公开(公告)号：US09548184B2

公开(公告)日：2017-01-17

申请号：US11575153

申请日：2005-09-12

Applicant: Jan Fredrik Creemer ,  Hendrik Willem Zandbergen ,  Pasqualina Maria Sarro

Inventor： Jan Fredrik Creemer ,  Hendrik Willem Zandbergen ,  Pasqualina Maria Sarro

IPC: H01J37/26 ,  H01J37/20

CPC classification number: H01J37/26 ,  H01J37/20 ,  H01J2237/2002 ,  H01J2237/206

Abstract: A microreactor for use in a microscope, comprising a first and second cove layer (13), which cover layers are both at least partly transparent to an electron beam (14) of an electron microscope, and extend next to each other at a mutual distance from each other and between which a chamber (15) is enclosed, wherein an inlet (4) and an outlet (5) are provided for feeding fluid through the chamber and wherein heating means (8) are provided for heating the chamber and/or elements present therein.

Abstract translation: 一种在显微镜中使用的微反应器，包括第一和第二平面层（13），其覆盖层对于电子显微镜的电子束（14）至少部分透明，并且彼此相距延伸 彼此之间并且其中封闭有腔室（15），其中提供入口（4）和出口（5），用于将流体输送通过所述腔室，并且其中提供加热装置（8）用于加热腔室和/或 其中存在的元素。

公开(公告)号：US20160351374A1

公开(公告)日：2016-12-01

申请号：US15233176

申请日：2016-08-10

Applicant: University of Washington

Inventor： Liguo Wang

IPC: H01J37/16 ,  C23F4/00 ,  C23F1/40 ,  H01J37/26

CPC classification number: H01J37/16 ,  C23F1/40 ,  C23F4/00 ,  H01J37/20 ,  H01J37/26 ,  H01J37/261 ,  H01J2237/2001 ,  H01J2237/2002 ,  H01J2237/2003 ,  H01J2237/2004

Abstract: A grid assembly for cryo-electron microscopy may be fabricated using standard nanofabrication processes. The grid assembly may comprise two support members, each support member comprising a silicon substrate coated with an electron-transparent silicon nitride layer. These two support members are positioned together with the silicon nitride layers facing each other with a rigid spacer layer disposed therebetween. The rigid spacer layer defines one or more chambers in which a biological sample may be provided and fast frozen with a high degree of control of the ice thickness.

Abstract translation: 用于低温电子显微镜的栅格组件可以使用标准的纳米制造工艺制造。 栅格组件可以包括两个支撑构件，每个支撑构件包括涂覆有电子透明氮化硅层的硅衬底。 这两个支撑构件与氮化硅层一起定位，其间设置有刚性间隔层。 刚性间隔层限定一个或多个室，其中可以提供生物样品并以高度控制冰厚度快速冷冻。

公开(公告)号：US09499939B2

公开(公告)日：2016-11-22

申请号：US15136343

申请日：2016-04-22

Applicant: XYLECO, INC.

Inventor： Marshall Medoff ,  Thomas Craig Masterman ,  Robert Paradis

IPC: A61L2/08 ,  D21B1/02 ,  C10L5/44 ,  C10G32/04 ,  C10B53/02 ,  C10G1/02 ,  C10B19/00 ,  G21F3/00 ,  B01J19/08 ,  B01J19/12 ,  B01J19/22 ,  H01J37/317 ,  H01J37/20

CPC classification number: G21F3/00 ,  A61L2/087 ,  B01J19/082 ,  B01J19/085 ,  B01J19/12 ,  B01J19/123 ,  B01J19/125 ,  B01J19/22 ,  B01J2219/0869 ,  B01J2219/0871 ,  B01J2219/0879 ,  B01J2219/12 ,  B01J2219/1203 ,  B65G27/04 ,  C08H8/00 ,  C10B19/00 ,  C10B53/02 ,  C10G1/02 ,  C10G32/04 ,  C10L5/403 ,  C10L5/442 ,  C10L5/445 ,  C10L5/46 ,  C10L2200/0469 ,  C10L2290/24 ,  C10L2290/28 ,  C10L2290/36 ,  C10L2290/52 ,  C13K1/02 ,  C13K13/002 ,  D21B1/02 ,  G21K5/04 ,  G21K5/10 ,  H01J5/18 ,  H01J33/04 ,  H01J37/20 ,  H01J37/317 ,  H01J2237/2002 ,  H01J2237/202 ,  Y02E50/10 ,  Y02E50/14 ,  Y02E50/16 ,  Y02E50/30 ,  Y02E50/32 ,  Y02P20/145

Abstract: Biomass (e.g., plant biomass, animal biomass, and municipal waste biomass) is processed to produce useful intermediates and products, such as energy, fuels, foods or materials. For example, systems and methods are described that can be used to treat feedstock materials, such as cellulosic and/or lignocellulosic materials, in a vault in which the equipment is protected from radiation and hazardous gases by equipment enclosures. The equipment enclosures may be purged with gas.

