apparatus 1, as a result of comparing the reflection image and the transmission image with each other, of areas respectively appearing as bright spots in the reflection image, an area appearing as a dark spot in the transmission image is determined as an area including a particle, whereas of the areas respectively appearing as the bright spots in the reflection image, an area other than the area determined as the area including the particle is determined as an area including a pinhole.

    Abstract translation: 太阳能电池100的检查装置1包括:适于照射可见光的可见光源11; 适于基于由太阳能电池100的抗反射膜反射的可见光测量反射图像的CCD照相机15; 适于用太阳能电池100照射红外光的红外光源13; 以及适于基于通过太阳能电池100透射的红外光来测量透射图像的CCD照相机16.在检查装置1中,作为将反射图像和透射图像彼此进行比较的结果,分别表现为 反射图像中的亮点,作为透射图像中的暗点的区域被确定为包括粒子的区域,而在反射图像中分别出现为亮点的区域,除了被确定为 将包括粒子的区域确定为包括针孔的区域。

    Shape measuring apparatus, and method of manufacturing article
    110.
    发明授权
    Shape measuring apparatus, and method of manufacturing article 有权
    形状测量装置及其制造方法

    公开(公告)号:US09297745B2

    公开(公告)日:2016-03-29

    申请号:US14534619

    申请日:2014-11-06

    Abstract: The present invention provides a measuring apparatus which measures a shape of an object to be measured, comprising an emitting unit configured to emit pattern light, an optical system configured to irradiate the object with the pattern light emitted from the emitting unit, a deflection unit configured to deflect light emitted from the optical system, an image sensing unit configured to sense an image of the object irradiated with the pattern light, and a processing unit configured to determine the shape of the object based on the image of the object sensed by the image sensing unit, wherein the deflection unit includes a deflection element, wherein the measuring apparatus irradiates the object with light deflected by the deflection element, and a direction deflected by the deflection element differs depending on a polarization state of incident light in the deflection element.

    Abstract translation: 本发明提供了一种测量被测物体的形状的测量装置,包括被配置为发射图案光的发射单元,被配置为用从所述发射单元发射的图案光照射所述物体的光学系统,所述偏转单元配置 以偏转从光学系统发射的光;图像感测单元,被配置为感测用图案光照射的物体的图像;以及处理单元,被配置为基于由图像感测的物体的图像来确定物体的形状 感测单元,其中所述偏转单元包括偏转元件,其中所述测量设备用由所述偏转元件偏转的光照射所述物体,并且所述偏转元件偏转的方向根据所述偏转元件中的入射光的偏振状态而不同。

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