Abstract translation: 加工生物质（例如，植物生物质，动物生物质和城市废物生物质）以产生有用的中间体和产品，例如能量，燃料，食品或材料。 例如，描述了可用于处理储存库中的原料（例如纤维素和/或木质纤维素材料）的系统和方法，其中设备通过设备外壳防止辐射和有害气体。 设备外壳可能会被气体吹扫。

公开(公告)号：US09449784B2

公开(公告)日：2016-09-20

申请号：US14520754

申请日：2014-10-22

Applicant: JEOL Ltd.

Inventor： Tatsuo Naruse

IPC: H01J37/00 ,  H01J37/20 ,  H01J37/18 ,  H01J37/26

CPC classification number: H01J37/20 ,  H01J37/18 ,  H01J37/261 ,  H01J2237/002 ,  H01J2237/2002 ,  H01J2237/26 ,  H01J2237/2602

Abstract: A charged particle beam instrument is offered which can introduce cooled samples easily into a sample chamber. The charged particle beam instrument (100) of the present invention has: a sample container (10) that accommodates samples (S) and a refrigerant (6) for cooling the samples (S); an evacuated sample chamber (20); a sample exchange chamber (30) connected with the sample chamber (20); a partition valve (40) disposed between the sample exchange chamber (30) and the sample container (10); and vacuum pumping equipment (50) for evacuating the sample container (10). The sample container (10) can be connected with the sample exchange chamber (30) via the partition valve (40). The sample container (10) is evacuated by the vacuum pumping equipment (50) while the partition valve (40) is closed.

Abstract translation: 提供带电粒子束仪器，可以将冷却的样品容易地引入样品室。 本发明的带电粒子束仪器（100）具有容纳样品（S）的样品容器（10）和用于冷却样品（S）的制冷剂（6）。 抽真空的样品室（20）; 与样品室（20）连接的样品更换室（30）; 设置在样品更换室（30）和样品容器（10）之间的分隔阀（40）; 以及用于抽空样品容器（10）的真空抽吸设备（50）。 样品容器（10）可以通过分隔阀（40）与样品更换室（30）连接。 当分隔阀（40）关闭时，样品容器（10）被真空泵送设备（50）抽真空。

公开(公告)号：US09418818B2

公开(公告)日：2016-08-16

申请号：US14422552

申请日：2013-06-28

Applicant: Hitachi High-Technologies Corporation

Inventor： Yusuke Ominami ,  Sukehiro Ito

IPC: H01J37/00 ,  H01J37/16 ,  H01J37/18 ,  H01J37/20 ,  H01J37/244 ,  H01J37/28 ,  H01J37/26

CPC classification number: H01J37/16 ,  H01J37/00 ,  H01J37/18 ,  H01J37/20 ,  H01J37/244 ,  H01J37/26 ,  H01J37/28 ,  H01J2237/2002 ,  H01J2237/24455 ,  H01J2237/2605

Abstract: A sample observation method includes irradiating a sample with a primary charged particle beam, detecting a secondary charged particle signal obtained by the irradiating, and observing the sample. The method is characterized by causing the primary charged particle beam generated in a charged particle optical lens barrel, which is maintained in a vacuum state, to be transmitted or passed through a separating film disposed to isolate a space in which the sample is placed from the charged particle optical lens barrel; and detecting a transmitted charged particle beam obtained by irradiating the sample, placed in an atmospheric pressure or a predetermined gas atmosphere of a slightly negative pressure state compared with the atmospheric pressure, with the primary charged particle beam.

Abstract translation: 样品观察方法包括用初级带电粒子束照射样品，检测通过照射获得的二次带电粒子信号，并观察样品。 该方法的特征在于使保持在真空状态的带电粒子光学镜筒中产生的初级带电粒子束透过或通过分离膜，以将样品放置的空间从 带电粒子光学镜头镜筒; 并且与初级带电粒子束一起检测放置在与大气压相比的微小负压状态的大气压或预定气体气氛中的样品所获得的透射带电粒子束。

公开(公告)号：US09366954B2

公开(公告)日：2016-06-14

申请号：US13948975

申请日：2013-07-23

Applicant: Applied Materials Israel, Ltd.

Inventor： Alon Litman ,  Nir Ben-David Dodzin ,  Albert Karabekov ,  Alex Goldenshtein

IPC: G01N23/00 ,  G03F1/86 ,  H01J37/28 ,  G21K1/06

CPC classification number: G03F1/86 ,  G03F1/62 ,  G21K1/062 ,  H01J37/28 ,  H01J2237/164 ,  H01J2237/2002 ,  H01J2237/244 ,  H01J2237/2449 ,  H01J2237/2809 ,  H01J2237/2817

Abstract: A system and a method for evaluating a lithography mask, the system may include: (a) electron optics for directing primary electrons towards a pellicle that is positioned between the electron optics and the lithography mask; wherein the primary electrons exhibit an energy level that allows the primary electrons to pass through the pellicle and to impinge on the lithographic mask; (b) at least one detector for detecting detected emitted electrons and for generating detection signals; wherein detected emitted electrons are generated as a result of an impingement of the primary electrons on the lithographic mask; and (c) a processor for processing the detection signals to provide information about the lithography mask.

Abstract translation: 一种用于评估光刻掩模的系统和方法，该系统可以包括：（a）用于将一次电子引导到位于电子光学器件和光刻掩模之间的防护薄膜的电子光学器件; 其中所述一次电子显示出允许所述一次电子通过所述防护薄膜并撞击所述光刻掩模的能级; （b）至少一个检测器，用于检测检测到的发射电子并产生检测信号; 其中由于一次电子撞击在光刻掩模上而产生检测到的发射电子; 和（c）用于处理检测信号以提供关于光刻掩模的信息的处理器。

公开(公告)号：US09324539B2

公开(公告)日：2016-04-26

申请号：US14481390

申请日：2014-09-09

Applicant: PROTOCHIPS, INC.

Inventor： John Damiano, Jr. ,  David P. Nackashi ,  Stephen E. Mick

IPC: G21K5/08 ,  H01J37/20 ,  H01J37/16 ,  H01J37/29

CPC classification number: H01J37/20 ,  H01J37/16 ,  H01J37/18 ,  H01J37/26 ,  H01J37/29 ,  H01J37/30 ,  H01J2237/2002 ,  H01J2237/2003 ,  H01J2237/2007

Abstract: A novel sample holder for specimen support devices for insertion in electron microscopes. The novel sample holder of the invention allows for the introduction of gases or liquids to specimens for in situ imaging, as well as electrical contacts for electrochemical or thermal experiments.

Abstract translation: 用于插入电子显微镜的样品支撑装置的新型样品架。 本发明的新型样品保持器允许将气体或液体引入用于原位成像的样品，以及用于电化学或热学实验的电触点。

公开(公告)号：US09275826B2

公开(公告)日：2016-03-01

申请号：US14525894

申请日：2014-10-28

Applicant: PROTOCHIPS, INC.

Inventor： John Damiano, Jr. ,  Stephen E. Mick ,  David P. Nackashi

IPC: H01J37/20 ,  H01J37/26

CPC classification number: H01J37/20 ,  H01J37/26 ,  H01J37/261 ,  H01J2237/188 ,  H01J2237/2001 ,  H01J2237/2002 ,  H01J2237/2003 ,  H01J2237/2007 ,  H01J2237/2008 ,  H01J2237/2602 ,  H01J2237/28 ,  H01J2237/2802

Abstract: Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.

Abstract translation: 电子显微镜支撑结构及其制作和使用方法。 支撑结构通常使用半导体材料和半导体制造工艺构造。 可以控制支撑结构的温度和/或气体或液体被限制在观察区域中用于反应和/或成像。

公开(公告)号：US09275825B2

公开(公告)日：2016-03-01

申请号：US14369537

申请日：2012-12-28

Applicant: John Damiano ,  David P. Nackashi ,  Daniel S. Gardiner

Inventor： John Damiano ,  David P. Nackashi ,  Daniel S. Gardiner

IPC: H01J37/00 ,  H01J37/20 ,  H01J37/28 ,  H01J37/26

CPC classification number: H01J37/20 ,  H01J37/261 ,  H01J37/28 ,  H01J2237/2002 ,  H01J2237/2802

Abstract: A novel specimen holder for insertion in electron microscopes, wherein the novel specimen holder is designed to minimize electrical noise so that signal integrity can be maintained during in situ electron microscopy.

Abstract translation: 用于插入电子显微镜中的新型样品保持器，其中新型样品架被设计为使电噪声最小化，使得在原位电子显微镜下可以维持信号完整性。

公开(公告)号：US20150380207A1

公开(公告)日：2015-12-31

申请号：US14768641

申请日：2014-02-18

Applicant: B-NANO LTD.

Inventor： Dov SHACHAL ,  Rafi DE PICCIOTTO

IPC: H01J37/18 ,  H01J37/28

CPC classification number: H01J37/18 ,  H01J37/244 ,  H01J37/28 ,  H01J2237/164 ,  H01J2237/188 ,  H01J2237/2002 ,  H01J2237/24445 ,  H01J2237/2605

Abstract: A scanning electron microscope suitable for imaging samples in a non-vacuum environment, the scanning electron microscope including an electron source located within an enclosure maintained under vacuum, an electron permeable membrane disposed at an opening of the enclosure separating an environment within the enclosure which is maintained under vacuum and an environment outside the enclosure which is not maintained under vacuum, the electron permeable membrane not being electrically grounded and at least one non-grounded electrode operative as an electron detector.

Abstract translation: 一种适用于在非真空环境中成像样品的扫描电子显微镜，所述扫描电子显微镜包括位于保持在真空下的外壳内的电子源，设置在所述外壳的开口处的电子透过膜，其分隔所述外壳内的环境， 维持在真空和外壳外部的环境，其不被保持在真空下，电渗透膜不被电接地，并且至少一个非接地电极用作电子检测器。